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interfaces, while X-ray diffraction results from the interference of x-rays diffractedfrom periodic lattice points. XRR can be used with crystalline, amorphous and liquid samples for typical layer thickness between 5 and 400 nm and surface roughness from 0 to 2 nm. This technique does not work effectively, if there is no difference between the electron density of different layers or layer and substrate. Proper goniometer alignment and selection of the data collection parameters are of crucial importance for a high-quality reflectivity data set. In the elementary case (single layer), the thickness t and density can be obtained from the definition of the fringe spacing and measurement of the critical -3 incident angle c: t / 2 and c 1.6410 . In more difficult cases (multilayer) the problem becomes complicated and for its solution is used special software REFSIM (Bruker AXS).
Examples of application of the XRD and XRR analysis can be found here: Phase identification for geological sample and alloys. Cell refinement and semi-quantitative phase analysis for geological sample. Profile Matching & Integrated Intensity Refinement with FullProf Suite. Profile fitting for single peak. XRR of multylaer samples. Crystallite size determination.
Unit for Nanocharacterization Equipment and Techniques XRD
Overview
X-ray diffraction is an important technique in the field of materials characterization to obtain structural information on an atomic scale from both crystalline and non-crystalline (amorphous) materials. The X-ray diffraction is nondestructive and can be successfully applied to determine crystal structures of metals and alloys, minerals, inorganic compounds, polymers and organic materials as well as to derive such information as crystallite size, lattice strain, surface and interface roughness, chemical composition, and crystal orientation. X-ray diffractometer D8 Advance of Bruker AXS is a versatile tool for for phase and structural analysis of powders, analysis of liquid samples (capillary and transmission modes) and reflectometry of thin layers. The system includes: Vertical Theta-Theta Goniometer with -110 < 2Theta 0 < 168 goniometer control with stepper motors and optical encoders providing smallest selectable stepsize 0 0.0001 . New short ceramic Cu X-ray tube with fine long focus. Two exchangeable detectors of scattered X-rays: NaI scintillator type detector with low background (0.4 cps) 6 and high dynamic range (up to 2x10 ) and Braun position-sensitive detector. Rotation-transmission, capillary and reflectrometry stages. Examples of the different types of analysis and measurements that can be performed with this instrument:
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