Idea of AFM Device

The Atomic Force Microscope (AFM) is a device used in nanotechnology, biology, and
physics to visualize objects at the atomic and molecular level. This device creates high-
resolution three-dimensional images of objects on their surfaces.
Mechanism :
The AFM consists of the Cantilever arm in its probe probe from a sharp header known as
TIP is used to clear the sample surface. The arm is made of silicon or silicon nitride at
half of Qatar within a few nanometers. When the header head of the sample is
approaching the strength of the force and the sample surface, this force will lead to a
deviation in the arm based on the power of hook and this is by the type of surface that is
studied. The laser beam is falling on the Cantilever arm and which rises and down with
high and low altitude and thus with the diversity of surface stirrings of high and low, and
the laser beam is reflected on the pregnant on the future and thus is determined and the
paint is determined The surface is impressed depending on the laser beam motion
Some of these applications include:
 Identifying atoms from samples
 Evaluating force interactions between atoms
 Studying the physical changing properties of atoms
 Studying the structural and mechanical properties of protein complexes and
assembly, such as microtubules.
 used to differentiate cancer cells and normal cells.
 Evaluating and differentiating neighboring cells and their shape and cell wall
rigidity.
Components and Description of the Device:
probe is made of a sharp head known as tip
Laser Beam Source
Detector