Volume 9, Issue 4, April – 2024
ISSN No:-2456-2165
Use of Particle Induced X-Ray Emission (PIXE),
Particle Induced Gamma–Ray Emission (PIGE),
Energy Dispersive X-Ray Analysis (EDXRF) for
Detecting Trace Elements in Soil Sample
Chandrashekhar Nivrutti Wani. (Sr. Lecturer Physics)
Sanjivani K.B.P. Polytechnic, Kopargaon.
Abstract:- This review paper provides a comprehensive
overview of trace element analysis utilizing ion-atom
interaction techniques, focusing on the principles,
applications, and recent advancements in the field. Ion-
atom interaction techniques, including Particle Induced X-
Ray Emission (PIXE), Particle Induced Gamma–Ray
Emission (PIGE), Energy Dispersive X-Ray Analysis
(EDXRF), Rutherford backscattering spectroscopy (RBS),
and ion beam analysis (IBA), offer unique capabilities for
trace element analysis with high sensitivity and minimal
sample preparation requirements.
The paper begins by discussing the fundamental
principles underlying ion-atom interaction techniques,
such as the interaction of energetic ions with matter and
the subsequent detection of emitted X-rays or
backscattered particles. It explores the various analytical
parameters that influence the sensitivity, resolution, and
depth profiling capabilities of these techniques.
Furthermore, the review highlights the diverse
applications of ion-atom interaction techniques in fields
such as environmental monitoring, forensic science,
biomedical research, and materials science. It showcases
how these techniques have been utilized to address specific
analytical challenges, such as the detection of trace
contaminants in environmental samples or the
characterization of thin films and semiconductor materials.
I. INTRODUCTION
Trace element analysis plays a crucial role in various
fields such as environmental science, geology, biology, and
material science. The accurate quantification of trace elements
in samples provides valuable insights into processes ranging
from environmental pollution to the characterization of
geological formations. Among the various analytical
techniques available for trace element analysis, ion-atom
interaction techniques have emerged as powerful tools due to
their sensitivity, selectivity, and non-destructive nature.
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Ion-atom interaction techniques encompass a range of
methodologies, including Particle Induced X-ray Emission
(PIXE), Rutherford Backscattering Spectrometry (RBS), and
Ion Beam Analysis (IBA). These techniques exploit the
interaction of accelerated ions with the atoms in a sample to
generate characteristic signals that can be used to identify and
quantify trace elements. By measuring the energies and
intensities of the emitted particles or X-rays, researchers can
obtain detailed information about the elemental composition
of the sample with high precision and accuracy.
In recent years, there has been a growing interest in the
application of ion-atom interaction techniques for trace
element analysis due to their ability to provide quantitative
data across a wide range of elements and concentrations.
These techniques offer advantages such as minimal sample
preparation requirements, rapid analysis times, and the ability
to analyze samples in situ without the need for extensive
sample manipulation.
This paper aims to review the latest developments and
applications of ion-atom interaction techniques in trace
element analysis. We will explore the principles underlying
these techniques, discuss their advantages and limitations, and
showcase their utility through case studies in various fields.
Additionally, we will highlight recent innovations and
emerging trends in the field, such as the integration of ion-
atom interaction techniques with advanced imaging and
spectroscopic methods.
By providing a comprehensive overview of trace element
analysis using ion-atom interaction techniques, this paper
seeks to contribute to the broader understanding of analytical
methodologies and their implications for research and
applications in diverse scientific disciplines.
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Volume 9, Issue 4, April – 2024 International Journal of Innovative Science and Research Technology
ISSN No:-2456-2165 https://doi.org/10.38124/ijisrt/IJISRT24APR2232

 Objectives
 Investigate the sensitivity and accuracy of ion-atom
interaction techniques, such as particle-induced X-ray
emission (PIXE) and ion beam analysis (IBA), for trace
element detection.
 Assess the applicability of ion-atom interaction techniques
for identifying and quantifying trace elements in various
sample matrices, including environmental, biological, and
geological samples.
 Explore the potential of ion-atom interaction techniques
for elemental mapping and spatial distribution analysis of
trace elements within samples.
 Optimize experimental parameters, such as beam energy,
detection systems, and sample preparation methods, to
enhance the performance of ion-atom interaction
techniques for trace element analysis.
 Compare the capabilities of different ion-atom interaction
techniques, such as PIXE, Rutherford backscattering
spectrometry (RBS), and nuclear reaction analysis (NRA),
for trace element analysis in terms of sensitivity, depth
resolution, and elemental range.
Fig 1: The Ion-Beam Facility Setup at Institute of Physics
II. METHODOLOGY (IOP), Bhubaneswar, India for the PIXE measurements.

 Sample Collection:
The soil samples will be collected from the top soil,i.e.,
10 - 15 cm depth,which is usually contaminated, to study the
anthropogenic sources of pollutants. Different distances like
100m, 500 m, 1000 m and 2000 m from the industry are
planned for the sample collection. The collected soil samples
will be grinded manually. It will be passed throughfine mesh
screen and stored in polythene bag at dry place till the testing.

 Sample Preparation:
Air-dry the samples to remove moisture, and grind them
to a fine powder to ensure homogeneity. Store the prepared
samples in clean, labeled containers to avoid contamination.

 Instrumentation Setup:
Select an appropriate ion-atom interaction technique such
as Particle-Induced X-ray Emission (PIXE) or Proton-Induced
Gamma-ray Emission (PIGE). Ensure the instrumentation is
calibrated using standard reference materials with known
elemental compositions.
Fig 2: The PIGE Setup at Bhabha Atomic Research Centre
(BARC), Mumbai, India
[(a) Liquid Nitrogen Container of HPGe Detector, (b)
HPGe Detector, (c) View Port, (d) Vacuum Gauge, (e)
Blank Off and (f) Turbomolecular Pump]

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Volume 9, Issue 4, April – 2024
ISSN No:-2456-2165
 Sample Analysis:
Load the prepared soil samples onto sample holders
compatible with the chosen technique. Place the sample
holders in the sample chamber of the instrument, ensuring
proper alignment. Initiate the analysis by irradiating the
samples with a beam of ions (e.g., protons or ions of heavier
elements) generated by an accelerator. Monitor the emitted X-
rays or gamma rays resulting from ion-atom interactions
within the sample. Capture the emitted signals using
appropriate detectors such as semiconductor detectors or
scintillation detectors. Record the energy spectra and
intensities of the detected X-rays or gamma rays for each
element of interest.
 Data Processing and Analysis:
Use dedicated software packages or algorithms to
process the acquired spectra and determine the elemental
compositions of the soil samples. Apply appropriate
corrections for background noise, sample matrix effects, and
instrument response. Quantify the concentrations of trace
elements in the soil samples based on the intensities of the
detected signals and calibration curves obtained from standard
reference materials.
 Quality Control:
Implement quality control measures by analyzing
duplicate samples, blanks, and certified reference materials
alongside the test samples. Monitor instrument performance
regularly through standardization and recalibration procedures.
Document all analytical procedures, instrument settings, and
calibration details for traceability and reproducibility.
 Data Interpretation and Reporting:
Interpret the analytical results in the context of
environmental or agronomic considerations. Compare the
obtained elemental concentrations with regulatory guidelines
or baseline values to assess soil quality and potential
environmental risks. Prepare a comprehensive report
summarizing the analytical methodology, results,
interpretations, and any relevant recommendations.
 Safety Considerations:
Adhere to all safety protocols and guidelines for handling
ionizing radiation sources and hazardous materials. Ensure
proper shielding and containment measures are in place to
minimize radiation exposure risks to operators and the
environment.
III. CHALLENGES
 Sample Preparation: Despite the non-destructive nature of
ion-atom interaction techniques, sample preparation
remains a critical step. Soil samples need to be properly
collected, homogenized, and prepared to ensure accurate
analysis. Contamination from external sources during
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International Journal of Innovative Science and Research Technology
https://doi.org/10.38124/ijisrt/IJISRT24APR2232
sample handling can affect the results and interpretation of
data.
 Matrix Effects: Soil samples often contain complex
matrices with varying compositions, which can pose
challenges for elemental analysis using ion beams. Matrix
effects such as interferences and background signals may
arise, leading to inaccuracies in quantification. Careful
calibration and correction methods are necessary to
mitigate these effects.
IV. POTENTIAL APPLICATIONS:
 Environmental Monitoring: Ion-atom interaction
techniques can be employed for environmental monitoring
of trace elements in soil, helping to assess contamination
levels, identify sources of pollution, and evaluate
remediation efforts. These techniques play a crucial role in
studying the impact of human activities on soil quality and
ecosystem health.
 Agricultural Research: Understanding the distribution of
essential nutrients and potentially harmful elements in soil
is essential for optimizing agricultural practices and
ensuring food safety. Ion-atom interaction techniques can
provide valuable insights into the availability and mobility
of nutrients and contaminants in soil, contributing to
sustainable agriculture and soil management strategies.
 Geological Studies: Beyond soil analysis, ion-atom
interaction techniques have applications in geological
studies for characterizing rock samples, mineral
exploration, and understanding geological processes. By
analyzing trace elements in soil and sedimentary layers,
researchers can reconstruct past environmental conditions
and geological events.
V. CONCLUSION
In conclusion, the utilization of ion-atom interaction
techniques for trace element analysis in soil has demonstrated
significant potential and value in various fields of study.
Through the employment of techniques such as proton-
induced X-ray emission (PIXE), Rutherford backscattering
spectrometry (RBS), and nuclear reaction analysis (NRA),
researchers have been able to delve into the elemental
composition of soil samples with remarkable precision and
sensitivity. These techniques provide invaluable insights into
soil composition, contamination patterns, nutrient availability,
and geological processes, thereby contributing to our
understanding of soil quality, ecosystem health, and geological
history. Ion-atom interaction techniques offer powerful tools
for trace element analysis in soil, with broad implications for
environmental science, agriculture, and geology. As we
continue to explore and innovate in this field, the insights
gained from these techniques will undoubtedly play a crucial
role in addressing pressing global challenges and ensuring the
health and resilience of our planet's soil ecosystems.
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Volume 9, Issue 4, April – 2024 International Journal of Innovative Science and Research Technology
ISSN No:-2456-2165 https://doi.org/10.38124/ijisrt/IJISRT24APR2232

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