A transmission electron microscopes (TEM) can magnify a sample up to one million times.

The sample must be cut extremely thin. An electron beam is directed onto the sample to be magnified and some of the electrons pass through and form a magnified image of the specimen. A scanning electron microscope (SEM) can magnify a sample up to 100,000 times. A sharply focused electron beam moves over the sample to create a magnified image of the surface. Some electrons in the beam scatter off the sample and are collected and counted by an electronic device. Each scanned point on the sample corresponds to a pixel on a television monitor; the more electrons the counting device detects, the brighter the pixel on the monitor is. As the electron beam scans over the entire sample, a complete image is displayed on the monitor. SEMs are particularly useful because they can produce three-dimensional images of the surface of objects. A SEM scans the surface of the sample bit by bit while a TEM which looks at a sample all at once. The scanning transmission electron microscope (STEM) combines elements of an SEM and a TEM and can resolve single atoms in a sample.
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Electron microscopes are a general category in which there are several varieties. The two most common are transmission electron microscopes and scanning electron microscopes. Both use a beam of electrons to view the very small, but the beam acts in different ways.
A transmission electron microscope uses a high-powered beam to essentially shoot electrons through the object. The electron beam first passes through a condenser lens in order to concentrate the beam on the object. Then the beam goes through the object. Some of the electrons pass all the way through; others hit molecules in the object and scatter. The modified beam then passes through an objective lens, a projector lens and onto a fluorescent screen where the final image is observed. Because the electron beam passes entirely through the object, the pattern of scatter gives the observed a comprehensive view of the interior of the object.

A scanning electron microscope doesnt use a concentrated electron beam to penetrate the object, as a transmission electron microscope does. Instead it scans a beam across the object. During the scanning the beam loses energy in different amounts according to the surface it is on. A scanning electron microscope measures the lost energy to create a three-dimensional picture of the surface of an object. While not quite as powerful as a transmission electron microscope, a scanning electron microscope is able to produce comprehensive magnified images of much larger objects, like that of an ant. Recently, other electron microscopes have been developed that combine transmission and scanning technologies. However, all electron microscopes, transmission, scanning or otherwise employ the basic principle of magnifying an object through the use of an electron beam.

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