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Characterization Techniques
Characterization Techniques
technology
Contents:
FIB and
CHARACERIZATION ANALYSIS
(MICROSCOPIC ANALYSIS)
SEM,TEM, STEM, STM,AFM
(FLUROSENCE/OPTICAL)
UV/VIS,RAMAN SPECTROSCOPY
(STRUCTURAL ANALYSIS)
XRD AND EDX
CONTENTS - Surface Analysis Laboratory Techniques
1.SEM
2.TEM
3.STM
4.AFM
5.UV/VIS
SPECTROSCOPY
6.RAMAN
SPECTROSCOPY
7.XRD
8.EDX
There are two basic techniques to characterize metal nanoparticles: Spectroscopic
methods (e.g., UV–visible absorption and Raman scattering) and Microscopy (e.g.,
transmission electron and scanning atomic force). The most common tool to provide
reliable diagnostic of size distribution is electron microscopy. But this still is an
expensive, time consuming and mostly inaccessible method in terms of required
materials and infrastructure (Martínez et al., 2012). On the other hand, UV–visible
spectroscopy is an accessible and therefore widely used in the study of nanomaterials,
from a basic diagnostic of nanoparticle formation to the assessment of their complex
interactions with other elements.
Although techniques to be used would depend upon the type of material and
information one needs to know, usually one is interested in first knowing the size,
crystalline type, composition, thermal, chemical state and properties like optical or
magnetic properties
FIB
The Gallium primary ion beam hits the sample and sputters
a small amount of material which leaves the surface as
either secondary ions (i+ or i-) ion or neutral atom(no).
Circuit modification
Photomask repair
Transmission electron microscope(TEM).
Defect analysis.
Scanning electron microscope (SEM)
Scanning electron microscope (SEM) is one of the most widely used
techniques used in characterization of nanomaterials and nanostructures.
The signals that derive from electron-sample interactions reveal information
about the sample including surface morphology (texture), chemical
composition of the sample. The morphology of the Cu nanoparticles was
carried out on JEOL, JSM- 67001 and the image is shown in figure .
Principle:
Steam of electrons are produced by electron gun and
made to fall over the specimen using the magnetic
condensing lens. Electrons are made to pass through the
specimen and the image is formed on the fluorescent
screen, either by using the transmitted beam or by using
the diffracted beam. This high contrast image is called
bright field image.
● How does TEM work?
An electron gun at the top of a TEM emits electrons that travel through the microscope's vacuum tube. Rather
than having a glass lens focusing the light (as in the case of light microscopes), the TEM employs an
electromagnetic lens which focuses the electrons into a very fine beam.
● Is Tem destructive?
However, a major limitation with TEM is the time-consuming, destructive sample preparation necessary for
generating electron transparent specimens. Scanning electron microscopy (SEM) has the significant advantage
over TEM of being non- destructive and can rapidly image large areas.
● where it is preferred?
TEM is the preferred method to directly measure nanoparticle size, grain size, size distribution, and
morphology
How scientists interpret results from it?
Advantages
TEMs offer very powerful magnification and resolution.
TEMs have a wide-range of applications and can be utilized in a variety of different
scientific, educational and industrial fields
TEMs provide information on element and compound structure. Images are high-quality
and detailed.
Disadvantages
TEMs are large and very expensive.
Laborious sample preparation. Operation and analysis requires special training. Samples
are limited to those that are electron transparent. TEMs require special housing and
maintenance.
Images are black and white.
ADVANTAGES & DISADVANTAGES
OF SEM
Advantages
It gives detailed 3D and topographical imaging and the versatile information garnered
from different detectors.
This instrument works very fast.
Modern SEMs allow for the generation of data in digital Most SEM samples require
minimal preparation actions.
Disadvantages
SEMs are expensive and large.
Special training is required to operate an SEM. The preparation of samples can result in
artifacts. .
SEMS are limited to solid samples.
SEMs carry a small risk of radiation exposure associated with the electrons that scatter
from beneath the sample surface.
Scanning Tunneling Microscope (STM)
Working Principle:
In STM, the sample is scanned by a very fine metallic tip. The
tip (tungsten) is mechanically connected to an xyz positioning
device realized by means of piezoelectric materials. The sample is
positively or negatively biased so that a small current known as the
“tunneling current” flows if the tip is in close proximity to, but not
actually touching the sample.
Scanning transmission electron
microscopy(STEM)
Scanning transmission electron microscopy (STEM)
combines the principles of transmission electron microscopy
and scanning electron microscopy and can be performed on
either type of instrument. Like TEM, STEM requires very thin
samples and looks primarily at beam electrons transmitted by
the sample. One of its principal advantages over TEM is in
enabling the use of other of signals that cannot be spatially
correlated in TEM, including secondary electrons, scattered
beam electrons, characteristic X-rays, and electron energy
loss.
Like SEM, the STEM technique scans a very finely focused
beam of electrons across the sample in a raster pattern.
Interactions between the beam electrons and sample atoms
generate a serial signal stream, which is correlated with beam
position to build a virtual image in which the signal level at any
location in the sample is represented by the gray level at the
corresponding location in the image. Its primary advantage
over conventional SEM imaging is the improvement in spatial
resolution.
Definition:
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-
resolution type of scanning probe microscopy (SPM), with demonstrated resolution on
the order of fractions of a nanometer, more than 1000 times better than the optical
diffraction limit.
AFM provides a 3D profile of the surface of a nanoscale by measuring froces between a
sharp probe and the surface .
The AFM has three major abilities: force measurment , imaging and manipulation.
• Advantages
Easy sample preparation
What are the limitations of the AFM?
• Accurate height information
AFM imaging is not ideally sharp.
• Works in vacuum, air, and liquids
• Living systems can be studied
The Future of Atomic Force Microscopy
• Disadvantages •Atomic or angstrom resolution images
of live cell surfaces: development of
• Limited vertical range
more flexible cantilever springs and less
• Limited magnification range
damaging and nonsticky probes
• Data not independent of tip needed
• Tip or sample can be damaged
Sharper tips by improved
microfabrication processes
AFM vs STM
STM is particularly AFM is needed for
useful for probing insulating samples.
electrons at Since most polymers
surfaces, for and biomolecules
example the are insulating, the
electron waves in probe of choice for
quantum corrals or soft matter is often
the energy levels of AFM. This image
the electrons in shows DNA on mica,
dangling bonds an insulator.
and surface
molecules.
❖ XRD:
Principle:
X-ray diffraction is based on constructive interference of monochromatic X-
rays and a crystalline sample. These X-rays are generated by a cathode ray
tube, filtered to produce monochromatic radiation, collimated to
concentrate, and directed toward the sample.
Significance:
XRD is a rapid analytical technique used for phase identification of a
crystalline material and also can provide information on unit cell dimensions.
The analyzed material is finely ground, homogenized and, the average bulk
composition is determined.
Basic arrangement of atoms
XRD is the most convenient, the most widely used method to determine
the crystal structure.
XRD gives also information about the structure of solids, and
arrangements of the atoms that compose solids.
Disadvantages of XRD
XRD has size limitations. It is much more accurate for measuring large
crystalline structures rather than small ones because small structures are
trace in amount and are undetected by XRD readings.
It is relatively low in sensitivity.
Uses of XRD
It is a laboratory-based technique used for the
identification of crystalline materials.
It is also used for the analysis of unit cell dimensions.
It is also used to determine the structure of proteins.
It is also used to distinguish between different crystal
structures with identical compositions.
It is used to study rapid biological and chemical
processes.
It is also used for crystallographic applications.
Definition:
Energy dispersive X-ray spectroscopy (EDX) is an analytical method for
analytical or chemical characterization of materials.
EDX systems are generally attached to an electron microscopy instrument such
as transmission electron microscopy (TEM) or scanning electron microscopy
(SEM).
EDX is based on the emission of a specimen characteristic X-rays.
A beam of high energy charged particles (electrons or protons) are focused
into the investigated sample.
EDX analysis gives a spectrum that displays the peaks correlated to the elemental composition of the
investigated sample.
In addition, the elemental mapping of a sample can be created with this characterization method.
The peak intensities are proportional to the elemental concentration and specimen thickness as shown in
the graph
Applications of EDX
Because of its many advantages, EDX analysis has become common practice across
industries ranging from manufacturing or research to energy and resource management
to consumer-packaged goods.
Product deformulation and competitor analysis
Adhesion, bonding, delamination investigations
Optical appearance, haze and colour problems
Disputed claim investigations and expert witness
Failure investigations, identification of cause
Catalyst quality, poisoning and elemental distribution
Product imperfections and defect analysis
Contamination detection, isolations and identification
Quality control, raw material and end product
Filler, pigment, fibre, additive distribution, orientation
Assessment of plant particulate emissions
Construction and maintenance monitoring
❖ Uv/vis spectroscopy
Strengths Weakness
Non Stray light
Light
Destructive scattering
Quick Geometrical-
Easy to use Considerations
Minimal
processing
Inexpensive
The relationship between the energy difference and wavelength is described by the
Planck equation.
E=hν=hc/λ
where E is the energy required to promote an electron from the ground to excited state, h is
Planck’s constant, ν is the wavenumber, c is the speed of light, and λ is the wavelength.
Planck’s equation demonstrates that the less energy needed to excite the electrons, the longer
the wavelength of the absorption band. The absorption bands are indicative of the molecular
structure of the sample and will shift in wavelength and intensity depending on the molecular
interaction and environmental conditions. These bands are typically broad and featureless due to
the numerous molecular vibrational levels associated with the electronic energy levels.
UV-Visible/NIR spectroscopy can be divided into ultraviolet, visible, and near-infrared regions of
the spectrum. The ultraviolet region is defined as 180 to 400 nm, visible between 400 and 800
nm, and the near-infrared is from 800 to 3200 nm. Near-infrared light is generally poorly absorbed
because its photon energy is insufficient to induce electronic transitions and its frequency is
greater than the natural vibration frequency of most chemical bonds. However, since the
frequency in the NIR is close to the overtone frequency of many natural vibrations, weak
substance-specific absorption bands can be detected.
Interpreting UV/Vis Spectroscopy Data
For Analysis of the For Water Analysis using a UV- For Evaluation of UPF for
Melting Temperature and Visible Spectrophotometer Sun Protection Fabrics
Thermodynamic with a 30 cm Cell
Parameters of a Nucleic
Acid using a UV-Visible
Spectrophotometer
Beer-Lambert law
A larger amount of
Ag-nanoseeds was
used as a precursor
for making the Ag-
nanoprisms. The
shift in the peak
maximum (position
and intensity) in the
UV–vis spectra
demonstrate the
effect of size of the
Ag-NPs.
Applications of UV-Vis spectroscopy
What is spectroscopy?
The study of molecular structure and dynamics through
the absorption emission and scattering of light .
Ramna spectroscopy
Raman spectroscopy was discovered by C.V. Raman in
1928.
•It is a spectroscopic technique used to observe vibration,
rotational and other low frequency modes in a system
•Raman spectroscopy is commonly used in chemistry to
provide a fingerprint by which molecules can be
identified.
Principle :