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VSBU29 Signal Integrity Part2
VSBU29 Signal Integrity Part2
High Level
High Threshold
Low state
overshoot
Low Threshold
Low Level
Ringback
Under-shoot
Overshoot error
Can lead to device damage
Affects long term reliability of device
Adds to EMI problems by dramatically increasing harmonics in
waveform
Ringback
May lead to false device latching
May lead to metastable behaviour in circuit
Causes increased EMI headaches
Reduces noise immunity of device
Undershoot
Can lead to device failure
Leads to excessive current in case a clamp diode is present, which
Affects device reliability
Dissipates power due to excessive clamp currents.
Increases EMI problems
Low-state overshoot
Can lead to false switching
Increases EMI problems
Reduces noise immunity of device
Delay Error
Excessive delay between driver and receiver, or,
Excessive delay between clock of the driver and output of the receiver
Can lead to timing problems, metastability, false latching and a host of
other problems
Arises due to excessive lengths or loading