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Shaping Electron

Bunches at the
Femtosecond
Level (Ehberger, Ryabov et al. 2018)

Vasilii Iugov

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Ultrafast 4D electron microscopy
• Pump-probe method: the sample
is hit with a laser pulse and then
probed by an electron beam with
adjustable delay
• Femtosecond temporal resolution
and nanometer spatial resolution
• Difficult to achieve the same
effective velocity of laser pulse
and probing beam along the
sample surface, especially at an
angle
(Zewail, Thomas 2009)
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Tilting and compressing an electron bunch
• Transverse THz field deflects
electrons in the front and in the
back of the bunch in different
directions
• Longitudinal THz field
accelerates electrons in the back
and decelerates electrons in the
front

(Faure 2018)
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Combining both effects
• A mirror is used in order to
create both transverse and
longitudinal electric fields
• Different degrees of tilt and
compression can be achieved by
changing mirror and pulse angles

(Faure 2018)

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Electron momentum bump

• are geometry factors():

e- e-

(Ehberger, Ryabov et al. 2018)


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Geometry factors for different angles

- compression, - deflection, (E=70 keV, )


Dotted line – convenient region for experiment: weak deflection, constant compression
(Ehberger, Ryabov et al. 2018)

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Temporal focus position
• At the temporal focus the electron bunch achieves maximal
compression
• If we approximate

the time it takes to reach the temporal focus is defined by

Thus,

and the position of the temporal focus is


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Velocity matching condition
• If the phase difference of electrons and light
pulse is constant along the mirror, all of the
electrons in a given -slice get the same
momentum change
• Condition for this is that the superluminal
phase velocities of electrons and light pulse
along the mirror are equal:
e- e-

• If it is satisfied, the electron bunch doesn’t get


tilted
(Ehberger, Ryabov et al. 2018)
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Geometry factors for different angles
At the velocity
matching point,
deflection is
identically zero!

- compression, - deflection, (E=70 keV, )


Dotted line – convenient region for experiment: weak deflection, constant compression
(Ehberger, Ryabov et al. 2018)

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Away from velocity matching
• If we want to achieve tilting, we need to break the
velocity matching condition. For arbitrary angles,
the time mismatch at different positions is

• The tilt angle at the temporal focus is

(remember that ) e- e-

(Ehberger, Ryabov et al. 2018)


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First experimental setup
• To measure tilt angle, additional

(Ehberger, Ryabov et al. 2018)


streaking pulse with the field
oscillating in the x direction,
providing additional varying
with arrival time
Scheme of the experiment, top and side views
• The tilted beam has z-y
correlation. Streaking introduces
z-x correlation so that we can
see x-y correlation on the screen
Screen images for different mirror angles
( is the velocity-matching angle)
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Second experimental setup
• As the THz pulse delay is

(Ehberger, Ryabov et al. 2018)


changed, the beam position
oscillates with the amplitude

• This amplitude was measured as a


function of the delay for different
angles
• As in theory, at the velocity matching Vertical position of the beam as a function of
angle control field delay for different mirror angles
( is the velocity-matching angle)

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Results
• Arrival time difference and
deflection amplitude were
measured
• Results were consistent with
formulas derived earlier, as can
be seen from the graphs

Measured arrival time difference (blue dots)


and deflection amplitude (red dots).
(Ehberger, Ryabov et al. 2018)

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Potential applications
Allows for ultrafast pump-probe diffraction and microscopy with optical and e-
cycles at an angle, but still hitting the sample synchronously

(Ehberger, Ryabov et al. 2018)


• Subcycle electron • Subcycle low-energy • Subcycle electron
diffraction electron diffraction microscopy

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Summary
• The same light beam used for producing the electron bunch can be
used to tilt and compress it
• To achieve this, the geometry must be fine-tuned so that the beam is
distorted in the right way
• It has possible applications in ultrafast 4D electron diffraction and
microscopy

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References
• Ehberger, D., et al. (2018). "Tilted Electron Pulses." Physical Review
Letters 121(9) + supplemental materials
• Zewail, A. H. A. T., John M (2009). 4D Electron Microscopy.
• Jérôme Faure (2009). Viewpoint: Shaping Electron Bunches at the
Femtosecond Level

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