OmniScan SX \ MX2 Training Program

Phased Array Probes

V4.3R2
OmniScan SX \ MX2 Training – Phased Array Probes Overview
 Material in this section of the training program is a summary of phased array probes
typically used in OmniScan SX\MX2 applications. The information is taken primarily
from of the Olympus probe catalog and is intended to provide an overview of the
various probe features that optimize different applications.
OmniScan SX \ MX2 Training – Phased Array Probes Overview cont.
 Phased array probes come in a variety of shapes and sizes for different applications.
The most common types are listed below.
 Typical array probes from Olympus have a frequency range between 1-13 MHz and
have between 8-256 elements.
 The number of total elements of the probe is limited by the second number in the
instrument configuration. (32:128)
 The maximum number of elements of a probe used with an OmniScan MX2 is 128
and maximum for an OmniScan SX is currently 64.
 There are 4 primary 1D probe types for use with OmniScan SX\MX2 applications:
1. Angle beam probes.
2. Curved probes.
3. Immersion/Straight beam probes.
4. Integrated wedge probes.
OmniScan SX \ MX2 Training – 1D Linear Array Probes
 1D Linear array probes are the most widely used for industrial inspection and the
only type that is supported directly in the OmniScan SX\MX2 software (Wizards).
 Phased array probes other than 1D linear must use focal laws generated from an
external calculator for import into MX2.
OmniScan SX \ MX2 Training – 1D Linear Array Probes cont.
 1D linear array probes are defined by the following parameters:
– Size or “Pitch” of the elements. (.25-2mm)
– Number of elements. (8, 16, 32, 64, 128, 256)
– Frequency. (1-17 MHz)
– Radius focused or flat.
– Reference point. (Only required for use without wedge and does not affect PA calculator)
OmniScan SX \ MX2 Training – 1D Linear Array Probes cont.
 The dimensional parameters of a 1D linear phased array probe are defined as
follows:

A = Aperture. Total length of all elements in active plane. (Pitch X element count)
H = Element height in the passive plane. Also called element elevation.
P = Pitch. Center to center distance between two adjacent elements.
E = Size. The width of an individual element.
G = Gap. The spacing between two adjacent elements.
OmniScan SX \ MX2 Training – 1D Linear Array Probes - Aperture
 The OmniScan SX\MX2 probe database includes the pitch and total elements to
prevent configurations that exceed the capacity of the instrument.
 The number of elements available for 1 focal law and the total number of elements
available on the probe are directly related to the instrument configuration. (16:16,
16:64, 32:128, etc.) This is covered in a later section.

A = Aperture. Total length of all elements in active plane. (Pitch X element count)
H = Element height in the passive plane. Also called element elevation.
P = Pitch. Center to center distance between two adjacent elements.
E = Size. The width of an individual element.
G = Gap. The spacing between two adjacent elements.
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Element Pitch
 The pitch of the probe is directly related to the maximum size (Aperture) of the beam
based on the available pulsers of the acquisition module. (16:64, 32:32, etc.)
 Below are two low frequency deep penetration probes that differ in both pitch and
total number of elements. (A4 and A5)
 Only a 32:XXX acquisition module can utilize all 32 elements of the A5 probe for a
sector scan. More elements of a smaller size increase beam steering limits, energy,
and focusing. (32X .75mm = 24mm aperture)
 A 16:XXX acquisition module can create a larger aperture using the A4 probe
because the pitch is larger. Larger element pitch reduces beam steering. Fewer
elements reduces focus. (16X 2mm = 32mm)

A4 A5
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Pitch cont.
 Most probe\wedge combinations for angle
beam inspection are designed for a steering
range of approximately 30-75 degrees.
 As the size of the element pitch is reduced,
beam steering is improved.
 Defining the limits of any probe\wedge
combination with respect to beam steering
is dependent on many factors including
sound path required for the application, size
of reflector, and what is an acceptable A-
scan signal to noise ratio for any one
customer.
 For this reason, the OmniScan SX\MX2
software does not attempt to limit or predict
acceptable steering limits in the software.
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Element Wiring
 1D linear array probes have elements aligned in one axis and are numbered 1-16,
1-32, etc. so the element wiring direction is known to the user and the probe can be
installed correctly in the system or on the wedge.
 Some Olympus probes have an arrow to indicate the direction of element wiring and
no numbers are present.
 The probe element wiring can be reversed in the software. This is a function of the
wedge orientation and is explained in another section.
OmniScan SX \ MX2 Training – Advanced Probes – Element Wiring cont.
 1.5D and 2D matrix arrays are more complex and must identify the probe in in more
than one axis.
 Below is an example of a quad 1.5D array using a 4X7 element configuration. All
matrix array probes wired into one phased array connector.
 This type of probe can only be used in the OmniScan SX\MX2 by importing the focal
laws from an external focal law calculator via the flashcard.
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Aperture
 The total number of elements that can be used with the OmniScan SX\MX2 or any
phased array system is dependent on the pulser configuration. (XX:128, XX:64,
XX:32, etc.)
 The second of the two numbers is relevant for total element utilization.
 Example: The image below is of a 32 element phased array probe using one
sector scan group. The minimum module configuration to perform this inspection
using all elements would be a 32:32 module. A 16:32 instrument using the same
probe is capable of only ½ the maximum aperture and can use any 16 of the
available 32 elements.
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Total Elements

 Example: The image below is of a scanner with two 5L64-A2 probes. Each probe
contains 64 elements requiring a minimum pulser configuration of XX:128.
 A 16:128 pulser configuration can fully utilize all elements in both probes. Any one
A-scan or focal law would have a maximum aperture of 9.6mm (16 X .6mm)
 A 32:128 pulser configuration can fully utilize both probes. Any one A-scan or focal
law would have a maximum aperture of 19.2mm (32 X .6mm)
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Frequency

 Most ultrasonic flaw detection is performed with probe frequencies between 2-

10MHz although manufacturing is available from 1-17MHz.
 As with conventional probes, frequency selection is a compromise between
sensitivity and penetration.
 The probe frequency has a significant affect on the near field length and is directly
related to the maximum focal distance of any probe.
 Lower frequency probes provide better penetration and are necessary on materials
like SS304 and SS316.
 When the probe frequency is known, the filters and pulse width can be
automatically set.
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Internal Radius

 An inner radius curvature in a 1D linear array combines mechanical beam focusing

in the passive axis with phased array beam steering and focusing in the active axis.
 Internally focused probes are becoming more widely used, especially for pipeline
and small diameter piping inspections.

Passive axis

15
OmniScan SX\MX2 Training – 1D Linear Probes – Internal Radius cont.

 The primary benefit of the internally focused array is to improve length sizing on
the C-scan and B-scan.
 For girth weld inspection in the axial axis, the smaller the diameter of the pipe, the
greater the distortion of reflected sound from the curved pipe inner surface
resulting in the over sizing of defects on the C-scan and B-scan. (Length sizing)
 The Cobra, Pipe Wizard, in-line manufacturing, and other inspections systems use
mechanically focused probes for improved results.

C-scan length sizing with flat 1D probe.

C-scan length sizing with internal radius focused 1D probe.

OmniScan SX\MX2 – 1D Linear Probes – Olympus Probe Definition

 The Olympus probe definition is below and can be found in the Olympus probe
catalog.
OmniScan SX\MX2 – 1D Linear Probes – Olympus Probe Housings

 Olympus probes are sold with common housings to minimize the amount of
wedges and accessories.
 Below is pictured a standard 5L64-A2 probe that uses the same housing as the
2.25L64-A2. All A2 probes are compatible with A2 wedges and are listed in the
OmniScan SX\MX2 database independently to account for different pitch and
position.
OmniScan SX\MX2 – 1D Linear Probes – Olympus Probe Cable Options

 Olympus phased array probes are not consumables and have a very low fail rate.
 Cable lengths come in standard 2.5 and 5 meters lengths and can be made to order.
 Common sources of failure due to misuse and abuse are the cable and cable
connection to the housing. Care should be taken not to bend it excessively beyond
90 degrees or allow excessive weight on the cable.
 Due to the number of micro solder connections and coaxial cables, probe cables
cannot easily be repaired.
 Cables for most probe models are available with optional armor shielding.
OmniScan SX\MX2 Training – 1D Probes – Probe Management in OmniScan
 The OmniScan MX2 has options for both single or multiple phased array probe
inspections but only one standard 64 or 128 pin connector on the instrument.
 The OmniScan SX is limited to single probe, single group inspection only.
 For multi-probe phased array inspections a Y splitter or adapter is required to split
the one connector into two separate connectors as pictured below.

127 128

1-64 65-128 1-64 65-128

65-128
1-64

TOFD = 127,128
OmniScan SX\MX2 Training – 1D Probes – Probe Management in OmniScan
 In addition to multi-probe phased array inspection these accessories also support
conventional UT inspections by using pulsers from the 64 or 128 element phased
array connector or a dedicated lemo or BNC connector on the instrument.
 These are necessary for a variety of both dedicated and complimentary conventional
UT applications including TOFD.
 This hardware is explained in detail in a later section and can be found in the
Olympus industrial scanners catalog.
OmniScan SX\MX2 Training – 1D Probes – Weld Series Probes
 Universal probes such as A31 and A32 are
designed for hand scanning or automated
inspections for a weld inspection.
 Pitch and frequency make these probes ideal
for thicknesses in carbon steel up to 100mm
for new construction and in-service inspection.
 Specific scanner adapters for automated
inspections and low profile wedges to reduce
the need for diameter contouring and improve
stability.
OmniScan SX\MX2 Training – 1D Probes - Small Footprint Probes

 Small footprint and access probes such as the

A00, A0, A15 and NW1\2\3 are designed for
confined areas and difficult access inspections.
 Small footprint wedges with low profile
attachment points and optimized design for the
elements to be as close to the wall of the
housing as possible.
 Typical applications include aerospace
inspections and composite inspections where
near wall coverage is required.
OmniScan SX\MX2 Training – 1D Probes - Deep Penetration Probes

 Deep penetration probes such as the

A3, A4, and A5 are designed for
heavy wall inspections and coarse
grain materials.
 Typical applications include the
inspection of large plates, castings,
and forgings where maximum
penetration and power is needed.
 Large element pitch and elevation
with low frequency options make the
deep penetration probes ideal for
stainless steel and course grain
material inspection over long sound
paths.
OmniScan SX\MX2 Training – 1D Probes - Pipeline Weld Probes

 Pipe Wizard probes such as the

PWZ series are the workhorse of the
Olympus pipeline phased array
systems.
 Typical applications include high
speed precision inspection using
zone discrimination and amplitude
techniques on pipeline girth welds.
 Suitable for manual and automated
inspections.
 Specialized wedges used with the
PWZ include carbide wear pins and 5L32-PWZ3 probe used for inspection of 8 inch X 20mm piping.
irrigation channels.
 Internal radius focusing for improved
length sizing of pipeline flaws.
 Short front cable exit available for
scanner accommodation.
OmniScan SX\MX2 Training - Small Diameter CCEV Piping Probes - Cobra
 Probes for the Cobra scanner are 5L16CCEV-A15 for inspection of 5mmX70mm SS304 piping.
optimized for the small piping
diameter inspection.
 The Olympus CCEV probes have
an internal radius of 35mm and
are suitable for thickness range of
approximately 4-25mm.
 Low profile element design when
used with the Olympus Cobra
scanner system need only 12mm
pipe to pipe clearance.
 Available in a range of
frequencies for carbon steel and
austenitic material inspection.

TF_SS304_2XSEC.Opd
OmniScan SX\MX2 Training - Immersion Probes

 Olympus immersion probes are designed

to be used with a water wedge or in an
immersion tank.
 Typical applications include thin plate or
tubing inspection, composite inspection,
inline thickness testing, and any immersion
application.
 Acoustic impedance matching layer for
water.
 Linear scanning allow coverage of 30-
90mm in one line scan.
 Corrosion resistant steel casing and
waterproof up to 1meter under water.
OmniScan SX\MX2 Training - 1D Linear Power Piping Crack Sizing Probes

 Designed to be used with the OmniScan

SX\MX2, Olympus offers 4 different housing
types with compatible wedges for shear and
longitudinal wave inspection of stainless and
carbon steel power piping.
 1.5 - 5 MHz Frequency and a range of pitch and
apertures for manual crack detection and sizing.
 Small footprint wedges and ergonomic probe
casings for hand scanning and access in small
spaces and on small diameters for precision
measurement.

SS304 2mm SDH depth of 38mm SS304 2mm SDH depth of 6mm SS304 ID notch - 68mm X 33 inch diameter.
OmniScan SX\MX2 Training - Dual Matrix TRL Array Probes

 Dual matrix array TRL probes perform a similar function as the conventional
version. Two arrays in a pitch catch configuration provide maximum beam steering
and focus, elimination of interference echo, and reduction of background noise.
 Typical applications include austenitic stainless steels, dissimilar metal welds,
inconel welds, cladded components, coverage across the weld for one sided
inspections, and the most difficult materials to penetrate.
 Squint and roof angle on the wedges that acoustically insulate the transmitter and
receiver allow maximum signal to noise in course grained materials.
OmniScan SX\MX2 Training - Dual Matrix TRL Array Probes cont.

 Designed for longitudinal inspection with a steering range of 30-

80 degrees and capable of a beam skew of +/- 20 degrees from
the center of the probe.
 Low frequency (1.5-2.25MHz) for maximum penetration of
difficult materials such as spun cast stainless steels and
inconel.
 Requires 32:64PR minimum pulser configuration.
 Available in custom aperture, configuration and frequency.
-15 Skew 0 Skew +15 Skew
OmniScan SX\MX2 Training - 2D Matrix Array Probes

 2D matrix arrays allow off axis beam skew up to 90 degrees.

 Replacement of mechanical skews for transverse defect detection.
 Inspection of austenitic materials, dissimilar metal welds, and deep penetration
applications.
 Frequencies available from 1.5 -12MHz.
 Standard and custom element pitch and configuration available.
 Full line of standard compatible wedges available. Custom and contoured wedges
available upon request.

High frequency (10 MHz) 2D array inspection of creep damage in HAZ of weld.
OmniScan SX\MX2 Training - 2D Matrix Array Probes
ID Notch detected at 0 degree beam skew

0 degree

ID Notch detected at 60 degree beam skew

60 degrees

ID Notch detected at 90 degree beam skew

90 degrees

32
OmniScan SX\MX2 Training - 1D Linear Curved Array Probes

 Typical applications include inspection

of carbon fiber reinforced polymers
(CFRP) corners for composite
delamination.
 Acoustic impedance matching layer
for water.
 Corrosive resistant stainless steel
casings waterproof up to 1 meter.
 Full line of adjustable immersion
wedges.
OmniScan SX\MX2 Training - Olympus Probe Catalog

 Presented in this training is only a sample of Olympus probe manufacturing

capability. The complete Olympus probe catalog, probe specific information and
application notes can found on the Olympus web site at www.olympus-ims.com
OmniScan SX\MX2 Training - Olympus Probe Specification Conformance

 Olympus probes are delivered from the factory

with a specification sheet that includes test
parameters, test results, and acceptance criteria
for the following parameters:
– Median waveform.
– Median waveform FFT.
– -6dB center frequency average.
– -6 dB percent bandwidth.
– Peak to peak sensitivity.
– -20 dB pulse width.
– -40 dB pulse width.
OmniScan SX\MX2 Training - Probe Conformance – Median Waveform

 The median waveform graph displays a typical median pulse-echo response

from the test target from one element. Half of the return pulses from the probe
elements will have a peak – peak voltage greater than or equal to the median
element (35 below). The other half will have a smaller value. Return pulse
duration is shown on the horizontal axis in microseconds and amplitude is
shown on the vertical axis in voltage.
OmniScan SX\MX2 Training - Probe Conformance – Median Waveform FFT

 The median waveform FFT graph shows the calculated spectrum for the
median waveform over a range of zero MHz to twice the probes frequency for 1
representative element that represents the median curve.
OmniScan SX\MX2 Training - Probe Conformance -6 dB Center Freq Average

 The -6 dB center frequency bar graph displays a calculated center frequency

value for each of the probe’s elements spectrum (FFT) data at the -6 dB level.
The average value of all the probe’s elements is displayed at the top of the
graph.
OmniScan SX\MX2 Training - Probe Conformance -6 dB % Bandwidth

 The -6 dB bandwidth bar graph displays a calculated percent bandwidth value

for each of the probe’s elements. This value is determined by using the length
(In frequency) of an imaginary line intersecting a given element’s spectrum
(FFT) data at the -6 dB level. The average value of all the probe’s elements is
displayed at the top of the graph.
OmniScan SX\MX2 Training - Probe Conformance – Peak to Peak Sensitivity

 The peak to peak sensitivity bar graph displays a value for each of the probe’s
elements representing the sensitivity of the probe. This value is calculated by
using the magnitude of the excitation test pulse sent to each element and the
peak to peak voltage measurement of that element’s pulse echo return from the
test target. The reported value is -20 multiplied by the log of the ratio of these
two magnitudes. The average value of all the probe’s elements is displayed at
the top of the graph.
OmniScan SX\MX2 Training - Probe Conformance – Pulse Width

 The various pulse width bar graphs display values representing the axial resolution of
the elements pulse echo returns at various levels such as -20 dB, -30 dB, and -40
dB. These values are calculated by measuring the return pulse's width in
nanoseconds at the desired level. Axial resolution is an important measure of the
ability to distinguish individual pulse returns from one another during normal probe
operation. The average value of all the probe’s elements is displayed at the top of
the graph.
OmniScan SX\MX2 Training - 1D Linear Probes – Dead Elements

 A dead element refers to a dead ultrasonic channel. The OmniScan MX2 uses
modules that can have 32, 64, or 128 channels meaning they could support a probe
with the same amount of elements.
 Cause of dead elements or channels is in the array housing, the probe side
connector, the cable, the instrument side connector, or a pulser in the instrument.
Water intrusion, excessive voltage, cable damage, etc can result in dead elements.
 Dead elements can have an adverse effect on beam formation. A procedure or the
ability to calibrate or achieve satisfactory A-scan is what determines the limit.
 Elements and pulsers are checked by programming a single focal law or A-scan for
each individual element in the probe and visualizing the S-scan. This allows both
the elements of the probe, the cable, and the instrument pulsers to be verified.
OmniScan SX\MX2 Training - Olympus Probe Warranty

 Olympus guarantees probes for one year against material and manufacturing
defects. The complete probe warranty is available on the probe specifications
sheets and the Olympus probe catalog.
OmniScan Probe Manufacturing Facility – State College, PA
 Olympus probe shop is a 7000 Sq Ft state of
the art manufacturing facility located in State
College, PA.
 With over 30 employees utilizing the latest
piezocomposite technology the Olympus probe
shop are world leaders in standard off the shelf
probes and custom complex matrix arrays.
OmniScan Probe Manufacturing Facility – State College, PA cont.
 Stream lined design and production engineering for reduced lead times and cost.
 Industry leading quality standards.
 Custom probe accommodation and engineering assistance for application
development.
 Production super cells for lean manufacturing.
 Olympus global sales distribution network and support centers.
OmniScan SX\MX2 Training – Probe Management in the Instrument

 Olympus probes are delivered with a proprietary connector that contains a chip for
auto detection of probe model and parameters in the OmniScan SX\MX2 software.
 Probes can also be manually selected from an editable database of all common
Olympus probe models.
 For multi-probe inspection auto probe detect must be off and the probes selected
manually from the database.
OmniScan SX\MX2 Training – Probe Management in the Instrument

 The probe sub menu in the OmniScan SX\MX2 software is available in two places:
1. The group set up wizard.
2. The group probe and part sub menu.
 When probe auto detect is on the probe selection is disabled and all probe
parameters are available based from the chip in the probe.
 With auto detect off the probe selection is enabled and the probe may be selected
manually or created and saved in the OmniScan SX\MX2 software.
OmniScan SX\MX2 Training – Probe Management in the Instrument

 Question: What are the essential parameters of 1D linear array probe that are
required by the OmniScan SX \ MX2 software?
– Probe model number.
– Element pitch.
– Element quantity.
– Reference point.
– Frequency.

 Answer: All of the above.

 Questions or comments:
PhasedArraySupport@Olympusndt.com

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V4.3R2