Characterization Techniques

-by
23251A6708-Balakeerthana
23251A6712-Harshitha.
23251A6732-Apoorva.
23251A6755-Sindhu Reddy.
Introduction
Nanomaterials exhibit distinct
physical, chemical,
mechanical properties due to
their high surface to volume ratio
and quantum effect
 Nanoparticles

Physical Chemical
~ based on size,shape, - Presence and method
monodispersity, of bonding of ligands
crystal structure
 Techniques used for
characterization of nanomaterials:
P P C
Microscopy Spectroscopic Thermal
techniques techniques analysis
- XRD techniques
- SEM
- XPS (c)
- TEM
- Raman - TGA
- AFM
Spectroscopy - DSC
 Techniques used for
characterization of nanomaterials:
P P C
Optical and Surface area,
Magnetic
Electrical porosity analysis
characterizations - BET
characterization
- uv spectroscopy - Pore size - VSM
- Photoluminescence spectroscopy
distribution
- Electrical conductivity
analysis
measurements
 Scanning Electron
Microscope (sEM)

-->electron gun
-->electron column with lenses
and coils
-->specimen chamber
-->detectors
-->and vacuum pumps
Advantages:
° High resolution
° Depth of field
° Versatility in signal detection
° Wide Range of Magnification

Disadvantages:
° Sample Preparation
° Vaccum environment
° High Cost and maintenance
°Potential Damage to Specimens
Transmission Electron
Microscope (TEM)
--> An electron gun
--> The condenser system
--> The image producing
system
--> The image-recording
system
Advantages:
° High resolution
° Analytical capabilities
° Imaging modes
° Sample preparation

Disadvantages:
° Vaccum environment
° Cost and maintenance
° Electron beam damage
X-ray Diffraction(XRD):
X-ray Diffraction (XRD) is a methodology used to
analyze the atomic or molecular composition of
materials.
Commonly referred to as x-ray powder diffraction,
this technique involves examining finely ground
materials to achieve a consistent state for analysis.
 Diffraction
Diffraction is when light bends slightly as it passes
around the edge of an object or encounters an obstacle
or aperture

Constructive interference
When two waves travel in the same direction and are in
phase with each other, their amplitude gets added, and
the resultant wave is obtained
Principle
The interaction of incident rays with the sample
produces constrictive interference when the
condition satisfies
. braggs law
 X-RAY Diffractometer

1.X-ray source
2.sample holder 1.

3.XRD Detector
Advantages:
° rapid,powerful technique
° requires minimal sample for analysis
° measurement instruments are widely available

Limitations:
° sample should be homogeneous
° sample requires grinded powder
° It becomes complex to determine the unit cells
if the crystal sample is non-isometric.
THANKYOU
very much