H. Heck 2008 Section 5.

5 1
Module 5: Advanced Transmission Lines
Topic 5: 2 Port Networks & S-Parameters
OGI EE564
Howard Heck
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H. Heck 2008
Section 5.5 2
Where Are We?
1. Introduction
2. Transmission Line Basics
3. Analysis Tools
4. Metrics & Methodology
5. Advanced Transmission Lines
1. Losses
2. Intersymbol Interference
3. Crosstalk
4. Frequency Domain Analysis
5. 2 Port Networks & S-Parameters
6. Multi-Gb/s Signaling
7. Special Topics
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H. Heck 2008
Section 5.5 3
Acknowledgement
Much of the material in this section has been adapted
from material developed by Stephen H. Hall and
James A. McCall (the authors of our text).
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H. Heck 2008
Section 5.5 4
Contents
Two Port Networks
Z Parameters
Y Parameters
Vector Network Analyzers
S Parameters: 2 port, n ports
Return Loss
Insertion Loss
Transmission (ABCD) Matrix
Differential S Parameters (MOVE TO 6.2)
Summary
References
Appendices
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H. Heck 2008
Section 5.5 5
Two Port Networks
Linear networks can be completely characterized by
parameters measured at the network ports without
knowing the content of the networks.
Networks can have any number of ports.
Analysis of a 2-port network is sufficient to explain the theory
and applies to isolated signals (no crosstalk).






The ports can be characterized with many parameters
(Z, Y, S, ABDC). Each has a specific advantage.
Each parameter set is related to 4 variables:
2 independent variables for excitation
2 dependent variables for response
2 Port
Network
P
o
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1
I
1

+
-
V
1
P
o
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t

2
I
2

+
-
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H. Heck 2008
Section 5.5 6
Z Parameters
Advantage: Z parameters are intuitive.
Relates all ports to an impedance & is easy to calculate.
Disadvantage: Requires open circuit voltage
measurements, which are difficult to make.
Open circuit reflections inject noise into measurements.
Open circuit capacitance is non-trivial at high frequencies.
(
(
(
(

(
(
(
(

=
(
(
(
(

N NN N N
N
N
I
I
I
Z Z Z
Z
Z Z Z
V
V
V

2
1
2 1
21
1 12 11
2
1
| | | || | I Z V =
0 =
=
=
j k
I
j
i
ij
I
V
Z
(Open circuit impedance)
Impedance Matrix: Z Parameters
or [5.5.1]
where [5.5.2]
2 22 1 21 2
2 12 1 11 1
I Z I Z V
I Z I Z V
+ =
+ =
2 Port example: (

=
(

2
1
22 21
12 11
2
1
I
I
Z Z
Z Z
V
V
[5.5.4] [5.5.3]
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H. Heck 2008
Section 5.5 7
Y Parameters
(
(
(
(

(
(
(
(

=
(
(
(
(

N NN N N
N
N
V
V
V
Y Y Y
Y
Y Y Y
I
I
I

2
1
2 1
21
1 12 11
2
1
| | | || | V Y I =
0 =
=
=
j k
V
j
i
ij
V
I
Y
(Short circuit admittance)
Admittance Matrix: Y Parameters
or
[5.5.6]
[5.5.5]
where
2 22 1 21 2
2 12 1 11 1
V Y V Y I
V Y V Y I
+ =
+ =
2 Port example: (

=
(

2
1
22 21
12 11
2
1
V
V
Y Y
Y Y
I
I
Advantage: Y parameters are also somewhat intuitive.
Disadvantage: Requires short circuit voltage
measurements, which are difficult to make.
Short circuit reflections inject noise into measurements.
Short circuit inductance is non-trivial at high frequencies.
[5.5.7] [5.5.8]
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H. Heck 2008
Section 5.5 8
Example
Z
C
Z
A
Z
B
+
-
+
-
V
1
V
2
I
1
I
2
P
o
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t

1
P
o
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t

2
C A
C A
I
Z Z
Z Z
V
V
I
V
Z + =
+
= =
=
1
1
1
1
11
0 2
C
C
I
Z
I
Z I
I
V
Z = = =
=
2
2
2
1
12
0 1
C
C
I
Z
I
Z I
I
V
Z = = =
=
1
1
1
2
21
0 2
C B
C B
I
Z Z
Z Z
V
V
I
V
Z + =
+
= =
=
2
2
2
2
22
0 1
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H. Heck 2008
Section 5.5 9
Frequency Domain: Vector Network Analyzer (VNA)
VNA offers a means to
characterize circuit elements
as a function of frequency.
VNA is a microwave based instrument that provides the
ability to understand frequency dependent effects.
The input signal is a frequency swept sinusoid.
Characterizes the network by observing transmitted and
reflected power waves.
Voltage and current are difficult to measure directly.
It is also difficult to implement open & short circuit loads at high
frequency.
Matched load is a unique, repeatable termination, and is
insensitive to length, making measurement easier.
Incident and reflected waves the key measures.
We characterize the device under test using S parameters.
2-Port
Network
V
1
+
V
2
I
1
I
2
-
+
-
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H. Heck 2008
Section 5.5 10
S Parameters
We wish to characterize the network by observing
transmitted and reflected power waves.
a
i
represents the square root of the power wave injected into port i.



b
i
represents the square root of the power wave injected into port j.

2 Port
Network
a
1

+
-
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1
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2
a
2

+
-
V
2
P
o
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t

1
b
1
b
2
R
V
P
2
=
R
V
P a
i
+
= =
1
R
V
b
j
j

=
use
to get
[5.5.9]
[5.5.10]
[5.5.11]
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H. Heck 2008
Section 5.5 11
S Parameters #2
We can use a set of
linear equations to
describe the behavior of
the network in terms of
the injected and
reflected power waves.
For the 2 port case:
2 Port
Network
a
1

+
-
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1
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2
a
2

+
-
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2
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o
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t

1
b
1
b
2
2 22 1 21 2
2 12 1 11 1
a S a S b
a S a S b
+ =
+ =
i port at measured power
j port at measured power
= =
i
j
ij
a
b
S
where
in matrix form:
[5.5.12]
[5.5.13]
(

=
(

2
1
22 21
12 11
2
1
a
a
S S
S S
b
b
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H. Heck 2008
Section 5.5 12
S Parameters n Ports
[5.5.14]
[5.5.17]
n
n
n
Z
V
a
0
+
=
| | | || | a S b =
n
n
n
Z
V
b
0

=
+
= =
= =
+

= =
j k k
j k k
V
j
j
i
i
a
j
i
ij
Z
V
Z
V
a
b
S
, 0
, 0
0
0
(
(
(
(

(
(
(
(

=
(
(
(
(

n nn n
N
n
a
a
a
S S
S
S S S
b
b
b

2
1
1
21
1 12 11
2
1
n nn n n n
n n
n n
a S a S a S b
a S a S a S b
a S a S a S b
+ + + =
+ + + =
+ + + =

2 2 1 1
2 2 22 1 21 2
1 2 12 1 11 1
or
[5.5.15]
[5.5.16]
[5.5.18]
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H. Heck 2008
Section 5.5 13
Scattering Matrix Return Loss
S
11
, the return loss, is a
measure of the power
returned to the source.
When there is no
reflection from the load,
or the line length is
zero, S
11
is equal to the
reflection coefficient.
O +
O
= = = = = =
+

=
50
50
0
0
0
1
1
0
1
0
1
1
1
11
0 2
Z
Z
V
V
V
V
Z
V
Z
V
a
b
S
incident
reflected
a

[5.5.19]
0
0 , 0
= =
= = j j
a
i
i
ii
a
b
S
In general:
[5.5.20]
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H. Heck 2008
Section 5.5 14
Scattering Matrix Return Loss #2
When there is a reflection from the load,
S
11
will be composed of multiple reflections
due to standing waves.
Use input impedance to calculate S
11
when
the line is not perfectly terminated.
) 0 ( 1
) 0 ( 1
) 0 (
=
= +
= = =
z
z
Z z Z Z
o in

If the network is driven with a 50O source,

S
11
is calculated using equation [5.5.22]
R
S
= 50O
Z
in
S
11
for a transmission line will exhibit
periodic effects due to the standing
waves.
In this case S
11
will be maximum when Z
in
is real. An imaginary
component implies a phase difference between V
inc
and V
ref
. No phase
difference means they are perfectly aligned and will constructively add.
50
50
11
+

= =
in
in
v
Z
Z
S
[5.5.21]
[5.5.22]
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H. Heck 2008
Section 5.5 15
Scattering Matrix Insertion Loss #1
When power is injected into Port 1 and measured at Port
2, the power ratio reduces to a voltage ratio:
incident
d transmitte
o
o
a
V
V
V
V
Z
V
Z
V
a
b
S = =
+
= =
+

= 1
2
1
2
0 2
1
2
21
2 Port
Network
a
1

+
-
V
1
P
o
r
t

2
a
2

+
-
V
2
P
o
r
t

1
b
1
b
2
Z
0
Z
0
S
21
, the insertion loss, is a measure of the power
transmitted from port 1 to port 2.
[5.5.22]
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H. Heck 2008
Section 5.5 16
Comments On Loss
True losses come from physical energy losses.
Ohmic (i.e. skin effect)
Field dampening effects (loss tangent)
Radiation (EMI)

Insertion and return losses include other effects, such
as impedance discontinuities and resonance, which
are not true losses.

Loss free networks can still exhibit significant insertion
and return losses due to impedance discontinuities.

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H. Heck 2008
Section 5.5 17
Reflection Coefficients
Reflection coefficient at the load:
0
0
Z Z
Z Z
L
L
L
+

=
0
0
Z Z
Z Z
S
S
S
+

=
L
L
L
L
in
S
S
S
S
S S
S

11
2
12
11
22
21 12
11
1 1
+ =

+ =
S
S
out
S
S S
S

11
21 12
22
1
+ =
[5.5.23]
[5.5.24]
[5.5.25]
[5.5.26]
Reflection coefficient at the source:
Input reflection coefficient:
Output reflection coefficient:
Assuming S
12
= S
21
and S
11
= S
22
.
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H. Heck 2008
Section 5.5 18
Transmission Line Velocity Measurements
We can calculate the delay per unit length
(or velocity) from S
21
:
S
21
= b
2
/a
1
( )
p
d
v l f
S 1
360
21
=

=

|
t
Where |(S
21
) is the phase angle of the S
21
measurement.
f is the frequency at which the measurement was taken.
l is the length of the line.
[5.5.27]
0 180
+90
-90
Positive
Phase
Negative
Phase
0.8 Z135
|
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H. Heck 2008
Section 5.5 19
Impedance vs. frequency
Recall

Z
in
vs f will be a function of delay (|) and Z
L
.
We can use Z
in
equations for open and short circuited
lossy transmission.
Transmission Line Z
0
Measurements
( ) l Z Z
open in
tanh
0 ,
=
( ) l Z Z
short in
coth
0 ,
=
l j
l j
in
e
e
Z Z
|
|

2
2
0
1
1

+
=
open in short in
Z Z Z
, , 0
=
[5.5.28]
[5.5.29]
[5.5.30]
Using the equation for Z
in
,

in
, and Z
0
, we can find the
impedance.
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H. Heck 2008
Section 5.5 20
Transmission Line Z
0
Measurement #2
( )
( )
short in
short in
VNA
j
short in
j
short in
VNA short in
Z
e
e
Z Z
,
,
0 2
,
0 2
,
,
1
1
1
1

|
|

+
=

+
=

open in short in
Z Z Z
, , 0
=
[5.5.31]
[5.5.32]
( )
( )
11
2
12
11
11
2
12
11 ,
1 1 1
1
S
S
S
S
S
S
open in

+ =

+ =
Input reflection coefficients for the open and short circuit cases:
( )
( )
11
2
12
11
11
2
12
11 ,
1 1 1
1
S
S
S
S
S
S
short in
+
=


+ =
( )
( )
open in
open in
VNA
j
open in
j
open in
VNA open in
Z
e
e
Z Z
,
,
0 2
,
0 2
,
,
1
1
1
1

|
|

+
=

+
=

Input impedance for the open and short circuit cases:

Now we can apply equation [5.5.30]:
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H. Heck 2008
Section 5.5 21
Scattering Matrix Example
Using the S
11
plot shown below, calculate Z
0
and
estimate c
r.

0
1.0 1.5 2.0 2.5 3..0 3.5 4.0 4.5 5.0
Frequency [GHz]
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
0.45
S
1
1

M
a
g
n
i
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H. Heck 2008
Section 5.5 22
Scattering Matrix Example #2
1.76GHz 2.94GHz
Step 1: Calculate the t
d

of the transmission line
based on the peaks or
dips.
d
peaks
t
GHz GHz f
2
1
76 . 1 94 . 2 = = A
Step 2: Calculate c
r
based on the velocity (prop delay per unit length).
m inch inch ps
s m c
v
r r d
/ 37 . 39 / 7 . 84
1 / 10 3 1
8

= = =
c c t
Peak=0.384
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
0.45
S
1
1

M
a
g
n
i
t
u
d
e

0 . 1 =
r
c
ps t
d
7 . 423 =
inch ps
in
ps
d
/ 7 . 84
5
7 . 423
= = t
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H. Heck 2008
Section 5.5 23
Example Scattering Matrix (Cont.)
Step 3: Calculate the input impedance to the transmission line
based on the peak S
11
at 1.76GHz, assuming a 50O port.
384 . 0
50
50
11
=
+

=
in
in
Z
Z
S
Step 4: Calculate Z
0
from Z
in
at z=0:
( )
LC fl j
o
o
l
e
Z
Z
e x
t

4 2
50
50
0 ) (
+

= =
Solution: c
r
= 1.0 and Z
0
= 75O
O = 33 . 112
in
Z
1
366 . 9 7 . 84 ) 5 ( 76 . 1 4 4
~ = =
j ps GHz LC fl j
e ej e
t t
) 1 (
50
50
1
) 1 (
50
50
1
33 . 112
) 5 ( 1
) 5 ( 1

+
= =
=
= +
=
o
o
o
o
o o in
Z
Z
Z
Z
Z
z
z
Z Z

O = 9 . 74
o
Z
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H. Heck 2008
Section 5.5 24
Advantages/Disadvantages of S Parameters
Advantages:
Ease of measurement: It is much easier to measure
power at high frequencies than open/short current and
voltage.

Disadvantages:
They are more difficult to understand and it is more
difficult to interpret measurements.
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H. Heck 2008
Section 5.5 25
Transmission (ABCD) Matrix
The transmission matrix describes the network in terms of
both voltage and current waves (analagous to a Thvinin
Equivalent).
The coefficients can be defined using superposition:
2 2 1
2 2 1
DI CV I
BI AV V
+ =
+ =
2
2
1
1
I
V
D C
B A
I
V
=
0
2
1
2
=
=
I
V
I
C
2 Port
Network
I
1

+
-
V
1
P
o
r
t

2
I
2

+
-
V
2
P
o
r
t

1
0
2
1
2
=
=
V
I
I
D
0
2
1
2
=
=
V
I
V
B
0
2
1
2
=
=
I
V
V
A
[5.5.33]
[5.5.34]
[5.5.35]
[5.5.36]
[5.5.29]
[5.5.31]
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H. Heck 2008
Section 5.5 26
I
1
+
-
V
1
I
2

V
2
I
1

I
3
+
-
V
3
Transmission (ABCD) Matrix
Since the ABCD matrix represents the ports in terms of currents and
voltages, it is well suited for cascading elements.
The matrices can be mathematically cascaded by multiplication:
3
3
2
2
2
2
2
1
1
1
I
V
D C
B A
I
V
I
V
D C
B A
I
V
=
=
3
3
2 1
1
1
I
V
D C
B A
D C
B A
I
V
=
This is the best way to cascade elements in the frequency domain.
It is accurate, intuitive and simple to use.
2
D C
B A
1
D C
B A
[5.5.37]
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H. Heck 2008
Section 5.5 27
ABCD Matrix Values for Common Circuits
Z
Port 1 Port 2
1 0
1
= =
= =
D C
Z B A
Port 1
Y
Port 2 1
0 1
= =
= =
D Y C
B A
3 2 3
3 2 1 2 1 3 1
/ 1 / 1
/ / 1
Z Z D Z C
Z Z Z Z Z B Z Z A
+ = =
+ + = + =
Z
1
Port 1 Port 2
Z
2
Z
3
Y
1
Port 1 Port 2
Y
2
Y
3
3 1 3 2 1 2 1
3 3 2
/ 1 /
/ 1 / 1
Y Y D Y Y Y Y Y C
Y B Y Y A
+ = + + =
= + =
Port 1 Port 2
,
o
Z
) cosh( ) sinh( ) / 1 (
) sinh( ) cosh(
l D l Z C
l Z B l A
o
o


= =
= =
l
[5.5.38]
[5.5.39]
[5.5.40]
[5.5.41]
[5.5.42]
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Section 5.5 28
Converting to and from the S-Matrix
The S-parameters can be measured with a VNA, and
converted back and forth into ABCD the Matrix
Allows conversion into a more intuitive matrix
Allows conversion to ABCD for cascading
ABCD matrix can be directly related to several useful circuit
topologies
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H. Heck 2008
Section 5.5 29
P
o
r
t

2
P
o
r
t

1
ABCD Matrix Example
Create a model of a via from the measured s-parameters.
The model can be extracted as either a Pi or a T network
The inductance values will include the L of the trace and
the via barrel
assumes the test setup minimizes the trace length, so
that trace capacitance is minimal.
The capacitance represents the via pads.
L
1
L
1
C
via
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H. Heck 2008
Section 5.5 30
ABCD Matrix Example #1
The measured S-parameter matrix at 5 GHz is:
153 . 0 110 . 0 572 . 0 798 . 0
572 . 0 798 . 0 153 . 0 110 . 0
22 21
12 11
j j
j j
S S
S S


=
Converted to ABCD parameters:
( )( ) ( )( )
( )( ) ( )( )
827 . 0 0157 . 0
08 . 20 827 . 0
2
1 1
2
1 1
2
1 1
2
1 1
21
21 12 22 11
21
21 12 22 11
21
21 12 22 11
21
21 12 22 11
j
j
S
S S S S
S Z
S S S S
S
S S S S
Z
S
S S S S
D C
B A
VNA
VNA
=
+
+ + + +
=
Relating the ABCD parameters to the T circuit topology,
the capacitance can be extracted from C & inductance
from A:
pF C
fC j
Z
j C
VIA
VIA
5 . 0
2
1
1 1
0157 . 0
3
=

= = =
t
nH L L
fC j
fL j
Z
Z
A
VIA
35 . 0
) 2 /( 1
2
1 827 . 0 1
2 1
3
1
= =

+ = = + =
t
t
Z
1
Port 1 Port 2
Z
2
Z
3
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H. Heck 2008
Section 5.5 31
Advantages/Disadvantages of ABCD Matrix
Advantages:
The ABCD matrix is intuitive: it describes all ports with
voltages and currents.
Allows easy cascading of networks.
Easy conversion to and from S-parameters.
Easy to relate to common circuit topologies.

Disadvantages:
Difficult to directly measure: Must convert from
measured scattering matrix.
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H. Heck 2008
Section 5.5 32
Summary
We can characterize interconnect networks
using n-Port circuits.
The VNA uses S- parameters.
From S- parameters we can characterize
transmission lines and discrete elements.
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H. Heck 2008
Section 5.5 33
References
D.M. Posar, Microwave Engineering, John Wiley & Sons,
Inc. (Wiley Interscience), 1998, 2
nd
edition.
B. Young, Digital Signal Integrity, Prentice-Hall PTR, 2001,
1
st
edition.
S. Hall, G. Hall, and J. McCall, High Speed Digital System
Design, John Wiley & Sons, Inc. (Wiley Interscience), 2000,
1
st
edition.
W. Dally and J. Poulton, Digital Systems Engineering,
Chapters 4.3 & 11, Cambridge University Press, 1998.
Understanding the Fundamental Principles of Vector
Network Analysis, Agilent Technologies application note
1287-1, 2000.
In-Fixture Measurements Using Vector Network Analyzers,
Agilent Technologies application note 1287-9, 2000.
De-embedding and Embedding S-Parameter Networks
Using A Vector Network Analyzer, Agilent Technologies
application note 1364-1, 2001.
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H. Heck 2008
Section 5.5 34
Appendix
More material on S parameters.
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H. Heck 2008
Section 5.5 35
{ }
{ } 0 Re
any for 0 Re
=
=
mn
mn
Y
m,n Z
j k k
I
j
i
ij
I
V
Z
= =
=
, 0
j k k
V
j
i
ij
V
I
Y
= =
=
, 0
Lossless
Reciprocal ji ij
Z Z =
ji ij
Z Z =
| | | |
1
= Z Y
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H. Heck 2008
Section 5.5 36
S Parameters
(
(
(
(
(

(
(
(
(

=
(
(
(
(
(

+
+
+

N NN N N
N
N
V
V
V
S S S
S
S S S
V
V
V

2
1
2 1
12
1 21 11
2
1
| | | || |
+
= V S V
+
= =
+

=
j k k
V
j
i
ij
V
V
S
, 0
Scattering Matrix: S Parameters
or
[5.5.1]
where
[5.5.2]
+
+ =
n n n
V V V
+ +
= + =
n n n n n
V V I I I
????
| || | | || | | || | | | | | | |
+ +
+ = = = V V V I Z I Z I Z
| | | | ( )| | | | | | ( )| |
+
= + V U Z V U Z
| |
(
(
(
(

=
1 0
1 0
0 0 1

U
| | | | | | | | | | ( ) | | | | ( ) U Z U Z V V S + = =

+
1
1
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H. Heck 2008
Section 5.5 37
S Parameters #2
[5.5.1]
where
[5.5.2]
| | | | | | | | | | ( ) | | | | ( ) U Z U Z V V S + = =

+
1
1
| | | | | | ( ) | | | | | || | | || | U S Z S U Z U Z S + = = +
| | | | | | ( ) | | | | ( ) S U S U Z + =
1
| | | |
T
S S =
Reciprocal

=
=
N
k
ki ki
S S
1
*
1

=
= =
N
k
kj ki
j i S S
1
*
, 0
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H. Heck 2008
Section 5.5 38
S Parameters n Ports
[5.5.1]
[5.5.2]
n
n
n
Z
V
a
0
+
=
| | | || | a S b =
n
n
n
Z
V
b
0

=
( )
n n n n n n
b a Z V V V + = + =
+
0
( )
n n
n n
n n
n
b a
Z Z
V V
I =

=
+
0 0
1
2 2
2
1
2
1
n n n
b a P =
j k k
a
j
i
ij
a
b
S
= =
=
, 0
+
= =
= =
+

= =
j k k
j k k
V
j
j
i
i
a
j
i
ij
Z
V
Z
V
a
b
S
, 0
, 0
0
0
(
(
(
(

(
(
(
(

=
(
(
(
(

n nn n
N
n
a
a
a
S S
S
S S S
b
b
b

2
1
1
21
1 12 11
2
1
n nn n n n
n n
n n
a S a S a S b
a S a S a S b
a S a S a S b
+ + + =
+ + + =
+ + + =

2 2 1 1
2 2 22 1 21 2
1 2 12 1 11 1
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H. Heck 2008
Section 5.5 39
S Parameters #4
[5.5.1]
[5.5.2]
| | | || | a S b =
where
j k k
a
j
i
ij
a
b
S
= =
=
, 0
+
= =
= =
+

= =
j k k
j k k
V
j
j
i
i
a
j
i
ij
Z
V
Z
V
a
b
S
, 0
, 0
0
0
n i a S b
n
j
j ij i
, , 3 , 2 , 1 for = =

S
ij
= I
ij
is the reflection coefficient of the ith
port if i=j with all other ports matched
S
ij
= T
ij
is the forward transmission coefficient
of the ith port if I>j with all other ports
matched
S
ij
= T
ij
is the reverse transmission coefficient
of the ith port if I<j with all other ports
matched
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H. Heck 2008
Section 5.5 40
VNA Calibration
Proper calibration is critical!!!
There are two basic calibration methods
Short, Open, Load and Thru (SOLT)
Calibrated to known standard( Ex: 50O)
Measurement plane at probe tip
Thru, Reflect, Line(TRL)
Calibrated to line Z
0
Helps create matched port condition.
Measurement plane moved to desired position set by
calibration structure design.
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H. Heck 2008
Section 5.5 41
SOLT Calibration Structures
OPEN SHORT
LOAD THRU
Calibration Substrate
G
G
S
S
G
S
Signal
Ground
G
S
G
S
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H. Heck 2008
Section 5.5 42
TRL Calibration Structures
TRL PCB Structures
Normalized Z
0
to line
De-embeds launch structure parasitics
6mil wide gap
Short
100 mils 100 mils
Open
?
Thru
?
L1
?
L2
Measurement
Planes
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H. Heck 2008
Section 5.5 43
Calibration- Verification
Always check the calibration prior to taking
measurements.
Verify open, load etc..
Smith Chart: Open & Short should be inside the perimeter.
Ideal response is dot at each location when probing the calibration
structures.

Capacitance
Inductance
Normalized
Zo
Perimeter
Zo = 0+/- j X
Short
1.0 0.2 20
-j0.5
-j1.0
+j0.5
+j1.0

Zo
Open
Normalized
Zo = 0.2 - j1
S
11
(Short) S
11
(Open)
S
11
(load)
S
21/12
(Thru)
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H. Heck 2008
Section 5.5 44
One Port Measurements
Practical sub 2 GHz technique for L & C data.
Structure must be electrically shorter than /4 of f
max
.
1
st
order (Low Loss):
Z
in
= jwL (Shorted transmission line)
Z
in
= 1/jwC (Open transmission line)
For an electrically short structure V and I to order are ~constant.
At the short, we have I
max
and V
min
.
Measure L using a shorted transmission line with negligible loss.
At the open you have V
max
and I
min
.
Measure C using an open transmission line with negligible loss.

V
R
S
= 50O
DUT
Short
Current
Z
in
= jeLI
DUT
Open
V
R
S
= 50O
Z
in
= V/jeC
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H. Heck 2008
Section 5.5 45
One Port Measurements L & C
VNA - Format
Use Smith chart
format to read L & C data
Capacitance
Inductance
Normalized
Zo
Perimeter
Zo = 0+/- j X
Short
1.0 0.2 20
-j0.5
-j1.0
+j0.5
+j1.0

Zo
Open
Normalized
Zo = 0.2 - j1
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H. Heck 2008
Section 5.5 46
Connector L & C
Use test board to measure connector inductance and
capacitance
Measure values relevant to pinout
Procedure
Measure test board L & C without connector
Measure test board with connector
Difference = connector parasitics
Short
Open