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UNIT IV - High Voltage Engineering
UNIT IV - High Voltage Engineering
CURRENTS
By
Anish John paul. M
Head of School
School of Electrical & Electronics Engineering
R2
(R1 R2 )
Highvoltagemagnitude,
V1 V2
(R1 R2 )
R2
The capacitance is a function of time as the area A varies with time and, therefore,
the charge q(t) is given as,
and,
For d.c. Voltages,
Hence
If the capacitance C varies sinusoidally between the limits C 0 and (C0 + Cm) then
C = C0 + Cm sin t
and the current i' is then given as, i(t) = im cos t , where im = VCm
Here is the angular frequency of variation of the capacitance.
If the current is small an amplifier may be used before the current is measured.
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Electrostatic Voltmeter
1
1
CV 2 dW V 2 dC F ds
2
2
1
dC
Force, F V 2
Newton
2
ds
W
A
dC
A
2
s
ds
s
1 V2
F A 2 Newton
2 s
It is thus seen that the force of attraction is proportional to the square of the potential difference
applied, so that the meter reads the square value (or can be marked to read the rms value).
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Electrostatic voltmeters of the attracted disc type may be connected across the high
voltage circuit directly to measure up to about 200 kV, without the use of any
potential divider or other reduction method. [The force in these electrostatic
instruments can be used to measure both a.c. and d.c. voltages].
The centre portion of the left hand disc is cut away and encloses a small disc which
is movable and is geared to the pointer of the instrument.
The small movement is generally transmitted and amplified by a spot light and
mirror system, but many other systems have also been used.
An incident light beam will therefore be reflected toward a scale calibrated to read
the applied voltage magnitude.
The electrostatic measuring device can be used for absolute voltage measurements
since the calibration can be made in terms of the fundamental quantities of the gap
length and forces.
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Electrostatic Voltmeter
Advantages:
i.
ii.
Disadvantage:
i.
For power frequency a.c. measurements the series impedance may be a pure
resistance or a reactance.
But use of resistances yields the followings,
Power losses
Temperature problem
Residual inductance of the resistance gives rise to an impedance different from its ohmic
resistance.
High resistance units for high voltages have stray capacitances and hence a unit
resistance will have an equivalent circuit as shown in Fig.
At any frequency of the a.c. voltage, R+jXL is connected in parallel with jXC.
1
R jL
jC
Z
2
1
1
LC jCR
R jL
jC
R jL
Since, 2 LC jCR,
Z
R jL
1 jCR
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R jL 1 jCR
1 jCR 1 jCR
R jL jCR 2 2 LCR
Z
1 2C 2 R 2
L
Z R jL jCR 2 R 1 j
CR
R
Not recommended when a.c. voltages are not pure sinusoidal waves but
contain considerable harmonics.
Used for measuring rms values up to 1000 kV.
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C capacitor
D1,D2 Diodes
OP Protective devices
I indicating meter
Ic(t) capacitor current
waveform
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C1 C2 Cm
C1
V1 V2
where,
V2 - Reading of Voltmeter
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L LT
1
C1 C 2
where,
L - Inductance of the choke
LT - Equivalent inductance of the transformer referred to
h.v. side
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Advantages:
simple design and easy installation,
can be used both as a voltage measuring device for meter
provides isolation between the high voltage terminal and low voltage metering.
Disadvantages:
the voltage ratio is susceptible to temperature variations, and
the problem of inducing ferro-resonance in power systems.
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An increased current would be obtained if the current reaches zero more than once during
one half cycle
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This means the wave shapes of the voltage would contain more than one maxima per half cycle.
The standard a.c. voltages for testing should not contain any harmonics and, therefore, there
could be very short and rapid voltages caused by the heavy predischarges, within the test circuit
which could introduce errors in measurements.
To eliminate this problem filtering of a.c. voltage is carried out by introducing a damping resistor
in between the capacitor and the diode circuit, Fig. 4.11 (b).
The measurement of symmetrical a.c. voltages using Chubb and Fortescue method is quite
accurate and it can be used for calibration of other peak voltage measuring devices.
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Sphere Gaps
A spark gap can be used for measurement of the peak value of the voltage, if the
gap distance is known.
Applications:
Voltage Measurement (Peak) - Peak values of voltages may be measured from 2 kV up to
about 2500 kV by means of spheres.
Arrangements:
1. Vertically with lower sphere grounded (For Higher Voltages)
2. Horizontally with both spheres connected to the source voltage or one sphere grounded
(For Lower Voltages).
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Sphere Gaps
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Sphere Gaps
The arrangement is selected based on the relation between the peak voltage,
determined by sparkover between the spheres, and the reading of a voltmeter on the
primary or input side of the high-voltage source. This relation should be within 3%
(IEC, 1973).
Standard values of sphere diameter are 6.25, 12.5, 25, 50, 75, 100, 150, and 200
cm.
The Clearance around the sphere gaps:
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Sphere Gaps
Under impulse voltages, the voltage at which there is a 50% breakdown probability
is recognized as the breakdown level.
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Sphere Gaps
Factors Influencing the Sparkover Voltage of Sphere Gaps
i.
ii.
iii.
iv.
The limits of accuracy are dependant on the ratio of the spacing d to the sphere
diameter D, as follows:
d < 0.5 D
0.75 D > d > 0.5 D
Accuracy = 3 %
Accuracy = 5 %
For accurate measurement purposes, gap distances in excess of 0.75D are not used
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Method used
D.C Current
1. Resistant shunt
2. Hall Generator
1.
2.
3.
4.
5.
Resistive shunts
Magnetic potentiometers or probes
Magnetic links
Hall generators
Faraday Generators
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Hall Generators
Hall Generators
Hall Voltage, VH
BI
d
BI
d
where, B-Magnetic Flux density
I-Current
d-Thickness of the metal plate
R-Hall Coefficient (depends on Material of
the plate & temperature)
R is small for metals and High for
semiconductors
VH R
Hall Generators
The Hall element is placed in the air gap and a small constant
d.c. current is passed through the element.
The voltage developed across the Hall element is measured
and by using the expression for Hall voltage the flux density B
is calculated and hence the value of current I is obtained.
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The filter F allows only the monochromatic light to pass through it.
Photoluminescent diodes too, the momentary light emission of which is
proportional to the current flowing through them, can be used for
current measurement.
Advantages:
1.
2.
3.
It provides isolation of the measuring set up from the main current circuit.
It is insensitive to overloading.
As the signal transmission is through an optical system no insulation problem
is faced. However, this device does not operate for D.C current.
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and M is the mutual inductance between the coil and the conductor, the
voltage across the coil terminals will be:
di
v(t) M
dt
Usually the coil is wound on a non-magnetic former in the form of a
toroid and has a large number of turns, to have sufficient voltage
induced which could be recorded.
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1
1
di
M
M
v0 (t)
v(t)dt
dt
di
i(t)
RC 0
RC
dt
RC
RC
The frequency response of the Rogowski coil is flat upto 100 MHz but
beyond that it is affected by the stray electric and magnetic fields and
also by the skin effect.
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Resistive Shunt
(a) Ohmic shunt
Used for high impulse current measurements is a low ohmic pure resistive
shunt.
Current through the resistive element R produces a voltage drop v(t)=i(t)R.
v(t) is transmitted to a CRO through a coaxial cable of surge impedance Z 0.
Cable at oscilloscope end is terminated by a resistance Ri = Z0 to avoid
reflections.
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Resistive Shunt
R sL
I ( s)
V ( s ) R sL I ( s )
LC
where, V(s) and I(s) are the transformed quantities of the signals v(t) and i(t)
s- Laplace Operator or Complex Frequency
1 sRC s
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Resistive Shunt
Types:
1. Bifilar flat strip design,
2. Coaxial tube or Park's shunt design, and
3. Coaxial squirrel cage design
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i.
ii.
a.
b.
c.
iii.
a.
b.
iv.
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The effect to residual and lead inductances becomes pronounced when fast
rising impulses of less than one microsecond are to be measured.
The residual inductances damp and slow down the fast rising pulses.
Secondly, the layout of the test objects, the impulse generator, and the
ground leads also require special attention to minimize recording errors.
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