Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

Anand K Bewoor & Vinay A Kulkarni

PROPRIETARY MATERIAL. 2009 The McGraw-Hill Companies, Inc. All rights reserved. No part of this PowerPoint slide may be displayed, reproduced or distributed in any form or by any means, without the prior written permission of the publisher, or used beyond the limited distribution to teachers and educators permitted by McGraw-Hill for their individual course preparation. If you are a student using this PowerPoint slide, you are using it without permission. 1

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Chapter 8

Interferometry

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

The sizes of end standards can also be determined by interferometry principles very accurately
Prof. M G Bhat, Professor Emeritus and Technical Director, Sinhgad College of Engineering., Pune University, Pune, India

UNDERSTANDING INTERFEROMETRY
In recent years industrial demand has resulted in a number of innovations in interferometry. Simultaneously, advances in basic science have posed new requirements for measurements with very low uncertainty. To understand the interferometry phenomenon, it is necessary to study the nature of light. To observe the phenomenon of continuous interference of light waves, the two light sources should be coherent, they should be very narrow and the sources emitting a set of interfering beams should be very close to each other. A monochromatic light source is allowed to fall on the optical flat, which is placed on the surface under test to get fringe patterns. These interference fringe patterns are used to measure flatness by comparing the fringe pattern obtained from the master flat surface of known flatness and the surface under test. The NPL Flatness Interferometer is one of the most popular types of interferometers used for flatness testing. In the testing of optical components and optical systems, there are many requirements of precision and accuracy, measurement time, ease of use, dynamic range, and environmental conditions. But, nowadays interferometry techniques in conjunction with modern electronics, computers, and software are used as an extremely powerful tool in many fields including the testing of optical components and optical systems.
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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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