Professional Documents
Culture Documents
Afm
Afm
Afm
PRESENTED BY
VijAY S Khoiwal
BRANCHES OF MICROSCOPY
There are three well-known branches of
microscopy,
Optical microscopy,
Electron microscopy, and
scanning probe microscopy.
CHARACTERISTICS OF COMMON
MICROSCOPIC TECHNIQUES
PRINCIPLEOFAFM
The AFM brings a probe in
close proximity to the surface
The force is detected by the
deflection of a spring, usually
a cantilever.
Forces between the probe
tip and the sample are
sensed to control the
distance between the the tip
and the sample.
AFM TIP
Tips have a pyramidal
geometry.
AFM TIP
One of the most important factors influencing the resolution which may be
achieved with an AFM is the sharpness of the scanning tip. Best tips may
have a radius of curvature of only around 5nm.
CANTILEVERS
AFM Cantilevers are specified by their width, length, and
thickness.
These parameters determine important factors like
resonance frequency and spring constant.
MODES IN AFM
MODES OF OPERATION
FORCES OF INTERACTION
CONTACT MODE
INTERMITTENT CONTACT
MODE/TAPPING MODE
Contact Mode
High resolution
Damage to sample
Can measure frictional forces
Non-Contact Mode
Lower resolution
No damage to sample
Tapping Mode
Better resolution
Minimal damage to sample
Tapping
Working mode
Sliding the probe tip across surface, heavily influenced by
frictional and adhesive forces, which can damage samples
and distort image data.
Sensing Van der Waals attractive forces between surface
and probe tip held above surface (50 - 150 ), low
resolution and can also be hampered by the contaminant
layer which can interfere with oscillation.
Tapping the surface with an oscillating probe tip,
eliminates frictional forces by intermittently contacting
the surface and oscillating with sufficient amplitude to
prevent the tip from being trapped by adhesive meniscus
forces from the contaminant layer.
Medium
Imaging
in air
Imaging
in liquids
Imaging
of
embedde
d
particles
Example
Dry powder
Carbon nano tube
Method
substrate is chemically treated and dry, it is immediately
ready for powder deposition
diluted dispersant suspensions of carbon nanotubes
are spin coated on a silicon wafer
Bio-particles in buffer
SAMPLE PREPARATION
DEPOSITION ON FRESHLY
PREPARED MICA SHEET
2% Wt CNC
conc.
I slope:
Cantilever- CNC stiffness
Modulus of CNC
Elastic response
Indentation
Approach
Withdraw
Indentation
length
Experimental value
Continued.
The resulting F() curve can be fitted to physics-based
models that predict the AFM tip-substrate contact
mechanics, and the elastic modulus can be estimated by
tuning the theoretical elastic modulus value to match the
theoretical prediction with observed data.
STIFFNESS MEASUREMENT
Keff (effective stiffness) = Kc(cantilever stiffness) +Ksample (stifness b/w tip and sample)
The slope of the F(z) = dF/dz
dF/dz
TOPOGRAPY
Bending rigidity
Measured in contact-mode AFM by pushing an AFM tip
against a CNC
By increasing the normal force into the 8-10 nN range, it
was observed empirically that crystals A and B( 3-5 nN were
insufficient to cause the relative motion )
The small radius of the bending curvature (i.e., large
amount of bending over an 100 nm crystal length
stiffening contribution of interhydrogen bonding between
neighboring cellulose chains within the crystalline cellulose
will resist local cellulose chain deformation resulting from an
applied load.
dynamic-mode AFM
topography images of two
CNCs prior to and after
manipulation (crystals A
and B)
APPLICATIONS
Nanostructures
Bucky balls and nanotubes.
Surface of polymers
Diffraction grating
Integrated circuits.
pharmaceutical research, including drug
polymorphic discrimination ,
determination of intrinsic dissolution rate of
crystal planes,
quantitation of adhesion between powders and
particles and gelatine surfaces ,
For characterisation of nanoparticles
ADVANTAGES OF AFM
Does not require vacuum to operate.
Gives a 3D topographical representation of the
surface of the sample.
Can give additional information about the physical
characteristics of the material like co-efficients of
friction.
Nanomanipulation.
Limitations:
THANK
YOU