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EM Lenses
EM Lenses
Lenses
MSE 954
Advanced Characterization
Techniques
Electron Optics
Transmission Electron Microscope
Optical instrument – because it uses a lens
to form an image
Refraction, or
bending of a beam of
illumination is
caused when the
wavelength enters a
medium of a
different optical
density.
Electron Optics
F = −e(v × B)
an electron of charge –e experiences
when traveling with a velocity v