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Infineon IRFP4868 DS v01 - 02 EN
Infineon IRFP4868 DS v01 - 02 EN
VDSS 300V D
RDS(on) typ. 25.5m
max. 32m
S
ID 70A D
G
Applications
TO-247AC
High Efficiency Synchronous Rectification in SMPS
Uninterruptible Power Supply
High Speed Power Switching G D S
Hard Switched and High Frequency Circuits
Gate Drain Source
Benefits
Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
Fully Characterized Capacitance and Avalanche SOA
Enhanced body diode dV/dt and dI/dt Capability
Lead-Free
Base Part Number Package Type Standard Pack Orderable Part Number
Form Quantity
IRFP4868PbF TO-247AC Tube 25 IRFP4868PbF
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IRFP4868PbF
Static @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 300 ––– ––– V VGS = 0V, ID = 250µA
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.29 ––– V/°C Reference to 25°C, ID = 5mA
RDS(on) Static Drain-to-Source On-Resistance ––– 25.5 32 m VGS = 10V, ID = 42A
VGS(th) Gate Threshold Voltage 3.0 ––– 5.0 V VDS = VGS, ID = 250µA
––– ––– 20 VDS = 300V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
––– ––– 250 VDS = 300V, VGS = 0V, TJ = 125°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V
IGSS nA
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -20V
RG Internal Gate Resistance ––– 1.1 –––
Dynamic @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units Conditions
gfs Forward Transconductance 80 ––– ––– S VDS = 50V, ID = 42A
Qg Total Gate Charge ––– 180 270 ID = 42A
Qgs Gate-to-Source Charge ––– 60 ––– VDS =150V
nC
Qgd Gate-to-Drain ("Miller") Charge ––– 57 ––– VGS = 10V
Qsync Total Gate Charge Sync. (Qg - Qgd) ––– 123 ––– ID = 42A, VDS =0V, VGS = 10V
td(on) Turn-On Delay Time ––– 24 ––– VDD = 195V
tr Rise Time ––– 16 ––– ID = 42A
ns
td(off) Turn-Off Delay Time ––– 62 ––– RG = 1.0
tf Fall Time ––– 45 ––– VGS = 10V
Ciss Input Capacitance ––– 10774 ––– VGS = 0V
Coss Output Capacitance ––– 612 ––– V DS = 50V
Crss Reverse Transfer Capacitance ––– 193 ––– ƒ = 1.0 MHz, See Fig. 5
Coss eff. (ER) Effective Output Capacitance pF VGS = 0V, VDS = 0V to 240V ,
––– 406 –––
(Energy Related) See Fig. 11
Coss eff. (TR) Effective Output Capacitance VGS = 0V, VDS = 0V to 240V
––– 710 –––
(Time Related)
Diode Characteristics
Symbol Parameter Min. Typ. Max. Units Conditions
IS Continuous Source Current MOSFET symbol D
––– ––– 70 A
(Body Diode) showing the
G
ISM Pulsed Source Current integral reverse
––– ––– 280 A
(Body Diode) p-n junction diode. S
VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 42A, VGS = 0V
dv/dt Peak Diode Recovery ––– 7.3 ––– V/ns TJ = 25°C, IS = 42A, VDS = 300V
trr Reverse Recovery Time ––– 351 ––– TJ = 25°C
ns VR = 255V,
––– 454 ––– TJ = 125°C
Qrr Reverse Recovery Charge ––– 2520 ––– TJ = 25°C IF = 42A
nC di/dt = 100A/µs
––– 3686 ––– TJ = 125°C
IRRM Reverse Recovery Current ––– 16 ––– A TJ = 25°C
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by
LS+LD)
Notes:
Repetitive rating; pulse width limited by max. Junction Coss eff. (TR) is a fixed capacitance that gives
temperature. the same charging time as Coss while VDS is
Limited by TJmax, starting TJ = 25°C, L = 1.2mH rising from 0 to 80% VDSS.
RG = 50, IAS = 42A, VGS =10V. Part not Coss eff. (ER) is a fixed capacitance that gives
recommended for use above this value. the same energy as Coss while VDS is rising
ISD ≤ 42A, di/dt ≤ 1706A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. from 0 to 80% VDSS.
Pulse width ≤ 400µs; duty cycle ≤ 2%. R is measured at TJ approximately 90°C.
RJC value shown is at time zero.
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IRFP4868PbF
1000 1000
VGS VGS
TOP 15V TOP 15V
12V 12V
100 10V 10V
ID, Drain-to-Source Current (A)
1
10 4.75V
0.1
4.75V
60µs PULSE WIDTH 60µs PULSE WIDTH
Tj = 25°C Tj = 175°C
0.01 1
0.1 1 10 100 1000 0.1 1 10 100
V DS, Drain-to-Source Voltage (V) V DS, Drain-to-Source Voltage (V)
1000 3.5
ID = 70A
100
2.5
TJ = 175°C
(Normalized)
2.0
10 TJ = 25°C
1.5
1.0
1
V DS = 50V 0.5
60µs PULSE WIDTH
0.1 0.0
3 4 5 6 7 8 -60 -40 -20 0 20 40 60 80 100120140160180
V GS, Gate-to-Source Voltage (V) T J , Junction Temperature (°C)
100000 14.0
VGS = 0V, f = 1 MHZ
ID= 42A
Ciss = C gs + Cgd, C ds SHORTED
12.0 V DS= 240V
Crss = C gd
V GS, Gate-to-Source Voltage (V)
10000
8.0
Coss
6.0
Crss
1000
4.0
2.0
100 0.0
1 10 100 1000 0 30 60 90 120 150 180 210 240
V DS, Drain-to-Source Voltage (V) QG, Total Gate Charge (nC)
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage
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IRFP4868PbF
1000 1000
OPERATION IN THIS AREA
LIMITED BY R DS(on)
1msec
100 100
TJ = 175°C
100µsec
10msec
TJ = 25°C
10 10
1 1
Tc = 25°C DC
Tj = 175°C
V GS = 0V
Single Pulse
0.1 0.1
0.0 0.5 1.0 1.5 1 10 100 1000
V SD, Source-to-Drain Voltage (V) VDS, Drain-to-Source Voltage (V)
340
40 330
30 320
310
20
300
10
290
0 280
25 50 75 100 125 150 175 -60 -40 -20 0 20 40 60 80 100120140160180
TC , Case Temperature (°C) TJ , Temperature ( °C )
Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Drain-to-Source Breakdown Voltage
20.0 5000
ID
EAS , Single Pulse Avalanche Energy (mJ)
TOP 11A
4000 20A
15.0 BOTTOM 42A
3000
Energy (µJ)
10.0
2000
5.0
1000
0.0 0
-50 0 50 100 150 200 250 300 350 25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
VDS, Drain-to-Source Voltage (V)
Fig 11. Typical Coss Stored Energy Fig 12. Maximum Avalanche Energy vs. Drain Current
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IRFP4868PbF
1
0.001
Notes:
SINGLE PULSE 1. Duty Factor D = t1/t2
( THERMAL RESPONSE ) 2. Peak Tj = P dm x Zthjc + Tc
0.0001
1E-006 1E-005 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
1000
0.01
10 0.05
0.10
1
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming j = 25°C and
Tstart = 150°C.
0.1
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
1200
TOP Single Pulse Notes on Repetitive Avalanche Curves , Figures 14, 15:
BOTTOM 1.0% Duty Cycle (For further info, see AN-1005 at www.irf.com)
1000 1. Avalanche failures assumption:
ID = 42A
Purely a thermal phenomenon and failure occurs at a temperature
EAR , Avalanche Energy (mJ)
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IRFP4868PbF
6.0 70
IF = 28A
V GS(th) , Gate threshold Voltage (V)
5.0 60 V R = 255V
TJ = 25°C
4.0 50 TJ = 125°C
IRRM (A)
3.0 ID = 250µA 40
ID = 1.0mA
2.0 ID = 1.0A 30
1.0 20
0.0 10
-75 -50 -25 0 25 50 75 100 125 150 175 0 200 400 600 800 1000
TJ , Temperature ( °C ) diF /dt (A/µs)
Fig. 16 Threshold Voltage vs. Temperature Fig. 17 Typical Recovery Current vs. dif/dt
90 6000
IF = 42A IF = 28A
80 V R = 255V
V R = 255V
50 4000
40
30 3000
20
10 2000
0 200 400 600 800 1000 0 200 400 600 800 1000
diF /dt (A/µs) diF /dt (A/µs)
Fig 18. Typical Recovery Current vs. dif/dt Fig 19. Typical Stored Charge vs. dif/dt
8000
IF = 42A
7000 V R = 255V
TJ = 25°C
6000 TJ = 125°C
QRR (nC)
5000
4000
3000
2000
0 200 400 600 800 1000
diF /dt (A/µs)
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IRFP4868PbF
Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs
Fig 22a. Unclamped Inductive Test Circuit Fig 22b. Unclamped Inductive Waveforms
Fig 23a. Switching Time Test Circuit Fig 23b. Switching Time Waveforms
Fig 24a. Gate Charge Test Circuit Fig 24b. Gate Charge Waveform
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IRFP4868PbF
Notes: This part marking information applies to devices produced after 02/26/2001
Note: For the most current drawing please refer to website at http://www.irf.com/package/
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IRFP4868PbF
Qualification information
Industrial
Qualification level
(per JEDEC JESD47F)†
Revision History
Date Comments
Changed datasheet with Infineon logo-all pages
06/21/2017 Corrected Package outline on page 8.
Added disclaimer on last page.
Published by
Infineon Technologies AG
81726 München, Germany
© Infineon Technologies AG 2015
All Rights Reserved.
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Due to technical requirements products may contain dangerous substances. For information on the types in question
please contact your nearest Infineon Technologies office.
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