Professional Documents
Culture Documents
A Comparative Study of Various Current Mirror Configurations - Topologies and Characteristics
A Comparative Study of Various Current Mirror Configurations - Topologies and Characteristics
Microelectronics Journal
journal homepage: www.elsevier.com/locate/mejo
art ic l e i nf o a b s t r a c t
Article history: Current mirror is a fundamental unit, widely used for current amplification, biasing and active load in
Received 16 July 2015 various analog/mixed mode integrated circuits. Its efficient design plays a major role in deciding the
Received in revised form overall performance of these circuits. In literature, various techniques have been developed and proposed
25 March 2016
to improve the performance parameters of a current mirror like accuracy, input resistance, output re-
Accepted 17 April 2016
sistance and bandwidth etc. This paper is an effort to bring all these techniques on a single platform and
compare their advantages and disadvantages. Here, a detailed survey of various current mirror topologies
Keywords: has been carried out and these topologies have been categorized on the basis of various characteristic
Current mirror parameters. The discussed circuits have been simulated using Mentor Graphics Eldo spice in TSMC
Accuracy
0.18 mm CMOS, BSIM3 and Level 53 technology. In order to get a fair comparison among these techniques,
Input resistance
simulations under similar conditions using a supply voltage of 1.8 V have been performed.
Output resistance
Bandwidth & 2016 Elsevier Ltd. All rights reserved.
Low voltage circuits
n
Corresponding author.
http://dx.doi.org/10.1016/j.mejo.2016.04.015
0026-2692/& 2016 Elsevier Ltd. All rights reserved.
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 135
iIN iOUT
iIN iOUT
M3
vOUT 5
0.25
5 5
M1 M2
0.25 0.25
5 5
0.25 M1 M2
0.25
(a) (b)
iOUT
iIN
iIN
iOUT +
5 5
0.25 0.25
5
M4 M3 0.25 M4 M3
+
5
- VDS,sat.+VT
0.25
vOUT
5 5
M1 M2 5
0.25 0.25 M1 M2
0.25
+
5
- VDS,sat.+VT 0.25
-
(c)
(d)
Fig. 1. Basic Current Mirrors (a–d). (a) Simple CM, (b) Wilson CM, (c) Improved Wilson CM, and (d) cascode CM.
of techniques that reduce the required compliance voltage, [4,24–30] were proposed in literature that offer electronic tun-
thereby reducing voltage headroom of the circuit. Structures ability of the gain in current amplifiers.
suggested in literature to reduce input resistance for a CM are In simple CM (Fig. 1(a)), due to channel length modulation ef-
summarized in Section 4. In Section 5, CM topologies that provide fect, the replication of input current at output node is not perfect.
high output resistance are explained. Techniques used to improve Its current mirroring accuracy depends on the drain–source vol-
bandwidth of CMs are summarized in Section 6. Low voltage CM tages of MOSFETs and channel length modulation parameter (λ).
techniques available in literature along with their description are The input resistance (rin), output resistance (rout) and bandwidth
discussed in Section 7. Some of the very high performance CMs (ω0) of a simple CM are given as [1,3]:
available in literature are described in Section 8. An effort has been
1
carried out to simulate these circuits on similar platform to get a rin = 1/gm1, rout = r02 = , ω 0 ≈ g m1/( Cgs1 + Cgs2 ),
λiD2 (1)
fair comparison amongst them. These simulated results are in-
cluded in every section and finally Section 9 concludes the paper. where gm is transconductance, r0 is incremental output resistance,
iD is drain current and Cgs is gate–source capacitance of respective
MOSFET. Eq. (1) shows that performance parameters of a simple
2. Basic current mirrors CM are limited by gm, r0 and Cgs of a MOSFET.
In case of short channel MOS devices used to design smaller,
MOSFET based simple CM is shown in Fig. 1(a). In this circuit, if high frequency and low power consumption equipments, the error
MOSFETs M1 and M2 operate in saturation region, output current ( in output current due to channel length modulation effect in-
iOUT) is proportional to input current (iIN) by the ratio of their as- creases further [1,18]. It has been noticed that a reduction in size
pect ratios. In case of identical MOSFETs, iIN ¼iOUT and the circuit of MOSFET leads to an increase in its transconductance along with
simply replicates or mirrors the input current at its output term- decrease in its output resistance [1]. In short channel MOSFETs, the
inal and hence the name current mirror [1]. If the aspect ratio of effect of reduction in output resistance is more prominent than
M2 is greater than that of M1, the circuit behaves as current am- increase in transconductance. Hence, simple CMs designed with
plifier, whose gain is directly proportional to the ratio of their these MOSFETs suffer from lower accuracy and lower output re-
aspect ratios. However, gain of such circuits is fixed and has to be sistance, thereby adversely affecting overall circuit performance.
decided at the time of fabrication. Various programmable CMs Moreover, these CM circuits suffer from poor matching and
136 B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155
It has been observed that in order to achieve improvement in Fig. 4. Input current vs. input voltage characteristics for basic CMs discussed in
performance parameters of a CM, designer has to use more Section 2.
number of MOSFETs, which leads to an increase in effective
parasitic capacitance of the circuit. Bandwidth of a CM majorly
depends upon its input time constant and thereby input capaci-
tance [35]. Generally, increase in parasitic capacitances leads to an
increase in the effective input capacitance and hence lowers the
bandwidth for the circuit. However, in both Wilson and improved
Wilson CMs, presence of a real zero before dominant pole causes
increase in their bandwidths. This also leads to peaking in their
frequency response [36,37].
Cascode CM shown in Fig. 1(d) also enhances output resistance
and accuracy of a simple CM [1,3]. Its output resistance is given as:
rout = r03 + r02 ( 1 + r03 ( gm3 + gmb3 ) ) ≈ gm3 r03 r02 (3)
In cascode CM, if (W/L)2/(W/L)1 ¼ (W/L)3/(W/L)4, vDS2 follows Fig. 5. Output voltage vs. output current characteristics at iIN ¼ 10 mA for basic CMs
vDS1 as long as M2 and M3 remain in saturation (here W/L is aspect discussed in Section 2.
ratio of the corresponding MOSFET). Moreover, M3 tries to main-
tain M2 in saturation region irrespective of variations in output and hence the performance of a cascode CM can be further im-
voltage (shielding effect), thereby iOUT closely tracks iIN. Its output proved by using double cascode CM. The approximate output re-
compliance voltage is 2vDS,sat þVT (here, vDS,sat is the minimum sistance of a double cascode CM is (gmr0)2r0, however it leads to
drain to source voltage required for a MOSFET to operate in sa- further increase in voltage headroom. In modern CMOS low vol-
turation region and VT is its threshold). This compliance voltage is
tage circuits, this problem assumes significance as it leads to re-
similar to that of Wilson and improved Wilson CMs, and is higher
stricted usage of cascode CM, in spite of its better current mir-
than the minimum voltage required for M2 and M3 to operate in
roring accuracy, higher output resistance and larger bandwidth
saturation region (2vDS,sat) by a value ‘VT’ [3]. The output resistance
[1,18].
Fig. 6. Input resistance as a function of frequency at iIN ¼10 mA for basic CMs dis-
Fig. 2. Current transfer characteristics for basic CMs discussed in Section 2. cussed in Section 2.
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 137
Mirroring accuracya Very poor Poor Very good Very good 3.1. High swing cascode CM (compound CM)
% Error ratio (PER)b 54.89 17.47 0.52 0.51
Vin,dropa(V) 0.5–0.95 1–1.8 1–1.8 1–1.8
Vout,mina(V) 0.1–0.4 0.5–0.9 0.5–1.1 0.5–0.9 In cascode CM (discussed in Section 2), output compliance
Input resistanceb (Ω) 4.5 k 9k 10 k 9k voltage can be reduced by VT, while maintaining MOSFETs M2 and
Output resistanceb (Ω) 200 k 18 M 14 M 14 M M3 in saturation region. The circuit of high swing cascode CM
Bandwidthb (Hz) 1.46 G 3.26 G 3.17 G 908.67 M shown in Fig. 9(a), achieves this low compliance voltage require-
Peaking in frequency Nil 0.12 1.08 Nil
responseb (dB)
ment, while maintaining output resistance equivalent to that of
Power consumedb (W) 33.12 m 25.12 m 28.56 m 28.69 m cascode CM [38]. The reduction in output compliance voltage is
achieved by segregating MOSFETs (M1 and M4) and biasing them
a
For input current range 0–500 mA. separately as shown in Fig. 9(a). In this circuit, the aspect ratio of
b
At input current¼ 10 mA.
M4 is chosen to be one-fourth as compared to rest of the MOSFETs
in the circuit, leading to reduction in the output compliance vol-
These basic CMs along with other circuits to be discussed in the tage by ‘VT’. However, in high swing cascode CM of Fig. 9(a), since
paper have been simulated using Mentor Graphics Eldo spice in vDS1≠vDS2, iOUT is not an accurate replica of iIN [3].
TSMC 0.18 mm CMOS, BSIM3 and Level 53 technology. All the CM
topologies described in the paper have been simulated under ap- 3.2. Low voltage cascode CM
proximately similar conditions to get a fair comparison among
them. To simulate these circuits, a supply voltage of 1.8 V along The structure of low voltage cascode CM is shown in Fig. 9(b)
with a load of 1 kΩ was used. Here, aspect ratio of the MOSFETs [18]. In this circuit, all the MOSFETs operate in saturation region
forming primary CM pair has been chosen to be 5 mm/0.25 mm. and vGS3 ¼vGS4 is ensured by proper selection of their aspect ratios.
However, these circuits may operate at other aspect ratios as well. The gate terminal of M1 is shorted with drain terminal of M4 in
DC analysis of all the circuits has been carried out by varying iIN for order to reduce the minimum voltage headroom by a value ‘VT’.
a sweep of 0–500 mA. However, many CM topologies are specially Here, if VB ¼vGS4 þ (vGS1 VT1)¼vGS3 þ(vGS2 VT2), M1 and M4 will
designed to operate at low currents, thus for the sake of generality operate in saturation region. This structure ensures high accuracy
all the comparisons like percentage error in mirroring accuracy, as vDS1 ¼vDS2 due to shielding effect of M3 and offers output re-
input resistance, output resistance and bandwidth have been sistance equivalent to a conventional cascode CM, while reducing
carried out at a small value of input current equal to 10 mA. the output compliance voltage by ‘VT’. However, it requires an
The current transfer characteristics for these basic CMs, de- additional circuit to generate the required value of VB.
signed for higher accuracy are shown in Fig. 2. To reflect the im-
provement achieved in current mirroring accuracy, their percen- 3.3. Improved high swing cascode CM
tage error ratio (PER) is plotted in Fig. 3. These figures indicate that
current mirroring accuracy of a simple CM is quite poor and is Improved high swing cascode CM shown in Fig. 9(c), generates
138 B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155
biasing voltage VB required in low voltage cascode CM with the 3.5. Low voltage tail current source
help of MOSFET M5 [3]. This configuration provides precise current
mirroring and a high output resistance equivalent to a cascode CM, The low voltage tail current source reported by You et al., de-
while maintaining output compliance voltage equal to 2VDS,sat. The signed to operate at low compliance voltage while providing high
negative feedback due to M4 equalizes the drain–source voltage of output resistance is shown in Fig. 9(e) [11]. It is also known as
bootstrapped configuration. In this circuit, output MOSFET (M2)
mirroring MOSFETs (M1 and M2) and eliminates any error due to
mirrors the current injected in M1 and an error amplifier A tries to
channel length modulation effect. However, this is achieved at the
maintain equal vDS voltages of both the MOSFETs. This configura-
cost of higher power consumption as it requires two reference
tion forces a similar change at input node that occurs at output
current sources. node with the help of two feedback loops; one formed by negative
feedback consisting of amplifier A and MOSFET M1 at input side
and second one formed by positive feedback consisting of ampli-
3.4. Self-biased high swing cascode CM fier A and MOSFET M2 at output side. These feedback loops ensure
identical voltages at input and output nodes and thereby reduce
In self-biased high swing cascode CM (Fig. 9(d)), voltage ‘VB’ of the error due to channel length modulation effect. In this circuit, if
low voltage cascode CM (Fig. 9(b)) is obtained with the help of a vOUT (voltage at output terminal of CM) varies, the variation in vDS2
resistor R. The resistance of R is adjusted in such a manner that the (and thereby in vDS1 due to feedback action) is absorbed by am-
potential drop across it is VDS,sat and output compliance voltage of plifier A by suitably adjusting the gate voltage of M1 and M2, as
the circuit is 2VDS,sat. Self-biased high swing cascode CM requires drain current of M1 is fixed (equal to iIN).
only one reference current source and hence dissipates lower In case of matched MOSFETs M1 and M2, the output resistance
power. It also maintains a higher output resistance and current of the CM is found to be equivalent to output resistance of input
mirroring accuracy equivalent to a conventional cascode CM while current source iIN, which is equal to gmr02 in case of cascode cur-
providing high swing operation. However, in self-biased high rent source. However, in this CM due to feedback action any
change in vOUT leads to a corresponding change in vIN (voltage at
swing cascode CM input resistance increases by ‘R’ and since
input terminal of CM). In case of non-ideal current source iIN, this
voltage drop across R need to track VDS,sat for different values of
may further lead to changes in input current. Moreover, its output
input current, its output voltage swing is restricted as compared to
resistance is negative due to positive feedback loop at output side
high swing cascode CM [3]. and stability of the circuit can be affected if positive feedback
Fig. 9. CMs with lower compliance voltage requirement (a–l). (a) High swing cascode CM [38]. (b) Low voltage cascode CM [18]. (c) Improved high swing cascode CM [3].
(d) Self-biased high swing cascode CM [14]. (e) Low voltage tail current source [11]. (f) Low voltage CM exploiting positive shunt feedback [39]. (g) Level shifted simple CM
[16]. (h) Level shifted cascode CM [16]. (i) Level shifted simple CM with unbalanced differential amplifier [16]. (j) Triode region simple CM [41]. (k) Triode region cascode CM
[17]. (l) Triode region cascode CM with adaptive biasing [17].
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 139
IB ¼ 10 mA)
Mb1
code CM
33.98 m
0.1–0.5
1.5 M
Eq. (5) shows that drain current of M1 depends upon biasing
20 k
0.51
current IB and ratio of transconductance parameters of M1 and
Mb1. This occurs because the potential difference between gate
current of 48 mA)
input current and depends on the device parameters of Mb1 and
0.025–0.425
its biasing current IB. In the circuit, assuming M1 and M2 to be
116.11 m
ple CM
0.2–0.4
matched and i2 operating in saturation region, current through M2
26.78
1.6 k
70 k
using Eq. (5) can be given as:
⎛ β ⎞
iD2 = iOUT = iIN + ⎜ 1 + 1 ⎟ IB
41.345 m
not very good due to presence of channel length modulation effect
0.1–0.4
200 k
54.45
0.5–1
Poor
in M2. Moreover, due to triode mode operation of M1, bandwidth
5k
of the CM is also poor.
111.02 m
0.1–0.4
0–0.45
21.66
[17]. In this circuit, MOSFETs M1 and M2 behave as primary CM
1.5 k
70 k
CM
pair operating in saturation region. MOSFETs M3 and M4 behave as
active resistors appropriately biased through diode connected
CM exploiting posi-
MOSFET M5 and operate in triode region. This circuit resembles a
simple CM, with M1 and M2 having source degeneration and iOUT
tive feedback
Equal to load
closely tracks iIN. The mirror has higher output resistance
Very good
resistance
523.47 m
0.1–0.45
equivalent to a conventional cascode CM, even at a output voltage
0.2–1.8
4.8 k
0.84
lower than 2vDS,sat., due to degeneration resistor (MOSFET M4).
This CM operates at a lower supply voltage but its operative cur-
rent range is limited, as iIN must be lower than IB.
Equal to load
This limitation can be overcome with the help of adaptive
Tail current
resistance
biasing method shown in Fig. 9(l) [17]. In this technique, in addi-
0.4–0.45
523.10 m
0.1–0.45
source
0.24
300
800 k
17.43
CM.
30.48 m
0.1–0.7
0.5–1
18.02
3M
6k
14 M
region simple CM, triode region cascode CM has very high output
resistance and improved current mirroring accuracy.
Input resistanceb (Ω)
Mirroring accuracya
Output resistanceb
Power consumedb
Vout,mina (V)
Vin,dropa (V)
(Ω)
VDD
VDD
IB=10u
5 3.6 3.6
5
0.25 0.54 0.54
0.25
Fig. 10. CMs with lower input resistance (a–f). (a) Active CM [42]. (b) FVF CM [44]. (c) Schematic of very low input resistance CM [46].
iOUT
VDD
D
5 IB=10u
VD A M3 iOUT ID2
0.25 D
iIN
iIN 5 M3
0.25 M2= mW/L ID
+
G VGS2 G
M4
- ID1 +
5
M1 M2 M1 M2
0.25 M1= W/L VGS
- S
5 5 +
5 5 0.25 0.25
0.25 0.25 VGS1
- S
VDD VDD
20
M7
0.58 2 M6 0.18
iIN
0.18 2
M4 IB=10u IB=10u
iOUT
VB=0.8V
50 iOUT
M3
0.25
Cex=0.1u M4 M3 -A M5
0.9 5
iIN 5 5
0.25 0.25
0.25 0.25
M2 M5
M1
5 M1 M2
5
0.25
0.25 5 5
0.25 0.25
VDD
IB1=10u
IB=10u
IB=10u
M6
VB=0.8V iOUT
5
0.25
M4 M3 M5
5 5
iIN 5
0.25 0.25
0.25
M1 M2
5
0.25 5
0.25
Fig. 11. CMs with higher output resistance (a–f). (a) Active-feedback cascode CM [47]. (b) Regulated cascode CM [48]. (c) Two transistor composite structure of self-cascode
MOSFET along with its equivalent structure [31]. (d) Low voltage CM based on self-cascode MOSFET [9] (capacitance with capacitor (shown dotted) is of capacitively
compensated self-cascode CM [56]). (e) Schematic of low voltage CM with super-cascode configuration [53]. (f) Simple implementation of CM shown in Fig. 4 (e) [53].
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 143
were used in cascade. This architecture reduced the input re- 5.3. CM based on self-cascode MOSFET
sistance of the circuit in the range of a few mΩ, without increasing
its supply voltage requirement. Self cascode MOSFET structure helps in providing higher output
resistance without increasing the required output voltage. A self-
4.4. Simulation results of CMs with lower input resistance cascode MOSFET is a two MOSFET structure as shown in Fig. 11(c),
which can be treated as a single composite MOSFET with much
Comparative simulation results of the CM topologies discussed higher effective channel length and output resistance [50]. For
in Section 4.1, for improvement in input resistance is given in optimal operation, aspect ratio of M2 must be higher than that of
Table 3. All these topologies represent a great improvement in M1. Assuming equal lengths of M1 and M2 and width of M2 to be
input resistance. The simulations carried out demonstrate that the ‘m’ times larger than M1, dc-equivalent width and length of the
input compliance voltage of active CM is dependent on biasing composite structure are given as:
voltage VD and a lower input resistance is achieved only for small
Weq . = W2; L eq . = L2 + mL1 (10)
frequency range. Furthermore, it consumes a significant amount of
power as well. Table 3 depicts that the CM structure suggested by Eq. (10) shows that the composite structure behaves as a long-
Baghtash and Azhari [46] provide very low input resistance at the channel transistor, when m 4 1. Since drain currents of M1 and M2
cost of increased input compliance voltage. The comparison shows are equal, current density of M2 is much lower than M1 and the
that FVF CM provides a lower input resistance at comparatively composite structure has much lower output conductance due to
lower input and output compliance voltages. However, its oper- lower current density at the drain terminal. Equivalent output
ating current range is comparatively low, as was discussed in resistance (r0,eq.) and trans-conductance (gm,eq.) of the composite
Section 4.2. structure are given as [51,52]:
g m2
r0, eq . ≈ (m + 1) r02; gm, eq . ≈
m+1 (11)
5. Current mirrors with higher output resistance
In composite structure, M1 always operates in triode region,
Some techniques like Wilson CM, improved Wilson CM and hence there is no appreciable increment in equivalent vDS,sat. Self-
cascode CM discussed in Section 2 for improving the accuracy of a cascode structure offers higher output resistance equivalent to a
simple CM increase its output resistance as well. A few more conventional cascode configuration while consuming output vol-
techniques available in literature for enhancement of output re- tage headroom comparable to a single MOSFET and can be used to
sistance of a CM are detailed in Section 5.1, followed by their si- design high performance low voltage circuits.
mulation results in Section 5.5. A low voltage CM based on self-cascode MOSFET, with output
resistance similar to a conventional cascode CM is shown in Fig. 11
5.1. Active feedback cascode CM (d) [51]. In the circuit, M2 operates in triode region, thus output
compliance voltage of the CM is less than vDS2,sat. þvDS3,sat., which
Active feedback cascode CM proposed by Yang and Allstot is much lower than a conventional cascode CM. MOSFET M4 is
(Fig. 11(a)) improves the performance of a cascode CM without used as a level shifter to reduce input compliance voltage of the
increasing its voltage headroom [47]. This CM in addition to the circuit. However, accuracy of this CM is lower than that of a con-
series feedback present in cascode configuration, employs a ne- ventional cascode CM.
gative series feedback through voltage amplifier A. The negative
feedback offered by amplifier A maintains the drain voltage of M2 5.4. Low voltage CM with super-cascode configuration
constant (equal to VD) irrespective of the variations in output
voltage. This makes the output current constant and independent The schematic of low voltage CM with super-cascode config-
of the changes in output voltage leading to a significant increase in uration at output side is shown in Fig. 11(e) [53,54]. This circuit
the output resistance. The output resistance offered by an active- forces equal drain–source voltages of MOSFETs M1 and M2 form-
feedback cascode CM is Av gm3r03 times that of a simple CM. This ing primary CM pair, by means of MOSFET M4, current source IB,
configuration provides output resistance equivalent to a double and voltage source VB. Biasing potential at gate terminal of MOS-
cascode CM, while its required voltage headroom is equivalent to FET M5 is provided through drain terminal of M3 and the requisite
that of a conventional cascode CM. However, it operates well as
long as M2 operates in saturation region. This condition depends Table 4
on voltage VD, input current and load impedance at output node of Comparative results of different CM topologies for higher output resistance.
the CM.
Regulated Low voltage CM Low supply voltage CM
cascode CM based on self- with super cascode
5.2. Regulated cascode CM cascode MOSFET configuration
In regulated cascode CM shown in Fig. 11(b), the amplifier A of Mirroring Very good Good Very good
active feedback cascode CM (Fig. 11(a)) is implemented as a accuracya
% Error ratio 0.38 18.93 0.09
common-source stage [3,48,49]. This configuration provides sig- (PER)b
nificant improvement in output resistance due to negative feed- Vin,dropa (V) 0.05–1 0.05–0.4 0.265–0.275
back provided by common-source MOSFET M4 and biasing current Vout,mina (V) 0.69–0.72 0.2–0.4 0.3–0.6
source IB. Its small-signal output resistance is given as: Input resistanceb 4.86 k 2k 60
(Ω)
rout = r02 + r03 + r02 gm3 r03 ( 1 + gm4 r04 ) ≈ r02 ( gm3 r03 )( gm4 r04 ) (9) Output 826 M 5.44 M 15 G
resistanceb (Ω)
Eq. (9) shows that output resistance of this CM is approxi- Power consumedb 25.76 m 30.06 m 39.37 m
(W)
mately equal to that of a double cascode CM, while its output
compliance voltage is similar to a conventional cascode CM. a
For input current range 0–500 mA.
However, it consumes higher power than cascode CM. b
At input current¼10 mA.
144 B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155
Fig. 12. Techniques to improve bandwidth of a CM (a–e). (a) Simple CM with resistive compensation technique [15]. (b) Improved high-swing cascode CM with resistive
compensation technique [15]. (c) Resistively compensated simple CM with active replacement [55]. (d) Simple CM with inductive compensation [58].
polarity is achieved with the help of inverting amplifier A. Output short channel MOSFETs, bandwidth gets increased due to reduc-
resistance of the circuit increases further if the amplifier's gain is tion in Cgs. However, with the advancement in technology, devices
greater than unity. A simple implementation of this CM is shown operating at even higher bandwidth and having higher speed are
in Fig. 11(f). In this circuit, amplifier A is formed by MOSFET M6 required. Thus, various techniques have been designed to improve
and current source IB1. Here, MOSFETs M3, M5, M6 and current the bandwidth of a CM. Some important ones are discussed in
sources IB and IB1 implement a super-cascode transistor. This cir- Section 6.1 and their simulation results are presented in Section
cuit has very high output resistance in GΩ range, given as: 6.4.
rout ≈ gm6 r06 gm5 r05 gm3 r03 r02 (12)
6.1. Resistive compensation technique
In this configuration, negative feedback loop formed by super-
cascode transistor ensures vDS1 ¼ vDS2, thereby nullifying any error An efficient and effective technique to improve the bandwidth
in accuracy due to channel length modulation effect. However, it of a CM by applying resistive compensation scheme was reported
requires higher number of current sources and hence consumes in literature by Voo and Toumazou [15]. In this technique, band-
more power. width of the CMs whose transfer function is similar to that of a low
pass filter can be enhanced by adding a compensating resistor
5.5. Simulation results of CMs with higher output resistance between common gate terminals of the MOSFETs forming primary
CM pair. Simple CM and improved high-swing cascode CM in-
Simulation results of these CM topologies reported for im- corporating resistive compensation technique are shown in Fig. 12
proving output resistance are summarized in Table 4. Their com-
(a) and (b) respectively. Here, the compensating resistor delays the
parative study shows that these topologies not only increase
response of the CM and introduces a pair of pole and zero in its
output resistance of a CM but also improve its current mirroring
transfer function. Bandwidth of the circuit is increased by properly
accuracy. The simulations represent that CM with super-cascode
adjusting the value of compensating resistor to cancel dominant
configuration provides maximum improvement in output re-
pole of the transfer function by the zero introduced due to use of
sistance, though with slight increase in power consumption.
compensating resistor. The transfer function of simple CM with
resistive compensation is given as [15]:
increases the bandwidth of CM without influencing its dc 6.3. Inductive series-peaking technique
characteristics.
In fully monolithic integrated circuits utilization of passive re- Fig. 12(d) shows a technique used to increase the bandwidth of
sistors is not preferred, as they are either made of poly-silicon or a CM using inductor [58,59]. A compensating inductor is added
by diffusion process and require large chip area and have large between gate terminals of the MOSFETs forming primary CM pair.
tolerances. A technique to replace these passive resistors with The transfer function of simple CM with inductive compensation is
active components was suggested by Voo and Toumazou [55] and given as [58]:
is shown in Fig. 12(c). Here R is replaced by MOSFET M3 whose iOUT (s ) g m2 / g m1
= 3
channel resistance must be equal to 1/gm1 for optimal bandwidth. iIN (s ) s LCgs1Cgs2/gm1 + s2LCgs2 + s ( Cgs1 + Cgs2 )/gm1 + 1 (16)
To achieve this, gate voltage of M3 is controlled by voltage Vtu
produced by MOSFETs M4, M5 and M8. In the circuit, M3 operates The inductor appears in series with Cgs of the MOSFETs and
leads to peaking in frequency response of the circuit, hence known
in triode region while M4, M5 and M8 operate in saturation region.
as inductive series-peaking technique. The inductor introduced
The channel resistance of M3 is given as:
does not affect the dc characteristics of the CM. New location of
1 poles in the modified CM depends on the value of inductor used.
r03 =
μCox (W /L )3 ( vGS 3 − VT ) (14) Maximum bandwidth with minimal ringing in time domain can be
achieved through this technique by properly sizing the peaking-
Equal aspect ratios and biasing currents of M1 and M4 leads to inductor, based on the criterion of critical damping. If Cgs2»Cgs1 and
equal voltages at nodes 1 and 2, this ensures vGS3 ¼vGS5. Hence, L¼ Cgs2/(4gm12), bandwidth approximately twice that of simple CM
channel resistance of M3 can be maintained equal to 1/gm1, by can be achieved with almost no ringing [58]. However, this tech-
tuning Itu and controlling vGS5 and thereby vGS3. Though, this nique suffers from inherent problems of on-chip inductor
technique replaces passive resistors with MOSFETs, it consumes fabrication.
more power.
6.4. Simulation results of techniques to improve bandwidth of a CM
6.2. Capacitive compensation technique The comparative results obtained at the time of simulation for
various techniques suggested for improvement in bandwidth of a
The circuit of low voltage CM with capacitive compensation CM discussed above are shown in Table 5. These results show that
technique is shown in Fig. 11(d) [56,57]. Here, an external capa- bandwidth of a CM can be improved significantly by using re-
citance Cex is added between the gate and source terminals of level sistive compensation technique and inductive-series peaking
shifting MOSFET M4. The total input capacitance of this circuit is technique, without altering dc characteristics of the CM. However,
given as [56]: inductive compensation technique has inherent disadvantage of
complexity involved in implementation of on-chip inductor. Al-
Cin = Cgd4 + Cgs1 + Cgd1 −
( Cgs4 + Cgd1 + Cex ) though, capacitive compensation technique helps in increasing the
r04 gm4 (15) bandwidth but its application is restricted to limited CMs.
Table 5
Comparative results of different techniques to improve bandwidth of a CM.
Mirroring accuracya Very poor Very poor Very poor Very good Very good Very good Very good
% Error ratio (PER)b 0.5–0.95 0.5–0.95 0.5–0.95 0.5–1 0.5–1 0.05–0.4 0.05–0.4
Vin,dropa (V) 0.1–0.4 0.1–0.4 0.1–0.4 0.1–0.7 0.1–0.7 0.2–0.4 0.2–0.4
Vout,mina (V) 4.5 k 4.5 k 4.5 k 6k 6k 2k 4k
Input resistanceb 200 k 200 k 200 k 3M 3M 350 k 5M
(Ω)
Output resistanceb 33.12 m 33.178 m 33.18 m 30.48 m 30.48 m 30.06 m 30.06 m
(Ω)
Bandwidthb (Hz) 1.46 G 2.69 G (R ¼5 kΩ) 3.48 G (L ¼ 350 nH) 858.07 M 1.15 G (R¼ 10 kΩ) 15.85 M 292.98 M
(C ¼0.1 mF)
Peaking in fre- Nil Nil Very little Nil Nil Nil Nil
quency responseb
a
For input current range 0–500 mA.
b
At input current¼ 0 mA.
146 B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155
iIN
iOUT
iIN iOUT
iIN VB=1.5V
iOUT
M4 M3 VDD =1V VDD=1V
5 5 M1 M2
M2 0.25 VB=1V 0.25
M1 VX VY
5 5
5 5 M1 M2 0.25 0.25
0.25 0.25
5 5
0.25 VB=0.75V 0.25
VDD
IDSS=10u IDSS=10u
iIN iOUT
M4 M3
5 5
0.25 0.25
M1 M2
5
5
0.25
0.25
Fig. 13. Low voltage CMs (a–d). (a) FGMOS transistors based simple CM [20]. (b) FGMOS transistors based cascode CM [21]. (c) Bulk-driven simple CM [22]. (d) Bulk-driven
cascode CM [23].
has to be reduced or threshold voltage drop has to be isolated from removal of this trapped charge in FGMOS transistor is possible by
signal path. Various techniques have been developed for operating using the methods suggested in [64,65]. As compared to a con-
CM with low supply voltage. A few important techniques are listed ventional MOSFET, FGMOS transistor has smaller transconduc-
in Section 7.1 and their simulation results are discussed in Section tance, larger output conductance and poor bandwidth due to
7.6. presence of parasitic capacitors [66,67]. Furthermore, the fabrica-
tion process of these CMs is more complex and occupies more
7.1. FGMOS transistors based simple CM silicon area due to requirement of multiple polysilicon layers
[20,21,67]. It has also been observed that in low nanometer
Floating Gate MOS (FGMOS) transistor has multiple control technologies floating gate approach is not so good due to gate
gates which are capacitively coupled to the floating gate [20]. The leakage.
gate terminals at which signal and biasing voltages are applied are
denoted as signal gate and bias gate respectively. In FGMOS tran- 7.2. FGMOS transistors based cascode CM
sistors, effective threshold voltage seen through the signal gate can
be adjusted or even practically be canceled by varying the dc A low voltage cascode CM based on FGMOS transistors is
voltage applied at the bias gate [20,60–63]. Thus, supply voltage shown in Fig. 13(b) [21]. Here, transistors M1–M4 are two-input
requirement of a circuit can be reduced by replacing MOSFETs floating-gate transistors. In these transistors, biasing voltage VB is
with FGMOS transistors having lower effective threshold voltage. used to form the conduction channel. In this circuit, similar to a
Fig. 13(a) shows a low-voltage simple CM implemented using two- conventional cascode CM, vDS2 is equal to vDS1, if (W/L)2/(W/L)1 ¼
input FGMOS transistors [20]. In the circuit, one of the input (W/L)3/(W/L)4. This ensures that the output current is equal to
terminals of each FGMOS transistor is connected to a dc bias vol- input current, if all FGMOS transistors are maintained in saturation
tage (VB), while the other terminal is used as a conventional input region. This CM operates at a much lower voltage in comparison to
terminal. Supply voltage requirement of both input and output a conventional cascode CM. However, it faces the problems dis-
sides become independent of threshold voltage as it is almost cussed in previous sub-section.
removed from the signal path and can be reduced to the level
required for signal variations only [20]. 7.3. Bulk-driven CM
FGMOS transistor based CMs face the problem of charge being
accumulated on the floating gate, at the time of fabrication process The circuit of a simple bulk-driven CM is shown in Fig. 13(c)
which reduces the controllability of threshold voltage. However, [22]. A bulk-driven CM utilizes a bulk-drain connection instead of
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 147
drain–gate connection used in a simple CM. Here, an input signal is 7.5. Multi-threshold CMs
applied at the bulk-terminals instead of gate-terminals. This fea-
ture removes the requirement of threshold voltage from signal In literature the possibility of multi-threshold (multi-VT) tran-
path and thereby reduces the required supply voltage. An inver- sistors have also been explored to reduce the required supply
sion layer is formed in MOSFETs M1 and M2 by connecting their voltage of various CMs [68,69]. In Fig. 10(b), if M5 have lower
gate terminals with a positive supply voltage (VDD), greater than or threshold voltage as compared to M1 and M2 the supply voltage
requirement of overall circuit can be correspondingly reduced.
equal to |VT|. In the circuit, negligible values of bulk currents have
This occurs as in this circuit for all MOSFETs to operate in sa-
to be ensured and hence source–bulk junctions can only be slightly
turation region following condition must be satisfied:
forward biased. This leads to triode mode operation of M1. How-
ever, M2 is free to operate in saturation region and the expression VDD > VT 5 + VOV 5 + VDSsat1 + ΔVB (19)
for output current in relation to input current can be found as [22]: where VOV5 is overdrive voltage of M5 and ΔVB is difference of
β ⎛ i2 i v2 ⎞
voltage appearing at gate terminal of M3 as compared to VDD. In
iD2 = iOUT = 2 ⎜⎜ 2 IN2 + IN + DS1 ⎟⎟ ( 1 + λvDS2 ) case the biasing voltage at gate terminal of M5 is realized by a
2 ⎝ β1 vDS1 β1 4 ⎠ (17) transistor bias circuit, then ΔVB has to be greater than VDSsat [69].
Eq. (17) shows that if aspect ratios of M1 and M2 are chosen to In similar fashion multi-VT approach can be used in different
ways in various CMs to reduce their supply voltage requirement. In
be equal, then iOUT≠iIN. Hence, better current matching can be
Fig. 10(b), supply voltage requirement can be reduced by using M1
obtained by careful selection of unequal aspect ratios of the two
of higher VT as compared to M2 [70]. Moreover, supply voltage
MOSFETs. Input and output resistances of the bulk-driven CM are
requirement of simple CM (shown in Fig. 1(a)) can also be reduced
given as [22]: by taking M1 of higher VT than M2 [70]. Though, in these cases the
1 ⎛⎜ 2 2ϕF − vBS ⎞ reduction in power supply is obtained with slight compromise in
1 ⎟⎟; 1
rin = = rout = current mirroring accuracy. Multi-VT approach reduces the supply
gmb gm ⎜⎝ γ ⎠ λiD, sat . (18) voltage requirement, however, at the cost of increase in fabrication
area and leakage current. Hence, this technique is more commonly
Eq. (18) shows that input resistance of bulk-driven CM is
used in digital circuits based on 65 nm or lower nanometer
greater than simple gate-driven CM, while its output resistance is
technologies.
comparatively lower. However, for the entire input current range
its corresponding input compliance voltage is very low as com- 7.6. Simulation results of low voltage CMs
pared to a gate-driven CM.
Table 6 shows the comparative simulation results of the CM
topologies discussed in Section 7.1. This comparison reveals that
7.4. Bulk-driven cascode CM
improvement achieved in input and output compliance voltages is
more in case of bulk-driven CMs, though at the cost of reduction in
The circuit of low voltage bulk-driven cascode CM is shown in
accuracy and increase in power consumption.
Fig. 13(d) [21,23]. This configuration significantly improves the
current mirroring accuracy as compared to a simple bulk-driven
CM, as both the MOSFETs forming primary CM pair (M1 and M2) 8. High-performance current mirrors reported in literature
operate in triode region. Furthermore, cascoding of the devices
increase output resistance of the CM to much higher values in Various architectures using the techniques discussed above
comparison to a simple bulk-driven CM. In this circuit, a lower have been proposed in literature to obtain very high performance
value of input voltage is required for a given drain current. How- low voltage CMs. Some of these important architectures are listed
ever, bandwidth of bulk-driven cascode CM is smaller than a gate- in Section 8.1 and their simulation results are discussed in Section
driven cascode CM due to its comparatively large input capaci- 8.9.
tance. Thus, bulk-driven cascode CM can be operated at a lower
8.1. Active-input regulated cascode CM [13]
supply voltage compared to a gate-driven CM with some com-
promise in other performance parameters.
The circuit of an active-input regulated cascode CM is shown in
Fig. 14(a) [13]. The circuit combines input stage of active CM
Table 6
Comparative results of CM topologies for low voltage operation. (Fig. 10(a)) with active-feedback cascode output stage (Fig. 11(a)).
In this circuit, amplifiers A1 and A2 improve input and output
FGMOS FGMOS cas- Bulk-driven Bulk-driven resistances by a factor of Av1 and Av2 respectively (here Avi is the
simple CM code CM simple CM cascode CM voltage gain of amplifier Ai). These amplifiers also improve the
Mirroring Poor Excellent No matching Very poor
accuracy of CM significantly. Here, since vDS1 and vDS2 are fixed to
accuracya a constant value (VD), the circuit can be operated even when the
% Error ratio 53.3 0.84 – – MOSFETs are in triode region. However, accuracy of the CM gets
(PER)b reduced when the output voltage approaches VD. As this config-
Vin,dropa (V) 0.5–1.5 0.2–1.8 0–0.25 0–0.22
uration uses two amplifiers to compare voltage at input and out-
Vout,mina (V) 0.2–0.45 0.2–0.45 0.2–0.3 0.6–0.8
Input resistanceb 9k 13 M 350 350 put nodes, more power is consumed and it requires larger chip
(Ω) area. Moreover, to certain extent the accuracy of CM depends on
Output resistanceb 200 k 28 k 15 k 30 k the gain of these amplifiers.
(Ω)
Power consumedb 33.18 m 25.165 m 411.71 m 1.3 m 8.2. Wide swing triode-region cascode CM [41]
(W)
a
For input current range 0–500 mA. The structure of wide swing triode region cascode CM is shown
b
At input current¼ 10 mA. in Fig. 14(b) [41]. This circuit operates at low supply voltage as M1
148 B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155
Fig. 14. High-performance CMs reported in literature (a–k). (a) Active input regulated cascode CM [13]. (b) Wide swing triode region cascode CM [41]. (c) Regulated body-
driven CM [71]. (d) Regulated body-driven CM with possible implementation of amplifier A [71]. (e) FGMOS transistors based wide range CM [72]. (f) CMOS implementation
of FGMOS transistors based wide range CM [72]. (g) Schematic of low voltage high performance Ramirez et al. CM along with implementation of its differential amplifier [73].
(h) Schematic of high performance compact all cascode CM [75–77]. (i) Resistively compensated SBCCM with high output resistance [2]. (j) High-performance self-biased
cascode CM with active resistances [2]. (k) High output resistance low power accurate CM [78].
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 149
and M2 operate in triode region due to level shifter MOSFETs Mb1 increase in input current (iIN). The circuit where iIN is fed back to
and Mb2 respectively. Here, negative feedback provided by Mb1 produce a voltage proportional to iIN is shown in Fig. 14(e) [72]. In
and Mb2 along with biasing current sources IB1 and IB2 ensures this circuit, MOSFETs M4 and M5 behave as a CM pair and provide
equal drain voltages of MOSFETs M1 and M2. This architecture feedback through resistor R to produce a voltage proportional to iIN
offers output resistance equivalent to a conventional cascode CM which is applied at biasing gate terminal X. Any change in iIN leads
as M3 is connected in cascode configuration with M2 and is ap- to a proportionate change in VB, thereby lowering the compliance
proximately given as: voltage at higher values of iIN. Fig. 14(f) shows the CMOS im-
βMb plementation of the circuit, where resistor R is replaced by a diode
rout ≈ g r03 r0Mb connected MOSFET (M6) [72]. In this circuit to ensure proper
βMb + β2 m3 (20)
biasing of FGMOS transistors even at low input currents, a biasing
This CM has a good symmetry and does not contain any offset current source (IB) is used to maintain a constant current flow
term in the output current as compared to triode region simple through M6. Furthermore, MOSFET M7 is used in cascode config-
CM (Fig. 9(j)). However, it can be observed from the circuit that: uration with M2 in order to increase output resistance of the CM
and MOSFETs M8 and M9 are used for proper biasing of the circuit.
vY = vGS2 and vX = vDS2 + vGS 3 (21)
Although FGMOS transistors based CMs have a lower supply vol-
Hence, voltage at node X is always greater than voltage at node tage requirement, they suffer from the problems of fabrication
Y. This leads to slight mismatch in vDS1 and vDS2 which lowers the complexity, charge trapping and poor bandwidth as discussed in
accuracy of the CM in comparison to that of a conventional cas- Section 7.1.
code CM.
8.5. Low supply voltage high-performance CM with low input and
8.3. Regulated body-driven (bulk-driven) CMOS CM [71] output voltage requirements [73]
A bulk-driven cascode CM (Fig. 13(d)) has better accuracy than The schematic of high performance CM proposed by Ramirez-
a bulk-driven simple CM (Fig. 13(c)). However, its accuracy is not Angulo et al. having low input and output voltage requirements is
good due to mismatch in vDS1 and vDS2 and its operative current shown in Fig. 14(g) [73,74]. MOSFET M3 along with current source
range is very restricted. The schematic of regulated body-driven IB and constant voltage source VC forms a negative shunt feedback
CM that overcomes these disadvantages is shown in Fig. 14(c) [71]. loop on input side, which significantly lowers the input resistance.
In this circuit, an amplifier A is used with MOSFET M3 to maintain Very high output resistance is achieved in the circuit by combining
equal drain voltages of MOSFETs forming primary CM pair (M1 and a regulated cascode output stage formed by differential amplifier
M2). Since, M1 and M2 are matched and have equal vSB, vSG and vSD Ad and cascoding MOSFET M4. Moreover, amplifier Ad helps the CM
, the CM has high accuracy. The gate terminals of these MOSFETs to operate with high degree of accuracy over a wide dynamic
are connected to negative supply voltage (VSS) in order to max- range. Low voltage implementation of differential amplifier Ad is
imize the operating current swing. Negative feedback provided by also shown in Fig. 14(g). In this circuit, a dc-level shifter (M7) is
the cascode configuration of M3 and amplifier A increases the required only for the technologies in which the threshold voltage
output resistance of CM considerably and is given as: of NMOS is higher than that of PMOS. Input and output resistances
rout ≈ Av gm3 r03 r02 of the circuit are respectively given as:
(22)
rin ≈ 1/gm1gm3 r03; rout ≈ r02 gm4 r04 Avd (24)
Eq. (22) shows that output resistance of body-driven regulated
CM can be made larger than a conventional cascode CM irre- Above expression for rout is valid if all the MOSFETs operate in
spective of triode mode operation of MOSFETs M1 and M2, by al- saturation region and can provide a value in GΩ range. The circuit
lowing larger values of Av. Implementation of feedback amplifier A has an added advantage that even when output MOSFETs go out of
is shown in Fig. 14(d). Here, the desired value of biasing current IB, saturation region and operate in triode mode, the CM remains
is achieved with the help of biasing voltage VB. Voltage drops functional with a comparatively higher output resistance. How-
across input and output terminals of the CM are given as: ever, this circuit consumes more power as compared to conven-
IB + iIN tional cascode and high-swing cascode CMs.
vIN ≈ and vOUT ≈ vIN + vSD, sat 3
β ( VDD − VSS − VT ) (23)
8.6. Low voltage high performance compact all cascode CMOS CM
Eq. (23) depicts that when iIN ¼ 0, vIN,min is few mV only. This [75–77]
leads to very low values of input and output compliance voltages.
In the circuit, feedback provided by amplifier A and MOSFET M3 A very high performance compact CM with very low input re-
improves accuracy of the CM, but it is not as good as conventional sistance, very high output resistance, high mirroring accuracy, low
cascode CM. The variation in output current leads to mismatch in input-output voltage requirements and high bandwidth was re-
drain currents of M6 and M7 due to channel length modulation ported by Ramirez-Angulo et al. [75]. The conceptual schematic of
effect. This mismatch further causes a difference in drain–source the circuit is shown in Fig. 14(h). It uses a double nested shunt
voltage of M1 and M2, reducing the accuracy of CM. Furthermore, feedback loop at input side to lower input resistance to extremely
the minimum supply voltage required by this circuit is largely low values. This double nested shunt feedback loop is im-
determined by the gate-driven MOSFETs M3–M7. plemented by the amplifier A1 and FVF formed by MOSFETs M1
and M1C and biasing current source IB. Furthermore, the CM uti-
8.4. FGMOS transistors based wide range CM [72] lizes a cascode configuration along with an amplifier A2 connected
in series feedback at output side. The cascode amplifier A2 im-
FGMOS transistors based simple CM (Fig. 13(a)) has a lower proves output resistance of the CM by a factor of Av2 and enhances
compliance voltage at lower currents, but with increase in input its current matching accuracy to a large extent as vDS1 ¼vDS2. Input
current required compliance voltage also increases, rendering it and output resistances of the circuit are respectively given as:
unusable at low supply voltage. However, this limitation can be
rin ≈ 1/gm1gm1C r01C Av1rout ≈ Av2 r02 gm2C r02C (25)
reduced, by proportionately increasing the value of VB with
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 151
Three different techniques have been suggested for im- The circuit has been made compatible with fully monolithic
plementation of auxiliary amplifiers A1 and A2. In first technique integrated circuit design, by replacing passive resistors by active
reported in [75] amplifiers A1 and A2 were implemented by resistors, as shown in Fig. 14(j). In this modified circuit, for opti-
common source PMOS amplifier with gain approximately equal to mum bandwidth, channel resistance of M7 (operating in triode
gmr0. However, this implementation required that threshold vol- region) needs to track 1/gm1. The desired resistances are achieved
tage of PMOS must be greater than that of NMOS, which is not by adjusting the aspect ratios of M7 and M10. This low voltage CM
always possible. In second technique suggested in [76], folded has wider bandwidth, very high output resistance and good cur-
cascode amplifiers with gain (gmr0)2 were used. This im- rent mirroring accuracy. However, it offers higher input resistance
plementation provided significant improvements in input and due to presence of resistor (R) or MOS diode (M10) at input side.
output resistances and all the MOSFETs remained in saturation
mode irrespective of the fabrication technology used. Third tech- 8.8. An ultra-high compliance, high output resistance low power
nique reported in [77], used cascode amplifiers based on NMOS accurate CM [78]
transistors to achieve similar input and output resistances as
achieved in [76], with better performance. However, this im- An accurate low power CM with high output resistance sug-
plementation requires higher supply voltage. gested by Azhari et al. [78] is shown in Fig. 14(k). This structure
lowers input compliance voltage and input resistance of the CM to
a great extent due to negative shunt feedback provided by FVF
8.7. A very high performance self-biased cascode current mirror [2] configuration, formed by MOSFETs M1, M3 and current source IB1
and positive series type feedback provided by MOSFETs M1–M4.
A very high performance self-biased cascode CM shown in This CM offers very high output resistance due to negative series
Fig. 14(i) was reported by Maneesha et al. [2]. It combines wide feedback formed by MOSFETs M4 and M5 in combination with
swing characteristic of self-biased cascode CM (Fig. 9(d)) and MOSFETs MA and MAC acting as an amplifier. Moreover, MOSFETs
bandwidth enhancement characteristic of resistive compensation M1–M4 provide positive shunt feedback at output side, which
technique (Fig. 12(a)). As discussed in Section 6.1, the proper further enhances its output resistance. The circuit is designed in
choice of compensating resistor R1 cancels the dominant pole such a way that even if M5 leaves saturation region and enter into
appearing in frequency response by the zero introduced, thereby triode region, input current is copied at the output node accu-
improving bandwidth of the circuit. Modified transfer function of rately, as positive feedback compensates the effect by increasing
the circuit is given as: vG2. This characteristic of the CM helps in reducing the required
iout (s ) − g m2 g m3 compliance voltage at the output node. Here, negative feedback
= dominates when M5 operates in saturation mode and positive
iin (s )
(
C2 C3 s2 + s ( gm2 C3 +gm3 C2 +gm1C3
C2 C3 )+ gm3 gm1
C2 C3 ) (26) feedback dominates when M5 is in triode region.
In this circuit, to achieve positive value of output resistance,
From Eq. (26), bandwidth of the circuit is obtained as: MOSFETs M1 and M2 must operate in triode region and to obtain
g m1 g m3 positive value of input resistance, gain of the amplifier (formed by
ω0 = MOSFETs MA and MAC) should be very high. However, the circuit
C2 C3 (27)
becomes unstable under certain conditions due to positive feed-
Comparison of Eq. (27) with the bandwidth of high-swing back loops both at input and output sides.
cascode CM (Fig. 9(a)), shows that this technique improves the
bandwidth by a factor of √2. 8.9. Simulation results of high performance CMs discussed in Section
In this CM, super-cascode configuration implemented at the 8.1
output terminal, (suggested in [53]) offers output resistance the-
oretically in GΩ range and is given as: Eldo Spice simulation results of these high performance CMs
have been discussed here. For simulation of these circuits, para-
rout ≈ gm6 r06 gm5 r05 gm3 r03 r02 (28) meters such as transistor sizes and bias current values have been
Table 7
Comparative results of different high performance CM topologies.
Active input Wide swing Regulated FGMOS High performance High performance Self-biased High output re-
regulated cas- triode region bulk-driven based wide Ramirez et al. CM compact all cascode cascode CM sistance Azhari
code CM cascode CM CM range CM CM et al. CM
Mirroring accuracya Poor Excellent Very good Very good Excellent (with off- Excellent (with off- Very good Very good till
set term) set term) 100 mA
% Error ratio (PER)b 18.46 0.71 10 3.05 0.18 0.0036 3.4 5.48
Vin,dropa (V) 1.5 (for VD 0.05–0.475 0–0.55 0.2–0.525 0.314–0.328 0.53 1–1.7 0.03–0.141
¼ 1.5 V)
Vout,mina (V) 0.5–0.9 0.1–0.5 0.1–0.6 0.1–0.3 0.3–0.5 0.6–0.65 0.2–0.6 0.1–0.12
Input resistanceb (Ω) 400 2k 850 8.5 k 100 10 5k 50
Output resistanceb 30 M 17 M 4M 30 M 700 M 3.5 G 9G 1G
(Ω)
Bandwidthb (Hz) 1.3 G 991.97 M 83.24 M 7.087 M 1.23 G 1.06 G 2.25 G 54 M
Peaking in fre- 8.9 0.34 Nil Nil 10 Nil 7.76 Nil
b
quency response
(dB)
Power consumedb 51.08 m 30.38 m 58.95 m 40.39 m 39.22 m 51.36 m 58.14 m 32.14 m
(W)
a
For input current range 0–500 mA.
b
At input current¼ 10 mA.
152 B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155
Fig. 15. Current transfer characteristics for various high performance CMs dis-
cussed in Section 8.
Fig. 20. Frequency response at iIN ¼ 10 mA, of various high performance CMs dis-
cussed in Section 8.
Fig. 16. PER in current mirroring accuracy for various high performance CMs dis-
cussed in Section 8.
Fig. 21. Input referred noise as a function of frequency for various high perfor-
mance CMs discussed in Section 8.
Fig. 17. Input current vs. input voltage characteristics for various high performance
CMs discussed in Section 8.
Fig. 22. Curves showing variation in output current for temperature change from
25 °C to þ75 °C for various high performance CMs discussed in Section 8.
[12] F. You, S.H.K. Embabi, J.F.D. Carrillo, E.S. Sinencio, An improved current source [45] J. Ramirez-Angulo, R.G. Carvajal, A. Torralba, J. Galan, A.P. Vega-Leal, J. Tombs,
for low voltage applications, in: Proceedings of IEEE conference of Custom The flipped voltage follower: a useful cell for low-voltage low-power circuit
Integrated Circuits, 1996, pp. 97–100. design, in: Proceedings of IEEE International Symposium on Circuits and
[13] T. Serrano, B.L. Barranco, The active-input regulated-cascode current mirror, Systems, 2002, 3, pp. 615–618.
IEEE Trans. Circuits Syst. I: Fundam. Theory Appl. 41 (1994) 464–467. [46] H.F. Baghtash, S.J. Azhari, Very low input impedance low power current mir-
[14] T.L. Brooks, M.A. Rybicki, Self-biased Cascode Current Mirror Having High ror, Analog. Integr. Circuits Signal Process. 66 (2011) 9–18.
Voltage Swing And Low Power Consumption, U.S. patent no. 5359296, 25 [47] H.C. Yang, D.J. Allstot, An active-feedback cascode current source, IEEE Trans.
October 1994. Circuits Syst. 37 (1990) 644–646.
[15] T. Voo, C. Toumazou, High-speed current mirror resistive compensation [48] E. Sackinger, W. Guggenbuhl, A versatile building block: the CMOS differential
technique, Electron. Lett. 31 (1995) 248–250. difference amplifier, IEEE J. Solid-State Circuits 22 (1987) 287–294.
[16] J. Ramirez-Angulo, Current mirrors with low input and low output voltage [49] E. Sackinger, W. Guggenbuhl, A high-swing, high-impedance MOS cascode
requirements, in: Proceedings of the 37th Midwest Symposium on Circuits circuit, IEEE J. Solid-State Circuits 25 (1990) 289–298.
and Systems, 1994, 1, pp. 107–110. [50] C.G. Montoro, M.C. Schneider, I.J.B. Loss, Series-parallel association of FET's for
[17] J. Mulder, A.C. Van-Ver-Woerd, W.A. Serdijn, A.H.M. Van Roermund, High- high gain and high frequency applications, IEEE J. Solid-State Circuits 29 (9)
swing cascode MOS current mirror, Electron. Lett. 32 (1996) 1251–1252. (1994) 1094–1101.
[18] B. Razavi, Design of Analog CMOS Integrated Circuits, Tata McGraw-Hill, New [51] S.S. Rajput, S.S. Jamuar, Ultra low voltage current mirror op-amp and its ap-
Delhi (India) 2002, pp. 135–145. plications, in: Proceedings of Asia-Pacific Conference on Circuits and Systems,
[19] R.C. Jaeger, T.N. Blalock, Microelectronic Circuit Design, McGraw-Hill, New 2002, 1, 145–148.
York 2011, pp. 968–1018. [52] M.T. Sanz, S. Celma, B. Calvo, D. Flandre, Self-cascode SOI versus graded-
[20] J. Ramirez-Angulo, S.C. Choi, G. Gonzalez-Altamirano, Low-voltage circuits channel SOI MOS transistors, IEE Proc. Circuits Devices Syst. 153 (5) (2006)
building blocks using multiple-input floating-gate transistors, IEEE Trans. 461–465.
Circuits Syst. I: Fundam. Theory Appl. 42 (1995) 971–974. [53] A. Torralba, R.G. Carvajal, J. Ramirez-Angulo, E. Munoz, Output stage for low
[21] B. Aggarwal, M. Gupta, Low-voltage cascode current mirror based on bulk- supply voltage, high-performance CMOS current mirrors, Electron. Lett. 38
driven MOSFET and FGMOS techniques, in: Proceedings of IEEE International (2002) 1528–1529.
Conference on Advances in Recent Technologies in Communication and [54] A. Torralba, R.G. Carvajal, F. Munoz, J. Ramirez-Angulo, New output stage for
Computing, Kottayam, 2009, pp. 473–477. low supply voltage, high-performance CMOS current mirrors, in: Proceedings
[22] B.J. Blalock, P.E. Allen, A low-voltage bulk-driven MOSFET current mirror for of International Symposium on Circuits and Systems, 2003, 1, I-269–I-272.
CMOS technology, in: Proceedings of IEEE International Symposium on Cir- [55] T. Voo, C. Toumazou, Precision temperature stabilized tunable CMOS current-
cuits and Systems, 1995, pp. 1972–1975. mirror for filter applications, Electron. Lett. 32 (1996) 105–106.
[23] B.J. Blalock, P.E. Allen, G.A. Rincon-Mora, Designing 1-V op-amps using stan- [56] S.S. Rajput, S.S. Jamuar, Low voltage, low power, high performance current
dard digital CMOS technology, IEEE Trans. Circuits Syst. II: Analog Digit. Signal mirror for portable analogue and mixed mode applications, IEE Proc. Circuits
Process. 45 (1998) 769–780. Devices Syst. 148 (2001) 273–278.
[24] J.M. Cartwright, Current Mirror Amplifiers with Programmable Current Gains, [57] S.S. Rajput, S.S. Jamuar, A high performance current mirror for low voltage
U.S. patent no. 4064506, 20 December 1977. designs, in: Proceedings of IEEE Asia-Pacific Conference on Circuits and Sys-
[25] K. Bacrania, Programmable Current Mirror, U.S. patent no. 4608530, 26 August tems, 2000, pp. 170–173.
1986. [58] B. Sun, F. Yuan, A new inductor series-peaking technique for bandwidth en-
[26] E.A.M. Klumperink, E. Seevinck, MOS current gain cells with electronically hancement of cmos current-mode circuits, Analog Integr. Circuits Signal Pro-
variable gain and constant bandwidth, IEEE J. Solid-State Circuits 24 (5) (1989) cess. 37 (2003) 259–264.
1465–1468. [59] B. Sun, F. Yuan, A new inductor series-peaking technique for bandwidth en-
[27] A.K. Gupta, J.W. Haslett, F.N. Trofimenkoff, A wide dynamic range continuously hancement of CMOS current-mode circuits, in: Proceedings of IEEE Canadian
adjustable CMOS current mirror, IEEE J. Solid-State Circuits 31 (8) (1996) Conference on Electrical and Computer Engineering, 2003, 1, pp. 215–218.
1208–1213. [60] T. Inoue, H. Nakane, Y. Fukuju, E.S. Sinencio, A design of a low-voltage current-
[28] J. Ramirez-Angulo, S.R.S. Garimella, A.J. Lopez-Martin, R.G. Carvajal, Gain mode fully-differential analog CMOS integrator using FG-MOSFETs and its
programmable current mirrors based on current steering, Electron. Lett. 42 implementation, Analog Integr. Circuits Signal Process. 32 (3) (2002) 249–256.
(10) (2006) 559–560. [61] T. Shibata, T. Ohmi, Intelligent MOS transistor featuring gate level weighted
[29] A. Zeki, A. Toker, Tunable linear CMOS current mirror, Analog Integr. Circuits sum and threshold operations, in: Proceedings of IEEE International Con-
Signal Process. 50 (3) (2007) 261–269. ference on Electron Devices Meeting, Washington, DC, USA, 1991, pp. 919–922.
[30] C. Laoudias, C. Psychalinos, Low-voltage CMOS adjustable current mirror, [62] T. Shibata, T. Ohmi, A functional MOS transistor featuring gate-level weighted
Electron. Lett. 46 (2) (2010) 124–126. sum and threshold operations, IEEE Trans. Electron Devices 39 (6) (1992)
[31] G.R. Wilson, A monolithic junction FET-n-p-n operational amplifier, IEEE J. 1444–1455.
Solid-State Circuits 3 (1968) 341–348. [63] M. Gupta, R. Pandey, Low-voltage FGMOS based analog building blocks, Mi-
[32] B.A. Minch, Low-voltage Wilson current mirrors in CMOS, in: Proceedings of croelectron. J. 42 (2011) 903–912.
IEEE International Symposium on Circuits and Systems (ISCAS), New Orleans, [64] P. Hasler, B.A. Minch, C. Diorio, An autozeroing floating-gate amplifier, IEEE
Los Angeles, 2007, pp. 2220–2223. Trans. Circuits Syst. II: Analog Digit. Signal Process. 48 (1) (2001) 74–82.
[33] K. Schlotzhauer, T.R. Viswanathian, Improved integrated unity-gain current [65] E.O. Rodriguez-Villegas, A. Yufera, A. Rueda, A charge correction cell for
controlled sources, Int. J. Electron. 37 (1974) 27–31. FGMOS-based circuits, in: Proceedings of IEEE 16th Symposium on Integrated
[34] B.L. Hart, R.W.J. Barker, D.C. matching errors in the Wilson current source, Circuits and Systems Design, 2003, pp. 191–195.
Electron. Lett. 12 (1976) 389–390. [66] J. Ramirez-Angulo, C.A. Urquidi, R. Gonzalez-Carvajal, A. Torralba, A. Lopez-
[35] A. Emira, S. Sanchez-Sinencio, M. Schneider, Design tradeoffs of CMOS current Martin, A new family of very low-voltage analog circuits based on quasi-
mirrors using one-equation for all-region model, in: Proceedings of IEEE In- floating-gate transistors, IEEE Trans. Circuits Syst. II: Analog Digit. Signal
ternational Symposium on Circuits and Systems (ISCAS), 2002, 5, V-45–V-48. Process. 50 (2003) 214–220.
[36] G. Palumbo, Design of the Wilson and improved Wilson MOS current mirrors [67] J. Ramirez-Angulo, R.G. Carvajal, J. Tombs, A. Torralba, Low-voltage CMOS
to reach the best settling time, in: Proceedings of IEEE International Sympo- opamp with rail-to-rail input and output signal swing for continuous-time
sium on Circuits and Systems, 1994, 5, pp. 413–416. signal processing using multiple-input floating-gate transistors, IEEE Trans.
[37] G, Palumbo, On the high-frequency response of CMOS cascode current mirror, Circuits Syst. II: Analog Digit. Signal Process. 48 (2001) 111–116.
in: Proceedings of IEEE Mediterranean Electrotechnical Conference, 1994, 3, [68] V. Kursun, E.G. Friedman, Multi-Voltage CMOS Circuit Design, Wiley, New York
pp. 1211–1214. 2006, pp. 45–95.
[38] E.J. Swanson, Compound Current Mirror, U.S. patent no. 4477782, 16 October [69] J. Sauerbrey, J. Wang, R. Shrivastava, D. Schmitt-Landsieder, A. Bargagli-Stoffi,
1984. A 0.6 V multi-Vt current mirror differential OTA, in: Proceedings of IEEE In-
[39] A. Tauro, M.D. Ciano, C. Marzocca, An improved low voltage CMOS current ternational Symposium on Signals, Circuits and Systems, 2005, pp. 279–282.
source exploiting positive shunt feedback, in: Proceedings of IEEE Interna- [70] L.S. Huang, Multi-Threshold Transistors Cell for Low Voltage Integrated Tem-
tional Conference on Electronics, Circuits and Systems, 2005, pp. 1–4. perature Sensing Application in Digital Deep Submicron Process, Graduate
[40] Y. Cong, R.L. Geiger, Cascode current mirrors with low input, output and Theses and Dissertations, 2011, paper 10253.
supply voltage requirements, in: Proceedings of the 43rd IEEE Midwest [71] X. Zhang, E.I. El-Masry, A regulated body-driven CMOS current mirror for low-
Symposium on Circuits and Systems, 2000, pp. 490–493. voltage applications, IEEE Trans. Circuits Syst. – II 51 (2004) 571–577.
[41] V.I. Prodanov, M.M. Green, CMOS current mirrors with reduced input and [72] S. Sharma, S.S. Rajput, L.K. Magotra, S.S. Jamuar, FGMOS based wide range low
output voltage requirements, Electron. Lett. 32 (1996) 104–105. voltage current mirror and its applications, in: Proceedings of Asia-Pacific
[42] D.G. Nairn, C.A.T. Salama, Current-mode algorithmic analog-to-digital con- Conference on Circuits and Systems, 2002, 2, pp. 331–334.
verter, IEEE J. Solid-State Circuits 25 (1990) 997–1004. [73] J. Ramirez-Angulo, R.G. Carvajal, A. Torralba, Low supply voltage high-perfor-
[43] T. Serrano-Gotarredona, B. Linares-Barranco, A.G. Andreou, Very wide range mance CMOS current mirror with low input and output voltage requirements,
tunable CMOS/bipolar current mirrors with voltage clamped input, IEEE Trans. IEEE Trans. Circuits Syst. II: Express Briefs 51 (2004) 124–129.
Circuits Syst. I: Fundam. Theory Appl. 46 (1999) 1398–1407. [74] J. Ramirez-Angulo, R.G. Carvajal, A. Torralba, Low supply voltage high-perfor-
[44] R.G. Carvajal, J. Ramirez-Angulo, A.J. Lopez-Martin, A. Torralba, J.A.G. Galan, mance CMOS current mirror with low input and output voltage requirements,
A. Carlosena, F.M. Chavero, The flipped voltage follower: a useful cell for low- 43rd IEEE Midwest Symp. Circuits Syst. 1 (2000) 510–513.
voltage low-power circuit design, IEEE Trans. Circuits Syst. – I 52 (2005) [75] J. Ramirez-Angulo, M.S. Sawant, A. Lopez-Martin, R.G. Carvajal, Compact im-
1276–1291. plementation of high-performance CMOS current mirror, Electron. Lett. 41
B. Aggarwal et al. / Microelectronics Journal 53 (2016) 134–155 155