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Testing PSRR With High-Frequency Ripple
Testing PSRR With High-Frequency Ripple
Testing PSRR With High-Frequency Ripple
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Introduction
One key factor while adding supply ripple is the presence of a decoupling
capacitor at the supply pin. Systems usually have decoupling capacitors on
all their supplies to decouple the power supply from the switching noise
caused by switching currents across the PCB trace inductance. As the ripple
frequencies increase, the shunt impedance to ground presented by the
decoupling capacitors decreases and the current required to achieve a
specific ripple amplitude across the capacitor increases. For example, for a
0.1μF decoupling capacitor, the impedance for a 1MHz ripple frequency is
about 1/(Cω)=1.59Ω, which is fairly low. To achieve a 200mVpp
(70.72mVrms) sinusoidal ripple amplitude at the supply pin with the
decoupling capacitor in place requires a root mean square (RMS) current of
70.72mVrms/1.59 Ω, which is nearly 45mArms. As frequencies go even
higher, the currents required will scale up accordingly. This makes the
required ripple amplitudes somewhat difficult to achieve when driven by
normally available signal sources or op-amp-based circuits, and may require
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The circuits discussed in this white paper use the higher current drive
capability of the DC power supplies by deriving the AC current for generating
the ripple directly from the supplies, and thus isolate the signal source/ op-
amp amplifier from the task of delivering this load current across the
decoupling capacitors. In addition to the basic circuit used to drive a sine/
square supply ripple at a supply pin without the decoupling capacitor in
place, this white paper discusses two enhanced versions, one that drives a
1MHz sinusoidal 200mVpp supply ripple across a 0.1μF decoupling capacitor,
and another that delivers a 30MHz sinusoidal 50mVpp supply ripple across a
0.1μF decoupling capacitor. All circuits have been simulated using Cadence®
OrCAD® PCB Designer with PSPICE® tool.
Circuits
Circuits 2 and 3 are modified versions of the basic circuit, and are both
capable of driving a supply ripple even when a decoupling capacitor is
present. This approach allows designers to leave the decoupling capacitors
on the board during PSRR testing, saving time during the testing stage and
enabling more automation.
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capacitor)
Figure 1 shows a basic circuit that drives a sine/square supply ripple without
a decoupling capacitor. This circuit makes use of negative feedback to ensure
that the ripple signal is an exact replica of the signal applied on the non-
inverting terminal of the op-amp. It works well for even square wave ripple
with faster rising edges and for high-ripple frequencies up to 100MHz,
assuming appropriate high-speed op-amps and MOSFETS are chosen.
However, because the output node is part of the negative feedback loop,
supply decoupling capacitors must be removed for testing to avoid instability.
In this circuit, the signal required to be replicated at the supply pin is applied
to the non-inverting input of the op-amp U1. For illustrative purposes,
consider a case where a 1MHz 200mVpp sine/square ripple riding on a 3.63V
DC supply is required. A 1MHz 200mVpp sine/square signal riding on 3.63V
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Once the required input signal is applied at the non-inverting op-amp input,
the op-amp tries to replicate the same signal on the inverting input by
resorting to negative feedback to reduce the difference or error between the
inverting and non-inverting inputs. In this case, the inverting input is not
directly connected to the op-amp output, but to the source terminal of T1,
and op-amp output is connected to the MOSFET gate terminal. The op-amp
can control how much the MOSFET turns on by setting the gate voltage to
allow the MOSFET to turn on just enough so that the current that flows
across it from drain to source (derived from the 10V DC supply) creates a
voltage across the R2, R3, and C1 combination that closely mimics the
voltage applied on the op-amp non-inverting terminal. Here, the MOSFET
behaves somewhat like a voltage variable resistor controlled by Vgs. Thus,
we replicate this signal at the output node, but the required current is fully
delivered by the 10V DC supply and not by the op-amp or signal source.
• The choice of the op-amp and MOSFET - The op-amp should have
sufficient bandwidth and slew rate to be able to track the input signal
fast enough using negative feedback. The op-amp used in this
particular example has a GBP of 165MHz. The MOSFET should also be
able to respond fast enough to the gate signal variations to ensure the
negative feedback action is good enough. A low threshold voltage and a
low RgCgs time constant-where Rg is the internal series gate resistance
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Figure 2 shows the input and output waveforms from simulation for a 1MHz
200mVpp sine and square signal riding on 3.63V DC level. VM1 is the output
and VM2 is the input. The output tracks the input closely, as both signals
overlap almost perfectly in both cases.
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Click to enlarge
Figure 3 shows a circuit that drives a 1MHz 200mVpp sinusoidal supply ripple
across a 0.1μF decoupling capacitor. This circuit does not require designers
to remove the decoupling capacitor for PSRR testing, saving testing time and
enabling more automation.
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Click to enlarge
Click to enlarge
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This is achieved in Circuit 2 by using the indicated values for R2, R3, and R5.
For the DC signal, the feedback point connected to the inverting input is
taken from the junction of the resistive voltage divider formed by R2 and R5.
The AC signal is taken from the junction of the voltage divider, which
consists of R5 at the top and the parallel combination of R2 and R3. (The
impedance of C1 is in series with R3, but at frequencies as high as 1MHz, the
series combination would still be nearly equal to R3 as the capacitive
reactance will be negligible in comparison.) This ensures that the DC and AC
components in the op-amp output are individually scaled by the respective
values required, and this signal is applied to the gates of both MOSFETs.
This architecture will not work well with square waves, as the amount of
switching current required for getting sharp rising edges across the
capacitive load will be too high, and the edges will start to slow down and
become distorted. The scope for this circuit is restricted only to sinusoidal
ripple.
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Figure 6 shows the input and output waveforms from simulation of a 1MHz
200mVpp sinusoidal signal riding on 3.63V DC level. VM1 is the output and
VM2 is the input. The output tracks the input fairly accurately even though
there is a small phase shift, which should not be an issue.
Click to enlarge
Figure 7 shows a circuit that drives a 30MHz 50mVpp sinusoidal supply ripple
across a 0.1μF decoupling capacitor This circuit is an enhanced version of
Circuit 2 shown in Figure 3 that is capable of driving comparatively higher
ripple frequencies by using a much faster op-amp.
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Click to enlarge
Figure 8 shows the simulation input and output waveforms for a 30MHz
50mVpp sinusoidal signal riding on 3.63V DC level. VM1 is the output and
VM2 is the input. The output tracks the input fairly accurately even though
there is a noticeable phase shift, which should not be an issue.
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Click to enlarge
Note that, at high speeds (≥10MHz), the PCB layout, the choice of the
components, and the parasitics of the components?especially the MOSFETs,
trace parasitics, etc.?become extremely important. Also, supplying the right
amount of current to achieve the desired ripple amplitude becomes more
difficult as the speeds increase, because the impedance across which the
ripple voltage is to be generated scales down with the ripple frequency. For
instance, at 30MHz, the load impedance becomes ~53mΩ, so the load
current required to achieve a particular ripple amplitude becomes that much
higher. Also, if you are using a current feedback op-amp as in this case, you
have to carefully follow the circuit recommendations, usually given in the
datasheets for such amplifiers. For example, do not use a feedback resistor
with a value less than the suggested value (in this circuit, R9 can be
considered the feedback resistor), and ensure the board parasitic
capacitance at the op-amp pins is low enough by removing the ground
planes from beneath them. Also make sure that the DC power supply can
drive the required output current.
Conclusion
Affecting PSRR measurements with the decoupling capacitors in place for the
supplies can be challenging. This white paper discusses how to insert high-
frequency ripple on a DC supply to affect PSRR measurements without
removing the decoupling capacitor on the supply pin. This capability is
especially important in highly automated test and measurement systems
where all the tests are run on batches of devices without changing the
hardware setups. With this solution, designers can avoid spending the time
and money required to implement a dedicated PSRR test hardware setup
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References
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