PES COLLEGE OF ENGINEERING, MANDYA - 571401

(An Autonomous Institution Affiliated to VTU, Belgaum)

Project Report
On
“FABRICATION AND TESTING OF
POWER DEVICES - DIODE AND THYRISTOR”
Submitted in Partial Fulfillment towards the Project work of 8th semester of
BACHELOR OF ENGINEERING
IN
ELECTRICAL AND ELECTRONICS ENGINEERING

Submitted By
AYESHA SIDDIQA 4PS20EE005
BHOOMIKA A S 4PS20EE006
DAJIED KYNSAI SUSNGI 4PS20EE009
JEEVAN G R 4PS20EE016

Under the Guidance of

Dr. S GOPIYA NAIK
Professor,
Department of Electrical and Electronics Engineering
PES COLLEGE OF ENGINEERING, MANDYA - 571401

2023-2024
 TABLE OF CONTENTS

1. INTRODUCTION......................................................................................... 1
1.1 INTRODUCTION............................................................................................... 2
1.2 LITERATURE SURVEY................................................................................... 5
1.3 OBJECTIVES.......................................................................................................9

2. METHODOLGY......................................................................................... 10
2.1 BLOCK DIAGRAM OF FABRICATION PROCESS...................................... 11
2.1.1 RESISTIVITY MEASUREMENT............................................................12
2.1.2 CRYSTAL ORIENTATION..................................................................... 12
2.1.3 LASER CUTTING.................................................................................... 13
2.1.4 DIFFUSION.............................................................................................. 13
2.1.5 OXIDATION.............................................................................................15
2.1.6 PHOTOLITHOGRAPHY..........................................................................15
2.1.7 UV - EXPOSING...................................................................................... 16
2.1.8 ETCHING..................................................................................................17
2.1.9 PHOSPHROUS DIFFUSION.....................................................................18
2.1.10 ALLOYING............................................................................................ 19
2.1.11 BEVELING............................................................................................. 19
2.1.12 ENCAPSULATION.................................................................................21

3. TESTING OF DIODE AND THYRISTOR..................................................................22

3.1 FORWARD VOLTAGE DROP TEST............................................................. 23
3.2 STABILITY TEST............................................................................................27
3.3 LEAKAGE TEST.............................................................................................. 28
4. TEST RESULTS......................................................................................... 30

5. APPLICATIONS AND ADVANTAGES................................................. 36

5.1 APPLICATIONS.............................................................................................. 37
5.2 ADVANTAGES............................................................................................... 41

6. CONCLUSIONS......................................................................................... 42
6.1 CONCLUSIONS.............................................................................................. 43
6.2 REFERENCES................................................................................................. 44
 LIST OF FIGURES

2.1.11 BLOCK DIAGRAM..................................................................................11

2.1.12 CRYSTAL ORIENTATION.......................................................................12
2.1.13 LASER CUTTING MACHINE....................................................................13
2.1.14 VISUAL REPRESENTATION OF RAW SILICON WAFER.....................13
2.1.15 AMPOULE PUMP STAND........................................................................ 14
2.1.16 PENETRATION OF IMPURITIES.............................................................. 14
2.1.17 OXIDATION............................................................................................. 15
2.1.18 PHOTO RESIST COATING........................................................................16
2.1.19 UV-EXPOSING......................................................................................... 16
2.1.20 DEVELOPING PROCESS........................................................................... 16
2.1.21 OXIDE ETCHING PROCESS......................................................................17
2.1.22 RESIST REMOVAL.................................................................................... 17
2.1.23 PHOSPHROUS DIFFUSION....................................................................... 18
2.1.24 GOLD DIFFUSION..................................................................................... 18
2.1.25 ALLOYING COMPONENTS AND PROCESS............................................ 19
2.1.26 BEVEL LAPPING MACHINE..................................................................... 20
2.1.27 BEVEL LAPPED THYRISTOR AND DIODE............................................. 21
3.1.1 V-I CHARACTERISTICS OF DIODE............................................................24
3.1.2 V-I CHARACTERISTICS OF THYRISTOR.................................................. 25
3.1.3 FORWARD VOLTAGE DROP TEST EXPERIMENTAL SETUP.................26
3.2.1 STABILITY TEST EXPERIMENTAL SETUP.............................................. 27
3.3.1 LEAKAGE TEST EXPERIMENTAL SETUP................................................ 28
4.1 BHdL-12 DIODE OUTLINE DIAGRAM........................................................ 32
4.2 BHtL-35 THYRISTOR OUTLINE DIAGRAM................................................. 34
5.1.1 TRACTION APPLICATION IN RAILWAYS................................................ 37
5.1.2 APPLICATION OF DIODE IN BRUSHLESS EXCITATION........................38
5.1.3 APPLICATION OF THYRISTOR IN VARIABLE FREQUENCY DRIVES...39
5.1.4 APPLICATION OF THYRISTOR IN HIGH CURRENT RECTIFIERS.......... 40