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System Design Constraints, RAM-T, A Paradigm Shift: Vern Fox United Defense LP
System Design Constraints, RAM-T, A Paradigm Shift: Vern Fox United Defense LP
Vern Fox
United Defense LP
Agenda
RAM-T Overview
Legacy Methods
Legacy Results
Paradigm Shift: RAM-T Case
Implementation
2
RAM-T Overview
What is RAM-T
Reliability - The ability of a system or component to perform its
required functions under stated conditions for a specified period of
time.
Availability – the ability of a product to be ready for use when the
customer wants to use it (uptime/uptime+downtime)
Maintainability - the relative ease and economy of time and resources
with which an item can be retained in, or restored to, a specified
condition when maintenance is performed by personnel having
specified skill levels, using prescribed procedures and resources at
prescribed level of maintenance and repair.
Testability – A design characteristic which allows the status (operable,
inoperable or degraded) of an item to be determined and the isolation
of failures within the item to be performed in a timely manner.
System Design Constraints
3
Legacy Methods
Legacy Approach Eliminate some component RAM-T drivers
Fix integration issues
Eliminate some component RAM-T drivers Update design
Fix integration issues Late identification of component
Update design RAM-T shortcomings
limits corrective action
System Int
Assessments Subsystem Int
and Test
Preliminary Design Detailed Design Test Fielding
Perform predictions
Based on handbook data
Based on similar equipment
Address SOME RAM-T drivers
RAM-T optimized during test
Low initial RAM-T
High test hours, high $’s
4
Legacy Results
Demonstrated Reliability Versus Requirements for
Operational TypeTests FIELD
4500
LUT
1000 FOT
900 IOT
Met
Demonstrated MTB_
800 DT/OT
Only
700 30%
600 Not Met
Success
500
400
300
200
(Data 1996 - Oct 01)
100
0
0 200 400 600 800 1000 1200 1400
Requirement MTB_
6
Paradigm Shift
Legacy Approach Eliminate some component RAM-T drivers
Fix integration issues
Eliminate some component RAM-T drivers Update design
Fix integration issues
Late identification of component
Update design
RAM-T shortcomings
limits corrective action
System Int
Assessments Subsystem Int
and Test
Preliminary Design Detailed Design Test Fielding
8
Paradigm Shift: RAM-T Case
A RAM-T Case Program/Plan sample contents
• Benchmarking RAM-T Requirements
• Dynamic/static design modeling, simulation, or probabilistic
analysis
• Critical component identification
• RAM-T Modeling, Optimization and Component/System Testing
• Environmental stress (operate and storage)
• Physics-of-Failure (PoF)
• Structural finite-element stress analysis
• Fatigue analysis
• Wear-out/service life analysis
• Long-term storage (shelf life) assessment
• Prognostics analysis
• Fault detection/isolation analysis
• Built-in Test False alarm rate analysis
• Availability Analysis
• On-board Sparing: Supportability analysis
• RAM-T Block Diagram
• RAM-T Assessments Analysis
• Risk assessment & mitigation
• Diminishing resources/obsolescence plan
• Pit Stop Engineering
9
Paradigm Shift: RAM-T Case
RAM-T Case Management Plan
Methods/activities to be performed to make case
• Goal - Robust designs
• Physics of Failure (PoF)
Finite Element Analysis (FEA)
Fatigue Analysis
Probabilistic Analysis
calcePWA Analysis
Pit-Stop Engineering
• RAM-T Enhancement Testing (RET)
Highly Accelerated Life Testing (HALT)
Accelerated Life Testing (ALT)
10
Engineering-Based Reliability
Physics of Failure,
-Model the root causes of failure (e.g.,
fatigue, fracture, corrosion & wear)
CAD tools developed
- By industry/academia/government
Stress (e.g., - To address specific materials, sites, &
vibration) is architectures
propagated from
system level to
failure site
Finite Element
Modeling
Solid Modeling Dynamic Simulation
12
Physics of Failure to Evaluate Electronics
Enclosure Design
Circuit Card Vibration/Shock
Computational Design Environment
Fluid
Dynamics Model
CalcePWA
Circuit Card
Thermal Tool
Conditions
Determine if electronics
are acceptable based on
analysis
PoF-Based ESS Determine if circuit
card or enclosure can be
redesigned to eliminate Accelerated Life Testing
failure mechanism on critical board or IC failure
mechanisms
13
Computational Fluid Dynamics (CFD) Modeling
Inputs
• Exterior ambient air temperature
• Initial temperature
• Fan properties
• Power dissipated for each CCA
Outputs
• Interior air velocity
• Interior air temperature
• CCA edge temperature
Outputs from CFD analysis used as boundary conditions for CCA thermal modeling
14
UMD CalcePWA Software Tool
Architecture & environment Reports and documentation
modeling Toolbox
Failure assessment
Vibration analysis & sensitivity analysis
Thermal analysis
15
Electronics Circuit Card Success Stories
Tracked Vehicle Increased
Radar Ground Station $1.2M Saved
• Identified potential Reliability
• Analysis showed commercial thermal & vibration
circuit card OK problems
DADS
Pro/E
Test Course Microprofile
ATC Cross Country 3 Course - Left and Right Tracks
November, 1998
De-trended Data
15
10
Displacement - Inches
5
Right Track
0
Left Track
-5
-10
-15
100 200 300 400 500 600 700
Distance - Feet
NASTRAN
Reliability Analysis
Fatigue Life Assessment Reliability Based
List of Critical Nodes Design Optimization
DRAW
17
Three-Dimensional CAD Solid Models
CAD: Pro/Engineer, AUTOCAD, I-deas, Solidworks,
Used for design and manufacture
Used to develop Finite Element Analysis & Dynamic Analysis
models
18
Finite Element Analysis (FEA) Models
Mode 1
20
Fatigue Analysis Software
Examples: nCode, LMS, University
of Iowa DRAW
• Edits & characterizes strain time
histories
• Rainflow counting & mean stress
correction of strain cycles
• Estimates plastic strain based on
elastic stress or strain calculations
• Calculates fatigue life based on
measured (strain gauge) or FEA
strain time histories
AMP1.DAC
Strain
uE
AMP1.RSD
Strain
uE
AMP1N.RSD
Strain
uE
1000
-1000
-2000
-3000
-4000
15.2 15.4 15.6 15.8
21
Trailer Physics-of-Failure Project
Life (Blocks)
Critical Point
White represents low fatigue life
Benefits:
Early identification of failure modes
Better test planning and design Enlargement of
Critical Region
Improved maintenance procedures
22
Paradigm Shift: RAM-T Case
Pit-Stop Engineering
User/Maintainer hardware interface as a key design parameter
Develop Standards of Excellence
• Defines the critical parameters
• Examples
37 pounds maximum for an electrical assembly.
Spares on board to provide on board failure recovery.
Placement of electronics should be on exterior man accessible
surfaces, no buried electronics.
No cables in places where they cannot be accessed.
Use common connectors throughout.
Etc.
Visualization for decision making
23
Paradigm Shift: RAM-T Case
24
Paradigm Shift: RAM-T Case
25
Paradigm Shift: RAM-T Case
26
Paradigm Shift: RAM-T Case
Reliability Enhancement Testing (RET)
Testing focused on Reliability improvement
Objective
• Find failure modes
• Eliminate failure modes
• Mitigate those not able to eliminate
Period of performance
• Once hardware is available
Methodologies
• Use up the life of the product
Normal use (years)
Accelerated life test (weeks or months)
Highly accelerated life test (days)
27
Paradigm Shift: RAM-T Case
Load Levels
Nominal
28
Paradigm Shift: RAM-T Case
29
Implementation
Embrace the philosophy
Determine critical items
Put together multi-disciplined team
Reliability Improvement Working Group (RIWG)
Determine RAM-T Case methodologies
Document in Action Plan
30
Implementation
Reliability Improvement Working Groups
Integrated, collaborative team composed of design,
specialty, and test personnel to develop Action Plans for
critical components to improve the reliability early in the
design process.
Action Plans cover proactive reliability tasks such as
design reviews, load/stress surveys, failure mode
analysis, physics of failure, probabilistic analysis, and
reliability enhancement testing.
Forum for discussing Action Plans with and receiving
input from reliability improvement experts from
customer, OPM, AMSAA, AEC, and other government and
industry organizations.
31
Implementation
Conceptual
Failure Mode Prognostic Probabilistic
Analysis Approach PoF RET Analysis
Recoil Seal Completed Ongoing Planned
Rammer Chain Completed Ongoing Planned
Laser Flash Tube Ongoing Planned Planned (1)
Servo Control Unit
Connector Completed Planned
Digital Servo
Controller Circuit Card Completed Planned Planned (1)
Dynamic Cable Completed
Split Idler Planned Planned Planned
Road Wheels Planned Planned Planned
Suspension
Subsystem Planned Planned
The gaps show that the whole surface area is not being used to seal.
33
RIWG Projected Costs
Emerging Findings, RET
Rammer Chain Housing Material
Material Sample
34