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X Raydiffraction 1
X Raydiffraction 1
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Bragg’s law is a simplistic model to understand what
conditions are required for diffraction.
2d hkl sin
d hkl d hkl
• For parallel planes of atoms, with a space dhkl between the planes, constructive
interference only occurs when Bragg’s law is satisfied.
– In our diffractometers, the X-ray wavelength is fixed.
– Consequently, a family of planes produces a diffraction peak only at a specific angle .
– Additionally, the plane normal must be parallel to the diffraction vector
• Plane normal: the direction perpendicular to a plane of atoms
• Diffraction vector: the vector that bisects the angle between the incident and diffracted beam
• The space between diffracting planes of atoms determines peak positions.
• The peak intensity is determined by what atoms are in the diffracting plane.
XRD-Methods
• Laue photographic method
• Braggs X-Ray spectrometer
• Rotating crystal method
• Powder method
Laue photographic method
• In his first experiments, Max von Laue (Nobel Prize in Physics in 1914)
used continuous radiation (with all possible wavelengths) to impact on a
stationary crystal. With this procedure the crystal generates a set of
diffracted beams that show the internal symmetry of the crystal. In these
circumstances, and taking into account Bragg's Law, the experimental
constants are the interplanar spacings d and the crystal position referred
to the incident beam. The variables are the wavelength λ and the integer
number n:
n λ = 2 dhkl sin θnh,nk,nl
• Thus, the diffraction pattern will contain (for the same spacing d) the
diffracted beams corresponding to the first order of diffraction (n=1) of a
certain wavelength, the second order (n=2) of half the wavelength (λ/2),
the third order (n=3) with wavelength λ/3, etc. Therefore, the Laue
diagram is simply a stereographic projection of the crystal
The Laue method in transmission mode The Laue method in reflection mode
AC CURRENT
Rotating crystal method
Most of our powder diffractometers use the
Bragg-Brentano parafocusing geometry.
• A point detector and sample are
moved so that the detector is always
at 2 and the sample surface is
always at to the incident X-ray
beam.
• In the parafocusing arrangement, the
incident- and diffracted-beam slits
move on a circle that is centered on
the sample. Divergent X rays from
the source hit the sample at different
points on its surface. During the
diffraction process the X rays are
refocused at the detector slit. F: the X-ray source
• This arrangement provides the best DS: the incident-beam divergence-limiting slit
SS: the Soller slit assembly
combination of intensity, peak shape, S: the sample
and angular resolution for the widest RS: the diffracted-beam receiving slit
number of samples. C: the monochromator crystal
AS: the anti-scatter slit
What is X-ray Powder Diffraction (XRD)
X-ray powder diffraction (XRD) is a rapid analytical
technique primarily used for phase identification of a
crystalline material and can provide information on unit
cell dimensions.
Strengths
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