Digital Integrated Circuit Design: Subject Code:18EC2019

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Digital Integrated Circuit Design

Subject Code:18EC2019
Content

• Introduction
• Structure
• Types
• Operation of MOSFET
• Simplified V-I Equation
Karunya Institute of Technology and
Sciences
Transistor & Types

Karunya Institute of Technology and


Sciences
Circuit Symbol (NMOS)
enhancement-type: no channel at zero gate voltage

D
ID= IS

G B (IB=0, should be reverse biased)


IG= 0

IS G-Gate
D-Drain
S S-Source
B-Substrate or Body
Structure: n-channel MOSFET
(NMOS)
gate: metal or heavily doped poly-Si
G
(bulk or body source IG=0 drain
substrate) B S D
ID=IS
y IS

metal
oxide

n+ n+
p
x

W
L
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Sciences
Energy bands

(“flat band” condition; not equilibrium) (equilibrium)


Cut off Region : Flatbands! For this choice of
materials, VGS<0
n+pn+ structure  ID ~ 0
gate
G
body source drain
B S - + D
VD=Vs

n++
oxide

n+ n+
p

W
L
Flatbands < VGS < VT (Includes VGS=0 here). n+-
depletion-n+ structure  ID ~ 0

gate
G
body source drain
B S - + D
VD=Vs
+++
n++
oxide

n+ n+
p

W
L
VGS > VT
n+-n-n+ structure  inversion

gate
G
body source drain
B S - + D
VD=Vs
+++
+++
+++
n++
oxide

n+ ----- n+
p

W
L
Triode Region
A voltage-controlled resistor @small VDS

B S D
- +
ID
+++
+++ VGS1>Vt
increasing
metal
- oxide
- - -
VGS
n+ n+
p

B S -+ D

+++ VGS2>VGS1
+++
+++
metal G
- -oxide
- - --
n+ n+
p
cut-off VDS
B S -+ D
0.1 v
+++ VGS3>VGS2
+++ +++
+++
metal
Increasing VGS puts more
n+
- - -oxide
------
p
n+ charge in the channel, allowing
more drain current to flow
Saturation Region
occurs at large VDS
As the drain voltage increases, the difference in
voltage between the drain and the gate becomes
smaller. At some point, the difference is too small
to maintain the channel near the drain  pinch-off
gate
G
body source drain
+
B S - D

+++ VDS large


+++
+++
metal
oxide

n+ n+
p
Saturation Region
occurs at large VDS
The saturation region is when the MOSFET
experiences pinch-off.
Pinch-off occurs when VG - VD is less than VT.
gate
G
body source drain
+
B S - D

+++ VDS large


+++
+++
metal
oxide

n+ n+
p
Saturation Region
occurs at large VDS

VGS - VDS < VT or VGD < VT


VDS > VGS - VT

gate
G
body source drain
+
B S - D

+++ VD>>Vs
+++
+++
metal
oxide

n+ n+
p
Saturation Region
once pinch-off occurs, there is no further increase in drain current

ID saturation
triode
VDS>VGS-VT
increasing
VDS<VGS-VT
VGS

VDS
0.1 v
Simplified MOSFET I-V Equations

Cut-off: VGS< VT
ID = IS = 0
Triode: VGS>VT and VDS < VGS-VT
ID = kn’(W/L)[(VGS-VT)VDS - 1/2VDS2]
Saturation: VGS>VT and VDS > VGS-VT
ID = 1/2kn’(W/L)(VGS-VT)2

where kn’= (electron mobility)x(gate capacitance)


= n(ox/tox) …electron velocity = nE
and VT depends on the doping concentration and gate material used (…
more details later)
Karunya Institute of Technology and
Sciences
Karunya Institute of Technology and
Sciences
Karunya Institute of Technology and
Sciences
Karunya Institute of Technology and
Sciences
Karunya Institute of Technology and
Sciences
Karunya Institute of Technology and
Sciences
Karunya Institute of Technology and
Sciences
Karunya Institute of Technology and
Sciences

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