The geometric distribution is used to model the number of attempts required to

achieve the first successful outcome in a series of independent and identical

Bernoulli trials. In this particular case, a "success" is defined as the production of a
defective transistor.

The probability mass function (PMF) of the geometric distribution can be expressed
as: P(X = k) = (1 - p)^(k - 1) * p

Where p represents the probability of success in a single trial, and k denotes the
number of trials.

The mean and standard deviation of the geometric distribution are calculated using
the following formulas: Mean = 1 / p

Standard Deviation = sqrt((1 - p) / p^2)

Solutions

1. The likelihood of the 10th transistor being the first defective unit produced is
given by: P(X = 10) = (1 - 0.02)^(10 - 1) * 0.02 = 0.0167
2. The probability of not obtaining any defective transistors in a batch of 100
units is given by: P(X > 100) = (1 - 0.02)^100 = 0.1326
3. On average, the expected number of transistors to be produced until the first
defective unit is encountered is 1 / 0.02 = 50. The standard deviation for
this process is sqrt((1 - 0.02) / 0.02^2) = 49.497
4. For a machine with a defective rate of 5%, the average number of transistors
expected to be produced until the first defective unit is 1 / 0.05 = 20. The
standard deviation in this case is sqrt((1 - 0.05) / 0.05^2) =
19.494
5. If P increases from 0.02 → 0.05 → the mean and standard deviation will
decrease

References:

Wackerly, D. D., Mendenhall, W., & Scheaffer, R. L. (2008). Mathematical statistics

with applications (7th ed.). Brooks/Cole.