The document discusses the components and functioning of a transmission electron microscope (TEM). It explains the illumination system, including the effect of condenser aperture size and lens strengths on probe size. It also covers the objective system and how bright and dark field images are formed using diffraction patterns by tilting diffracted beams along the optical axis for dark field imaging. Additionally, it mentions electron scattering techniques like elastic and inelastic scattering and beam damage from inelastic scattering.
The document discusses the components and functioning of a transmission electron microscope (TEM). It explains the illumination system, including the effect of condenser aperture size and lens strengths on probe size. It also covers the objective system and how bright and dark field images are formed using diffraction patterns by tilting diffracted beams along the optical axis for dark field imaging. Additionally, it mentions electron scattering techniques like elastic and inelastic scattering and beam damage from inelastic scattering.
The document discusses the components and functioning of a transmission electron microscope (TEM). It explains the illumination system, including the effect of condenser aperture size and lens strengths on probe size. It also covers the objective system and how bright and dark field images are formed using diffraction patterns by tilting diffracted beams along the optical axis for dark field imaging. Additionally, it mentions electron scattering techniques like elastic and inelastic scattering and beam damage from inelastic scattering.
Inelastic Scattering Beam Damage Due to Inelastic Scattering Electron Diffraction-Best Example from Hgh School Physics Two Types of Diffraction: Fresnel and Fraunhofer Schematic of TEM Let’s First Talk About the Illumination System Illumination System: Effect of Strength of C2 and Condenser Aperture Size Illumination System: Effect of C1 Lens Strength on Probe Size Illumination System: Effect of C3 Lens Illumination System: Gun Shift and Gun Tilt Role of Deflectors Now We Will Talk About Objective System Let’s look at the Information on Diffraction Patterns First Imaging mode: Bright and Dark Field Images How Can We Form Bright and Dark Field TEM Images? How to Form a Bright Field Image? What if we want to form a dark field image using one of the diffracted beams? Solution is-------Proper Dark Field Imaging Proper Dark Field Imaging Achieved By Tilting the Diffracted Beam Along the Optical Axis Scanning Transmission Electron Microscopy (STEM)