Trescal Calibration LA 2013 0551 C 1

Trescal (Singapore) Pte Ltd Certificate No.
: LA-2013-0551-C-1
8 Admiralty Street
#05-10, Admirax Issue No. : 10
Singapore 757438
Date : 13 July 2023
Expiry of Certificate : 06 October 2025
Page : 1 of 53
FIELD OF TESTING: CALIBRATION AND MEASUREMENT
CALIBRATION &
MEASURED QUANTITIES/
METHOD MEASUREMENT
INSTRUMENTS/ RANGE TO BE
CAPABILITY
CALIBRATED
(CMC*)
A. DIMENSIONAL Lab Environmental Condition:

Temperature: (20±1) °C
Humidity: (55±10) %RH
A1. Gauge Blocks and Accessories Tungsten

(Tungsten & Steel only) BS 4311: Part 1: 2007 Carbide Steel
A1.1 Metric unit ISO 3650: 1998
a. 0 mm to 10 mm QCD/TRSG/Procedure 019, 0.06m 0.06m
b. Above 10 mm to 25 mm (Issue 03) 0.07m 0.07m
c. Above 25 mm to 50 mm 0.10m 0.10m
d. Above 50 mm to 75 mm 0.11m 0.14m
e. Above 75 mm to 100 mm 0.13 m 0.17m
A1.2 Imperial Unit

a. 0 inch to 0.4 inch 2 inch 2 inch
b. Above 0.4 inch to 1 inch 3 inch 3 inch
c. Above 1 inch to 2 inch 4 inch 4 inch
d. Above 2 inch to 3 inch 6 inch 6 inch
e. Above 3 inch to 4 inch 7 inch 7 inch
Flatness
Up to 2.5 mm 0.18 m 7.1 inch
Above 2.5 mm to 100 mm 0.18 m 7.1 inch
A2. Gauge Block Comparators QCD/TRSG/SEAMS-0008,

(Lab / On-Site) Issue 01
a. Up to 10 mm 0.030 m
b. Up to 50 mm 0.061 m
c. Up to 100 mm 0.091 m
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Certificate No. : LA-2013-0551-C-1 Issue No. : 10
Date : 13 July 2023 Page : 2 of 53
MEASURED QUANTITIES/ CALIBRATION &

INSTRUMENTS/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)
A3. Plain Plug Gauges or Pin Gauges BS 969: 2008

a. 0 mm to 10 mm QCD/TRSG/Procedure 001, 0.4 m
b. Above 10 mm to 50 mm (Issue 03) 0.6 m
c. Above 50 mm to 100 mm Using ULM 1.3 m
d. Above 100 mm to 200 mm 1.8 m
a. 0 mm to 10 mm Using Laser scan micrometer 0.7 m

b. Above 10 mm to 25 mm 0.8 m
A3.1 Plug/Pin gauges of lower accuracy

(Lab/On-Site)
Up to 25mm 2 m
A3.2 Precision Balls up to 10mm 0.4 m
A4. Thread Wires (Measuring BS 5590: 1978

Cylinders) QCD/TRSG/Procedure 025,
0 mm to 10 mm (Issue 01) 0.4 m
A5. Plain Ring Gauges BS 969: 2008

a. 1 mm to 50 mm BS 4064:1966 0.9 m
b. Above 50 mm to 100 mm QCD/TRSG/Procedure 002, 1.0 m
c. Above 100 mm to 150 mm (Issue 02) 1.4 m
d. Above 150 mm to 200 mm 1.8 m
A6. Parallel Screw Thread Plug Gauges BS 1580: 2007 Part 1or Part 3
a. M2 to M38 ANSI/ASME B1.2-1983 2 m
b. M38 to M100 ASME/ANSI B1.8-1988 3 m
c. Pitch ASME B 1.5-1997 5 m
d. Angle ISO 1502: 1996 5 minutes
A6.1 Parallel Screw Thread Ring Gauges QCD/TRSG/Procedure 014,

a. M3.5 to M38 (Issue 01) 2 m
b. M38 to M100 3 m
A7. Tapered Thread Plug Gauges ASME B1.20.5-1991 5 m

(Up to 76.2 mm) QCD/TRSG/Procedure 030,
(Issue 01)
A8. Plain Gap Gauges ASME B 47.1: 2007 as a

a. 0.5 mm to 50 mm guide QCD/TRSG / 2 m
b. Above 50 mm to 150 mm Procedure 003, (Issue 01) 3 m
c. Above 150 mm to 300 mm 5 m

MEASURED QUANTITIES / CALIBRATION &

INSTRUMENTS / RANGE TO BE METHOD MEASUREMENT
A9. Feeler Gauges BS 957: 2008 0.4 m

(Up to 1 mm) JIS B 7524: 2008
QCD/TRSG/Procedure 010,
(Issue 01)
A9.1 Feeler gauges of lower accuracy 2 m

(Lab/On-Site)
A10. Surface Plate BS 817: 2008

(Lab/On-site) QCD/TRSG/Procedure 023,
2000 mm X 1500 mm (Issue 01) 1.6 m / 63 inch
A11. Universal Measuring Machine QCD/TRSG/SEAMS-0012,

(Lab / On-Site) (Issue 01)
a. 0 mm to 100 mm 0.3 m
b. Above 100 mm to 500 mm 1.7 m
c. Above 500 mm to 1000 mm 3.5 m
Flatness 0.18 m
A12. Dial Gauge Calibration Tester

a. Up to 25mm QCD/TRSG/SEAMS-0013, 0.6 m
0.001 mm resolution (Issue 01)
b. Up to 30mm QCD/TRSG/SEAMS-0009, 0.3 m
0.0001 mm resolution (Issue 01)
A13. Height Setting Micrometer/ Riser ISO 7863: 1984

Block
a. up to 300 mm QCD/TRSG/Procedure 018, 1.3 m
b. up to 600 mm (Issue 01) 2.5 m
Accuracy of lead screw 0.5 m

Parallelism 0.8 m
A14. Calliper Checker QCD/TRSG/SEAMS-0001,

a. Up to 360 mm (Issue 01) 1.3 m
b. Up to 670 mm 2.5 m
Flatness 0.18 m
Parallelism 0.8 m


INSTRUMENTS / RANGE TO METHOD MEASUREMENT
BE CALIBRATED CAPABILITY (CMC*)
A15. Measuring Microscopes JIS B 7153: 1995

(Toolmaker’s) QCD/TRSG/Procedure 022,
(Lab / On-Site) (Issue 01)
Up to 200 mm 3.0 m
A16. Measuring Projectors JIS B 7184: 2021 as a guide 2 minutes angular

(Lab / On-Site) QCD/TRSG/Procedure 016,
a. Up to 240 mm (Issue 02) 3.0 m linear
b. Up to 300 mm 4.0 m linear
A17. Engineering Squares - (Including BS 939: 2007 3.0 m

Cylindrical & Block Type) QCD/TRSG/Procedure 017,
(Up to 300 mm) (Issue 01)
A18. External Micrometers
A18.1 a. Up to 25 mm 0.2 m
b. Above 25 mm to 100 mm QCD/TRSG/Procedure 005, 1 m
c. Above 100 mm to 300 mm (Issue 01) 2 m
d. Above 300 mm to 500 mm ISO 3611:2010 as guide and 3 m
e. Above 500 mm to 600 mm with reference to 4 m
f. Above 600 mm to 1000 mm manufacturers’ requirements 6 m
g. Above 1000 mm to 1500 mm BS 870: 2008 9 m
h. Above 1500 mm to 2000 mm 13 m
Flatness 0.2 m
Parallelism
a. Up to 600 mm 1 m
b. Above 600 mm to 1000 mm 2 m
d. Above 1500 mm to 2000 mm 5 m
A18.2 Up to 100 mm (On-Site) 2 m
A18.3 Setting Rods

a. Up to 100 mm 1 m
d. Above 500 mm to 600 mm 4 m
e. Above 600 mm to 1000 mm 6 m
f. Above 1000 mm to 1500 mm 9 m
g. Above 1500 mm to 1950 mm 13 m
Micrometer Head Accuracy 0.7 m


CALIBRATED CAPABILITY
(CMC*)
A19. Thread Micrometer QCD/TRSG/SEAMS-0010,

0 mm to 100 mm (Issue 01) 1 m
A20. Internal Micrometer BS 959: 2008

(incl. Stick Micrometer) QCD/TRSG/Procedure 006,
a. Up to 300 mm (Issue 01) 2 m
A21. Internal Micrometer QCD/TRSG/SEAMS-0011,

5 mm to 300 mm (Issue 01) 2 m
A22. Depth Micrometer BS 6468: 2008

Functional requirements as covered in QCD/TRSG/Procedure 007,
BS 6468: 2008 (Issue 01)
Up to 300 mm 2 m
A23. Holtest QCD/TRSG/SEAMS-0007,

(Issue 01)
A23.1 Using Ring Gauge

Up to 100 mm 2 m
Above 100 mm to 200 mm 3 m
A23.2 Using Fixture (Bore Gauge Calibrator)

Up to 100 mm 4 m
Above 100 mm to 200 mm 4 m
A24. Dial Gauges and Precision Dial ISO 463: 2006, JIS B
Indicators 7503: 2017, DIN 879: 1999
a. Up to 1 mm ASME B 89.1.10M-2001, 0.7 m
b. Above 1 mm to 10 mm BS907: 2008 0.9 m
c. Above 10 mm to 50 mm QCD/TRSG/Procedure 011, 1.0 m
d. Above 50 mm to 100 mm (Issue 01) 1.5 m
A24.1 Dial Gauges (On-Site)

Up to 12.7 mm 2 m
0.01 mm resolution
A24.2 Electrical Comparator JIS B 7536-1982 0.1 m

(Analog and Digital type) QCD/TRSG/Procedure 034
(Issue 1)


(CMC*)
A25. Dial Test Indicators BS 2795: 1981 0.7m

(Up to 1 mm) ASME B 89.1.10M-2001
QCD/TRSG/Procedure 012,
(Issue 1)
A26. Linear Gauges (Lab/ On-Site) In-house Procedure

a. Up to 100 mm QCD/TRSG/SEAMS-0017 1 m
b. Up to 150 mm (Issue 2) 2 m
C. Up to 200 mm 10 m
A27. Digital Indicator (Lab/ On-Site) In-house Procedure

QCD/TRSG/SEAMS-0017
a. Up to 100 mm (Issue 2) 1 m
b. Up to 150 mm BS 907: 2008 2 m
c. Up to 200 mm 10 m
A28. Dial Thickness Gauge In-house Procedure

a.Up to 25 mm QCD/TRSG/SEAMS-0005 3 m
b.Up to 50 mm (Issue 1) 10 m
A29. Electronic & Mechanical Slide Caliper JIS B 7507: 2016

BS EN ISO 13385-1: 2011
a. Up to 1000 mm BS 887: 2008 10 m
b. Up to 2000 mm 20 m
c. Up to 300 mm (On-Site) QCD/TRSG/Procedure 008, 20 m
(Issue 1)
Flatness / Parallelism 2 m
A30. Caliper Gauge In-house Procedure

0 to 50 mm QCD/TRSG/SEAMS-0004 5 m
50 to 150 mm (Issue 1) 10 m
A31. Electronic & Mechanical Height BS EN ISO 13225: 2012

Gauges (Lab / On-Site) BS 1643: 2008
up to 700 mm QCD/TRSG/Procedure 009 4 m
up to 1000 mm (Issue 1) 10 m
up to 1500 mm 20 m
A32. Other Limit Gauges incl. Height, QCD/TRSG/Procedure 004

Depth, Length (Issue 1)
Up to 50 mm 2 m
Up to 300 mm 5 m
Angle 5 minutes
Radius 5 m


INSTRUMENTS / RANGE TO METHOD MEASUREMENT
A33. Dimensional Measurements of Jigs & In-house Procedure

Fixtures Using CMM QCD/TRSG/SEAMS-0035
0 to 100 mm (Issue 01) 0.004 mm
100 to 300 mm 0.005 mm
300 to 500 mm 0.007 mm
A34. Precision Vernier Depth Caliper BSEN ISO 13385-2:2020

0 to 1000 mm BS 6365: 2008 10 m
QCD/TRSG/Procedure 021
(Issue 2)
A35. Depth Gauge Electronic & Mechanical In-house Procedure

QCD/TRSG/SEAMS-0014
Up to 10 mm (Issue 1) 1 m
Up to 100 mm 2 m
A36. Bevel Protractor QCD/TRSG/Procedure 015 3 m linear

a. Functional requirements as (Issue 1) 5 minutes angular
covered in BS 1685: 2008 BS 1685: 2008
b. Digital/Analog Protractor QCD/TRSG/SEAMS-0037 0.05 degree
(Issue 1)
A37. Cylinder (bore) Gauges JIS B 7515: 1982 2 m

QCD/TRSG/Procedure 013
(Issue 1)
A38. Form Measurement In-house Procedure

(Lab / On-Site) QCD/TRSG/SEAMS-0015
(Issue 2)
Parallelism
a. Up to 12 mm Using optical parallel 0.36 m
b. Up to 100 mm Using electronic probe 0.85 m
c. Up to 500 mm 1.2 m
d. Up to 1200 mm 4.0 m
Flatness
a. Up to 60 mm Using optical flat 0.18 m
b. Up to 100 mm Using electronic probe 0.85 m
c. Up to 500 mm 1.2 m
d. Up to 1000 mm 3.0 m
A39. Gauge block Accessories QCD/TRSG/Procedure 019,

(Dimensions) (Issue 1)
Using electronic probe 1.1 m
Using ULM 0.33 m


A40. Check-master QCD/TRSG/SEAMS-0016

Up to 30 mm (Issue 1) 1.3 µm
Up to 600 mm 2.5 µm
Up to 1000 mm 4.1 µm
A41. Coating Thickness Gauge QCD/TRSG/SEAMS-0023

Up to 3 mm (Issue 1) 2.5 µm
Above 3 mm to 8 mm 12 µm
Foil Measurement (up to 8mm) 1.5 m
A42. Metal Rule JIS B 7516: 2005

a. Up to 300 mm QCD/TRSG/Procedure 027 0.02 mm
b. Above 300 mm to 500 mm (Issue 1) 0.03 mm
c. Above 500 mm to 1000 mm 0.05 mm
d. Above 1000 mm to 2000 mm 0.10 mm
A43. Measuring Tape JIS B 7512: 2018

a. Up to 1 m QCD/TRSG/Procedure 029 0.16 mm
b. Above 1 m up to 5 m (Issue 1) 0.36 mm
c. Above 5 m up to 10 m 0.51 mm
d. Above 10 m up to 20 m 0.72 mm
e. Above 20 m up to 30 m 0.88 mm
f. Above 30 m up to 50 m 1.2 mm
g. Above 50 m up to 100 m 1.6 mm
A44. Laser Scan Micrometer In-house Procedure

a. 0 mm to 10 mm QCD/TRSG/SEAMS-0038 0.5 m
b. Above 10 mm to 25 mm (Issue 2) 0.7 m
A45. Surface Roughness Tester In-house Procedure 0.12 m

QCD/TRSG/SEAMS-0026
(Issue 2)
A46. Surface Roughness Specimen In-house Procedure 0.10 m

QCD/TRSG/SEAMS-0026
(Issue 2)


B MECHANICAL Lab Environmental Conditions:
B1. Pneumatic Absolute Pressure TEMPERATURE (20±1) °C

Measuring Instruments HUMIDITY (55 ± 10) %RH.
Range In-house Procedure

a) (800 to 1150) mbar abs QCD/TRSG/P02 (Issue 5) 0.2 mbar abs
b) (0.005 to 0.05) bar abs 0.0007 bar abs
c) (0.05 to 1) bar abs 0.002% of Rdg -0.0002 bar abs
d) (1 to 2) bar abs 0.005% Rdg + 0.00007 bar abs
e) (0.05 to 35) bar abs 0.005% of Rdg + 0.001 bar abs
f) (1 to 70) bar abs 0.004% of Rdg + 0.004 bar abs
B2. Hydraulic Absolute Pressure

Measuring Instruments

a) (14.5 to 1000) psi abs QCD/TRSG/P01 (Issue 5) 0.3 psi abs
b) (14.5 to 20000) psi abs 0.012% of Rdg+0.09 psi abs
c) (14.5 to 30000) psi abs 0.028% of Rgd+0.23 psi abs
B3. Pneumatic Gauge Pressure &

Differential Pressure

a) (0 to 0.07) bar QCD/TRSG/P04 (Issue 5) 0.0001 bar
b) (0 to 0.35) bar Low or Negative port of the 0.00016 bar
c) (0 to 1) bar Differential pressure 0.004% of Rdg + 0.00005 bar
d) (0 to 2) bar measuring instruments will 0.012% of Rdg +0.00001 bar
e) (0 to 35) bar be opened to atmosphere 0.008% of Rdg + 0.00003 bar
f) (0 to 70) bar while calibration 0.007% of Rdg + 0.0004 bar
g) (0 to 200) bar 0.09 bar
B4. Negative Pressure

a) (0 to -0.07) bar QCD/TRSG/P05 (Issue 6) 0.0001 bar
b) (0 to -0.95) bar 0.00011 bar


B5. Differential Pressure Measuring In-house Procedure

Instruments QCD/TRSG/P06 (Issue 5)
Range Calibration of Differential
a) (-2.5 to 2.5) mbar pressure measuring instruments 0.009 mbar
b) (-25 to 25) mbar with low and high pressure ports 0.013 mbar
are connected to the reference
master.
B6. Hydraulic Gauge Pressure & In-house Procedure

Differential Pressure QCD/TRSG/P08 (Issue 5)
Measuring Instruments Low or Negative port of the
Range Differential pressure measuring
a) (0 to 20000) psi instruments will be opened to 0.012% of Rdg + 0.09 psi
b) (0 to 60000) psi atmosphere while calibration 0.026% of Rdg + 1 psi
c) (0 to 10000) psi 0.009% of Rdg + 0.55 psi
(Using Distilled water)
B7. Deadweight Testers (DWT)

Type
Hydraulic Oil DWT and In-house Procedure
Distilled Water DWT QCD/TRSG/P07 (Issue 5)
Range
(10 to 1000) psi 0.014% of reading
(100 to 20000) psi 0.097% of reading
B8. Force Gauge (with bourdon tube

element)
a) (0 to 10000) psi QCD/TRSG/P11 (Issue 5) 0.001 % of Rdg + 12 psi
(Reported CMC value has been
calculated for a force gauge with
a range of 1000 mTonf and Area
of 227.08 in2)


B9. Tachometer (Non-contact/

Stroboscope)
a) (6 to 99) rpm QCD/TRSG/P19 (Issue 4) 0.0094 rpm
b) (100 to 999) rpm 0.081 rpm
c) (1000 to 4999) rpm 0.11 rpm
d) (5000 to 9999) rpm 0.12 rpm
e) (10000 to 49999) rpm 1.1 rpm
f) (50000 to 99999) rpm 1.2 rpm
Tachometer (Contact type)

Range
a) (30 to 99) rpm 0.23 rpm
b) (100 to 999) rpm 0.52 rpm
c) (1000 to 4999) rpm 2.0 rpm
d) (5000 to 9999) rpm 2.0 rpm
B10. On-Site Calibration of Absolute,

Gauge & Differential Pressure In-house Procedure
Measuring Instruments QCD/TRSG/SP01 (Issue 6)
B10.1 Pneumatic Absolute Pressure Low or Negative port of the

Measuring Instruments Differential pressure measuring
a) (800 to 1150) mbar abs instruments will be opened to 0.3 mbar abs
b) (0.005 to 0.05) bar abs atmosphere while calibration 0.0013 bar abs
c) (> 0.05 to 2) bar abs 0.002 bar abs
d) (0.07 to 20) bar abs 0.021 bar abs
e) (1 to 70) bar abs 0.07 bar abs
B10.2 Hydraulic Absolute Pressure

a) (0.07 to 20) bar abs 0.021 bar abs
b) (1 to 70) bar abs 0.07 bar abs


B10.3 Pneumatic Gauge Pressure &

Differential Pressure Measuring
Instruments
a) ( 0 to 0.07 ) bar 0.0001 bar
b) ( 0 to 0.35 ) bar 0.00014 bar
c) ( 0 to 1 ) bar 0.0003 bar
d) ( 0 to 2 ) bar 0.0009 bar
e) ( 0 to 6 ) bar 0.0025 bar
f) ( 0 to 7 ) bar 0.0046 bar
g) ( 0 to 20 ) bar 0.009 bar
h) ( 0 to 35 ) bar 0.023 bar
i) ( 0 to 100 ) bar 0.05 bar
j) ( 0 to 200 ) bar 0.23 bar
B10.4 Hydraulic Gauge Pressure &

Differential Pressure Measuring
Instruments
a) ( 0 to 90 ) psi 0.04 psi
b) ( 0 to 300 ) psi 0.12 psi
c) ( 0 to 500 ) psi 0.35 psi
d) ( 0 to 1500 ) psi 0.6 psi
e) ( 0 to 3700 ) psi 1.5 psi
f) ( 0 to 5000 ) psi 3.1 psi
g) ( 0 to 10000 ) psi 7 psi
h) ( 0 to 15000 ) psi 6 psi
i) ( 0 to 20000 ) psi 14 psi
j) ( 0 to 45000 ) psi 11 psi
B10.5 Negative Pressure Measuring

Instruments
Range
a) (0 to -0.07 ) bar 0.0001 bar
b) (0 to -0.95 ) bar 0.00042 bar


INSTRUMENTS/ RANGE TO METHOD MEASUREMENT
B10.6 Differential Pressure Measuring Calibration of Differential pressure

Instruments measuring instruments with low and
high pressure ports are connected to
the reference master high pressure
a) (-2.5 to 2.5) mbar ports are connected to the 0.012 mbar
b) (-25 to 25) mbar reference master 0.033 mbar
B11. Weighing Scales/Balances In-house Calibration Procedure

(Lab /On-site) QCD/TRSG/SEAMS-0006 (Issue 2)
a Up to 2 mg 0.01 mg
b Above 2 mg to 1 g 0.02 mg
c Above 1 g to 6 g 0.03 mg
d. Above 6 g to 62g 0.0001 g
e. Above 62 g to 400 g 0.0002 g
f. Above 400 g to 1000 g 0.003 g
g. Above 1000 g to 1500 g 0.003 g
h. Above 1500 g to 5000 g 0.03 g
i. Above 5 kg to 10 kg 0.04 g
j. Above 10 kg to 30 kg 0.10 g
k. Above 30 kg to 60 kg 0.30 g
l. Above 60 kg to 130 kg 0.002 kg
B12. Push/Pull Gauge In-house Calibration Procedure

(Lab/On-Site) QCD/TRSG/SEAMS-0002 (Issue 2)
a. Up to 1 kgf 0.0002 kgf
b. Above 1 kgf to 10 kgf 0.002 kgf
c. Above 10 kgf to 50 kgf 0.02 kgf
d. Above 50 kgf to 110 kgf 0.03 kgf
B13. Tension Gauges In-house Calibration Procedure

(Lab/On-Site) QCD/TRSG/SEAMS-0003 (Issue 2)
Up to 50 gf 0.2 gf
Above 50 gf to 500 gf 0.7 gf
Above 500 gf to 2000 gf 7 gf
Above 2 kgf to 50 kgf 0.28 kgf


B14. Standard Weights In-house Calibration Procedure

a. 100 mg to 500 mg QCD/TRSG/SEAMS-0021 0.0002 g
(OIML Class M2 and below) (Issue 2)
b. 1g to 20g 0.0002 g
(OIML Class M1 and below)
c. 50g 0.0002 g
(OIML Class F2 and below)
d. 100 g to 200 g 0.0003 g

e. 500 g 0.003 g
f. 1000 g 0.003 g
OIML Class F2 and below)
g. 2 kg to 5 kg 0.04 g
h. 10 kg 0.05 g
i. 20 kg 0.05 g
B15. Force Measuring Devices In-house Calibration Procedure

(Tension and Compression- Lab) QCD/TRSG/SEAMS-0024
Loadcell, Crane Scale, Force (Issue 3)
Gauge, Dynamometer, Proving ASTM E74-18
Rings, Load Links and Load Pins
a. 0 kN to 5 kN Using Loadcell 0.04 % of full scale
b. 5 kN to 10 kN 0.03 % of full scale
c. 10 kN to 50 kN 0.03 % of full scale
d. 50 kN to 100 kN 0.05 % of full scale
e. 100 kN to 300 kN 0.03 % of full scale
f. 300 kN to 500 kN 0.04 % of full scale
g. 500 kN to 800 kN 0.09 % of full scale
h. 800 kN to 1000 kN 0.14 % of full scale
a. 0 N to 50 N Using Weights 0.03 % of full scale

b. 50 N to 500 N 0.03 % of full scale
c. 500 N to 1100 N 0.02 % of full scale


B16. Force Measuring System In-house Calibration Procedure

(Tension and Compression) QCD/TRSG/SEAMS-0031
(On-Site) (Issue 2)
Universal Testing Machine, (BS EN ISO 7500-1:2018)
Compression Testing Machine,
Tension Testing Machine
a. 0 kN to 0.2 kN 0.20 % of full scale
c. 0.2 kN to 0.5 kN 0.20 % of full scale
c. 0.5 kN to 1 kN 0.20 % of full scale
d. 1 kN to 5 kN 0.10 % of full scale
e. 5 kN to 20 kN 0.15 % of full scale
f. 20 kN to 100 kN 0.16 % of full scale
g. 100 kN to 500 kN 0.08 % of full scale
h. 500 kN to 1500 kN 0.05 % of full scale
i. 1500 kN to 3000 kN 0.17 % of full scale
B17. Aircraft Weighing Platform In-house Calibration Procedure

a. 0 lbf to 6000 lbf QCD/TRSG/SEAMS-0036 5 lbf
b. 6000 lbf to 12000 lbf (Issue 2) 6 lbf
c. 12000 lbf to 24000 lbf 11 lbf
d. 24000 lbf to 36000 lbf 14 lbf
e. 36000 lbf to 48000 lbf 18 lbf
f. 48000 lbf to 60000 lbf 22 lbf
B18. Cable Tensiometer In-house Calibration Procedure

0 lbf to 500 lbf QCD/TRSG/SEAMS-0027 2 lbf (using 1/8” cable)
500 lbf to 1600 lbf (Issue 2) 12 lbf (using 1/4” cable)
1600 lbf to 3000 lbf 19 lbf (using 1/4” cable)
3000 lbf to 3500 lbf 30 lbf (using 3/8” cable)
B19.a Torque Wrenches/ Gauges ISO 6789 - 2:2017

0 to 813 N∙m QCD/TRSG/Procedure036 1 % of reading
(Issue 1)
B19.b Torque Wrenches/ Gauges ISO 6789:2003

(withdrawn and superseded)
Up to 3000 lbf∙ft QCD/TRSG/Procedure 037 1 % of reading
(Issue 2)


B20. Torque Multiplier QCD/TRSG/Procedure020

Up to 5000 lbf∙ft (Issue 2) 0.65 % of mean output
B21. Torque Meter QCD/TRSG/Procedure 024

(Issue 2)
B21.1 Using Torque Arm and Weights

Up to 2 N∙m 0.30 % of reading
Above 2 N∙m to 4 N∙m 0.37 % of reading
Above 4 N∙m to 10 N∙m 0.37 % of reading
B21.2 Using Transducer

Up to 4 lbf∙in 0.021 lbf∙in
Above 4 lbf∙in to 10 lbf∙in 0.049 lbf∙in
B22. Rockwell Hardness Testing QCD/TRSG/Procedure 031

Machine (Scale HRC, HRBW, (Issue 3)
HRN, HRT etc.) (Lab/On-Site)
HRC Scale ASTM E18 - 22 0.4 HRC

(In-direct method only)
HRBW Scale 0.6 HRBW


C. TEMPERATURE
C1. Contact temperature sensors In-house Procedure Conditions:
With indicators QCD/TRSG/T01(Issue 1) Temperature: (23 ± 2) °C
Humidity: (55 ± 10) %RH
Range
(-80 to -40) °C 0.06 °C
(-40 to 5) °C 0.03 °C
(5 to 95) °C 0.02 °C
(95 to 150) °C 0.03 °C
(150 to 250) °C 0.20 °C
(250 to 400) °C 0.24 °C
(400 to 660) °C 0.59 °C
C2. Contact temperature sensors In-house Procedure

Without indicators QCD/TRSG/T03 (Issue 2)
Range
(-80 to -40) °C 0.06 °C
(-40 to 5) °C 0.03 °C
(5 to 95) °C 0.02 °C
(95 to 150) °C 0.03 °C
(150 to 250) °C 0.20 °C
(250 to 400) °C 0.24 °C
(400 to 660) °C 0.59 °C
C3.a T/C Sensor with and without In-house Procedure

Indicators QCD/TRSG/T01(Issue1)
Range QCD/TRSG/T03 (Issue 2)
(-80 to -40) °C 0.24 °C
(-40 to 0) °C 0.13 °C
(0 to 50) °C 0.07 °C
(50 to 100) °C 0.13 °C
(100 to 150) °C 0.23 °C
(150 to 250) °C 0.32 °C
(250 to 420) °C 0.34 °C
(420 to 660) °C 0.83 °C
(660 to 700) °C 1.5 °C
(700 to 1000) °C 1.8 °C
(1000 to 1200) °C 4.9 °C

CALIBRATION &
MEASURED QUANTITIES/ METHOD MEASUREMENT
INSTRUMENTS/ RANGE TO BE CAPABILITY
CALIBRATED (CMC*)
C3.b T/C Extension/Compensation Cable In-house Procedure

QCD/TRSG/T03 (Issue 2)
Type B
(0 to 50) °C 0.025 µV
Type J
(0 to 50) °C 2.355 µV
Type K
(0 to 50) °C 1.844 µV
Type R
(0 to 50) °C 0.278 µV
Type S
(0 to 50) °C 0.279 µV
Type T
(0 to 50) °C 1.863 µV
Type E
(0 to 50) °C 2.776 µV
Type N
(0 to 50) °C 1.219 µV


C4. Temperature Dry Block In-house Procedure

Calibrators QCD/TRSG/T04 (Issue 4)
Range
(-40 to -25) °C 0.26 °C
(-25 to 150) °C 0.14 °C
(150 to 400) °C 0.12 °C
(400 to 660) °C 0.25 °C
(660 to 1200) °C 4.6 °C
C5. RTD Simulator / Calibrator In-house Procedure

Range
(-200 to -80) °C 0.037 °C
(-80 to 100) °C 0.072 °C
(100 to 300) °C 0.10 °C
(300 to 400) °C 0.12 °C
(400 to 630) °C 0.16 °C
(630 to 800) °C 0.19 °C
C6. TC Simulator / Calibrator, TC In-house Procedure

Indicator without sensor QCD/TRSG/T02 (Issue 3)
Type J
(-210 to -100) °C 0.21 °C
(-100 to 800) °C 0.13 °C
(800 to 1200) °C 0.13 °C
Type K
(-250 to -200) °C 0.74 °C
(-200 to -100) °C 0.25 °C
(-100 to 500) °C 0.15 °C
(500 to 800) °C 0.14 °C
(800 to 1372) °C 0.17 °C
Type R
(-50 to -25) °C 0.66 °C
(-25 to 0) °C 0.54 °C
(0 to 100) °C 0.47 °C
(100 to 400) °C 0.34 °C
(400 to 600) °C 0.26 °C
(600 to 1000) °C 0.25 °C
(1000 to 1767) °C 0.28 °C


Type S
(-50 to -25) °C 0.62 °C
(-25 to 0) °C 0.52 °C
(0 to 100) °C 0.46 °C
(100 to 400) °C 0.35 °C
(400 to 600) °C 0.28 °C
(600 to 1000) °C 0.27 °C
(1000 to 1767) °C 0.31 °C
Type B
(300 to 500) °C 2.40 °C
(500 to 600) °C 0.97 °C
(600 to 800) °C 0.41 °C
(800 to 1550) °C 0.33 °C
(1550 to 1820) °C 0.26 °C
Type T
(-250 to -200) °C 0.56°C
(-200 to -100) °C 0.25 °C
(-100 to 400) °C 0.16 °C
Type E
(-250 to -200) °C 0.52 °C
(-200 to -100) °C 0.22 °C
(-100 to 0) °C 0.15 °C
(0 to 600) °C 0.12 °C
(600 to 1000) °C 0.14 °C
Type N
(-250 to -200) °C 0.96 °C
(-200 to -100) °C 0.30 °C
(-100 to 0) °C 0.16 °C
(0 to 800) °C 0.14 °C
(800 to 1300) °C 0.15 °C

CALIBRATION &
METHOD MEASUREMENT
CAPABILITY
CALIBRATED
(CMC*)
C7. RTD Indicator without sensor In-house Procedure

Range QCD/TRSG/T02 (Issue 3)
(-200 to -80) °C 0.058 °C
(-80 to 100) °C 0.081 °C
(100 to 300) °C 0.10 °C
(300 to 400) °C 0.12 °C
(400 to 630) °C 0.14 °C
(630 to 800) °C 0.27 °C
C8. Thermohyrograph / In-House Procedure

Thermohygrometer / Air Probes QCD/TRSG/T06 (Issue 2)
(10 to 20) °C 0.22 °C

(10 to 95) %RH %RH: % Relative Humidity 2.0 %RH
(20 to 40) °C 0.20 °C

(10 to 60) %RH 1.7 %RH
(20 to 40) °C 0.20 °C

(60 to 95) %RH 1.9 %RH
(40 to 70) °C 0.20 °C

(10 to 60) %RH 1.7 %RH
(40 to 70) °C 0.32 °C

(60 to 95) %RH 2.1 %RH
(-40 to 0) °C 0.16 °C
(70 to 100) °C 0.46 °C
C9. Calibration of Dew/Frost Point In-House Procedure

a. Meters / Transmitters QCD/TRSG/T09 (Issue 3)
(-75 to -40) °C fp 0.80 °C fp

(-40°C fp to 20 °C dp) 0.46 °C dp/fp

CALIBRATION &
METHOD MEASUREMENT
CAPABILITY
CALIBRATED
(CMC*)
C10. Infrared Thermometers / Thermal In-House Procedure

Imagers QCD/TRSG/T07 (Issue 1)
(-20 to 50) °C 0.56 °C
(50 to 150) °C 0.96 °C
(150 to 350) °C 1.8 °C
(350 to 500) °C 2.3 °C
(500 to 700) °C 3.1 °C
(700 to 1000) °C 4.6 °C
C11. Liquid-In-Glass Thermometer In-house Procedure

(Partial-immersion) QCD/TRSG/T08 (Issue 2)
a. Least scale division: 0.1°C
(-75 to -20) °C 0.16 °C
(-20 to 150) °C 0.36 °C
(150 to 250) °C 0.72 °C
b. Least scale division: 0.2°C

(-75 to -20) °C 0.26 °C
(-20 to 150) °C 0.41 °C
(150 to 250) °C 0.74 °C
c. Least scale division: 0.4°C

(-75 to -20) °C 0.48 °C
(-20 to 150) °C 0.60 °C
(150 to 250) °C 0.85 °C


C12. Surface Probe Calibration In-house Procedure

With Indicators QCD/TRSG/T11 (Issue 1)
0 °C 0.2 °C
(50 to 100) °C 1.4 °C
(100 to 150) °C 1.5 °C
(150 to 200) °C 1.6 °C
(200 to 250) °C 1.7 °C
(250 to 300) °C 1.8 °C
(300 to 350) °C 1.9 °C
Without Indicators
TYPE E, J & K
0 °C 0.2 °C
(50 to 100) °C 1.4 °C
(100 to 150) °C 1.5 °C
(150 to 200) °C 1.6 °C
(200 to 250) °C 1.7 °C
(250 to 300) °C 1.8 °C
(300 to 350) °C 1.9 °C
C13. Site Calibration of Temperature In-house Procedure

sensors with indicators QCD/TRSG/ST01(Issue 1)
(-25 to 150) °C 0.14 °C
(150 to 200) °C 0.22 °C
(200 to 420) °C 0.42 °C
(420 to 660) °C 0.61 °C


C14. Site Calibration of Contact In-house Procedure

Temperature sensors without QCD/TRSG/ST01(Issue 1)
indicators
(-25 to 0) °C 0.36 °C
(0 to 150) °C 0.30 °C
(150 to 200) °C 0.34 °C
(200 to 420) °C 0.50 °C
(420 to 660) °C 0.66 °C
C15. Site Calibration of T/C Sensors In-house Procedure

with Indicators QCD/TRSG/ST01 (Issue 1)
(650 to 1000) °C 3.3 °C
(1000 to 1200) °C 4.4 °C
C16. Site Calibration of T/C Sensors In-house Procedure

without Indicators QCD/TRSG/ST01 (Issue 1)
(650 to 1000) °C 3.3 °C
(1000 to 1200) °C 4.4 °C
C17. Site Calibration of Dry Block In-house Procedure

Calibrators QCD/TRSG/ST03 (Issue 1)
(-40 to -25) °C 0.34 °C
(-25 to 400) °C 0.20 °C
(400 to 660) °C 0.26 °C
(660 to 1200) °C 4.7 °C
C18. Site Calibration of RTD Indicator In-house Procedure

without sensor QCD/TRSG/ST02 (Issue 2)
(-200 to -80) °C 0.046 °C
(-80 to 100) °C 0.07 °C
(100 to 300) °C 0.092 °C
(300 to 400) °C 0.12 °C
(400 to 630) °C 0.14 °C
(630 to 800) °C 0.24 °C


C19. Site Calibration of T/C Simulator / In-house Procedure

Calibrator, TC Indicator without QCD/TRSG/ST02 (Issue 2)
sensor
Type J
(-210 to -100) °C 0.47 °C
(-100 to -30) °C 0.30 °C
(-30 to 150) °C 0.27 °C
(150 to 760) °C 0.27 °C
(760 to 1200) °C 0.29 °C
Type K
(-200 to -100) °C 0.47 °C
(-100 to -25) °C 0.37 °C
(-25 to 120) °C 0.22 °C
(120 to 1000) °C 0.31 °C
(1000 to 1372) °C 0.43 °C
Type R
(0 to 250) °C 0.96 °C
(250 to 400) °C 0.71 °C
(400 to 1000) °C 0.57 °C
(1000 to 1767) °C 0.57 °C
Type S
(0 to 250) °C 0.92 °C
(250 to 1000) °C 0.76 °C
(1000 to 1400) °C 0.65 °C
(1400 to 1767) °C 0.62 °C
Type B
300 °C to 500 °C 2.60 °C
500 °C to 800 °C 1.20 °C
800 °C to 1550 °C 0.75 °C
1550 °C to 1820 °C 0.67 °C
Type T
(-250 to -150) °C 1.2 °C
(-150 to 0) °C 0.43 °C
(0 to 120) °C 0.24 °C
(120 to 400) °C 0.26 °C


Type E
(-250 to -100) °C 0.55 °C
(-100 to -25) °C 0.25 °C
(-25 to 350) °C 0.22 °C
(350 to 650) °C 0.24 °C
(650 to 1000) °C 0.27 °C
Type N
(-200 to -100) °C 0.75 °C
(-100 to -25) °C 0.39 °C
(-25 to 120) °C 0.34 °C
(120 to 410) °C 0.30 °C
(410 to 1300) °C 0.36 °C
C20 Calibration of Temperature and In-house Procedure

Humidity Controlled Enclosures in QCD/TRSG/ST04 (Issue 1)
Permanent Laboratory & at site
(0 to 15 ) °C 0.30 °C
(5 to 10) %RH 2.1 %RH
(15 to 30 ) °C 0.65 °C
(10 to 90) %RH 4.2 %RH
(0 to 70 ) °C 0.69 °C
(5 to 95 ) %RH 4.2 %RH
C21. Calibration of Temperature In-house Procedure

Controlled Enclosures and QCD/TRSG/ST04(Issue 1)
liquid baths in Permanent
Laboratory & at site
(-80 to -40) °C 0.75 °C
(-40 to 50) °C 0.34 °C
(50 to 100) °C 0.61 °C
(100 to 150) °C 0.96 °C
(150 to 400) °C 1.6 °C
(400 to 800) °C 2.0 °C
(800 to 1000) °C 2.6 °C
(1000 to 1200) °C 4.6 °C


C22 Temperature Uniformity Survey for QCD/TRSG/ST05 (Issue 2)

Furnace and Oven (Lab/Site) AMS 2750 Rev. G
Type K
(0 to 650) °C 1.7°C
(650 to 1100) °C 2.7°C
(1100 to 1300) °C 5.8 °C
Type N
(0 to 650) °C 1.6°C
(650 to 1100) °C 3.1°C
(1100 to 1300) °C 5.6°C
C23 System Accuracy Test for Furnace for QCD/TRSG/ST05 (Issue2)

Furnace and Oven (Lab/Site) AMS 2750 Rev. G
Type K
(0 to 650) °C 1.7°C
(650 to 1100) °C 2.1°C
(1100 to 1300)°C 4.8°C
Type N
(0 to 650) °C 1.6°C
(650 to 1100) °C 2.4°C
(1100 to 1300) °C 4.4°C
C24 Calibration of Temperature Control, QCD/TRSG/ST05 (Issue2)

Recording or Monitoring Instruments AMS 2750 Rev. G
(Lab/Site)
Type J Lab / Site
(-210 to -100) °C 0.18°C/0.52°C
(-100 to 0) °C 0.13°C/0.50°C
(0 to 500) °C 0.13°C/0.49°C
(500 to 800) °C 0.13°C/0.49°C
(800 to 1200) °C 0.14°C/0.49°C
Type K
(-250 to -200) °C 0.63°C/ -
(-200 to -100) °C 0.39°C/0.85°C
(-100 to 500) °C 0.17°C/0.84°C
(500 to 800) °C 0.14°C/0.51°C
(800 to 1372) °C 0.17°C/0.6°C


Type R
(-50 to -25) °C 0.69°C/1.4°C
(-25 to 0) °C 0.58°C/1.4°C
(0 to 100) °C 0.49°C/1.2°C
(100 to 400) °C 0.36°C/0.93°C
(400 to 600) °C 0.28°C/0.84°C
(600 to 1000) °C 0.27°C/0.82°C
(1000 to 1767) °C 0.29°C/0.83°C
Type S
(-50 to -25) °C 0.66°C/1.4°C
(-25 to 0) °C 0.57°C/1.4°C
(0 to 100) °C 0.49°C/1.1°C
(100 to 400) °C 0.37°C/0.93°C
(400 to 600) °C 0.29°C/0.94°C
(600 to 1000) °C 0.28°C/0.92°C
(1000 to 1767) °C 0.32°C/0.93°C
Type T
(-250 to -200) °C 0.42°C/0.98°C
(-200 to -100) °C 0.21°C/0.77°C
(-100 to 400) °C 0.15°C/0.48°C
Type E
(-250 to -200) °C 0.33°C/0.99°C
(-200 to -100) °C 0.21°C/0.99°C
(-100 to 0) °C 0.14°C/0.56°C
(0 to 600) °C 0.12°C/0.48°C
(600 to 1000) °C 0.14°C/0.47°C
Type N
(-250 to -200) °C 0.86°C/0.65°C
(-200 to -100) °C 0.28°C/0.63°C
(-100 to 0) °C 0.16°C/0.58°C
(0 to 800) °C 0.15°C/0.58°C
(800 to 1300) °C 0.16°C/0.58°C

MEASURED CALIBRATION &

QUANTITIES/ METHOD MEASUREMENT
INSTRUMENTS/ RANGE CAPABILITY (CMC*)
TO BE CALIBRATED
D. ELECTRICAL - RF In house Procedure: Lab Environmental

QCD/TRSG/RFP1 Issue:2
Dated 07 Jan 2022
Conditions:
Temperature: (23 ± 2)°C
Humidity: (55 ± 10) %RH
D1. Frequency Source 10 MHz (Specific value) 1.1E-03 Hz

0.1 Hz to 100 kHz 0.007 Hz
100 kHz to 225 MHz 1.3E-02 to 3.7E-02 Hz
100 MHz to 6 GHz 1.8E-01 to 4.2E-01 Hz
6 GHz to 12.4 GHz 5.6E-01 Hz
12.4 GHz to 26.5 GHz 1.0 to 1.6 Hz
Frequency Measure 0.1 Hz to 1 GHz 8.5E-10*Freq() to 5.8E-6*Freq()

0.1 Hz to 26.5 GHz 6.23E-10*Freq() to 8.5E-10*Freq()
D2. RF Power Source Power Level Frequency

(50Ω) 17 dBm to 50 dBm 10 MHz to 1 GHz 1.14 dB
(50mW to 100W)
0 dBm to 16 dBm 100 kHz to 18 GHz 0.2 dB to 0.61 dB
-10 dBm to 0 dBm 100 kHz to 18 GHz 0.17 dB to 0.58 dB
-40 dBm to -10 dBm 100 kHz to 18 GHz 0.17 dB to 0.58 dB
-120 dBm to -40 dBm 500 kHz to 18 GHz 0.38 dB to 0.75 dB
-120 dBm to -150 dBm 10 MHz to 3 GHz 0.61 dB to 0.65 dB
AC Voltage Source
1 mV to 20 V 10 Hz to 100 kHz 0.03 mV to 0.24 V
RF Power Measure Power Level Frequency

(50Ω) 17 dBm to 50 dBm\ 10 MHz to 1 GHz 0.51 dB
(50mW to 100W)
0 dBm to 16 dBm 500 kHz to 3 GHz 0.31 dB
-50 dBm to 0 dBm 500 kHz to 3 GHz 0.20 dB
-120 dBm to -50 dBm 500 kHz to 3 GHz 0.29 dB
16 dBm to -110 dBm 3 GHz to 18 GHz 0.43 dB


INSTRUMENTS/ RANGE METHOD MEASUREMENT
TO BE CALIBRATED CAPABILITY (CMC*)
D3. Amplitude
Modulation Modulation Depth Carrier
Source Depth: 5% to 95% fc: 150 kHz to 10 MHz 0.13 % to 2.33 % AM
fm: 50 Hz to 10 kHz
Depth: 5% to 95% fc: 10 MHz to 1.3 GHz 0.08 % to 1.25 % AM

fm: 50 Hz to 20 kHz
Depth: 5% to 95% fc: 1.3GHz to 18 GHz 0.08 % to 1.25 % AM

fm: 50 Hz to 20 kHz
AM Distortion Modulation Depth Carrier

0.01% To 5% Mod Freq 20 Hz-20 kHz Fc: 150kHz-1.3GHz
Depth <50% 0.38%
Depth <95% 0.71%
Mod Freq 20 kHz-100 kHz
Depth <50% 0.46%
Depth <95% 0.76%
D4. Frequency Frequency Deviation Carrier

Modulation Source Deviation: 200 Hz to 40 kHz fc: 250 kHz to 10 MHz 0.03 kHz to 0.94 kHz
fm: 50 Hz to 10 kHz
Deviation: 200 Hz to 400 kHz fc: 10 MHz to 1.3 GHz 0.03 kHz to 4.75 kHz
fm: 50 Hz to 20 kHz
Deviation: 1 kHz to 400 kHz fc: 1.3 GHz to 18 GHz 0.03 kHz to 4.75 kHz
fm: 50 Hz to 20 kHz
FM Distortion Frequency Deviation Carrier

0.01% To 5% Mod Freq 20Hz-10kHz fc: 150 kHz to 400 kHz 0.38%
Deviation <10kHz
Mod Freq 20Hz-10kHz fc: 400 kHz to 10 MHz

Deviation <10kHz 0.19%
Mod Freq 20Hz-20kHz fc: 10 MHz to 1.3 GHz 0.19%

Deviation <100kHz
Mod Freq 20 kHz-100 kHz fc: 10 MHz to 1.3 GHz 0.33%

Deviation <100 kHz


D5. Audio Distortion

0.01% To 5% Audio Frequency 20 Hz-20 kHz 0.15%
0.01% To 5% Audio Frequency 20 kHz-100 kHz 0.30%
D6. RF Pulse Power

Source Power Level Carrier
17 dBm to 60 dBm 50 MHz to 2.0 GHz 0.51 dB
-20 dBm to 17 dBm 50 MHz to 18.0 GHz 0.31 dB
-50 dBm to -20 dBm 50 MHz to 18.0 GHz 0.38 dB to 0.75 dB
Measure Power Level Carrier

10 dBm to 53 dBm 0.9 GHz to 1.2 GHz 0.51 dB
-20 dBm to 17 dBm 50 MHz to 18 GHz 0.30 dB
D7. Time Interval / Period

(Source/Measure)
Rise Time / Fall Time Range 5 ns to 10 ns 0.03 ns
Range 10 ns to 100 ns 0.35 ns
Range 100 ns to 1 μs 1.8 ns
Range 1 μs to 10 μs 0.035 μs
Pulse Width Range 5ns to 10ns 0.03 ns

Range 10ns to 100ns 0.35 ns
Range 100ns to 1 μs 1.8 ns
Range 1 to 10 μs 0.035 μs
Range 100 μs to 1ms 3.5 μs
Range 1ms to 10ms 0.035 ms
Range 100ms to 1s 3.5 ms
Period / Time Interval Range 5ns to 10ns 0.03 ns

Range 10ns to 100ns 0.35 ns
Range 100ns to 1 μs 1.8 ns


Period / Time Interval Range 10 to 100 μs 0.35 μs

(continue) Range 100 μs to 1ms 3.5 μs
Range 100ms to 1s 3.5 ms
D8. VSWR (Source)

1.05 to 2.0 5 MHz to 2 GHz 0.07
D9. Instrument Landing System (ILS) Phase

(Source/Measure)
Source
0 deg to 359.9 deg Baseband 0.13°
Measure
0 deg to 359.9 deg Baseband 0.13°
VHF Omni-Directional Ranging (VOR)

Bearing (Phase)
Source
0 deg to 360 deg RF 0.06°
Baseband 0.06°
Measure
0 deg to 360 deg Baseband 0.08°
# Frequency Source and Measurement using the same 10 MHz reference.


ELECTRICAL
- Time and Frequency
D10. Calibration of Oscilloscopes In-house procedure

a. AC Voltage Amplitude QCD/TRSG/EP02 (Issue 1)
(1 mV to 130 V p-p) 0.77 %
b. Frequency Response (Flatness)

(0.07Vp-p to 5Vp-p)
50 kHz to 100 MHz 2.4 %
100 MHz to 300 MHz 2.8 %
300 MHz to 500 MHz 4.4 %
500 MHz to 600 MHz 5.0 %
600 MHz to 1100 MHz 7.2 %
c. Timebase
2 ns to 20 ns 75 µs/s
20 ns to 200 ns 3.4 µs/s
0.2 µs to 20 µs 29 µs/s
20 µs to 200 ms 2.9 µs/s
200 ms to 5s 34 µs/s
d. Rise Time
>= 300 ps 120 ps
D11. Calibration of Time Interval In-house procedure

Measuring Instruments QCD/TRSG/EP17 (Issue 1)
1 s to 60 s 0.001 s
60 s to 1800 s 0.007 s
1800 s to 99999 s 0.37 s
D12. Calibration of Time Interval In-house procedure

Measuring Instruments QCD/TRSG/SE05 (Issue 1)
(Lab/ On-Site+)
1 s to 60 s 0.01 s
60 s to 900 s 0.02 s
900 s to 7200 s 0.38 s
7200 s to 99999 s 1.4 s


D13. Calibration of Frequency measuring In-house procedure

instruments QCD/TRSG/EP25 (Issue 1)
100 mHz to 100 Hz 0.001 Hz
100 Hz to 1000 Hz 0.004 Hz
1 kHz to 10 kHz 0.04 Hz
100 kHz to 1000 kHz 0.01 kHz
1 MHz to 10 MHz 0.1 kHz
10 MHz to 600 MHz 0.01 MHz
D14. Calibration of Frequency sourcing In-house procedure

100 mHz to 1.0 Hz 0.22 mHz

1 Hz to 100 Hz 0.44 mHz
100 Hz to 1000 Hz 3.2 mHz
100 kHz to 1000kHz 3.2 Hz
1 MHz to 10 MHz 32 Hz
10 MHz to 225 MHz 0.01 MHz
Lab/On-Site+ (for items D10 to D11)
D15. Frequency measuring instruments In-house procedure

QCD/TRSG/SE06 (Issue 1)
0.01 Hz to 119.99 Hz 0.001 Hz
120.0 Hz to 1199.9 Hz 0.1 Hz
1.200 kHz to 11.999 kHz 0.001 kHz
12.00 kHz to 119.99 kHz 0.01 kHz
120 kHz to 1199.9 kHz 0.1 kHz
1.200 MHz to 2.000 MHz 0.001 MHz
D16. Frequency Sourcing Instruments In-house procedure

100 mV to 750 V 3 Hz to 5 Hz 0.0062 Hz

5 Hz to 10 Hz 0.0062 Hz
10 Hz to 40 Hz 0.014 Hz
40 Hz to 500 Hz 0.058 Hz
500 Hz to 5 kHz 0.00058 kHz
5 kHz to 50 kHz 0.0058 kHz
50 kHz to 300 kHz 0.035 kHz


ELECTRICAL – DC/LF
D17. Calibration of Resistance Measuring In-house procedure
1.9  0.00021 
10  0.00028 
19  0.00053 
100  0.0012 
190  0.0022 
1 k 0.0000078 k
1.9 k 0.000015 k
10 k 0.000077 k
19 k 0.00015 k
100 k 0.0010 k
190 k 0.0019 k
1 M 0.000016 M
1.9 M 0.000040 M
10 M 0.00048 M
19 M 0.0011 M
100 M 0.012 M
0  to 10.99  0.0019 
11  to 32.999  0.0033 
33  to 109.999  0.0056 
110  to 329.999  0.014 
330  to 1.09999 k 0.041 
1.1 k to 3.29999 k 0.14 
3.3 k to 10.9999 k 0.44 
11 k to 32.9999 k 0.0014 k
33 k to 109.999 k 0.0040 k
110 k to 329.999 k 0.015 k
330 k to 1.09999 M 0.045 k
1.1 M to 3.29999 M 0.28 k
3.3 M to 10.9999 M 0.0019 M
11 M to 32.9999 M 0.013 M
33 M to 109.999 M 0.068 M
110 M to 330 M 1.8 M
330 M to 1100 M 20 M


(CMC*)
D18. Calibration of Milli- Ohmmeters /

Micro- Ohmmeters / Insulation
Testers In-house procedure
0.001  QCD/TRSG/EP10 (Issue 1) 0.84 
0.01  0.0061 m
0.1  0.024 m
1.0  0.24 m
1.9  0.44 m
19  4.4 m
100  0.023 
1 k 0.23 
QCD/TRSG/EP12 (Issue 1)
100  to 1 k 100  / Step 0.87 
1 k to 10 k 1 k / Step 8.2 
10 k to 100 k 10 k / Step 0.088 k
100 k to 1 M 100 k / Step 0.0059 M
1 M to 10 M 1 M / Step 0.024 M
10 M to 100 M 10 M / Step 0.25 M
100 M to 1000 M 100 M / Step 6.1 M
1G  to 10 G 1 G / Step 0.062 G
10 G to 100 G 10 G / Step 1.3 G
100 G to 1000 G 100 G / Step 12 G
D19. Calibration of Resistance Sourcing

Instruments (2 wire or 4 wire) In-house procedure
1m to 10 m QCD/TRSG/EP18 (Issue 1) 0.00038 m
10 m to 100 m 0.0027 m
100 m to 1000 m 0.028 m
1 to 10  QCD/TRSG/EP09 (Issue 1) 0.36 m

10  to 100  0.0026 
100  to 1 k 0.025 
1 k to 10 k 0.25 
10 k to 100 k 0.0030 k
100 k to 1 M 0.098 k
1 M to 10 M 0.00051 M
10 M to 100 M 0.058 M
100 M to 1 G 0.0046 G


D20. Calibration of DC Voltage

Measuring instruments In-house procedure
0 to 220.0 mV QCD/TRSG/EP16 (Issue 1) 8.1 µV/V + 0.4 µV
0.22 V to 2.2 V 5.1 µV/V + 0.76 µV
2.2 V to 11 V 3.6 µV/V + 2.5 µV
11.0 V to 22.0 V 3.6 µV/V + 4.9 µV
22.0 V to 220.0 V 5.1 µV/V + 46 µV
220.0 V to 1100.0 V 6.6 µV/V + 0.42 mV
1 kV to 30 kV QCD/TRSG/EP19 (Issue 1) 1.5 % of reading
D21. Calibration of DC Voltage In-house procedure

sourcing instruments QCD/TRSG/EP09 (Issue 1)
0.1 mV to 1 mV 0.00024 mV
1 mV to 10 mV 0.00048 mV
10 mV to 100 mV 0.0027 mV
100 mV to 1 V 0.000021 V
1 V to 10 V 0.00017 V
10 V to 100 V 0.0020 V
100 V to 1000 V 0.026 V
1 kV to 10 kV QCD/TRSG/EP03 (Issue 1) 1.5% of reading
D22. Calibration of AC Voltage In-house procedure

measuring instruments QCD/TRSG/EP16 (Issue 1)
2.2 to 22 mV 10 Hz to 20 Hz 0.036 % + 4.6 µV
20 Hz to 40 Hz 0.018 % + 4.6 µV
0.04 kHz to 20 kHz 0.013 % + 4.6 µV
20 kHz to 50 kHz 0.029 % + 4.6 µV
50 kHz to 100 kHz 0.063 % + 5.8 µV
100 kHz to 300 kHz 0.14 % + 12 µV
300 kHz to 500 kHz 0.18 % + 23 µV
0.5 MHz to 1MHz 0.34 % + 23 µV
22 to 220 mV 10 Hz to 20 Hz 0.033 % + 19 µV
20 Hz to 40 Hz 0.012 % + 14 µV
0.04 kHz to 20 kHz 0.0072 % + 19 µV
20 kHz to 50 kHz 0.015 % + 14 µV
50 kHz to 100 kHz 0.038 % + 26 µV
100 kHz to 300 kHz 0.078 % + 37 µV
300 kHz to 500 kHz 0.16 % + 42 µV
0.5 MHz to 1 MHz 0.32 % + 0.12 mV


Calibration of AC Voltage
measuring instruments (Continue)
0.22 to 2.2 V 10 Hz to 20 Hz 0.28 % + 54 µV
20 Hz to 40 Hz 0.011 % + 43 µV
0.04 kHz to 20 kHz 0.0057 % + 62 µV
20 kHz to 50 kHz 0.010 % + 66 µV
50 kHz to 100 kHz 0.012 % + 74 µV
100 kHz to 300 kHz 0.042 % + 0.21 mV
300 kHz to 500 kHz 0.14 % + 0.33 mV
0.5 MHz to 1 MHz 0.21 % + 0.85 mV
2.2 to 22 V 10 Hz to 20 Hz 0.32 % + 1.9 mV

20 Hz to 40 Hz 0.012 % + 0.66 mV
0.04 kHz to 20 kHz 0.0053 % + 0.64 mV
20 kHz to 50 kHz 0.0086 % + 0.66 mV
50 kHz to 100 kHz 0.011 % + 0.69 mV
100 kHz to 300 kHz 0.033 % + 0.19 mV
300 kHz to 500 kHz 0.12 % + 3.1 mV
0.5 MHz to 1 MHz 0.20 % + 12 mV
22 V to 220 V 10 Hz to 20 Hz 0.032 % + 19 mV
20 Hz to 40 Hz 0.012 % + 19 mV
0.04 kHz to 20 kHz 0.0065 % + 62 mV
20 kHz to 50 kHz 0.011 % + 81 mV
50 kHz to 100 kHz 0.019 % + 10 mV
100 kHz to 300 kHz 0.11 % + 22 mV
300 kHz to 500 kHz 0.51 % + 48 mV
0.5 MHz to 1 MHz 0.93 % + 0.1 mV
220 V to 250 V 15 Hz to 50Hz 0.35 % + 59 mV
220 V to 1100 V 50 Hz to 1 kHz 0.0087 % + 43 mV
220 V to 1020 V 1 kHz to 5 kHz 0.31 V

5 kHz to 10 kHz 0.37 V
In-house procedure
1 kV to 5 kV QCD/TRSG/EP19 (Issue 1) 2.2 % of reading


D23. Calibration of AC Voltage sourcing In-house procedure

1 mV to 10 mV 40 Hz to 2 kHz 0.031 mV
2 kHz to 20 kHz 0.050 mV
10 mV to 100 mV 40 Hz to 2 kHz 0.045 mV

100 mV to 1 V 0.04 kHz to 20 kHz 0.00067 V

20 kHz to 100 kHz 0.0017 V
1 V to 100 V 0.04 kHz to 20 kHz 0.0035 V

20 kHz to 100 kHz 0.16 V
100 V to 1000 V 40 Hz to 2 kHz 0.45 V

In-house procedure
1 kV to 10 kV 50 Hz 2.2% of reading
10 kV to 100 kV 50 Hz 1.5 % of reading
D24. Calibration of DC Current In-house procedure

Measuring Instruments QCD/TRSG/EP16 (Issue 1)
0 A to 220 A 47 µA/A + 6.9 nA

0.22 mA to 2.2 mA 41 µA/A + 9.6 nA
2.2 mA to 22 mA 41 µA/A + 76 nA
22 mA to 100 mA 53 µA/A + 1.1 µA
100 mA to 220 mA 64 µA/A + 1.1 µA
0.22 A to 1.0 A 93 µA/A + 1.4 µA
1.0 A to 2.2 A 150 µA/A + 1.4 µA
2.2 A to 2.99999 A 0.0014 A
3 A to 10.9999 A 0.0070 A
11 A to 30 A QCD/TRSG/EP06 (Issue 1) 0.02 A


Using Current Coil QCD/TRSG/EP11 (Issue 1)

30 A to 50 A 0.16 A
50 A to 100 A 0.39 A
100 A to 200 A 0.69 A
200 A to 300 A 1.0 A
300 A to 400 A 1.4 A
400 A to 500 A 1.7 A
500 A to 600 A 2.2 A
600 A to 700 A 2.5 A
700 A to 800 A 2.7 A
800 A to 900 A 3.1 A
900 A to 1000 A 4.0 A
D25. Calibration of DC Current Sourcing

Instruments
In-house procedure
10 A to 100 A QCD/TRSG/EP09 (Issue 1) 0.012 µA
0.1 mA to 1 mA 0.00012 mA
1 mA to 10 mA 0.0012 mA
10 mA to 100 mA 0.024 mA
0.1 A to 1 A 0.00038 A
1 A to 5 A 60 µA/A
5 A to 20 A QCD/TRSG/EP06 (Issue 1) 40 µA/A

20 A to 50 A 160 µA/A
50 A to 100 A 0.17 A
D26. Calibration of AC Current In-house procedure

measuring instruments QCD/TRSG/EP16 (Issue 1)
33 A to 220A 10 Hz to 20 Hz 0.035 % + 18 nA
20 Hz to 40 Hz 0.020 % + 14 nA
0.04 kHz to 1 kHz 0.017 % + 12 nA
1 kHz to 5 kHz 0.033 % + 15 nA
5 kHz to 10 kHz 0.13 % + 75 nA
33 µA to 329 µA 10 kHz to 30 kHz 6.6 µA
0.22 mA to 2.2 mA 10 Hz to 20 Hz 0.033 % + 0.099 µA

20 Hz to 40 Hz 0.019 % + 0.090 µA
0.04 kHz to 1 kHz 0.013 % + 0.078 µA
1 kHz to 5 kHz 0.023 % + 0.15 µA
5 kHz to 10 kHz 0.13 % + 0.75 µA
0.33 mA to 3.2999 mA 10 kHz to 30 kHz 0.039 mA


2.2 mA to 22 mA 10 Hz to 20 Hz 0.029 % + 0.95 µA

20 Hz to 40 Hz 0.019 % + 1 µA
0.04 Hz to 1 kHz 0.012 % + 0.78 µA
1 kHz to 5 kHz 0.023 % + 0.92 µA
5 kHz to 10 kHz 0.13 % + 6.0 µA
3.3 mA to 32.999 mA 10 kHz to 30 kHz 0.16 mA
22 mA to 220 mA 10 Hz to 20 Hz 0.030 % + 8 µA
20 Hz to 45 Hz 0.020 % + 9.1 µA
45 Hz to 1 kHz 0.013 % + 7.8 µA
1 kHz to 5 kHz 0.024 % + 8.3 µA
5 kHz to 10 kHz 0.13 % + 0.017 mA
33 mA to 329.99 mA 10 kHz to 30 kHz 1.8 mA
0.22 A to 2.2 A 0.02 kHz to 1 kHz 0.030 % + 0.078 mA

1 kHz to 5 kHz 0.053 % + 1.2 mA
5 kHz to 10 kHz 0.81 % + 0.20 mA
2.2 A to 2.99999 A 10 Hz to 45 Hz 0.0064 A

45 Hz to 1 kHz 0.0023 A
1 kHz to 5 kHz 0.022 A
5 kHz to 10 kHz 0.092 A
3 A to 10.9999 A 45 Hz to 100 Hz 0.010 A

100 Hz to 1 kHz 0.015 A
11 A to 20.0 A 45 Hz to 99 Hz 0.035 A
100 Hz to 1 kHz 0.042 A
In-house procedure
20 A to 30.0 A 45 Hz to 99 Hz 0.052 A


Using Current Coil QCD/TRSG/EP11 (Issue 1)

30 A to 50 A 45 Hz to 65 Hz 0.24 A
50 A to 100 A 45 Hz to 65 Hz 0.45 A
100 A to 200 A 45 Hz to 65 Hz 0.92 A
200 A to 300 A 45 Hz to 65 Hz 1.2 A
300 A to 400 A 45 Hz to 65 Hz 1.6 A
400 A to 500 A 45 Hz to 65 Hz 2.0 A
500 A to 600 A 45 Hz to 65 Hz 2.4 A
600 A to 700 A 45 Hz to 65 Hz 2.7 A
700 A to 800 A 45 Hz to 65 Hz 3.1 A
800 A to 900 A 45 Hz to 65 Hz 3.5 A
900 A to 1000 A 45 Hz to 65 Hz 4.4 A
30 A to 50 A 400 Hz 0.56 A
50 A to 100 A 400 Hz 1.1 A
100 A to 200 A 400 Hz 3.3 A
200 A to 300 A 400 Hz 4.8 A
D27. Calibration of AC Current In-house procedure

sourcing instruments QCD/TRSG/EP09 (Issue 1)
10 A to 100 A 10 Hz to 5 kHz 0.053 A

0.1 mA to 1 mA 10 Hz to 5 kHz 0.00050 mA
1 mA to 10 mA 10 Hz to 5 kHz 0.0050 mA
10 mA to 100 mA 10 Hz to 5 kHz 0.05 mA
0.1 A to 1 A 10 Hz to 5 kHz 0.0027 A
1 A to 3 A 45 Hz to 1 kHz 0.0095 A
3 A to 10 A 45 Hz to 65 Hz 0.031 A
10 A to 20 A 45 Hz to 65 Hz 0.067 A
20 A to 100 A 45 Hz to 65 Hz 0.56 A
D28. Calibration of Electrical Power In-house procedure

Meters QCD/TRSG/EP04 (Issue 1)
DC Power In-house procedure
1 W to 300 W QCD/TRSG/EP05 (Issue 1) 0.04 %
300 W to 3000 W 0.04 %
3 kW to 20 kW 0.09 %
20 kW to 550 kW 0.65 %


AC Single Phase Power p.f.=1

1 W to 300 W 45 Hz to 65 Hz 0.17 %
300 W to 3000 W 0.16 %
3 kW to 20 kW 0.12 %
20 kW to 550 kW 0.76 %
Phase Difference 45 Hz to 65 Hz
(0 ° to 90 °) 0.30 °
AC Three Phase Power

0.045 kW to 5.4 kW 50 Hz 0.14 % of reading
5.4 kW to 5.58 kW 0.13 % of reading
5.58 kW to 270 kW 0.67 % of reading
270 kW to 279 kW 0.68 % of reading
AC Three Phase Power Factor 50 Hz

Phase Difference p.f = 0 to 1
(0 ° to 360 °) 0.5°
D29. AC Power Sourcing Devices In-house procedure

12 W to 30 W 0.09 W
30 W to 150 W 0.46 W
150 W to 300 W 0.91 W
300 W to 600 W 1.7 W
600 W to 3000 W 9.1 W
3000 W to 12000 W 36 W
(0 ° to 90 °) p.f = 0 to 1 0.27 °


D30. Calibration of Capacitance measuring In-house procedure

1nF 0.12 pF
10nF 1.2 pF
0.19 nF to 0.3999 nF 0.014 nF
0.4 nF to 1.0999 nF 0.018 nF
1.1 nF to 3.2999 nF 0.032 nF
3.3 nF to 10.999 nF 0.046 nF
11 nF to 32.999 nF 0.22 nF
33 nF to 109.99 nF 0.46 nF
110 nF to 329.99 nF 1.4 nF
0.33 µF to 1.0999 µF 4.6 nF
1.1 µF to 3.2999 µF 14 nF
3.3 µF to 10.999 µF 46 nF
11 µF to 32.999 µF 0.20 µF
33 µF to 109.99 µF 0.70 µF
110 µF to 329.99 µF 2.1 µF
330 µF to 1.1 mF 0.007 mF
1.1 mF to 3.2999 mF 0.022 mF
3.3 mF to 10.9999 mF 0.07 mF
11 mF to 32.9999 mF 0.32 mF
33 mF to 110 mF 1.5 mF
D31. Calibration of Inductance Measuring In-house procedure

Instruments QCD/TRSG/EP15 (Issue 1)
100 µH @ 1 kHz 0.027 µH

1 mH 0.18 µH


Lab/On-Site+ (for items D27 to D41)
D32 Resistance Measuring Instruments In-house procedure

0  to 10.99  0.0019 
11  to 32.999  0.0033 
33  to 109.999  0.0056 
110  to 329.999  0.014 
330  to 1.09999 k 0.041 
1.1 k to 3.29999 k 0.14 
3.3 k to 10.9999 k 0.44 
11 k to 32.9999 k 0.0014 k
33 k to 109.999 k 0.0040 k
110 k to 329.999 k 0.015 k
330 k to 1.09999 M 0.045 k
1.1 M to 3.29999 M 0.28 k
3.3 M to 10.9999 M 0.0019 M
11 M to 32.9999 M 0.013 M
33 M to 109.999 M 0.068 M
110 M to 330 M 1.8 M
330 M to 1100 M 20 M
D33. DC Voltage Measuring In-house procedure

Instruments QCD/TRSG/SE06 (Issue 1)
0 to 329.9999 mV 0.0092 mV
0.33 V to 3.299999 V 0.000050 V
3.3 V to 32.99999 V 0.00051 V
33 V to 329.9999 V 0.0072 V
330 V to 1020.000 V 0.023 V
D34. AC Voltage Measuring In-house procedure

Instruments QCD/TRSG/SE06 (Issue 1)
1.0 mV to 32.999 mV 10 Hz to 45 Hz 0.038 mV

45 Hz to 10 kHz 0.014 mV
100 kHz to 500 kHz 0.36 mV


AC Voltage Measuring
Instruments (Continue)
33 mV to 329.999 mV 10 Hz to 45 Hz 0.12 mV
45 Hz to 10 kHz 0.066 mV
100 kHz to 500 kHz 0.85 mV
0.33 V to 3.29999 V 10 Hz to 45 Hz 0.0012 V

45 Hz to 10 kHz 0.00065 V
10 kHz to 20 kHz 0.00080 V
20 kHz to 50 kHz 0.0012 V
50 kHz to 100 kHz 0.0028 V
100 kHz to 500 kHz 0.014 V
3.3 V to 32.9999 V 10 Hz to 45 Hz 0.012 V

45 Hz to 10 kHz 0.0065 V
10 kHz to 20 kHz 0.0099 V
20 kHz to 50 kHz 0.014 V
50 kHz to 100 kHz 0.036 V
33 V to 329.999 V 45 Hz to 1 kHz 0.076 V

1 kHz to 10 kHz 0.085 V
10 kHz to 20 kHz 0.10 V
20 kHz to 50 kHz 0.14 V
50 kHz to 100 kHz 0.82 V
330 V to 1020 V 45 Hz to 1 kHz 0.37 V



INSTRUMENTS / RANGE TO BE MEASUREMENT
METHOD
D35. DC Current measuring instruments In-house procedure

0 A to 329.999 A QCD/TRSG/SE06 (Issue 1) 0.080 A
0.33 mA to 3.29999 mA 0.00044 mA
3.3 mA to 32.9999 mA 0.0041 mA
33 mA to 329.999 mA 0.041 mA
0.33 A to 1.09999 A 0.00030 A
1.1 A to 2.99999 A 0.0014 A
0 A to 10.9999 A 0.0070 A
11 A to 20.5 A 0.026 A
D36. AC Current measuring In-house procedure

instruments QCD/TRSG/SE06 (Issue 1)
0.029 mA to 0.32999 mA 10 Hz to 20 Hz 0.88 A
20 Hz to 45 Hz 0.69 A
45 Hz to 1 kHz 0.60 A
1 kHz to 5 kHz 1.3 A
5 kHz to 10 kHz 3.3 A
10 kHz to 30 kHz 6.6 A
0.33 mA to 3.2999 mA 10 Hz to 20 Hz 0.0080 mA

20 Hz to 45 Hz 0.0050 mA
45 Hz to 1 kHz 0.0040 mA
1 kHz to 5 kHz 0.0080 mA
3.3 mA to 32.999 mA 10 Hz to 20 Hz 0.071 mA

20 Hz to 45 Hz 0.037 mA
45 Hz to 1 kHz 0.018 mA
33 mA to 329.99 mA 10 Hz to 20 Hz 0.71 mA
20 Hz to 45 Hz 0.37 mA
45 Hz to 1 kHz 0.18 mA
0.33 A to 1.09999 A 10 Hz to 45 Hz 0.0024 A

45 Hz to 1 kHz 0.00080 A
1 kHz to 5 kHz 0.0088 A
5 kHz to 10 kHz 0.038 A


METHOD
1.1 A to 2.99999 A 10 Hz to 45 Hz 0.0064 A

45 Hz to 1 kHz 0.0023 A
5 kHz to 10 kHz 0.092 A
3 A to 10.9999 A 45 Hz to 100 Hz 0.010 A

100 Hz to 1 kHz 0.015 A
11 A to 20.5 A 45 Hz to 100 Hz 0.035 A

100 Hz to 1 kHz 0.042 A
D37. Electrical Power Meters In-house procedure

DC Power
1 W to 300 W 0.04 %
300 W to 3000 W 0.04 %
3 kW to 20 kW 0.09 %
20 kW to 550 kW 0.65 %
Single Phase AC Power 45 Hz to 65 Hz

1 W to 300 W p.f. = 1 0.17 %
300 W to 3000 W 0.16 %
3 kW to 20 kW 0.12 %
20 kW to 550 kW 0.76 %
(0° to 90°) p.f. = 0 to 1 0.30 °


METHOD
D38. Capacitance measuring instruments In-house procedure

0.19 nF to 0.3999 nF 0.014 nF
0.4 nF to 1.0999 nF 0.018 nF
1.1 nF to 3.2999 nF 0.032 nF
3.3 nF to 10.999 nF 0.046 nF
11 nF to 32.999 nF 0.22 nF
33 nF to 109.99 nF 0.46 nF
110 nF to 329.99 nF 1.4 nF
0.33 µF to 1.0999 µF 4.6 nF

1.1 µF to 3.2999 µF 14 nF
3.3 µF to 10.999 µF 46 nF
11 µF to 32.999 µF 0.20 µF
33 µF to 109.99 µF 0.70 µF
110 µF to 329.99 µF 2.1 µF
330 µF to 1.1 mF 0.007 mF

1.1 mF to 3.2999 mF 0.022 mF
3.3 mF to 10.9999 mF 0.07 mF
11 mF to 32.9999 mF 0.32 mF
33 mF to 110 mF 1.5 mF
D39. Capacitance measuring Instruments In-house procedure

10 pF to 110 pF 3.2 pF
110 pF to 1000 pF 13 pF
1 nF to 10 nF 0.13 nF
10 nF to 100 nF 1.3 nF
100 nF to 1000 nF 13 nF
1 µF to 10 µF 0.13 µF
D40. Inductance Measuring Instruments In-house procedure

10 µH to 100 µH 2.5 µH
100 µH to 1000 µH 25 µH
1 mH to 10 mH 0.25 mH
10 mH to 100 mH 2.5 mH
100 mH to 1000 mH 25 mH
1 H to 10 H 0.25 H


METHOD
D41. DC Voltage Sourcing Instruments In-house procedure

1 mV to 100.0 mV 16 µV
100 mV to 1.0 V 85 µV
1.0 V to 10V 0.82 mV
10 V to 100 V 0.010 V
100 V to 1000 V 0.084 V
1 kV to 100 kV In-house procedure 1.6 %
D42. AC Voltage Sourcing Instruments In-house procedure

1 mV to 100.0 mV 3 Hz to 5 Hz 1.5 mV
5 Hz to 10 Hz 0.55 mV
10 Hz to 20 kHz 0.15 mV
100 mV to 1.0 V 3 Hz to 5 Hz 0.015 V

5 Hz to 10 Hz 0.0054 V
10 Hz to 20 kHz 0.0016 V
20 kHz to 50 kHz 0.0026 V
50 kHz to 100 kHz 0.0096 V
100 kHz to 300 kHz 0.055 V
1 V to 10.0 V 3 Hz to 5 Hz 0.15 V
5 Hz to 10 Hz 0.054 V
10 Hz to 20 kHz 0.014 V
20 kHz to 50 kHz 0.027 V
50 kHz to 100 kHz 0.097 V
100 kHz to 300 kHz 0.55 V
10 V to 100.0 V 3 Hz to 5 Hz 1.5 V
5 Hz to 10 Hz 0.54 V
10 Hz to 20 kHz 0.14 V
20 kHz to 50 kHz 0.25 V
50 kHz to 100 kHz 0.97 V
100 kHz to 300 kHz 5.5 V


METHOD
100 V to 750.0 V 3 Hz to 5 Hz 11 V
5 Hz to 10 Hz 4V
10 Hz to 20 kHz 0.99 V
50 kHz to 100 kHz 7.2 V
100 kHz to 300 kHz 41 V
In-house procedure
1 kV to 100 kV 50 Hz 1.6 %
D43. DC Current Sourcing Instruments In-house procedure

50 A to 500 A 1.4 %
0.5 mA to 5 mA 0.34 %
1 mA to 10.0 mA 11 A
10 mA to 100.0 mA 98 A
100 mA to 1.0 A 1.5 mA
1 A to 3.0 A 5.5 mA
3 A to 100 A In-house procedure 0.58 A
D44. AC Current Sourcing Instruments In-house procedure

50 A to 500 A 20 Hz to 45 Hz 1.3 %
45 Hz to 20 kHz 0.94 %
0.5 mA to 5 mA 20 Hz to 45 Hz 1.2 %
45 Hz to 20 kHz 0.90 %
5 mA to 50 mA 20 Hz to 45 Hz 1.2 %
45 Hz to 20 kHz 0.92 %
50 mA to 400 mA 5 kHz to 20 kHz 2.6 %
1 mA to 100 mA 3 Hz to 5 Hz 1.2 mA
5 Hz to 10 Hz 0.43 mA
100 mA to 1.0 A 3 Hz to 5 Hz 12 mA
5 Hz to 10 Hz 4 mA


METHOD
1 A to 3.0 A 3 Hz to 5 Hz 0.04 A
5 Hz to 10 Hz 14 mA
In-house procedure
3 A to 100 A 50 Hz 0.80 A
D45. Resistance Sourcing Instruments In-house procedure

0.1  to 100.0  0.061 
100  to 1.0 k 0.0006 k
1 k to 10.0 k 0.006 k
10 k to 100.0 k 0.06 k
100 k to 1.0 M 0.0006 M
1 M to 10.0 M 0.0082 M
10 M to 100.0 M 1.5 M
D46. Capacitance Sourcing Instruments In-house procedure

100 nF to 1000 nF 18 nF
1000 nF to 10 F 0.18 µF
10 F to 100 F 1.9 µF
100 F to 1000 F 18 µF
1000 F to 9999 F 180 µF
* CMC is expressed as an expanded uncertainty estimated at a level of confidence of approximately 95 %.
+ The electrical scope CMC’s is applicable for on-site calibration when the environmental condition is
maintained at (23 ± 5) degree Celsius and relative humidity of 30 % to 70 %.

Approved Signatories:
Category A – Dimensional, Category B – Mechanical, Category C – Temperature, Category D – Electrical
1. Mr Sreejith Radhakrishan Category A & Category B - all items
2. Mr Vincent Lim Kim Siong Category A - items A3, A5, A18, A20, A22, A24, A25, A27, A29, A31,
A32, A34 & A44
Category B - item B19.a & B19.b only
3. Ms Karl Lim Category A - all items
Category B - items B11 to B16 and B19 to B21
4. Mr Noorazmi Bin Mohamed Category A - items A1 to A9.1, A12 to A46
5. Mr Bhasi Arunkumar Category A - items A18 to A34
6. Mr Lim Hon Kiong Category B - items B1 to B6, B8, B10 except B10.6
7. Mr Arunachalam Category B - Items B1 to B10

Perichiappan
8. Mr Mohanakrishnan Category A - items A3 to A6.1, A18 to A32 and A34
Sreesankar Category B - items B1 to B10 and B11 to B19
Category C - all items
9. Ms Shimna Sreedhar Category C - all items
Category D - items D10 to D46
10. Mr Lorian Sanchez Category D - items D1 to D9
11. Mr Ramanathan Muthu Category D - items D10 to D46
Note :
This laboratory is accredited in accordance with the recognised International Standard ISO/IEC 17025. A
laboratory's fulfilment of the requirements of ISO/IEC 17025 means the laboratory meets both the technical
competence requirements and management system requirements that are necessary for it to consistently
deliver technically valid calibration results. The management system requirements in ISO/IEC 17025 are
written in language relevant to laboratory operations and operate generally in accordance with the
principles of ISO 9001.


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Trescal Calibration LA 2013 0551 C 1

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Trescal (Singapore) Pte Ltd Certificate No.

Expiry of Certificate : 06 October 2025

FIELD OF TESTING: CALIBRATION AND MEASUREMENT

A. DIMENSIONAL Lab Environmental Condition:

A1. Gauge Blocks and Accessories Tungsten

A1.2 Imperial Unit

A2. Gauge Block Comparators QCD/TRSG/SEAMS-0008,

The SAC Programme is managed by Enterprise Singapore

Date : 13 July 2023 Page : 2 of 53

MEASURED QUANTITIES/ CALIBRATION &

A3. Plain Plug Gauges or Pin Gauges BS 969: 2008

a. 0 mm to 10 mm Using Laser scan micrometer 0.7 m

A3.1 Plug/Pin gauges of lower accuracy

A3.2 Precision Balls up to 10mm 0.4 m

A4. Thread Wires (Measuring BS 5590: 1978

A5. Plain Ring Gauges BS 969: 2008

A6.1 Parallel Screw Thread Ring Gauges QCD/TRSG/Procedure 014,

A7. Tapered Thread Plug Gauges ASME B1.20.5-1991 5 m

A8. Plain Gap Gauges ASME B 47.1: 2007 as a

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Date : 13 July 2023 Page : 3 of 53

MEASURED QUANTITIES / CALIBRATION &

A9. Feeler Gauges BS 957: 2008 0.4 m

A9.1 Feeler gauges of lower accuracy 2 m

A10. Surface Plate BS 817: 2008

A11. Universal Measuring Machine QCD/TRSG/SEAMS-0012,

A12. Dial Gauge Calibration Tester

A13. Height Setting Micrometer/ Riser ISO 7863: 1984

Accuracy of lead screw 0.5 m

A14. Calliper Checker QCD/TRSG/SEAMS-0001,

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Date : 13 July 2023 Page : 4 of 53

MEASURED QUANTITIES / CALIBRATION &

A15. Measuring Microscopes JIS B 7153: 1995

A16. Measuring Projectors JIS B 7184: 2021 as a guide 2 minutes angular

A17. Engineering Squares - (Including BS 939: 2007 3.0 m

A18. External Micrometers

A18.2 Up to 100 mm (On-Site) 2 m

A18.3 Setting Rods

Micrometer Head Accuracy 0.7 m

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Date : 13 July 2023 Page : 5 of 53

MEASURED QUANTITIES / CALIBRATION &

A19. Thread Micrometer QCD/TRSG/SEAMS-0010,

A20. Internal Micrometer BS 959: 2008

A21. Internal Micrometer QCD/TRSG/SEAMS-0011,

A22. Depth Micrometer BS 6468: 2008

A23. Holtest QCD/TRSG/SEAMS-0007,

A23.1 Using Ring Gauge

A23.2 Using Fixture (Bore Gauge Calibrator)

A24.1 Dial Gauges (On-Site)

A24.2 Electrical Comparator JIS B 7536-1982 0.1 m

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Date : 13 July 2023 Page : 6 of 53

MEASURED QUANTITIES / CALIBRATION &

A25. Dial Test Indicators BS 2795: 1981 0.7m

A26. Linear Gauges (Lab/ On-Site) In-house Procedure

A27. Digital Indicator (Lab/ On-Site) In-house Procedure

A28. Dial Thickness Gauge In-house Procedure

A29. Electronic & Mechanical Slide Caliper JIS B 7507: 2016

A30. Caliper Gauge In-house Procedure

A31. Electronic & Mechanical Height BS EN ISO 13225: 2012

A32. Other Limit Gauges incl. Height, QCD/TRSG/Procedure 004

The SAC Programme is managed by Enterprise Singapore