[U tJQP L\ c{./.

~o~ N~vt {(i~11 0/2011

[lGJlOGO
-------
Syllabus
Day 4-Lecture/Lab
-Phased Array Calibration and System Verification
oCheck for Element Operability
o Vertical Linearity
oHorizontal Linearity
oDAC/TCG/TVG
-Scanning reference direction-transducer skew
-Using multiple displays
oScanning with A-S-[C]
oEvaluating with A-B-S
-Tip Diffraction and crack sizing
-Using the encoder

Vertical Linearity
-Vertical Linearity - (Amplitude)
-Linearity, Amplitude - A measure ofthe
proportionality ofthe signal input to the receiver and
the amplitude of the signa] appearing on the display of
the ultrasonic instrument or on an auxiliary display.
•Linearity -The characteristic of an instrument that is
revealed by a linear change in reflected signal
amplitude. The verticallinearity is determined by
plotting the change in ratios of signal amplitude from
two reflecting areas. The horizontal linearity is
determined by plotting the distance the signal is
displaced along the sweep against the change in
materia] thickness.
 12/1 0/201 J

Horizontal Linearity
•Horizontal Linearity - A measure of the
proportionality between the positions of the indications
appearing on the horizontal trace and the positions of
their sources.

DAC Curve
A B e D

2
 12110/2011

DAC Curve (con't.)

Accept Reject

DAC Curve (con't.)

3
 12/1 0/20 11

Syllabus

·Perfonn Exercise 10: 5L-16 Angle Beam Create DAC curve

Phased Array Terminology

5. Time Varied Gain: , OC! - - - , - - - - , - --
- --
-­-.­

also called Time

Corrected Gain :: ._.¡--! -
~G
iI
- - - _. ¡ - - -- -
!
...:. - - - -
I
_.­
(TCG). This is 50 [;
M
r
j
~!
i
;
compensation for the 40
~o
!:
L
t:
!
,1
..
.:

l·
variation in signal ?<I i. j.

amplitudes received
I~ .-1:n _. -h· .. .¡ , .--
1-
r­
o , '1 0I !> 6 7 o 9 110
from fixed depth
reflectors. The
compensation is
typically performed
electronically at
multiple depths.

4
/ 12110/2011

Syllabus

·Perform Exercise 11: 5L-16 Angle Beam Perform TCG/TVG

calibration

Actual Red
amplitude Guide
Lines

Scanning reference direction­

transducer skew
-The Omniscan uses relative positioning to acquire
data and orientate the reference lines 00 the screen
Weld Centerllne

tI

270·skew

+
Index

JO

5
 12110/2011

Scanning reference direction­

transducer skew

11

Displays
A-S-[C]
13._ __ 14._ __ 15._ __ 16., _ _ _

18.,_ __

12

6
 12/1012011

Displays
A-S-[C]

13

Displays
A-S-[C]

14

7
 12/1 0/20] 1

Displays
A-B-S

e-Sean

8
 1211012011

Crack Detection and Sizing

-Tip Diffraction-Uses the diffracted signal from the tip
of the indication to determine the uppermost tip of the
discontinuity

S-Wave

17

Crack Detection and Sizing

-Two basic Techniques for Crack Sizing
-Time ofFlight technique
-PATT-Pulsed Arrival Time Technique
-AATT-Absolute Arrival Time Technique
-Measures Time ofFlight ofthe tip diffracted
signal
-The tip signal is maximized
-The signa] time of flight signal is used to
determine the depth to the top of the indication

18

9
 12110/2011

Crack Detection and Sizing

-Two basic Techniques for Crack Sizing
-Delta Time ofFlight Technique (DTOF) H e'l G'ffi
-SPOT-Satellite Pulse Observation Technique
-RATT-Relative Arrival Time Technique
·Measures separation in time from tip signal and
base signal
·These signals do not need to be maximized
-The larger the separation, the greater the depth
---,,-1UF:: ~ tzr1i)
trto~ ~ ~\)~ ,
19

Crack Detection and Sizing

-Time of flight of the diffracted signa) (TOF)

T._ CQrN ITf. . ~J

. 1L
., • ,., Ui

http://www.ndt.netlarticleI1198/davis/davis2.htm
20

¡-_~~L------------' Ao I >­
\J (M\\ I
riLtv~ ,
10
L{rt) ~-----~=-#---------4
 12/10/2011

Crack Detection and Sizing

-Separation of time of the diffracted signal of the tip
and the signal from the corner trap (DTOF)

t,_

!J 1 '1 " .. !a .,. 7 • ,., 10

http://www.ndt.net/artic1e/1198/davis/davis2.htm
21

Crack Detection and Sizing

Other considerations
-Multiple faceted cracks like stress corrosion cracking
(SCC) and thermal fatigue, cracks, may produce
multiple tip diffracted signals.
i_

.. lA.. I...­_ _"'¡

( . ..." . I • , ' 11

http://www.ndLnet/artic1e/1198/davis/davis2.htm
22

11
 12/1 0/2011

Crack Detection and Sizing

Other considerations
•F or OD connected cracks, the tip diffracted technique
can size flaws using the full vee-path technique.
1_­

, I J I. I • , I • l'

http://www.ndt.netlarticle/1198/davis/davis2.htm

Crack Detection and Sizing

Other considerations
·Midwall cracks (not connected at the ID or OD) may be
sized with the Tip Diffraction method. Special
calibration blocks are necessary

l • •• • • • •

http://www.ndLnetlarticleIl198/davis/davis2.htm
24

12
 12/1 0/20 11

Displays
Crack Sizing-Depth
Depth to
top of
indieation

Walk the

just breaks Li:::x;~~~~~;¡¡¡&~iii:~~~~

the gate ..

Displays
Crack Sizing-Length (need encoder)

Red
measure
ment
marker

Double­
c1iek on
indieation

Adjust angle and wateh B-sean indieation

13
 12110/2011

Displays
Crack Sizing-Length (need encoder)

~~CA-~
: ()dPtO
_ ANt)lp.
-1i-EJo~

14
 12/] 0/2011

Probe Testing and Qualification

• Phased array probe testing and qualification is still
in its infancy. Standardization ofprobes is a
current problem.
• Lack of Standardization between manufacturers
exists until the codes catch up.
• Phased array probes must be considered as
consumables, and replaceable. In many situations,
similar pro bes from the same batch must perfonn
on identical objects in very reliable way. Similar
to conventional probe features, the P A probe
features must be standardized.

Probe Testing and Qualification

The difficulty of standardization resides in the following
aspects:
• lack of unifonnity in design requirements
• lack of data for realistic acceptance vaJues
• diversity of phased array probes (size, frequency,
wedge, immersion)-same type
• diversity of phased array probes - different types (I-D
planar, annular, 2-D matrix, ] .5-D planar, segmented
annular, custom build Fennat surface)
• diversity of applications
 12/10/2011

Probe Testing and Qualification

• lack of sharing the information between
manufacturers, end users, research institutions,
regulators/insurers
• lack of standardization of testing methods
• lack of merging good practice from conventional
probe standardization with medical field
experience and specific NDT applications
• most important: lack of standardization body /
Phased Array Technology User Group

Probe Testing and Qualification

• AH pro bes are checked according to interna!

procedures and periodically calibrated equipment
linked to traceable standards. The goal of these
procedures is to test during the manufacturing and
the final control the performance s of the probe that
can guarantee the specified performances in the
specified using configuration.

2
 12/1 0/2011

Probe Testing and Qualification

Checked parameters: The main parameters checked
during the final control are:
• Frequency (typically ± 10%)
• Bandwidth (typically 60 to 100%) with a
tolerance of (15-20%)
• Pulse length [typically 0.2 - 0.8 s± (15 -20)
%]
• Sensitivity homogeneity (typically ±3dB)
• Cross coupling (typically <-40dB)
• Electrical impedance (typically < 100 )

Probe Testing and Qualification

Testing and checking the PA probes should be done

in stages:
• Upon receiving
• In the laboratory conditions
• Before job
• During the job (in the field)
• After the job
• After repair

3
 12/1 0/20 11

Probe Testing and Qualification

At receiving: The following features are checked:
• Mechanical aspects (sharp comers, engraving,
probe ID)
• Probe integrity (case, contact face, connector)
• Cable (length, position, flexibility, twisting
effect on coiling)
• Connector (pins)
• QA and delivery documents [within specified
tolerances]
• Element wiring checking (linear scanning)

Probe Testing and Qualification

Lab testing requires dedicated scanning rigs, reference
blocks and detailed procedures. The following
features are checked and certified
• Center frequency [± 10%]
• Peak frequency [± 10%]
• Pulse duration [± 20%]
• Relative bandwidth [± 20%]
• Focal depth [± 20%]
• Depth offield [± 30%]
• Wedge delay [± 10%]
• Index migration [± 2 mm]

4
 12110/2011

Probe Testing and Qualification

Lab Testing Continued
• Refracted angle [± 2°]
• Signal-to-noise ratio [± 2 dB]
• DAC / DDF DAC [± 2 dB]
• Beam divergence [± 2°]
• Beam dimensions in parallel plane [± 4 nun]
• Beam dimensions in vertical plane [± 2 nun]
• Near-surface resolutíon [± 2 nun]
• Far-surface resolution [± 2 mm]
• Skew angle [± 1°]
• Wedge noise: < - 30 dB [± 2 dB]
9

Probe Testing and Qualification

Befare Job and during the Job: The following
mínimum features are checked:
• Probe integrity - active elements [linear
scan]
• SNR [dB] on SDH or EDM notch]
• Index [mm] on SDHJnotch
• Angle [0] on SDH / notch
• Calibration [3-5 times / shift]

ID

5
 12/1 0/2011

Probe Testing and Qualification

• After the job the following minimum features

must be checked:
• COlmector, pins, cable
face wearing, contact surface
dead elements-if any
SNR [dB]
angle [0]
index [mm]
center frequency [MHz] - optional
bandwidth [%], pulse duration [ s] - optional

11

6
 cA ~u 11
Designation: E 2491 - 06
INrl!RNATIPNAL
Standard Guide tor
Evaluating Performance Characteristics of Phased-Array
Ultrasonic Examlnation Instruments and Systems1
T~~ standard. is issu~ under !he fixcd designation E 2491; !he number immcdiately foUowing !he designation indicates the year of
oogma! adopllOn or, ID tbe case of revision, the year of last revision. A oumber iD pareotheses indicares tbe year of last reapproval. A
superscript epsilon (€) indicates an editorial change sinee the lasr revision or reapprova!.
1. Scope
1.1 This guide describes procedures for evaluating sorne
performance characteristics of phased-array ultrasonic exami­
nation instruments and systems.
1.2 Evaluation of these characteristics ís intended to be used
for comparing instruments and systems or, by periodic repeti­
tion, for detecting long-term changes in the characteristics of a
given instrument or system that may be indicative of impend­
ing failure, and which, if beyond celtain limits, will require
corrective maintenance. Instrument characteristics measured in
accordance with this practice are expressed in terms Ibat relate
to Iheír potential usefulness for ultrasoruc examinations. Other
electronic instrument characteristics in phased-array units are
similar to non-phased-array units and may be measured as
described in E 1065 or E 1324.
1.3 Ultrasonic examination systems using pulsed-wave
trains and A-scan presentation (rf or video) may be evaluated.
1.4 This practice establishes no performance 1imits for
examination systems; if such acceptance criteria are required,
Ibese must be specified by Ibe using parties. Where acceptance
criteria are implied herein they are for example only and are
subject to more or less restrictive limits imposed by customer's
and end user's controlling documents.
1.5 The specific parameters to be evaluated, conditions and
frequency of test, and report data required, must also be
determined by the user.
1.6 This practice may be used for the evaluation of a
complete examination system, ineluding search unit, instru­
ment, interconnections, scanner fixtures and connected' alarm
and auxiliary devices. primarily in cases where such a system
is used repetitively without change or substitution. This prac­
tice is not Íntended to be used as a substitute tor calibration or
standardization of an iDstniment or system to inspect any given
matelial.
1.7 Required test apparatus ineludes selected test blocks and
position encoders in addition to the instrument or system to be
evaluated. . Ibe transducers configured as a set of concentric rings. They
I This guide is under tbe jurisdietion of ASTM Co.mmittee E07 on Nondestrue­
Uve Testing and ls tbe direct responsibility of Subeo.mmittee E07.06 00 Ultrasonle
Metbod.
Current editioo approvcd May 1, 2006. Publishcd June 2006.
Copyright el ASTM IntamaHonar. 100 Sa" Harbor Orive, PO Sox C700. West Conshohocken, PA 19428-2959. UnHed Stales.
1.8 Precautions relating to the applicabilíty of the proce­
dures and interpretation of the results are included.
1.9 Alternate procedures, such as examples described in Ibis
document, or others, may only be used wilb customer approval.
1.10 This standard does not purport to address al! of the
safety concems, if any, associated with its use. lt is the
responsibility of the user of this standard to establish appro­
priate safety and health practices and detennine the applica­
bility of regulatory limitatwns prior to use.
1, Referenced Documents
2.1 ASTM Stant/ards: 2
E 317 Practice for Evaluating Performance Charactenstics
of Ultrasonic Pulse-Echo Exanúnation Instruments and
Systems without the Use of Electronic Measurement In­
struments
E 494 Practice for Measuring Ultrasonic Velocity in Mate­
rials
E 1065 Guide for Evaluating Characteristics of Ultrasonic
Search Uñits
E 1316 Terminology for Nondestructive Examinations
E 1324 Guide for Measuring Sorne Electronic Characteris­
tics of Ultrasonic Examination Instrurnents
3. Terminology
3.1 Refer to Ternlin010gy E 1316 for definitions of terms in
this guide
3.2 Defmitions:
3.2.1 angle corrected gain-also caIled ACG. This is com­
pensation for the variation in signal amplitudes received froro
fixed depth side driUed holes (SDH's) dUDng S-sean calibra­
don. The compensation is typically performed electronically at
multiple depths. Note that there are technicallimits to ACG,
Ibat is, beyond a certain angular range, compensation is not
possible.
3.2.2 annular array probes-phased-array probes that have
!'por referenced ASTM standards, visit Ibe ASTM website, WWW.asUD.org. or
contact ASTM Customer Service aL service@astm.org. Por ATlIllltil Boo/< {Jf AS1M
SUIluJards volume information, refer to !he standard's Document Summary page on
tbe ASTM website.
 e E2491-06
7. Keywords
7.1 characterization; focal point; phased-array; phased-array
probe; sound beal11 profilej ultrasound

ANNEXES
, (Mandatory Information)

Al. DETERMINATION OF PHASED-ARRAY BEAM PROFILE

AI.I IntroductioD Al.2.2 Linear-array probes

Al.1.1 Tbis annex describes peocedures to detennine beam
peotiles of phased-array probes. Eithee immeesion oc contact
peobe applications can be addressed using these peocedures.
Howevee, it should be cautioned that assessments of contact
probes may suffee trom variability greatee than irnposed
tolerances if propee precautions are not taken to ensure
constant coupling conditions.
Al.2 Test Setup
A1.2.l For single focal laws whece the heam is fixed (that
is, not used in an eIectronic oc sectorial scan mode) and the
probe is used in an immeesion setup, the ball-target oe
hydrophone options described in E 1065 may be used. Foe
phased array probes used in a dynarnic fashion where several
focallaws are used to produce sectorial or electronic scanning
it may be possible to make beam-peofile assessments with no oc
little mechanical motion. Where mechanical motion is used it
shall be encoded to relate signal time and amplitude to distance
moved. Encodee accuracy shall be verified to be within
tolerances appropriate foe the measurements made. Descrip­
tions made for electronic scan and sectorial sean beam profile
assessments will be made foc contact probes; however" when
,assessment in water is required the machined targets may be
replaced with rods or balls as appropriate.
- Linear-array pcobes have an active plane and an inactive or
passive planeo Assessment of the beam in the active plane
should be made by use of an eleetronic scan sequence foe
peobes with sufficient number of eIements to electronically
advance the beam past the targets oí intecest. For phased array
probes using a large portian of tbe available elements to foem
the bearn tbe number of remaining elements for the electronic
raster may be too small to allow the beam 10 pass over the
target. In this case it wíll be necessary to llave encoded
mechanical motion and assess each foeallaw along tbe active
plane separately.
Al .2.3 Side-drilled hales should be arranged at vacious
depths in a flaw-feee sample of the test material in whieh focal
laws have been prograrnmed foro Using the linear sean feature
of the phased-array system the beam is passed over the targets
at the vacious depths of interest. The electronic sean is
illustrated sehematically in Fig. Al.1.
A1.2.4 Data collection of the entice waveform over the
rauge of inteeest shall be made. The display shall represent
amplitude as a color or grayscale. Time oc equívalent distance
in tbe test material shall be presented along one axis aud
distance displaced along the other axis. This is a typical B-scau
as illustrated in Fig. A1.2.

FIG. A1.1 Eleetronie Sean of Side Drilled Hales

3
 o E2491-06

FIG. A1.4 Scannlng End-Drilled Holes to Oblaln Beam Dimensions In Passive Plane

Electronie sean
~ ..
Inclined through h~_~~~

stepped focal I
FIG. A1.6 Representatlon of an Incllned Hole tor Beam Characterlzatlon In the Passlve Plane

Active
. ....plana

FIG. A1.6 Representation of Projeeted C-Sean of Corner Effect Sean Seen In Fig. A1.4

A2. DETERMINATION OF PHASED-ARRAY BEAM STEERING LIMITS

Al.1 Introduction
A2.1.1 This annex describes procedures to detenllÍne prac­
tica! limits for beam steering capabilities of a phased-array
probe and as such applies to tbe active planees) only. Eitber
irnmersion or contact probe applications can be addressed
using these procedures. However, it should be cautioned that
assessmonts of contact probes may suffer from variability
greater than imposed to1erances if proper precautions are not
taken to ensure constant coupling conditions.
A2.1.2 Recornmended linúts to establish tbe working range
of angular sweep of a phased-array probe relate to the
divergence of the beam of each element in the probe array.
When used in pulse-echo mode the steering lirnit is considered
to be within the 6-dB divergence envelope of the individual
e1ements. Ir is therefore possible lo calculate a theoreticallinút
based on nominal fi:equency and manufacturer provided infor­
matíon on tbe element dimensions . However, several param­
eters can affect me fucoretica1 calculations. These are primarily
related to fue nominal frequency of the probe. Some param·
eters affecting actual frequency incJude; pulse length, damping,

5
 o E2491-06

Vertical plane SOmm from fixit point

85°
80°
75°
70°
65°
60° Si 0'20'30° 40° 50° 55°60°
I
55°
. Horizontal plane 25mm from exit

Block dimensions 150 mm by 100 mm by 25 mm

flO. A2;2 eoom Stoerlnl! AEl611SSment Blook-Slngle PIllOS

separated by 50; however, greater or lesser intervals may be
used depending on fue required resolution.
A2.2.5 Assessment of steering lirnits shall be made using
the dE difference between the maximum and minimum signa!
amplitudes between two adjacent side drilled holes. Por ex­
ample, when a phased array probe is configured to sweep +45 0
on a block such as illustrated in Fig. A2.1, the higher of the pair
of the SDHs which achieves a 6-dE separation shall be
considered the maximum steering capability of fue probe
corifiguration.
A2.2.6 Acceptable limits of steering may be indicated by
the maximum and minimum angles that can achieve a pre­
specified separation between adjacent holes. Dependíng on the
application a 6dE or 20 dE (or some other value) may be
specified as fue required separation.
A2.2.7 Steering capabilities may be uscd as a prerequisíte;
for example, a phased array system is required to achieve a
minimum steering capability for 5° resolution of 2-mm diam­
eler side drilled holes of plus and minus 20° from a nominal
mid-angle. Conversely, a system may be Iimited to S-scans not
exceedíng the angles assessed to achleve a specified signa!
separation, for example, -20 dE between 2-rnm diameter SDHs
separated by 5°.
A2.3 An alternatÍve assessment may use a single SDH at a
specified depfu or sound path distance. Displaying fue A-sean
for fue rnaximum and minimum angles used would assess the
steering capability by observing the S/N ratio at fue peaked
response. Steering limit would be a pre-defined S/N ratio being
achieved. Caution must be taken when using this method so as
to not peak on grating lobe signals. This method will also .
require confinnation that the SDH is positioned at !he calcu­
lated fflfracted angle.

7
 e E2491-06
FIG. A3.1 Continulty Display far Phased-Array Instrument ar Cable
A4. ASSESSMENT OF PHASED·ARRAY FOCUSING ABILITY
A4.1 Introdudion
A4.1.1 Focusing of ultrasonic beams is based on well
known principIes. However, unlike single element pro bes ,
phased-array systems can be configured to focus over a range
of sound paths and in both transmit and receive modes.
Effectiveness of the focusing algorithms can be assessed by
determining the beam response dimensions. This is similar to
the beam profiling described in Annex Al. Limits of focusing
are intrinsic in the probe parameters and subject to the
mínimum timing-delay capabilities of the phased-array ultra­
sonic instrument.
A4.2 Test Set-Up
A4.2.1 Configure the phased-array systenl for me focusing
focal laws to be assessed and acoustically couple the phased­
!lrray probo to a block with inclincd side drilled holes as
illustrated in Fig. A1.!. Compression modes wíth or without a
delay-line and shear modes using a refracting wedge can be
assessed by this method.
A4.2.2 Focusing at a single refracted angle is assessed by
this method. Where several angles are used it will be necessary
to assess the focusing ability for each angle separately.
A4.2.3 Using either an electronic scan or encoded mechani­
cal scan in fue plane of interest, the fulI waveforms are
colIected and displayed in a depth corrected B-scan projection
image as illustrated in Fig. A4.1.
9
Inactive
Elements:
'Ínrucatedby
zeroampiitude
(no:color)ón
tine
r~ptesenti1ig •
'Íhecbannél
A4.2.4 Effectiveness of the focusing algorithm is assessed
by sizing the diameter of the projected image based on a dB
drop from maxirnum amplitude and comparing that dimension
to the actual machined diameter of the side drilled holeo
A4.2.5 Workíng range of the focusing algorithm may be
deterrnined by agreement as to the maximum dimension of the
oversizing of the side-drilled hole diameter. For example, if
2-mm diameter SDH's are used and the 6-dB drop is used to
gauge diameter from the B-scan, the working range can be
defined as the depth or sound-path distance that the B-scan can
maintaÍn the 6-dB dimension to les s than twice the actual
diameter.
A4.2.6 Practical lirnits for hole diameters and focal spot
sizes are required. Practical focal spots for focused bearns
cannot be made smaller that about 1.5 times the wavelength
use<!. For a S-MHz compressioll wave i.n steel this i~ about 1.7
mm. The focal spot size is ruso a function of sound path; the
deeper fue holes, the weaker the focusing.
A4.2.7 In order that the diameter assessment be meaningful,
fue sample inlerval must be small compared to the target
assessed. It is recornmended that al least four samples per hole
diameter be used. For example, for a 2-rnm diameter SDH
target the sample interval of a mechanized encoded sean should
be 0.5 mm or for an electromc scan the step between each focal
law should not exceed 0.5 mm (this will be lirnited by the
element pitch of the probe).
 e E2491-06
A6. ASSESSMENT OF PHASED-ARRAY WEDGE ATTENUATION AND DELAY COMPENSATIONS
A6.1 Introduction
A6.1.l When an electronic or sectorial scan is used the
variations between lbe electronlcs of each pulser and receivel'
and variations between probe elemefits rnay result in smaIl gain
variations froro one focallaw to the next. Also, the efficiency
of generation varies with angle, and declines away froro the
"natural" angle of the wedge. When a delay line or refracting
wedge is used, variations in path distances within the wedge
will result in some focal laws requiring roore or less amplifier
gain. A method of coropensating for gain variations so as to
"nórmalize" the set of focallaws in an eIectronic or S-sean is
required. . transmittance effects intrinsic in angle variation.
A6.1.2 When a phased array pro be is used on a delay line or
refracting wedge, calculations for beam steering and projection
displays rely on the Fermat principIe. lbis requires that the
operator identify the position in space of the probe eIements.
This ensures that the path lengths to the wedge-steeI interface
are accurately known. It is necessary to verify that the
coo~dinates used by the operator provide correct depth calcu­
lations. This ensures that the display software correctly posi­
tiOllS indications detocted.
A6.1.3 Compensation for attenuatiol1 variations IlJld delay
times may be made one focallaw at a time or software can be
configured to make the compensations dynamica1ly.
A6.2 Wedge-attenuation Compensation
A6.2.1 This guide applies to assessments of wedge­
attenuation compensations for E-sean or electronic raster scans
where ID linear array probes are used.
A6.2.2 Configure the phased-array system for the focallaws
to be used in the electronic raster sean application.
A6.2.3 Acoustica1ly couple the phased array probe to the
block with a side drilled hole at a known depth. The I .S-mm
diameter SDH in the IIW block is a convenient target for this
purpose.
A6.2.4 Select the A-scan display for the first focal law
configured and move the probe forward and backward to locate
the maximum amplitude signal from the SDH.
A6.2.S Adjust the response from the SDH to 80 % MI
screen height (FSH) and save the pru:ameters in the focallaw
file.
A6.2.6 Repeat the process of maximizing the signal from
tbe SDH and setting it to 80 % FSH for each focal law and
saving the set-up file afrer each focaIlaw is completed.
A6.2.7 Altematively, this process may be computerized so
tbal a dynarnic assessment of sensitivity adjustment is calcu­
lated by the computer. A dynarnic assessment would simply
require the operator to move the probe back and forth over the
SDH ensuring that a1l the focallaws used have the SDH target
move through the beam. Wedge attenuation corrections would
then be calculated by the phased-array system to ensure that the
11
amplitude of the SDH delected by each focal law would be
adjusted lo tbe same amplitude.
A6.2.S Assessment of wedge-attenuatiQo compensation re·
quires a constant steel path te enSUfe that only the effect wedge
variations are assessed. For S-scans where ID linear array
probes are used, a single SDH results in a changing steel path
for each angle making it unsuitable for this task. A recom­
mended target is a radius similar to that of the lOO-mm radius
of the IIW block. For S-scans steps A6.2.2 to A6.2.6 are used
replacing the SDH with a suitable radius. Use of the radius for
S-sean configurations also provides correction for echo­
NOlE A6.l-If appropriate compensation cannot be achieved, for
example. if the angular range is so large that the signa! amplitude cannot
effectively be compensated. then the range must be reduced until it is
possible lo compensate.
A6.2.9 Probe motion for the various wedge and scan-type
configurations are illustrated in Fig. A6.1.
A6.3 Wedge-delay Compensation
A6.3.1 When an angled refracting wedge is used for E-Rcans
or S-scans, or when a fixed thiclmess delay line is used for
S-scans, the sound patb in the wedge material varies from one
focal law to the next. Compensation for this delay time
difference is required so as to ensure that indications detected
are correctly positioned in the projection scan displays, that is,
depth and angle within the test piece are correctly plotted.
A6.3.2 Configure the phased-array system for the focallaws
lo be used in the S-sean or e1ectronic raster scan application.
A6.3.3 Acoustically couple the phased array probe to a
block with known radius of curvature. The SO-mm or lOO-mm
radius of the IIW block is a convenient target for this purpose.
A6.3.4 Select the A-sean display for tbe first focal law
configured and move the probe forward and backward to locate
the maximum amplitude signal from the radius selected.
A6.3 .5 Adjust the delay settings to indicate the sound path
in tbe metal to correctly indicate tbe radius used and save the
focallaw parameters.
A6.3.6 Repeat fue maximization of the radius response for
each focalla.w in the sean set and save fhe pru.'ameter settlng
after each delay has been adjusted.
A6.3.7 Altematively, this process may be computerized so
that a dynarnic assessment of delay adjustment is calculated by
the computer. A dynamic assessment would simply require tbat
the operator move the probe back and forth over the center of
the radius assuring that all the focal1aws used have the center
of beam ray peak on the radius appropriate for theír angle.
A6.3.8 Small angle compression wave focal laws may
require a clistom block to carry out this compensation.
A6.3.9 Probe motion for the various wedge and sean type
configurations are illustrated in Fig. A6.2.
 ~ E2491-06

Delay adjustment movement

Delay adjustmentmovement for electronic sean with refraeting

FIG. A6.2 Delay Adjustment Seans Using Curved Surfaees

13
 <O E 2491-06
FIG. A7.2 Dlflplay Height Llnearity
element number 1 and end at the element number that
corresponds to the nwnber of pulsers in the phased-array
instrument.
A7 AA Couple the probe to a suitable surface to obtain a
pulse-echo response from each focal law. The backwall echo
from the 25-rnm thickness of the IIW block or the backwall
from the 20-nun thickness of the custom linearity block
illustrated in Fig. A7.1 provides a suitable target option.
Altematively. inunersion testing can be used.
A7.4.5 Select Channel 1 of the pulser-receivers of the
phased-array instrument. Using theA-scan display, monitor the
response from the selected target. Adjust the gain to bring the
signal to 40 % screen height. This is illustrated in Fig. A7.3 .
A7A.6 Add gain to the receiver in the increments of 1 dB,
then 2 dB, then 4 dB and then 6 dB . Remove the gain added
after each mcrement to eusure that the signal has retumed to
40 % display height. Record the actual height oí' fue signal as
a percentage of the display height.
FIG. A7.3 A-Sean Display of Baekwall Echo on Channel 1 of a Phased-Array Instrument
15
A7.4.7 Adjust the signal to 100 % display height, remo ve
6-dB gain and record tbe actual heigbt of the signal as a
percentage of the display height.
A7.4.8 Signal amplitudes should fall within a range of
±3 % of the display height required in the allowed height
range of Table A7.1.
A7.4.9 Repeat the sequence from A7A.5 to A7.4.7 for all
other pulser-receiver channels.
A7.4.10 For instruments having 10- or 12-bit amplitude
digitization and configured to read amplitudes in a gated region
lo amplitudes greater than can be seen on the display, a larger
range of check points can be used. For these instruments the
gated output instead of the A-scan display would be verified for
linearity.
NOTIl A7.2~30 cxomple of wupliUlc!es grcatcr than 100 % display
heigbt 18 acen in FJg. A7.4 where gafe A % Jlldicates a 200 % slgnnl iIIld
gale B % indicates 176 %.
 o E2491-06
A7.5 Time-Base Linearity (Horizontal Linearity)
A7.5.1 Configure lhe phased array instrument to display an
A-scan presentation.
A7.5.2 Select any compression wave probe and configure
lhe phased-array instrwnent to display a range suitable to
obtain at least ten multiple back refiections from a block of a
known thickness. The 25-mm wall truckness of lhe IIW block
is a convenient option for this test.
A7.5.3 Set lhe phased-array instrument analog-to-digital
conversion rate lo at least 80 MHz.
A7.5.4 Wilh lhe probe coupIed to the block and !he A-scan
displaying 10 clearly defined multiples as illustrated in Fig.
A7.4. the display software is used to assess tbe interval
between adjacent backwall signals.
A7.5.5 Acoustic velocity of lhe test block, determined using
lhe melhods described in E 494, is entered into lhe display
software and lhe display configured to read out in distance
(thlckness).
A7.5.6 Using lhe reference and measurement cursors deter­
mine !he interval between each muItiple and record lhe interval
of lhe first 10 multiples.
A7.5.7 Acceptable linearity may be established by an eiTor
tolerance based on lhe analog-to-digital conversion rate con­
verted to a distance equivalent. For example, at 100 MHz each
sample of lhe timebase is 10 ns. For steel at 5900 mis each
sample along lhe timebase (10 ns) in pulse-echo mode repre­
sents 30 ¡.un. A tolerance of ±3 timing samples should be
achievable by most analog-to-digital systems. Sorne allowance
should be made for velocity detennination error (-1 %).
Typically the errors 011 the multiples should not exceed ;tO.5
mm for a steel pIate.
A7.5.8 A sample recording tabIe for lhe linearity checks is
indicated in Table A7.1.

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17