Presentation on “Power Optimization in DFT”

DEPARTMENT OF ELECTRONICS AND COMMUNICATION

B.M.S COLLEGE OF ENGINEERING

FACULTY IN CHARGE : Dr. R. Jayagowri

Associate Professor
PRESENTED BY : NAMBOODARI AKHIL MM KRISHNAN
USN: 1BM17LVS14
 Reducing Scan-shift Power Through Scan
Partitioning and Test Vector Reordering

By Tiebin Wu, Li Zhou, Hengzhu Liu of College of Computer, National

University of Defense Technology, Changsha, China

This paper was presented at 21st IEEE International Conference on

Electronics, Circuits and Systems (ICECS), 2014
Flow of Presentation
• Introduction
• Scan-shift Power Metric
• Scan Partitioning
• Proposed Scheme
• ACO Algorithm
• Experimental Results
• Conclusion
• References
Introduction
• Excessive test power dissipation results in
• Over testing
• IR-Drop
• Yield Loss
• Heat Damage to the circuit
• Structural Damage
• An efficient scan-shift power reduction scheme based on scan chain partitioning and test vector
reordering is presented in this paper.
• A heuristic ‘Ant Colony Optimization (ACO)’ algorithm is introduced to reorder the test vectors to
minimize the clashes between the previous test response and current test vector, which leads to
further reduction in scan-shift power.
• Experimental results show that the proposal can achieve 3.48% scan-shift power reduction on
average with the help of ACO test vectors reordering after scan partitioning.
• The proposed scan-shift power reduction technique can be acceptable for any scan-based testing
architecture without affecting test application time, test fault coverage, performance and/or routing
cost of the CUT.
Scan-shift Power Metric
• Weighted Transition Metric (WTM) is utilized to evaluate the scan-shift power in this work, since it is the dynamic power dissipated
during scan-shift test data through scan chains, which is generally determined by the switching activity or transitions occurred in the
scan cells.
• Scan-in power, which is the dynamic power consumption dissipated during scan-in of the test stimuli, can be calculated using Eq.
(1)

• Scan-out power can be calculated as Eq. (2), since it is the dynamic power consumption dissipated during scan-out the test
responses.

where N - Number of test vectors

L - Length of scan chain
ti,j is the jth bit of test vector ti
ri,j is the jth bit of test response ri
Scan-shift Power Metric
• Clash is defined as the transition between the MSB of the previous test response and the LSB of
the current test vector, which will propagate from the first scan cell to the last in the scan chains
during scan-in/out shift operations.
• Scan-shift power is the sum of the scan-in power, scan-out power and the dynamic power
consumption dissipated by all clashes, which can be calculated as Eq. (3)

where ti+1,L is the LSB of test vector ti+1

ri,1 is the MSB of test response ri
ri is the corresponding response of test vector ti.
Scan Partitioning
• A low power scan scheme based on partitioning and scan hold is shown in Fig. 1. Each scan chain
is evenly partitioned into s segments, and a multiplexer is inserted between every two
consecutive segments, where each jth multiplexer of every scan chain is controlled by the same
corresponding signal Cj (1<=j<=s) as shown in Fig. 1(b).
• During scan-in/out shift operations, only single signal Cj is enabled and others are set to low,
which means that only the corresponding jth segment in every scan chain is active for scan-in/out
test data, while others are held in bypass state.
Scan Partitioning
• The scan test data of each segment only require to scan-in/out through itself as shown in red line in
Fig. 1(b), while it need to shift through the full scan chain until it arrive at appropriate position
before scan partitioning as shown in red line in Fig. 1(a).
• If a transition occurs at the last two bits of a test vector, it will propagate from the first scan cell to
the(L − 1) th scan cell (assume the scan chain length is L), which will cause L−1 transitions during
scan-in operations.
• This transition propagates only through the last segment, and causes only L/s−1 scan cell
transitions, where scan-shift transitions will be reduced efficiently.
Proposed Scheme
• Partitioning is done as per the scan partitioning described earlier.
• Clash will be redefined as the transition between the MSB of the previous test response in a given
segment and the LSB of the current test vector in the same segment, which will only propagate from the
first scan cell to the last in the corresponding scan segment during shift operations.
• The clashes between two consecutive test vectors will be the total clashes of corresponding s segments,
whose number ranges from 0 to s. Therefore, the total number of WTM occurred by all clashes should
be calculated as Eq. (4)

where ti+1,js is the LSB of jth segment of test vector ti+1,

ri,(j−1)s+1 is the MSB of jth segment of test response ri,
ri is the corresponding response of test vector ti.
• The dynamic power consumption dissipated by all clashes is directly determined by the
number of clashes.
• The WTMclash will decrease if the number of clashes can be reduced, which can be
obtained through test vector reordering.
Ant Colony Optimization (ACO) Algorithm
• Consider each test vector as a city, and the number of clashes between every two test vectors as the
distance between these two corresponding cities.
• The problem for finding the optimization order of the test vectors to minimize the number of
clashes can be considered as the problem for finding the shortest route to traverse all these
corresponding cities, which is similar to the classical traveling salesman problem (TSP).
• ACO algorithm is shown in the next slide.
• The input parameter D is a n×n distance matrix (n is the number of test vectors), and each Dij
denotes the distance (clashes) between ith test vector ti and jth test vector tj. Dij is given as shown
below.

where rj - corresponding response of test vector tj ,

s - number of partitioned segments
ti,ks - (ks)th bit of test vector ti
Ant Colony Optimization (ACO) Algorithm
m – Number of ants
α - pheromone importance factor
β - heuristic function importance factor
ƿ - pheromone evaporation factor
Q - constant enhancement coefficient
Ƭ - pheromone matrix
Ƞ - heuristic function
Itermax - maximum iteration number
Rbest – best route
Lmin - minimum traversing length
Experimental Results
Conclusion
• After partitioning the scan chains evenly, the heuristic ACO test vectors reordering algorithm is
introduced to minimize the clashes between the previous test response and current test vector,
which in turn reduces the scan-shift power further.
• The proposal can achieve about 3.48% scan-shift power reduction on average after introducing
ACO test vectors reordering technique.
• It only reorders the test vectors without introduce any additional test cost, which is suitable for any
scan test environment without penalty of test quality and/or performance degradation of the CUT.