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The Chalange of Spin in Electronics
The Chalange of Spin in Electronics
The Chalange of Spin in Electronics
Spin electronics
Coriolan TIUSAN CNRS-UHP Nancy, France TUCN, Romania
S
Origin of spin dependent transport
Electron = charge + spin spin
e Charge
electronics
magnetism
Electrons in atoms
L = li
i
S = si
i
J = L+S
n 4s band
4s
n4s
n(EF)= n (EF)
n(EF) n (EF)
Most of transport properties are determined by DOS at Fermi energy Spin-dependent density of state at Fermi energy Different spin population : polarized current
Pi f i W f
n(EF )
= + =
Spin-dependent carrier densities and scattering rates both contribute to spin dependent transport in magnetic multilayers
Spin electronics
What is an electron ? particle with negative electric charge q=-e and spin 1/2 (magnetic moment m=B )
Spin electronics
electronics = manipulation of electrons by using their charge for storage and processing of information the spin is (almost) completely neglected
Magnetism: develop materials in which the electron spins tend to align parallel to each (magnets) the charge of the electron plays a secondary (no) role
Purpose of spin-electronics: ``Teaching electrons new tricks combine electronics and magnetism in order to make new devices in which both the charge and the spin of the electron play an active role new fundamental physical questions, new phenomena new devices and applications
Take advantage of the electron spin as a new degree of freedom to generate new functionalities and devices
Magnetic materials can be used as polarizer and analyzer of electrons (spin filters)
Spin electronics
Optics
N N
> <
1975: Prior to the discovery of giant magnetoresistance, the main magnetoresistive effect known in magnetic transition metals (Fe, Ni, Co and many of their alloys) at room temperature was the Anisotropic magnetoresistance (AMR).
Mc Guire, IEEE Trans.Magn.,MAG-11, 4 (1975) 1018
consequence of an anisotropic mixing of spin-up and spin-down conduction bands induced by the spin-orbit interaction
Campbell et al, Phys.Rev.Lett.24, (1970) 269
AMR= dependence of the electrical resistivity on the relative angle between the direction of the sense current and the local magnetization.
M j
R=R+RAMRcos2()
Resistivity lower than ||
/= 3 to 5% in bulk NiFe or NiCo alloys at RT AMR decrease with reduction of the film thickness
Wheatstone bridge configuration is used to ensure high sensitivity and good repeatability Disadvantage of AMR sensor: can only sense the magnitude, but not the direction; non-linear output.
AMR thin films were used in magnetoresistive heads from 1992 to 1998 The introduction of AMR films in magnetic recording technology in 1992 major breakthrough which led to a doubling in the rate of increase of storage areal density per year (from 30%/year to 60%/year).
GMR=(RAP-RP)/RP
= + = +
P Configuration
AP Configuration
M NM M
M NM M
R+= r r r R R R- = R
R+ = (r+R)/2 r R R r
R- = (R+r)/2
RP =
M1
(2)
R
(4)
(4)
Hard-soft architecture
(3)
A significant step towards applications of GMR in devices was achieved by Parkin et al: GMR in sputtered multilayers.
Phys.Rev.Lett.,64 (1990) 2304.
R/R<20%
Inductive heads
GMR head
Disk drive
Suspended MR head
sens positif
SPINTRONICS
Spin-valves can be viewed as sensitive magnetic field sensors Applications : measurements of electrical current position or rotation encoders magnetoresistive compass magnetoresistive heads for video-tapes or other storage media of lower density than hard disk drives.
Hrot FM2
M1 M2
R
Rap
FM1
Rp 0
Due to their outstanding sensitivity, Wheatstone Bridge Circuits are very advantageous for the measurement of resistance, inductance, and capacitance.
GMR resistors can be configured as a Wheatstone bridge sensor. Two of which are active. Resistor is 2 m wide, which makes the resistors sensitive only to the field along their long dimension.
Siemens Aktiengesellschaft
TMR
Magnetic tunnel junctions Physics of spin polarized tunneling Applications: sensors, MRAMS, logic gates Multiple barrier systems: spin electronic nonlinear devices Coulomb blockade, SET
R (RAP RP ) 2 P1 P2 = = R RP 1 P1 P2 with P1 ( 2 ) =
n1 ( 2 ) n1 ( 2 ) n 1 ( 2 ) + n1 ( 2 )
First observations of large TMR amplitudes at 300K : Moodera et al, PRL (1995); Myazaki et al, JMMM(1995). Alumina based tunnel junctions. R/R~40-80%
Mechanisms of TMR
EF
1 2
eV Two current model Spin conservation during tunneling spin up: I spin down: I Itot =I +I
Quantum Mechanics
4 e J = T na nb ( f a f b ) dE kt T = OK J n a ( E F ) nb ( E F + eV )
Mechanisms of TMR
FM1
FM2
Parallel configuration
EF
nFM1
n FM1
nFM2
n FM2
Mechanisms of TMR
FM1
FM2
Antiparralel configuration
EF
nFM1
n FM1
nFM2
n FM2
R RAP
Tunnel magnetoresistance:
R R AP R P = TMR = R RP
Rp
R (RAP RP ) 2 P1 P2 = = R RP 1 P1 P2
H rot
R=f (cos())
with
M 2 FM2 I M1 FM1
P1 ( 2 ) =
n 1 ( 2 ) n1 ( 2 ) n1 ( 2 ) + n1 ( 2 )
Spin-valve effect
FM2 Isolant
e-
FM1
Hc1 Hc2
R=f()=R(H)
U EF
T exp d
1
eV
R anti parallel
R parallel
Control of barrier structure at nanometer scale
Hc2 Hc1
M1+ M2
M1+M2
(3)
R R high (2)
R low
(3)
(1) H
Hc2
Hc1
|H|<HC2
Minor loop:
(2)
Hc2
Hc1
M1+M2
M1+ M2
R (2) R high
(1) H
)
Control of Tunnel cartography
Image AFM
0.7 nm
Image TEM
D'
A A'
0 nm 0.5 nm
C' D
50nm
100 nA
50nm
AA'
50nm
CC
0 nm
DD'
0.1 nA
inhomogne
courant
Fe
400 300 200 100 0 -1.0 -0.5 0.0 0.5 1.0
4K 300K
MgO
TMR (%)
2nm Fe
Field (kOe)
S = substrate Bf = buffer layer MB = bottom magnetic layer B = barrier MT = top magnetic layer C = capping layer
Patterning the MTJ: lithography ion etching Step no.2 Etching to define the junction
Patterning the MTJ: lithography ion etching Step no.3 The RIE through SiO2 down to the bottom contacts
I+
top electrodes
2020 m2 J
V+ I-
V100 m
bottom electrodes
SIEMENS
Tension [V]
R=
d K1 exp d K 2 S
Small voltage
70.8 10 24 S [ m 2 ] d [ m]
Capacity
K C= 3S d
C [F ] =
Small voltage
RC
RC = cte exp d K 2
+ magnetic control
Applications of MTJ
Sensors
Magnetic field, position, etc: similar to GMR. Tunnel junctions would then offer a superior signal to noise ratio than metal based CIP or CPP sensors. Data storage unit in magnetic random access memories (MRAM)
Tehrani et al, IEEE.Trans.Magn., 35, 2814, (1999).
The requirements of the properties, especially the product of resistance and area (R.A) are different for these various applications.
RP<RAP
Electric characteristics High resistance low power consumption Large R high signal/noise Perpendicular transport, low mean free path high integration potential Exponential variation of current with voltage, barrier thickness
High density of DRAM
Analyzer
Polarizer
RD
RP
R(Hi)
R(H)
Field dependence of the domain structure analysis
C. Tiusan et al, JAP (2001)
From 2D to 3D memories
Resonant diodes
Resonant diodes
Resonant diodes
Resonant diodes
Scheme of a vertical resonant tunneling transistor (left) and the corresponding layer structure (right).
Schematic view of the device (scanning electron micrograph of the completely processed device with different mesa sizes).
Towards Resonant Tunneling Devices: Quantum well structures Quantum coherent transport effects in multiple MTJ structures Double MTJ
Spin transistor
or
M1
M2
M3
VEB
B
MTJ1 MTJ2
VBC
IE
IC
E
C
C insulator MTJ2 MTJ1
electrode B E
IB
VEB VBC
Ic double controlled: bias voltage of EB and BC junctions applied magnetic field (tunnel transmission of spin polarized electrons across the two Magnetic Tunnel Junction)
Tunnel junctions
Bell Lab researchers fabricated the first SET in 1987 Similar tunneling concept as RTDs
- One electron tunnels from source to drain, through the barriers
Semiconductor spintronics
Nanotechnology
Carbon Nanotubes
Graphite
Nanotechnology
Nanotechnology
C = n a1 + m a2
Chiral Vector C is defined as the vector from one open end of the tube to the other after it is rolled. If (n-m) is divisible by 3, the tube is metallic If (n-m) is not divisible by 3, the tube is semiconducting.
Carbon Nanotubes
Nanotechnology
IBM
CNT can be used as the conducting channel of a MOSFET. These new devices are very similar to the CMOS FETs. All CNFETs are pFETs by nature. nFETs can be made through Annealing Doping Very low current and power consumption Although tubes are 3nm thick CNFETs are still the size of the contacts, about 20nm.
Nanotechnology
Nanotechnology
Convergence of sciences
Nanotechnology