electronics
Article
A Formal Approach to the Extraction of Permittivity and
Permeability of Isotropic and Anisotropic Media Using the
TM11 Mode in Rectangular Waveguides
Waldemar Susek * , Andrzej Dukata
Citation: Susek, W.; Dukata, A.;
Pomarańska, P. A Formal Approach
to the Extraction of Permittivity and
Permeability of Isotropic and
Anisotropic Media Using the TM11
Mode in Rectangular Waveguides.
Electronics 2023, 12, 2899. https://
doi.org/10.3390/electronics12132899
Academic Editors: Erika Ottaviano,
Jose Machado, Katarzyna Antosz,
Dariusz Mazurkiewicz, Yi Ren,
Pierluigi Rea, Rochdi El Abdi,
Marina Ranga, Vijaya Kumar
Manupati and Emilia Villani
Received: 30 May 2023
Revised: 28 June 2023
Accepted: 29 June 2023
Published: 1 July 2023
Copyright: © 2023 by the authors.
Licensee MDPI, Basel, Switzerland.
This article is an open access article
distributed under the terms and
conditions of the Creative Commons
Attribution (CC BY) license (https://
creativecommons.org/licenses/by/
4.0/).
Electronics 2023, 12, 2899. https://doi.org/10.3390/electronics12132899
and Patrycja Pomarańska
Electronic Department, Military University of Technology, 2 Kaliski St., 49, 00-908 Warsaw, Poland;
andrzej.dukata@wat.edu.pl (A.D.); patrycja.pomaranska@wat.edu.pl (P.P.)
* Correspondence: waldemar.susek@wat.edu.pl
Abstract: Based on our previous work on the propagation of electromagnetic waves in a layered
medium placed in a rectangular waveguide, we present the theory of using the TE10 and TM11 modes
to determine the complex parameters of isotropic and anisotropic media. The Nicolson–Ross–Weir
method was used. The cases of isotropic, uniaxial, and biaxial materials were considered. It has been
shown that the TM11 mode can be used to extract parameters of non-magnetic uniaxial anisotropy
media by a single measurement, without changing the sample position. This is not possible with the
previously used TE10 mode. It is also possible to use the TM11 mode to quickly determine whether a
material is isotropic or not. Experimental results are presented for some isotropic materials.
Keywords: Nicolson–Ross–Weir method; uniaxial anisotropy; rectangular waveguide; complex
permittivity; complex permeability
1. Introduction
One of the most important methods for determining the relative permittivity εr and
relative permeability µr of isotropic media is the Nicolson–Ross–Weir (NRW) method.
In 1970, Nicolson and Ross [1] gave the formulas for the retrieval of the electromagnetic
(EM) parameters from measurements of the scattering matrix elements S11 and S21 . The
material under test (MUT) was placed in a coaxial transverse electromagnetic (TEM) waves
transmission line. In 1974, Weir [2] obtained analogous relations for the MUT placed in a
rectangular waveguide. In both works, the field reflection coefficient Γ at the interface, and
the propagation coefficient P, were used. The algebraic inversion procedure used in the
NRW method allows us to obtain εr and µr in terms of S11 and S21 .
The overview of the NRW method and closed-form extraction equations for isotropic
media can be found anywhere (see e.g., [3]). The NRW method is still being used and
improved [4–14], in particular for the determination of the effective parameters of metama-
terials (MM).
The above-mentioned methods use only a TEM mode (coaxial transmission line
systems, and free-space systems), or TE modes (usually TE10 in rectangular waveguide
systems). To the best of our knowledge, TM modes have not been effectively used.
Relatively little work exists that relates to methods of retrieving EM properties of
anisotropic media [15–23]. Isotropy and anisotropy relate to the directional properties of
permittivity and permeability of the media (forming crystallographic systems). Consider
the so-called linear media. Using the Einstein summation convention, the relationship
between the components Di (i = x, y, z) electric flux density, and Ek (k = x, y, z) electric
field vectors is Di = ε0 εik Ek . The tensor εik is the relative permittivity tensor, and ε0 is the
permittivity of vacuum. If the properties of the medium do not depend on the direction
of the vector of the electric field, then such a medium is isotropic. Then, the permittivity
tensor can be always written in diagonal form εik = εr δik , where δik is the Kronecker delta.
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Electronics 2023, 12, 2899 2 of 15

In the general case, the properties of the medium may depend on the direction; then,
such a medium is called anisotropic, and the permittivity tensor has nine components. One
can find eigenvalues and eigenvectors of the coordinate system in which this tensor can be
represented by a diagonal matrix. Normalized eigenvectors are unit vectors defining the
directions of the main axes of the crystallographic system. For three different eigenvalues,
such a medium is called biaxial. When two eigenvalues of the tensor are equal, such a
medium is called uniaxial. Similar considerations can be carried out for the permittivity
tensor µik (see our previous work [24]). If µik = δik , then we say that the medium is non-
magnetic and, in general, we are dealing only with electrical isotropy or anisotropy.
Many of the MMs realized so far are assumed to be biaxially or uniaxially anisotropic.
Some conventional materials, i.e., double-positive MM, are also anisotropic.
Based on [24] on the propagation of electromagnetic waves in a layered medium
placed in a rectangular waveguide, the theory of using TE10 and TM11 modes to determine
the complex parameters of anisotropic and isotropic media is presented. The Nicolson–
Ross–Weir method was used. The main aim of the work is to present the method. The cases
of isotropic, uniaxial, and biaxial materials were considered.
The second section of the paper presents the above-mentioned theoretical basis of
material parameter extraction in terms of the possibility of using the TM11 mode. To
facilitate the use of the formulas for specialists who are closer to the network description,
rather than the field description (see e.g., our work [24]), a graph of the signal flow for TE
and TM waves, and an anisotropic structure placed in a rectangular waveguide were used.
A similar approach was used by Nicolson and Ross [1] for TEM waves in a coaxial line.
Although the results for the anisotropic medium, when the main axes of the crystallographic
system are oriented parallel to the edges of the waveguide, are identical to those of [1] for
the isotropic medium, the physical basis is fundamentally different.
The third section contains a diagram of the proposed measuring system and its prac-
tical implementation. The advantage of this configuration is the constant position of the
sample in the waveguide. At the end of the chapter, the S-parameter measurements for
selected frequencies and the resulting calculations are presented. These results, for isotropic
media with known electromagnetic parameters, confirm the theoretical assumptions pre-
sented in the second section.
The fourth section presents the advantages of the method used, compared to traditional
methods using the TE10 (or TEM) mode.

2. Extraction Procedure
2.1. Description of the Configurations
Consider the anisotropic slab of thickness d placed inside a rectangular waveguide
with the cross-sectional dimensions a and b. The principal axes of the crystallographic
system and the Cartesian system are oriented parallel to the waveguide edges (Figure 1),
and the matrices of relative permeability ε and relative permittivity µ tensors of the medium
are diagonal:
   
εx 0 0 µx 0 0
[ε] =  0 ε y 0  [µ] =  0 µ y 0  (1)
0 0 εz 0 0 µz
Due to the possibility of using TM modes (in particular, the TM11 mode) for the
extraction of material parameters, it is convenient to distinguish two configurations: that
which TM waves can propagate (A), and that for which this does not occur (B).
The first case occurs when the medium is isotropic (εx = εy = εz = εr , µx = µy = µz = µr )
or uniaxially anisotropic with a special configuration of MUT (εx = εy 6= εz , µx = µy 6= µz ),
so-called transversely isotropic. In this case, TM and TE waves can propagate. For an
isotropic sample, two material parameters (εr , µr ) can be obtained, by using either the TE10
or TM11 modes. For the transversely isotropic configuration of MUT, it is possible to extract
all four material parameters (εx = εy , εz , µx = µy , µz ).
Electronics 2023, 12, 2899 3 of 15

Figure 1. A slab of thickness d placed in an air-filled rectangular waveguide with cross-sectional

dimensions a and b.

Configuration B is considered in the remaining cases. These include media with

electrical anisotropy when all parameters εx (µx ), εy (µy ), and εz (µz ) are different. In
this configuration, only the TEm0 or TE0n mode (m, n = 1, 2, . . . ) can be used to extract
parameters, because other TE and TM modes do not propagate [15,24]. The same situ-
ation occurs for materials with uniaxial anisotropy, when εx = εz 6= εy (µx = µz 6= µy ) or
εy = εz 6= εx (µy = µz 6= µx ).
In addition, for configuration A, parameter extraction is possible without changing
the sample position, using a standard rectangular waveguide and two types of coax-to-
waveguide (C-W) adapters (providing excitation of the TE10 or TM11 modes). If the sample
is non-magnetic (i.e., µx = µz = 1) it is sufficient to use the TM11 mode only to determine
the parameters εx and εz . Figure 2 shows some representative examples of non-magnetic
uniaxially anisotropic media. It is worth noticing that in the case of the most general biaxial
anisotropy (configuration B), the extraction of the six material parameters (εx , εy , εz , µx ,
µy , µz ) in the same way is not possible, even when the medium is non-magnetic. Detailed
procedures for extracting material parameters are presented below.

Figure 2. Some examples of uniaxially anisotropic media: (a) a hexagonal crystal, (b) wood, (c) a
layered structure, (d) a honeycomb structure, (e) a woodpile structure.

First, we get Γ and P as a function of S11 and S21 . The Rosetta Stone of understanding
the problem is Figure 3, showing a network model of an air-filled rectangular waveguide
with a MUT placed. Based on this model, a graph of signal flow was plotted. Based on the
graph, the Mason’s rule formulas [25,26], used in the literature on the subject, are presented.
Electronics 2023, 12, 2899 4 of 15

Figure 3. Air-filled waveguide with the dielectric layers.

2.2. Determination of Γ and P as Functions of S11 and S21

The considered structure is shown in Figure 3. It is divided into five parts by four
theoretical surfaces perpendicular to the waveguide’s propagation axis: 1, 10 , 20 , 2.
Air-filled parts of the waveguide have relative permittivity and permeability equal
to 1, whereas layers of dielectric have their own specific values, and a specific complex
propagation constant results from them. Respective impedances Z01 for air-filled, and Z02
for dielectric-filled waveguide can also be determined. The dielectric layer, 10 -20 , has length
d, layers 1-10 and 2-20 have lengths tending to zero, the lengths of the outer layers are out
of consideration. Additionally, incident Cs , ax , and reflected bx (x = {1, 10 , 20 , 2}) complex
normalized wave-voltage amplitudes are marked for each connection surface. Last, there is
no reflection from behind the 2 surface, nor from the 1 surface outside. This structure may
be analyzed using a signal-flow graph approach.
Let us define the reflection coefficients at the interface between the layers as:

Z02 − Z01 Z − Z02

Γ1 = , Γ2 = 01 (2)
Z01 + Z02 Z01 + Z02

and the propagation factor P (transmittance through the dielectric layer) as:

P = exp(−jk z d) = exp[−(α + jβ)d] (3)

where kz = β − jα is the complex wavenumber, and β and α are the phase and attenua-
tions coefficient, respectively. Figure 4 shows a graph of the signal flow adequate to the
analyzed structure.

Figure 4. Signal-flow graphs of the air-filled waveguide with the dielectric layers.
Electronics 2023, 12, 2899 5 of 15

Based on this graph, the Mason rule [25,26] can be used to determine the transmittance
Tax-bx between the ax and bx nodes.
" #
j ( j)
∑ Ti 1 + ∑ (−1) ∑ Lk,i
i j k
T= ( j)
(4)
j
1 + ∑ (−1) ∑ Lk
j k

where
T—source-to-sink transmittance of the graph;
Ti —the ith forward-path transmittance between the initial and out nodes;
Lk (j) —the kth loop transmittance; j—of this kind, occurring in the graph;
Lk,i (j) —the kth loop transmittance not touching the ith path.
The transmittance between nodes a1 and b1 is the scattering matrix coefficient S11

Γ1 1 − P2 Γ22 + P2 Γ2 (1 + Γ1 )(1 + Γ2 )k1 k2

S11 = Ta1 →b1 = (5)
1 − Γ22 P2

where k1 = 1/µz , k2 = µz for TE modes, or k1 = 1/εz , k2 = εz for TM modes; moreover,

Γ1 = − Γ2 .
Taking this into account, and introducing the designation Γ = Γ1 , we get:

(1 − P2 ) Γ
S11 = (6)
1 − Γ2 P2
In the same way, the formula for S21, which is the transmittance between nodes CS
and b2 , can be derived:

(1 + Γ1 )(1 + Γ2 ) Pk1 k2
S21 = TCS →b2 = (7)
1 − Γ22 P2

(1 − Γ2 ) P
S21 = (8)
1 − Γ2 P2
The scattering-matrix elements S11 and S21 are expressed by the electric field reflection
coefficient Γ and the propagation factor P, in the same form as for the isotropic medium.
The system of Equations (6) and (8) will remain unchanged if Γ is mutually replaced with
P, and S21 with S11 . Moreover, the sum and difference of S21 and S11 can be expressed in a
simple form:
P+Γ P−Γ
S21 + S11 = , S21 − S11 = . (9)
1 + ΓP 1 − ΓP
By eliminating P or Γ from the above equations, quadratic equations can be obtained:

Γ2 − 2ΓX1 + 1 = 0 or P2 − 2PX2 + 1 = 0 (10)

where
2 − S2 + 1
S11 S2 − S11
2 +1
21
X1 = , X2 = 21 (11)
2S11 2S21
The solutions to the above equations are:
q q
Γ = X1 + X12 − 1, P = X2 + X22 − 1 (12)

or q q
Γ = X1 − X12 − 1, P = X2 − X22 − 1 (13)
Electronics 2023, 12, 2899 6 of 15

At this point, it is worth noting the ambiguity of the resulting pair of non-trivial
solutions (Γ, P). Firstly, a quadratic equation has two solutions. Secondly, in the domain of
complex numbers, the root in expressions (12) and (13) has two values.
This ambiguity is usually removed by adopting the solution for which |Γ| ≤ 1. It is
true for the passive medium. Once Γ is determined, P is found as (cf. e.g., refs.[3,8]):

(S21 + S11 ) − Γ (S21 − S11 ) + Γ

P= or P = (14)
1 − (S21 + S11 )Γ 1 + (S21 − S11 )Γ

The pairs (Γ, P) can be expressed in terms of the material parameters of the medium,
and have a different form depending on the considered waveguide mode. The method is
based on the use of two pairs of solutions, (ΓTE , PTE ) and (ΓTM , PTM ), determined in terms
S11 and S21 for TE and TM polarization, respectively. This enables their direct application
for the extraction of complex components of permittivity and permeability tensors.
For technical reasons, the frequency f TE(TM) used for the TE10 and TM11 modes may
be different. For instance, k0TE(TM) and λ0TE(TM) are wavenumbers and wavelengths in a
vacuum, respectively.

2π f TE 2π 2π f TM 2π
k0TE = = , k0TM = = (15)
c λ0TE c λ0TM

where c is the velocity of light in a vacuum. Let us introduce the relative sample thickness
dTE(TM) , and the transverse dimensions of the waveguide aTE(TM) and bTE(TM) :

d a b
dTE(TM) = , a = , b = (16)
λ0TE(TM) TE(TM) λ0TE(TM) TE(TM) λ0TE(TM)

Next, let us define the dimensionless relative wavenumbers Kz TE(TM) , and the relative
cut-off wavenumbers KTE(TM)
k zTE(TM)
KzTE(TM) = (17)
k0TE(TM)

k10 1
KTE = = (18)
k0TE 2aTE
s
1 2 1 2
   
k11 1
KTM = = + (19)
k0TM 2 aTM bTM
where k10 and k11 are the cut-off wavenumbers for the TE10 and TM11 modes, respectively.
The propagation factors PTE(TM) can be rewritten as

PTE(TM) = exp(−jdTE(TM) 2πKzTE(TM) ) = PTE(TM) exp(jφTE(TM) ) (20)

where −π < φTE , φTM ≤ π. Then

φTE(TM) ln| PTE(TM) |

nTE(TM) − 2π 2π
KzTE(TM) = +j (21)
dTE(TM) dTE(TM)

where nTE(TM) are the branch cut numbers of a complex logarithm.

A relative wave impedance zTE(TM) (the ratio of the wave impedance in the medium,
to the wave impedance in an air-filled waveguide) can be expressed in terms of the electric
field reflection coefficient ΓTE,TM , by the formula

1 + ΓTE(TM)
zTE(TM) = . (22)
1 − ΓTE(TM)
Electronics 2023, 12, 2899 7 of 15

Next, we will show how to obtain the complex material parameters εx , εy , εz , µx , µy ,

and µz using algebraic transformations.

2.3. Extraction of Material Parameters Using z and Kz —Configuration A

For transversely isotropic configuration, Equations (21) and (22) have the form
q q
µx 2
1 − KTE
εx
zTE = q (23)
1 2
1− ε x µz KTE

s
√ 1
KzTE = µx ε x 1− K2 (24)
ε x µz TE
q q
µx 1 2
εx 1− µ x ε z KTM
zTM = q . (25)
2
1 − KTM
s
√ 1
KzTM = µx ε x 1− K2 (26)
µ x ε z TM
We have obtained a system of four Equations (23)–(26), from which the complex
material parameters εx , εz , µx , and µz should be determined. Equations (23) and (24) can be
rewritten as: q
r
µx 1 − ε x1µz KTE
2
√ KzTE
= zTE q , µx ε x = q (27)
εx 1 − KTE 2 1 − ε x1µz KTE
2

Multiplying the above expressions side by side, we get µx

µx √
r
z K
µx = µ x ε x = qTE zTE , (28)
εx 2
1 − KTE

Similarly, from (25) and (26), we obtain εx

q
1 − KTM 2
√
r
µx KzTM
= zTM q , µx ε x = q (29)
εx 1 − µx1ε z KTM
2 1 − µx1ε z KTM
2

√
µx ε x K
εx = q = qzTM (30)
µx 2
εx zTM 1 − KTM

Using (24) and (26) the remaining parameters, µz and εz can be expressed by µx and εx
2
µ x KTE
µz = 2
(31)
µ x ε x − KzTE

2
ε x KTM
εz = 2
(32)
µ x ε x − KzTM
Equation (32) shows that the TM11 mode is necessary to determine the parameter εz .
However, in the case of this mode and a non-magnetic medium (µx = µy = µz = 1), it is
enough to use (30) and (32) to uniquely determine εx and εz . This is not possible using the
TE10 mode.
Electronics 2023, 12, 2899 8 of 15

To extract parameters εr and µr of an isotropic MUT (εx = εy = εz = εr , µx = µy = µz = µr ),

we can use the results (28) and (31) for the TE10 mode (see, e.g., ref. [3])

z K
µr = qTE zTE , (33)
2
1 − KTE

2
KzTE 2
+ KTE
εr = (34)
µr
or (30) and (32) for the TM11 mode

K
εr = qzTM (35)
2
zTM 1 − KTM

2
KzTM 2
+ KTM
µr = (36)
εr
None among (28), (30), (31), and (32) for uniaxial anisotropy, or (35) and (36) for
isotropy, has yet been reported in the scientific literature.

2.4. Extraction of Material Parameters Using z and Kz —Configuration B

In the case of the configuration B, only the TE10 mode can be considered. For the most
general biaxial medium, Equations (21) and (22) have the form:
q q
µx 2
1 − KTE
εy
zTE = q , (37)
1 2
1− ε y µz KTE

s
√ 1
KzTE = µx ε y 1− K2 (38)
ε y µz TE

By writing (37) and (38) as

q
r
µx 1 − ε y1µz KTE
2
= zTE q , (39)
εy 1 − KTE 2

√ KzTE
µx ε y = q (40)
1 2
1− ε y µz KTE

the parameter µx can be obtained

µx √ K
r
µx = µ x ε y = zTE q zTE (41)
εy 1 − K2 TE

Then, for non-magnetic media, using (38) can determin εy

2 2
ε y = KzTE + KTE (42)

Since the TM11 mode is disabled for biaxial anisotropy, this can be a simple test of its
existence or non-existence.
Electronics 2023, 12, 2899 9 of 15

3. Simulations and Measurements

3.1. Description of the Configuration
Measurements in a rectangular waveguide, especially using the TE10 and TM11 modes,
have some known advantages over the use of the TEM mode in a coaxial line, or TEM
waves in an open microwave path:
• the isolation of signals from the external environment in a closed microwave path, and
the possibility of using a smaller sample and its more precise positioning, compared
to the so-called free-space methods; and
• the easier preparation of the sample in the form of a hexahedron, than of a cylinder in
a coaxial line.
For the experiments, one rectangular waveguide with dimensions a = 40 mm, b = 20 mm,
and two C-W adapters, were used to excite the TE10 and TM11 modes in the waveguide.
Measurements were made at 6 GHz and 10.55 GHz for the TE10 and TM11 modes, respec-
tively. A C-W adapter with a magnetic loop was used to excite the TE10 mode. To excite the
TM11 mode, a C-W adapter with electrical coupling in the form of an antenna was designed
and manufactured.
The proposed measurement system is shown in Figure 5.

Figure 5. The proposed measurement system.

3.2. TM Mode Coax-to-Waveguide Adapter Design

Using the CST Studio Suite® program, the C-W adapter was modeled for a rectangular
waveguide in the 10–11 GHz band. The adapter matches the Z0 = 50 Ω TEM coax line
impedance to the wave impedance of the TM11 mode, and ensures the excitation of this
mode. Simulations of such a model were carried out. The simulation results are shown in
Figures 6–8.

Figure 6. A simulation structure containing a rectangular waveguide, together with a C-W adapter.
Electronics 2023, 12, 2899 10 of 15

Figure 7. Cross-section of the distribution of the electric field vector E in the rectangular waveguide.

Figure 8. Cross-section of the distribution of the magnetic field vector H in the rectangular waveguide.

The simulation results presented in Figures 7 and 8 confirm the excitation of the TM11
mode in the rectangular waveguide. The electric field E has the component along the
direction of wave propagation. On the other hand, the magnetic field H, at any point
in the waveguide space, is transverse to the direction of wave propagation. To ensure
the excitation of the TM11 mode with the longitudinal component of the electric field
vector, a radiator located in the middle of the front and rear walls of the waveguide was
used, as shown in Figures 6 and 9. Figure 10 shows the result of the simulation of the
waveguide-scattering matrix coefficients.

Figure 9. Dimensions (in mm) of the C-W adapter for the waveguide-supporting the TM11 mode.
Electronics 2023, 12, 2899 11 of 15

Figure 10. Simulation results of the scattering parameters S11 and S21 in an empty waveguide with
the TM11 mode.

3.3. Practical Implementation

Figure 11 shows a view of the C-W adapter, designed according to the project.

Figure 11. TM11 mode C-W adapter.

A view of the waveguide structure is shown in Figure 12. This figure also shows the
result of the measurements of the parameters S11 and S21 of the waveguide structure with
Electronics 2023, 12, x FOR PEER REVIEW
the excited TM11 mode. The measurements S11 and S21 fully confirmed the simulation12 of 15
results of the TM11 mode C-W adapter.

(a) (b)
Figure12.
Figure 12.An An empty
emptywaveguide
waveguidesupporting
supportingthe
theTM
TMmode,
mode,(a)
(a)measured
measuredS-parameters
S-parametersdB[S
dB[S1111]] (red),
(red),
(b)dB[S
(b) dB[S21]
21]] (blue).

3.4.
3.4. Measurement
MeasurementResults
Results
Measurements
Measurements were made at
were made at two frequencies:fTEf TE
two frequencies: = 6=GHz
6 GHz
for for
TE10TE10 mode,
mode, and fand
TM =
f10.55
TM = 10.55 GHz for the TM
GHz for the TM11 mode. mode. In both cases, during the measurements, the tested
11 In both cases, during the measurements, the tested material
sample was in a rectangular waveguide, in which the type of C-W adapters was succes-
sively changed, depending on the analyzed mode. The measurements of the parameters
S11 and S21 of the waveguide structure with the sample placed in it were carried out using
a vector network analyzer (VNA). This is the most effective technique for measuring S-pa-
Electronics 2023, 12, 2899 12 of 15

material sample was in a rectangular waveguide, in which the type of C-W adapters
was successively changed, depending on the analyzed mode. The measurements of the
parameters S11 and S21 of the waveguide structure with the sample placed in it were
carried out using a vector network analyzer (VNA). This is the most effective technique for
measuring S-parameters. Using this instrument allowed us to measure S-parameters with
high accuracy in relation to previously calibrated measurement gates. Measurements were
made with a P9373B Streamline Vector Network Analyzer, 9 kHz to 14 GHz, 2-port. The
VNA calibration was performed using the N7553A Electronic Calibration Module (ECal),
DC-14 GHz, 2-port module that supports 3.5 mm 50 Ω connectors.
To reduce measurement errors, the procedure described in application note [27] was
used. This application note described the techniques of de-embedding S-parameter net-
works with a device under test. Using the error-correcting algorithms of the vector network
analyzer, the error coefficients can be modified, so that the process of de-embedding two
port networks can be performed directly on the analyser in real time. This allowed us to
use the de-embedding process, resulting in very accurate measurements.
Several isotropic and non-magnetic materials, whose electromagnetic parameters are
described in the scientific literature, were selected for the measurements. The follow-
ing materials were tested: PA-6 (Polyamide 6), FR4 (Epoxy Fiberglass Laminate), PVDF
(Polyvinylidene Fluoride), and PTFE (Polytetrafluoroethylene).
The properties of the materials confirmed in the literature are presented in Table 1.

Table 1. Properties of tested materials found in literature.

Material f [GHz] ε0 ε00 tanδ 1 µ0 µ00 Reference

PA-6 1.7–2.5 3.0723 ± 0.0095 0.0107 ± 0.0083 - - − [28]
8.2–12.4 2.999 ± 0.0059 0.0091 ± 0.0045 - - − [28]
FR4 4–12 4.4 - 2 × 10−2 - - [29]
nominal 4.2–5 - - - - [30]
10 4.43 - - - - [30]
PVDF 8–12 2.5 ± 0.5 - 1.0 ± 1.5 0.3 ± 2 [31]
PTFE 8–13 2.046 ± 0.002 - - - - [5]
5 2.1 3.1 × 10−4 [32]
8–12 2.01 ± 0.05 0.003 - - - [33]
9.816 2.06 - 2.1 × 10−4 - - [34]
8–12 2.07 ± 0.3 0.003 ± 0.0004 1.02 ± 0.02 0.0 ± 0.002 [35]
70–114 2.12 - 3 × 10−4 - - [35]
1 tanδ = ε00 /ε0 .

Tables 2 and 3 shows the measurements of the S11 and S21 , and calculation results of
relative permittivity εr = ε0 − jε00 and relative permeability µr = µ0 − jµ00 for the TM11 and
TE10 modes, respectively.

Table 2. Measurements and calculation results for the TM11 mode (f TM = 10.55 GHz).

Material dTM [mm] S11 S21 ε0 ε00 µ0 µ00

PA-6 3 0.171 < −152◦ 0.984 < −61.7◦ 3.23 0.006 0.999 0.0002
FR4 1.5 0.262 < −132.8◦ 0.956 < −77.9◦ 5.11 0.102 0.928 0.0023
PVDF 5 0.203 < −170.5◦ 0.909 < −63.6◦ 3.48 0.439 0.983 0.0220
PTFE 5 0.021 < 42.0◦ 0.999 < −48.9◦ 2.05 0.0028 1.110 0.00005

Measurements of the PA-6 sample for the TE10 and TM11 modes gave a consistent
result of relative permittivity ε0 = 3.23. Similar values of parameters of this material are
presented in [28]. For the remaining materials, there is an analogous agreement between
the measurement results obtained using the TE10 and TM11 modes. For the FR4 sample,
the obtained values were confirmed in [29,30], for the PVDF in [31,36], and for the PTFE
in [5,32–35].
Electronics 2023, 12, 2899 13 of 15

Table 3. Measurements and calculation results for the TE10 mode (f TE = 6 GHz).

Material dTE [mm] S11 S21 ε0 ε00 µ0 µ00

PA-6 3 0.449 < −134.2◦ 0.892 < −44◦ 3.23 0.008 0.999 0.0001
FR4 1.5 0.432 < −125.5◦ 0.892 < −34.1◦ 5.12 0.102 0.998 0.004
PVDF 5 0.459 < −143.8◦ 0.814 < −44.4◦ 3.47 0.438 1.001 0.002
PTFE 5 0.239 < −121◦ 0.970 < −30.9◦ 2.06 0.002 0.998 0.0019

4. Discussion
The comparison of measurements presented in Table 2 (the novel method) and Table 3
(the traditional method) confirms the validity of using the TM11 mode to extract the material
parameters µr and εr of the isotropic medium.
The proposed method of extracting material parameters using the TM11 mode has
several advantages over the traditional method using the TE10 mode.
• The first is due to the permittivity εr extraction resulting from (35). The traditional
method requires first the determination of permeability µr , from (33), and then εr , from
(34). The proposed method does not require the prior determination of permeability, so
it does not introduce an additional error. In broadband studies, a known disadvantage
of the NRW method is instability at frequencies corresponding to integer multiples of
one-half wavelength in the MUT. An effective and widely used method of eliminating
these instabilities is the iterative method, first described in [5]. This method applies
to non-magnetic materials, i.e., with µr = 1. Using the TM11 mode does not require
this assumption.
• When the medium is non-magnetic (which is a common case) and uniaxial, both
relative permittivity εx , and εz can be determined using the TM11 mode without
changing the position of the sample. This cannot be done with the TE11 mode, because
the latter does not has an electric field z-component.
• In turn, the use of the TM11 and TE10 modes allows us to determine all four parameters
of the uniaxial medium, without changing the position of the sample.
An experimental confirmation of the presented theoretical results for uniaxial anisotropic
materials will be the direction of further research.
The work fits into the broader context of verifying the properties of materials using various
methods of microwave measurements [37,38]. In a narrower context, it provides an alternative
to using TEM or the TE10 modes in transmission/reflection measurement techniques.
At this point, it is necessary to mention the work [39], where the method of extracting
the parameters of biaxial media in the rectangular waveguide, using the TM11 mode, is
presented. We questioned the theoretical basis of this work in comments [40] accepted for
publication. Quite simply, the TM11 mode is not propagated in the biaxial medium, as we
have stated in [24], and clearly indicated in this paper.

Author Contributions: Conceptualization, A.D. and W.S.; methodology, A.D.; validation, W.S., P.P.
and A.D.; formal analysis, W.S. and A.D.; investigation, P.P.; data curation, P.P.; writing—original
draft preparation, A.D.; writing—review and editing, W.S. and A.D.; visualization, A.D. and W.S.;
supervision, W.S. All authors have read and agreed to the published version of the manuscript.
Funding: This work was financed by Military University of Technology under Research Project
UGB 868.
Data Availability Statement: Not applicable.
Conflicts of Interest: The authors declare no conflict of interest.
Electronics 2023, 12, 2899 14 of 15

References
1. Nicolson, A.M.; Ross, G.F. Measurement of the intrinsic properties of materials by time-domain techniques. IEEE Trans. Instrum.
Meas. 1970, 19, 377–382. [CrossRef]
2. Weir, W.B. Automatic measurement of complex dielectric constant and permeability at microwave frequencies. IEEE 1974, 62,
33–36. [CrossRef]
3. Rothwell, E.J.; Frasch, J.L.; Ellison, S.M.; Chahal, P.; Ouedraogo, R.O. Analysis of the Nicolson-Ross-Weir Method for Characteriz-
ing the Electromagnetic Properties of Engineered Materials. Prog. Electromagn. Res. 2016, 157, 31–47. [CrossRef]
4. Costa, F.; Borgese, M.; Degiorgi, M.; Monorchio, A. Electromagnetic Characterisation of Materials by Using Transmis-
sion/Reflection (T/R) Devices. Electronics 2017, 6, 95. [CrossRef]
5. Baker-Jarvis, J.; Vanzura, E.J.; Kissick, W.A. Improved technique for determining complex permittivity with the transmis-
sion/reflection method. IEEE Trans. Microw. Theory Tech. 1990, 38, 1096–1103. [CrossRef]
6. Smith, D.R.; Schultz, S.; Markoš, P.; Soukoulis, C.M. Determination of effective permittivity and permeability of metamaterials
from reflection and transmission coefficients. Phys. Rev. B 2002, 65, 195104. [CrossRef]
7. Markos, P.; Soukoulis, C.M. Transmission properties and effective electromagnetic parameters of double negative metamaterials.
Opt. Express 2003, 11, 649–661. [CrossRef]
8. Varadan, V.V.; Ro, R. Unique Retrieval of Complex Permittivity and Permeability of Dispersive Materials from Reflection and
Transmitted Fields by Enforcing Causality. IEEE Trans. Microw. Theory Tech. 2007, 55, 2224–2230. [CrossRef]
9. Chen, X.; Grzegorczyk, T.M.; Wu, B.-I.; Pacheco, J.; Kong, J.A. Robust method to retrieve the constitutive effective parameters of
metamaterials. Phys. Rev. E 2004, 70, 016608. [CrossRef]
10. Barroso, J.J.; de Paula, A.L. Retrieval of Permittivity and Permeability of Homogeneous Materials from Scattering Parameters. J.
Electromagn. Waves Appl. 2010, 24, 1563–1574. [CrossRef]
11. de Paula, A.L.; Rezende, M.C.; Barroso, J.J. Modified Nicolson-Ross-Weir (NRW) method to retrieve the constitutive parameters
of low-loss materials. In Proceedings of the SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference
(IMOC 2011), Natal, Brazil, 29 October–1 November 2011; pp. 488–492. [CrossRef]
12. Arslanagić, S.; Hansen, T.V.; Mortensen, N.A.; Gregersen, A.H.; Sigmund, O.; Ziolkowski, R.W.; Breinbjerg, O. A Review of the
Scattering-Parameter Extraction Method with Clarification of Ambiguity Issues in Relation to Metamaterial Homogenization.
IEEE Antennas Propag. Mag. 2013, 55, 91–106. [CrossRef]
13. Angiulli, G.; Versaci, M. Retrieving the Effective Parameters of an Electromagnetic Metamaterial Using the Nicolson-Ross-
Weir Method: An Analytic Continuation Problem Along the Path Determined by Scattering Parameters. IEEE Access 2021, 9,
77511–77525. [CrossRef]
14. Chen, H.; Zhang, J.; Wang, Y.; Che, W.; Huang, Z.; Qiao, Y.; Luo, J.; Xue, Q. An Improved NRW Method for Thin Material
Characterization Using Dielectric Filled Waveguide and Numerical Compensation. IEEE Trans. Instrum. Meas. 2022, 71, 1–9, Art
no. 8003009. [CrossRef]
15. Damaskos, N.J.; Mack, R.B.; Maffett, A.L.; Parmon, W.; Uslenghi, P.L.E. The inverse problem for biaxial materials. IEEE Trans.
Microw. Theory Tech. 1984, 32, 400–405, Erratum in IEEE Trans. Microw. Theory Tech. 1992, 40, 174. [CrossRef]
16. Akhtar, M.J.; Feher, L.E.; Thumm, M. A waveguide-based two-step approach for measuring complex permittivity tensor of
uniaxial composite materials. IEEE Trans. Microw. Theory Tech. 2006, 54, 2011–2022. [CrossRef]
17. Chen, H.; Zhang, J.; Bai, Y.; Luo, Y.; Ran, L.; Jiang, Q.; Kong, J.A. Experimental retrieval of the effective parameters of metamaterials
based on a waveguide method. Opt. Express 2006, 14, 12944–12949. [CrossRef]
18. Ishizaki, T.; Kida, S.; Awai, I. A measurement method of material parameters for uniaxially anisotropic artificial dielectrics. IEICE
Electron. Express 2010, 7, 810–816. [CrossRef]
19. Xu, X. Double waveguide method to retrieve the electromagnetic parameters of biaxial anisotropic materials. Electron. Lett. 2018,
54, 5436. [CrossRef]
20. Hasar, U.C.; Buldu, G.; Bute, M.; Muratoglu, A. Calibration-free extraction of constitutive parameters of magnetically coupled
anisotropic metamaterials using waveguide measurements. Rev. Sci. Instrum. 2017, 88, 104702. [CrossRef]
21. Hasar, U.C.; Buldu, G.; Barroso, J.J. Waveguide Method for Electromagnetic Parameter Extraction of Weakly Coupled Metamateri-
als. IEEE Microw. Wirel. Compon. Lett. 2017, 27, 851–853. [CrossRef]
22. Jiang, Z.; Bossard, J.A.; Wang, X.; Werner, D.H. Synthesizing metamaterials with angularly independent effective medium
properties based on an anisotropic parameter retrieval technique coupled with a genetic algorithm. J. Appl. Phys. 2011,
109, 013515. [CrossRef]
23. Castanié, A.; Mercier, J.-F.; Félix, S.; Maurel, A. Generalized method for retrieving effective parameters of anisotropic metamateri-
als. Opt. Express 2014, 22, 29937–29953. [CrossRef] [PubMed]
24. Dukata, A.; Susek, W. Transmission Parameters of an Anisotropic Layered Structure in the Waveguide. In Proceedings of the SPIE
11442, Radioelectronic Systems Conference, Jachranka, Poland, 20–21 November 2019. [CrossRef]
25. Mason, S.J. Feedback Theory–Some Properties of Signal Flow Graphs. Proc. IRE 1953, 41, 1144–1156. [CrossRef]
26. Mason, S.J. Feedback Theory–Further Properties of Signal Flow Graphs. Proc. IRE 1956, 44, 920–926. [CrossRef]
27. Application Note 1364-1, Agilent De-Embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer; Agilent
Technologies, Inc.: Santa Clara, CA, USA, 2004.
Electronics 2023, 12, 2899 15 of 15

28. Pittella, E.; Piuzzi, E.; Russo, P.; Fabbrocino, F. Microwave Characterization and Modelling of PA6/GNPs Composites. Math.
Comput. Appl. 2022, 27, 41. [CrossRef]
29. Guo, Z.; Pan, G.; Hall, S.; Pan, C. Broadband Characterization of Complex Permittivity for Low-Loss Dielectrics: Circular PC
Board Disk Approach. IEEE Trans. Antennas Propag. 2009, 57, 3126–3135. [CrossRef]
30. Narayanan, P.M. Microstrip Transmission Line Method for Broadband Permittivity Measurement of Dielectric Substrates. IEEE
Trans. Microw. Theory Tech. 2014, 62, 2784–2790. [CrossRef]
31. Indrusiak, T.; Pereira, I.M.; Pontes, K.; Pereira, E.C.; Peixoto, G.G.; Migliano, A.C.; Soares, B.G. Hybrid carbonaceous materials for
radar absorbing poly (vinylidene fluoride) composites with multilayered structures. SPE Polym. 2021, 2, 62–73. [CrossRef]
32. Chen, Y.C.; Lin, H.C.; Lee, Y.D. The effects of filler content and size on the properties of PTFE/SiO2 composites. J. Polym. Res.
2003, 10, 247–258. [CrossRef]
33. Yakubu, A.; Abbas, Z.; Ibrahim, N.A.; Fahad, A. The effect of ZNO nanoparticles filler on complex permittivity of ZNO-PCL
nanocomposite at microwave frequency. Phys. Sci. Int. J. 2015, 6, 196–202. [CrossRef]
34. Wu, C.; Liu, Y.; Lu, S.; Gruszczynski, S.; Yashchyshyn, Y. Convenient waveguide technique for determining permittivity and
permeability of materials. IEEE Trans. Microw. Theory Tech. 2020, 68, 4905–4912. [CrossRef]
35. Yashchyshyn, Y.; Derzakowski, K.; Wu, C.; Cywiński, G. W-band sensor for complex permittivity measurements of rod shaped
samples. IEEE Access 2021, 9, 111125–111131. [CrossRef]
36. Meng, X.M.; Zhang, X.J.; Lu, C.; Pan, Y.F.; Wang, G.S. Enhanced absorbing properties of three-phase composites based on a
thermoplastic-ceramic matrix (BaTiO3+ PVDF) and carbon black nanoparticles. J. Mater. Chem. A 2014, 2, 18725–18730. [CrossRef]
37. Krupka, J. Frequency domain complex permittivity measurements at microwave frequencies. Meas. Sci. Technol. 2006, 17,
R55–R70. [CrossRef]
38. Krupka, J. Microwave Measurements of Electromagnetic Properties of Materials. Materials 2021, 14, 5097. [CrossRef]
39. Kiani, M.; Abdolali, A.; Tayarani, M. Rectangular Waveguide Characterization of Biaxial Material Using TM11 Mode. IEEE Trans.
Instrum. Meas. 2022, 71, 8005615. [CrossRef]
40. Dukata, A.; Susek, W. Comments on “Rectangular Waveguide Characterization of Biaxial Material Using TM11 Mode”. IEEE
Trans. Instrum. Meas 2023, accepted for publication.

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