BRITISH STANDARD BS CECC

16100:1980

Harmonized system of
quality assessment for
electronic
components —
Sectional specification:
Electromechanical
all-or-nothing relays

UDC 621.318.56
BS CECC 16100:1980

Cooperating organizations

The Electronic Components Standards Committee, under whose direction this

British Standard was prepared, consists of representatives from the following
Government department and scientific and industrial organizations:

British Electrical and Allied Manufacturers’ Association (BEAMA)

Electricity Supply Industry in England and Wales
Electronic Components Industry Federation*
Electronic Engineering Association*
Institution of Electronic and Radio Engineers
Ministry of Defence*
National Supervising Inspectorate*
Post Office*
Society of British Aerospace Companies Limited
Telecommunication Engineering and Manufacturing Association (TEMA)*

The organizations marked with an asterisk in the above list, together with the
following, were directly represented on the Committee entrusted with the
preparation of this British Standard:

Association of Control Manufacturers Tacma (BEAMA)

Cinematograph Exhibitors’ Association of Great Britain and Ireland
Transmission and Distribution Association (BEAMA)

This British Standard, having

been prepared under the
direction of the Electronic
Components Standards
Committee, was published
under the authority of the
Executive Board and
comes into effect on Amendments issued since publication
29 August 1980
Amd. No. Date of issue Comments
© BSI 11-1999

The following BSI references

relate to the work on this
standard:
Committee reference ECL/1
Draft for comment 77/29527 DC

ISBN 0 580 11518 6

 BS CECC 16100:1980

Contents

Page
Cooperating organizations Inside front cover
National foreword ii
Foreword iii
Text of CECC 16100 1
Publications referred to Inside back cover

© BSI 11-1999 i
BS CECC 16100:1980

National foreword

This British Standard has been prepared under the direction of the Electronic
Components Standards Committee. It is identical with the CENELEC Electronic
Components Committee (CECC) 16100 “Harmonized system of quality
assessment for electronic components. Sectional specification: Electromechanical
all-or-nothing relays”.
This standard is a harmonized specification within the CECC system. The
existing non-harmonized BS 9151 “Rules for the preparation of detail
specifications for all-or-nothing relays of assessed quality” will remain in force for
the time being because of current approvals within the BS 9000 scheme.
Terminology and conventions. The text of the CECC specification has been
approved as suitable for publication, without deviation, as a British Standard.
Some terminology and certain conventions are not identical with those used in
British Standards; attention is especially drawn to the following.
The comma has been used throughout as a decimal marker. In British Standards
it is current practice to use a full point on the baseline as the decimal marker.
Cross-reference. The British Standard harmonized with CECC 00100 is
BS E9000 “General requirements for electronic components of assessed quality
harmonized with the CENELEC Electronic Components Committee System”
Part 1 “Basic rules”. The British Standard harmonized with CECC 00107 is
BS E9000-2 “Rules of procedure”.
International Standard Corresponding British Standard
IEC 410:1973 BS 6001:1972 Sampling procedures and tables for
inspection by attributes
(Technically equivalent)
CECC 16000:1979 BS CECC 16000:1980 Harmonized system of quality
assessment for electronic components. Generic
specification: Electromechanical all-or-nothing relays
(Identical)
IEC 255 (to which reference is made in 4.2), is a multipart standard and relevant
parts of it are to be published as identical British Standards.
A British Standard does not purport to include all the necessary provisions of a
contract. Users of British Standards are responsible for their correct application.

Compliance with a British Standard does not of itself confer immunity

from legal obligations.

Summary of pages
This document comprises a front cover, an inside front cover, pages i and ii,
the CECC title page, pages ii to iv, pages 1 to 12, an inside back cover and
a back cover.
This standard has been updated (see copyright date) and may have had
amendments incorporated. This will be indicated in the amendment table on the
inside front cover.

ii © BSI 11-1999
BS CECC 16100:1980

Contents
Page
Foreword iii
Section 1. Scope 1
Section 2. General 1
2.1 Related documents 1
Section 3. Quality assessment procedures 1
3.1 Primary stage of manufacture 1
3.2 Structurally similar relays 1
3.3 Qualification approval tests 1
3.4 Formation of inspection lots 1
3.5 Test schedules 2
3.6 Order of tests 2
Section 4. Writing of blank detail and detail specifications 3
Section 5. Marking 9
5.1 Relay 9
5.2 Package 9
Appendix A Explanations and examples regarding IL- and AQL-values 10
Table 1 — Basic test schedules for electromechanical all-or-nothing relays 4

ii © BSI 11-1999
 BS CECC 16100:1980

Foreword
The CENELEC Electronic Components Committee (CECC) is composed of those
member countries of the European Committee for Electrotechnical
Standardization (CENELEC) who wish to take part in a harmonized System for
electronic components of assessed quality.
The object of the System is to facilitate international trade by the harmonization
of the specifications and quality assessment procedures for electronic
components, and by the grant of an internationally recognized Mark, or
Certificate, of Conformity. The components produced under the System are
thereby accepted by all member countries without further testing.
This document has been formally approved by the CECC, and has been prepared
for those member countries taking part in the System who wish to issue national
harmonized specifications for ELECTROMECHANICAL ALL-OR-NOTHING
RELAYS. It should be read in conjunction with document CECC 00100: Basic
Rules (1974).

Preface
This sectional specification was prepared by CECC Working Group 16: “Relays”.
In accordance with the requirements of document CECC 00100 it is based,
wherever possible, on the Recommendations of the International
Electrotechnical Commission.
The text of this sectional specification was circulated to the CECC for voting in
the document CECC(Secretariat)644 in September 1977, and was ratified by the
CECC for printing as a CECC specification.
The layout of this specification deviates from that given in CECC 00400,
mainly by the insertion of an “Appendix A: Explanations and Examples
Regarding IL- and AQL-Values”, which gives guidance to specification writers.

© BSI 11-1999 iii

iv blank
 BS CECC 16100:1980

Section 1. Scope
This sectional specification applies to electromechanical all-or-nothing relays of assessed quality.
It selects from the generic specification CECC 16000 the appropriate methods of tests to be used in detail
specifications derived from this specification, and contains basic test schedules to be used in the
preparation of such specifications. Detailed test schedules are contained in the blank detail specifications
supplementary to this specification.

Section 2. General
2.1 Related documents
CECC 16000:1979, Generic Specification: Electromechanical all-or-nothing relays.

Section 3. Quality assessment procedures

3.1 Primary stage of manufacture
The primary stage of manufacture is the manufacturer’s incoming goods inspection stage where he checks
that these goods fulfil his specified requirements.

3.2 Structurally similar relays

Relays are considered structurally similar if having no other differences in design than in:
1) coil wire diameter and number of windings
2) types, numbers and material of contacts
3) rated coil and/or contact voltage(s)
4) mounting and terminal variants
altogether up to the limits prescribed in the detail specification.
NOTE If a detail specification covers variants 1) to 4), then the purchaser shall specify which variant(s) he requires.

3.3 Qualification approval tests

Qualification approval tests shall include all the tests prescribed in the detail specification, and shall be
performed:
— for short production runs: by a schedule specifically prescribed in the detail specification
(method 1 of CECC 00107).
— for large production runs: by the schedule prescribed in the detail specification for quality
conformance inspection on three consecutive lots (method 2 of CECC 00107).
As a general rule, a minimum of five specimens are required for each group of tests in a test schedule as in
method 1 of CECC 00107. Specimens which pass a non-destructive test may be used again for subsequent
destructive tests.

3.4 Formation of inspection lots

Inspection lots shall be formed in accordance with § 10 of CECC 00107 and with the sampling plans and
procedures given in IEC Publication 410, except for small production runs, isolated lots, and small lots.
3.4.1 When sampling is carried out in accordance with IEC Publication 410, the percent defective concept
only shall be used. Stratified or representative sampling shall always be used to include all production lines
and structurally similar relays in proportion to their respective quantities in the lot. Where variants are
liable to cause differing results in a particular test, exceptions from proportionality may become necessary
and shall be stated in the detail specification or agreed between the manufacturer and the National
Supervising Inspectorate (ONS). Specimens shall be as representative as possible of the production.
Samples for Group C inspection shall be taken from a lot (or lots) which has passed Group A and B
inspection. They may be taken either from the lot which leaves production at the end of the Group C period,
or from different lots at intervals during the Group C period. In either case the sample size shall not be less
than that applicable to the average lot size in the current Group C period.

© BSI 11-1999 1
BS CECC 16100:1980

3.4.2 A short production run is defined as a production comprising not more than 30 inspection lots. For
each of these lots the procedures for isolated lots shall be adopted. However, depending on lot size and
acceptable quality level (AQL), the switching rules may have a greater chance if operating with large lots
and low AQL, which may also be considered when determining the sampling plans to be used. These shall
be agreed between the manufacturer and the ONS.
3.4.3 An isolated lot (as distinct from the lot of isolated nature in IEC 410, Clause 11.6) is defined as a
unique production or supply lot, not forming part of a current sequence of inspection lots in the quality
assessment system.
The following options are available and shall be chosen by agreement between the manufacturer and
the ONS.
1) 100 % inspection if the lot is too small for sampling with adequate discrimination against the release
of non-conforming items for the specified AQL and inspection level (IL) (non-destructive tests only)
2) Change to a sampling plan with an operating characteristic giving adequate protection (DR)* at the
limiting quality (LQ) and for the known usage of the relays in the lot. The plan to be used shall be agreed
between the manufacturer and the ONS and should not unduly increase the producer’s risk of the
original AQL. The plan chosen may have both different AQL and IL from those specified in the detail
specification.
NOTE *DR = Discrimination Ratio, defined as:
Quality Level for which Pa = 10 %
----------------------------------------------------------------------------------------------
AQL
(see Table VI-A and Table X of IEC Publication 410)
3) Where good discrimination cannot be obtained e.g. for a small lot and a destructive test, a greater
sampling risk must be taken and agreement on the plan to be used shall be reached between the
manufacturer, the ONS and when known, the ultimate customer (user).
3.4.4 For small lots, procedures as described in 1), 2) or 3) of 3.4.3 above may be used and agreed between
the manufacturer, the ONS and when known, the ultimate customer (user).

3.5 Test schedules

3.5.1 A test sequence shall consist of all tests listed in the detail specification.
The reference numbers of the tests are those of CECC 16000 Generic Specification: Electromechanical
All-or-nothing Relays, except those described in detail in the detail specification.
3.5.2 The IL-notation applies for all tests in one Sub-Group. A corresponding range of values of AQL is
given, including a centre value which is underlined, and the and the authority preparing detail
specifications shall choose the appropriate value which then applies to all tests in one Sub-Group.
3.5.3 All tests in Sub-Group A0 shall normally be performed on every relay. However, if for some reason
there is a need to check by auditing the outcome of the 100 % test or in special cases of mass production, it
is advisable to check the lot on a statistical basis. For this purpose, an IL value and an AQL range are given
in Table 1.
3.5.4 Any IL- and AQL-notations shall be interpreted such that the number of defectives allowable for
acceptance is applicable to each test within a Sub-Group separately, i.e., no accumulated AQLs are to be
stated.

3.6 Order of tests

3.6.1 Quality conformance inspection is divided into two parts: that carried out lot-by-lot, on which the
release of the individual lots is based, and that carried out on a periodic basis which contains the
time-consuming and more expensive tests.
Following § 8.2 of CECC 00107, Groups A and B contain lot-by-lot tests, while periodic and further tests
required for the maintenance of qualification approval are contained in Group C.
3.6.2 When several tests are subsequently to be carried out on any one specimen or number of specimens,
the following order shall apply, unless otherwise prescribed in the detail specification.
— Tests of Sub-Group A0 shall always precede any other non-destructive (ND) or destructive (D) tests.
— The remaining ND tests may be conducted in any suitable order, provided that the effects of earlier
tests are not liable to invalidate the results of the later tests.

2 © BSI 11-1999
 BS CECC 16100:1980

— Destructive (D) tests may be preceded by one or more ND tests, provided that the effects of the ND
tests are not liable to invalidate the results of the D test.

Section 4. Writing of blank detail and detail specifications

4.1 Blank detail specifications shall conform with the test schedules given in Table 1 of this specification
and the related explanations.
Detail specifications shall follow the blank detail specifications as far as tests in the latter are marked by M
(mandatory). Tests marked by R (recommended) may be included in the detail specifications. Other tests
contained in CECC 16000 and any other tests not listed there but considered necessary, may be included
but care shall then be taken to check whether the IL- and AQL- notations are still reasonable, and that the
final measurements for each test in a Group are correctly listed at the end of that Group.
NOTE Although some tests are marked by R in the blank detail specification if included in the detail specification, they are then
mandatory.
4.2 Blank detail specifications shall call for, and detail specifications shall include, the following
information:
1) Identification of the detail specification.
2) Identification of the relay and information on its applications.
Identification shall be provided by such properties as size, sealing, whether monostable or bistable,
polarised or not, or as otherwise required for identification.
3) Outline drawing of the relay and key dimensions. Variants, such as for terminations, may be given in
an Appendix to the detail specification.
4) Reference data of the relay
A limited number of values is required on the front page, so as to describe the overall performance of
the relay. Full information in conformance with IEC-Publication 255-1-00 shall be added on one of the
subsequent pages, and accordance with IEC 255-1-00 implies that rated values should preferably be
those listed therein. Where tests are referred to rated values, they shall be indicated with each test.
Where tests are to be performed at other than rated values, the test values shall be indicated and
clearly distinguished from the rated values.
5) Related documents
Reference shall be made to CECC 16000 and this sectional specification. When reference to further
documents is necessary, such documents shall be listed with their full titles, year of edition and, unless
common knowledge, the source from which they can be obtained.
6) Level of assessment
Table 1 of this specification contains three test schedules. They shall be referenced as test schedule X
(number 1, 2 or 3) without additions, if containing only tests listed in that schedule, or as test
schedule X with additions, if tests have been added which are not listed in the test schedule.
7) Intervals between tests
8) Formation of inspection lots, if predictable in the sense of 3.4
9) Order of tests, if deviating from 3.6
10) General test conditions, if deviating from 5.5 of CECC 16000
11) Qualification approval test schedule
12) Quality conformance test schedule For 11) and 12):
For each group of tests, the final measurements specified in each of them shall be summed up and be
stated at the end of the Sub-Group
13) Specification of IL-numbers
14) Specification of AQL-numbers
15) Marking of package and/or relays beyond that listed in this specification, if necessary.
Each of the above items shall be taken into consideration during the testing of the relays covered by the
detail specification.
4.3 Additional information, such as diagrams and graphs, may be given in an Appendix of the detail
specification. Such information should not be used for test purposes.

© BSI 11-1999 3
BS CECC 16100:1980

4.4 When preparing detail specifications the following steps are to be taken in order to obtain an adequate
test schedule:
— Select from Table 1 of this sectional specification the properties relevant to the intended use of the
relay
— Select the test schedule which most closely satisfies the requirements for the relay
— Include in the detail specification all the mandatory tests prescribed in the chosen test schedule,
together with those recommended tests considered appropriate for the intended use
— If necessary, add any other tests required either from or beyond CECC 16000.
Table 1 — Basic test schedules for electromechanical all-or-nothing relays
Explanations and abbreviations
T1. Ranking of test schedules
All mandatory and recommended tests listed in test schedule 1 are also included in test
schedule 2, plus some further tests. Likewise the tests of test schedule 2 are again included in
test schedule 3, plus still further tests. In a few cases, tests are shifted from one group to another,
or recommended tests become mandatory when proceeding from test schedule 1 to the higher
ones.
Such shifting and changes are marked by an asterisk
(for example: M+ )
T2. Order of tests
The tests in each Sub-Group are listed in the order of the number of paragraphs in CECC 16000.
For the order in which tests shall be cried out, see 3.6 of this specification.
T3. Abbreviations
T3.1 Options
M test mandatorily to be included in detail specification
R test recommended for inclusion in detail specification
Tests contained in CECC 16000 but not listed in the test schedule may be added to any detail,
specification if required.
T3.2 Properties of relays
RT 0 relay with open contacts
RT I relay with sealed contacts
RT II sealed relay
The effectiveness of sealing is defined by the test methods in 5.20 of CECC 16000.
T3.3 Categories of contacts
CA 0 relay with category 0 contacts (30 mV; 10 mA)
CA I relay with category I contacts (60 V;100 mA)
CA II relay with category II contacts (250 V; 1 A)
CA relay with category III contacts (600 V; 100 A)
III
The application categories of contacts are defined in full in 3.7 of CECC 16000.
T4. Notes
Table 1 refers to the following notes:
NOTE 1 These tests are to be carried out in this test group when either, or both, of the following situations apply:
1) When the parameter concerned is vital to the successful operation of the relay in its intended use.
2) When the manufacturing variability is comparable to the specified tolerance range for a stated parameter, and
when any relay with characteristics outside these limits would have an adverse effect on its intended use.
NOTE 2 Only applicable when agreed upon between manufacturer and purchaser and when the test duration does not
exceed one week.
NOTE 3 Only applicable when agreed upon between manufacturer and purchaser.
NOTE 4 Combination of electrical and mechanical endurance is allowed when the required number of operations for one
of the electrical endurance tests is at least equal to the number of operations required for mechanical endurance.
NOTE 5 In the tables on pages 6 to 10 references such as A0, A1, B2 etc. refer to Sub-Groups A0, A1, B2 etc.

4 © BSI 11-1999
 BS CECC 16100:1980

Table 1 — Basic test schedules for electromechanical all-or-nothing relays

Test Test schedule Test schedule Test schedule
References are to 1 2 3
CECC 16000
Group A
Sub-Group A0
For all tests General case
in this Sub-Group 100 % test
Special case
IL: II
AQL: 0,065 . . . 0,25 . . . 0,65
Visual inspection, M M M
marking
5.6.4
Coil resistance M+ if notes 1 and/or 3
5.8.1 apply
Dielectric test M reduced number of M terminals stated in M terminals stated in
5.9 terminals as stated in detail spec. to which detail spec. to which
detail specification note 1 applies note 1 applies
Contact-circuit M only for CA 0 M only for CA 0
resistance
5.12
Functional tests M operate and release M operate and release M operate and release
5.13 value for RT I and value for RT I and value for RT I and
RT II only RT II only RT II only
Sealing M only for RT II M only for RT II M only for RT II
5.20.2

Sub-Group A1
For all tests IL: I
in this Sub-Group AQL: 0,4 . . . 1,0 . . . 4
Mechanical test R R
procedures
5.7.1
Coil resistance M only for d.c. relays M only for d.c. relays M only if not tested
5.8.1 in A 0
Coil impedance M only for a.c. relays M only for a.c. relays M only for a.c. relays
5.8.3
Contact-circuit M only for CA I M only for CA I
resistance
5.12
Functional tests M operate and release M operate and release M operate and release
5.13 value for RT 0 only value for RT 0 only value for RT 0 only
Timing tests R+ if notes 1 and 3 apply
5.14
Internal moisture R+ only for RT II and M+ only for RT II and
5.21 CA 0 both combined CA 0 both combined
Abbreviations and notes on page 4

© BSI 11-1999 5
BS CECC 16100:1980

Table 1 — Basic test schedules for electromechanical all-or-nothing relays

Test Test schedule Test schedule Test schedule
References are to 1 2 3
CECC 16000
Sub-Group A2
For all tests IL: S-4
in this Sub-Group AQL: 0,4 . . . 1,0 . . . 4
Check of dimensions R M+ M
5.6.1

Sub-Group A3
For all tests IL: II
in this Sub-Group AQL: 0,4 . . . 1,0 . . . 4
Visual inspection, M M M
other than marking
5.6.4

Sub-Group A4
For all tests IL: S-4
in this Sub-Group AQL: 0,4 . . . 1,0 . . . 4
Dielectric test 5.9 M+ further selected M further selected
terminals not tested terminals not tested
in A0 and if note 1 in A0 and if note 1
applies applies
Insulation resistance M+
5.11

Group B
Sub-Group B1
For all tests IL: S-3
in this Sub-Group AQL: 0,4 . . . 1,5 . . . 6,5
Electrical endurance R+ only if notes 1 and 2 R only if notes 1 and 2
5.30 apply apply

Sub-Group B2
For all tests IL: S-3
in this AQL: 0,4 . . . 1,0 . . . 4
Heating R R R
5.18
Rapid change of M only for RT II M only for RT II
temperature,
method 2
5.19.2
Internal moisture R only for RT II and
5.21 CA 0 both combined
Abbreviations and notes on page 4

6 © BSI 11-1999
 BS CECC 16100:1980

Table 1 — Basic test schedules for electromechanical all-or-nothing relays

Test Test schedule Test schedule Test schedule
References are to 1 2 3
CECC 16000
Sub-Group B2
Robustness of M+ only for RT II M only for RT II
terminals
5.24
Solderability, Test 1 M for printed wiring M M
5.25.3 board relays only
Magnetic remanence R for d.c. relays only R for d.c. relays only
5.43

Sub-Group B3
For all tests IL: S-3
in this Sub-Group AQL: 0,1 . . . 0,65 . . . 2,5
Contact sticking R only for RT I and R only for RT I and
5.42 RT II RT II

Group C
Sub-Group C1
For all tests IL: S-2
in this Sub-Group AQL: 0,4 . . . 1,5 . . . 6,5
Electrical endurance R+ only if not tested in R only if not tested in
5.30 B1 and if note 1 B1 and if note 1
applies applies

Sub-Group C2
For all tests IL: S-3
in this Sub-Group AQL: 0,4 . . . 1,0 . . . 4
Coil inductance R
5.8.2
Dielectric test M terminals not tested M only if not in A0 M only if not in A0
5.9 in A0 and A4 and A4
Insulation resistance M
5.11
Contact-circuit R only for CA II M+ only for CA II
resistance and CA III and CA III
5.12
Timing tests R M+ only if not tested in
5.14 A1
Abbreviations and notes on page 4

© BSI 11-1999 7
BS CECC 16100:1980

Table 1 — Basic test schedules for electromechanical all-or-nothing relays

Test Test schedule Test schedule Test schedule
References are to 1 2 3
CECC 16000
Sub-Group C3
For all tests IL: S-2
in this Sub-Group AQL: 0,65 . . . 1,5 . . . 6,5
Check of dimensions R no dimensions
5.6.1 checked in A2
Mass R R
5.7.2
Contact noise R only for CA 0 and
5.39 CA I

Sub-Group C4
For all tests IL: S-2
in this Sub-Group AQL: 0,4 . . . 1,5 . . . 6,5
Electrical endurance R M+ only if not tested M only if not tested
5.30 in B1 or C1 in B1 or C1
Mechanical M see note 4 M see note 4
endurance
5.31

Sub-Group C5
For all tests IL: S-2
in this Sub-Group AQL: 0,4 . . . 1,0 . . . 4
Climatic sequence R R R
5.15
Damp heat, steady R R R
state
5.16
Salt mist R only for RT II R only for RT II
5.22.1
Robustness of R M+ only if not tested in M only if not tested in
terminals B2 B2
5.24
Shock, Bump, R R R
Vibration and
Acceleration
5.26 to 5.29
Thermal endurance R
5.32
Thermo-electric e.m.f. R only for CA 0
5.40
Abbreviations and notes on page 4

8 © BSI 11-1999
 BS CECC 16100:1980

Table 1 — Basic test schedules for electromechanical all-or-nothing relays

Test Test schedule Test schedule Test schedule
References are to 1 2 3
CECC 16000
Sub-Group C6
For all tests IL: S-2
in this AQL: 1,5 . . . 2,5 . . . 6,5
Thermal resistance R R
5.17
Rapid change of R only for RT 0 R only for RT 0
temperature and RT I and RT I
5.19
Mould growth R
5.23
Resistance to R R
soldering heat, Test 2
5.25.3
Abbreviations and notes on page 4

Section 5. Marking
Marking of relays and package
Relays and their package supplied in accordance with detail specifications covered by this specification,
shall be marked as follows unless otherwise prescribed in the detail specification.

5.1 Relay (minimum information)

— trade mark or manufacturer’s name
— relay type and variant code
— coded date of manufacture, to at least the nearest month.

5.2 Package (minimum information)

— detail specification reference
— trade mark or manufacturer’s name
— relay type and variant code
— manufacturer’s batch identification code
— quantity.

© BSI 11-1999 9
BS CECC 16100:1980

Appendix A Explanations and examples regarding IL- and AQL- values

A.1 Introduction
This sectional specification refers to, and detail specifications derived from it will generally use, the concept
of IEC-Publication 410 which is based on notations called IL- and AQL-values.
This Appendix explains in a rather simple form the meaning; of inspection level (IL) and acceptable quality
level (AQL) while showing by some examples the consequences from choosing IL- and AQL-values.
It is not intended to replace or supersede the far more detailed terminology and specifications contained in
IEC-Publication 410.
A.2 Inspection level — IL-
The inspection level determines the relationship between the lot or batch size and the sample size. This
relationship is established by means of a table in IEC 410 which contains lines for various lot or batch sizes,
from 2 to more than 50 000, and contains columns for seven different inspection levels. These levels are
divided into two groups.
The general inspection levels are I, II and III from which IL II is normally be used, while IL I results in a
smaller, and IL III in a larger number of test specimens.
The special inspection levels are S-1 to S-4 and result in far smaller sample sizes. They are to be used for
expensive tests, e.g. destructive tests or tests of long duration. IL S-1 results in the smallest, and IL S-4
results in the largest sample size among the special inspection levels.
A.3 Sample sizes, versus IL-values
If single sampling and normal inspection (see IEC 410 for the explanations of these terms) are used, the
following examples of relationship between lot or batch size and sample size apply.
Lot or batch Sample size for IL
size
S-1 S-2 S-3 S-4 I II III

91 to 150 3 3 5 8 8 20 32
501 to 1 200 5 5 13 20 32 80 125
10 001 to 35 000 5 8 20 50 125 315 500

A.4 Acceptable quality level — AQL —

The acceptable quality level is — simply explained — the percentage of defectives within a lot which a
buyer is willing to admit, and which is ensured to him, by means of sampling inspection, at a given
probability. This probability is of the order of 90 % but varies with the chosen IL and AQL.
The AQL is the index of tables in IEC 410 which relate two figures to a given AQL and the sample size
determined as above: The figure Ac (accepted) is the maximum number of defectives up to which the lot or
batch is accepted. The figure Re (rejected) is the number of defectives above which the lot or batch is
rejected. The figures Ac and Re are results from statistical equations (Poisson distributions) which connect
IL and AQL notations such that the supplier, when complying with these figures, may suppose at the given
probability, that the buyer will accept the delivery when the latter uses the same AQL.
A.5 Admitted defectives versus AQL
If single sampling, normal inspection and IL II are used, the following examples of relationship between
sample size and number of allowed defectives apply.

10 © BSI 11-1999
 BS CECC 16100:1980

It is to be noted that some AQL-values may require a larger or smaller sample size than determined in
accordance with the IL-value. This is indicated by arrows in the following table.

Number of allowed defectives (Ac) at IL II and AQL

Lot size Sample size
0,25 0,40 0,65 1,0 1,5 2,5

0
E
91–150 20 use 50 use 32 0 use 13 use 32 1
specimens specimens specimens specimens
G G G
0 0
E
501–1 200 80 use 50 use 125 1 3 5
specimens
2
specimens
G
1

10 001–35 000 315 2 3 5 7 10 14

© BSI 11-1999 11
12 blank
 BS CECC 16100:1980

Publications referred to

See national foreword.

© BSI 11-1999
BS CECC
16100:1980
BSI — British Standards Institution
BSI is the independent national body responsible for preparing
British Standards. It presents the UK view on standards in Europe and at the
international level. It is incorporated by Royal Charter.

Revisions

British Standards are updated by amendment or revision. Users of

British Standards should make sure that they possess the latest amendments or
editions.

It is the constant aim of BSI to improve the quality of our products and services.
We would be grateful if anyone finding an inaccuracy or ambiguity while using
this British Standard would inform the Secretary of the technical committee
responsible, the identity of which can be found on the inside front cover.
Tel: 020 8996 9000. Fax: 020 8996 7400.

BSI offers members an individual updating service called PLUS which ensures
that subscribers automatically receive the latest editions of standards.

Buying standards

Orders for all BSI, international and foreign standards publications should be
addressed to Customer Services. Tel: 020 8996 9001. Fax: 020 8996 7001.

In response to orders for international standards, it is BSI policy to supply the

BSI implementation of those that have been published as British Standards,
unless otherwise requested.

Information on standards

BSI provides a wide range of information on national, European and

international standards through its Library and its Technical Help to Exporters
Service. Various BSI electronic information services are also available which give
details on all its products and services. Contact the Information Centre.
Tel: 020 8996 7111. Fax: 020 8996 7048.

Subscribing members of BSI are kept up to date with standards developments

and receive substantial discounts on the purchase price of standards. For details
of these and other benefits contact Membership Administration.
Tel: 020 8996 7002. Fax: 020 8996 7001.

Copyright

Copyright subsists in all BSI publications. BSI also holds the copyright, in the
UK, of the publications of the international standardization bodies. Except as
permitted under the Copyright, Designs and Patents Act 1988 no extract may be
reproduced, stored in a retrieval system or transmitted in any form or by any
means – electronic, photocopying, recording or otherwise – without prior written
permission from BSI.

This does not preclude the free use, in the course of implementing the standard,
of necessary details such as symbols, and size, type or grade designations. If these
details are to be used for any other purpose than implementation then the prior
written permission of BSI must be obtained.

If permission is granted, the terms may include royalty payments or a licensing

agreement. Details and advice can be obtained from the Copyright Manager.
BSI Tel: 020 8996 7070.
389 Chiswick High Road
London
W4 4AL