Executive Summary

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Executive summary

Identifying Materials Through Optical Spectroscopy

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Executive summary

Identifying Materials Through Optical Spectroscopy

The interaction between electromagnetic waves and an unidentified material was examined in

this experimental investigation at various wavelengths and incidence angles. The main

objective was to use sophisticated reflection measuring techniques to extract important

information about the properties of the material.

After careful examination, it was discovered that the unknown substance had a Brewster

angle of around 67.793 degrees and a refractive index of roughly 2.574. After further

analysis, the substance was determined to be strontium titanate (SrTiO3), which was in good

agreement with available literature and reference values.

Despite several differences throughout the research, especially when compared to established

reference values, the findings offered useful information about the optical characteristics of

the substance under consideration. Critical analysis of characteristics such as refractive index

dispersion and Brewster's angle improved material identification and our knowledge of

electromagnetic wave interactions.

The study's results have larger ramifications for scientific research and industrial

breakthroughs, especially in disciplines that rely on precise material characterisation. Future

optical material characterization efforts will help us better understand electromagnetic wave

behavior and its many uses in academia and industry.

This work advances scientific understanding and technological innovation by meticulously

experimenting and analyzing exact material identification procedures.


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References

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Dobbs, R. (2013, March 13). Electromagnetic Waves. Springer Science & Business Media.
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Simmons, J. H., & Potter, K. S. (2000, January 1). Optical Materials. Academic Press.
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Emission in an Efficient and Near‐Zero Thermal Quenching Garnet‐Type Phosphor.
Advanced Optical Materials. https://doi.org/10.1002/adom.202302391

Mondal, M., Dash, A. K., & Singh, A. (2022, September 8). Optical Microscope Based
Universal Parameter for Identifying Layer Number in Two-Dimensional Materials. ACS
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Koike, Y. (1988). Refractive index, refractive index distribution, birefringence. Kobunshi,


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Koike, Y. (1988). Refractive index, refractive index distribution, birefringence. Kobunshi,


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