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Leakage Reduction Techniques
Leakage Reduction Techniques
Leakage Reduction Techniques
EC400150
S= +ve
Sub= -Ve
LEAKAGE REDUCTION TECHNIQUES
For a CMOS circuit, the total power dissipation includes dynamic and
static components during the active mode of operation. In the standby
mode, the power dissipation is due to the standby leakage current.
Dynamic power dissipation consists of two components.
Retrograde Doping:
More highly doped p-type substrate
Halo Doping: near the edges of the channel reduces the charge-
sharing effects from the source and drain fields, thus
Halo doping or nonuniform channel reducing the width of the depletion region in the drain-
profile in a lateral direction was introduced below substrate and source-substrate regions.
0.25-um technology node to provide another way to
control the dependence of threshold voltage on
channel length
For leakage reduction in digital circuits (logic and memory), four major circuit design techniques—
• Transistor stacking,
• Multiple Vth
• Dynamic Vth
• Supply voltage scaling (multiple and dynamic)
Standby Leakage Control Using Transistor Stacks ((Self-Reverse Bias))
• Subthershold leakage current flowing through a stack of series-connected transistors reduces when more than
one transistor in the stack is turned off. This effect is known as the stacking effect.
A high threshold voltage in the standby mode gives low leakage current,
while a low threshold voltage allows for higher current drives in the active mode
of operation
Dynamic Vth Designs: Dynamic threshold voltage scaling is a technique for active leakage power reduction.
• Two varieties of dynamic Vth scaling (DVTS) have been proposed
a) Vth-hopping scheme:
b) Dynamic vth scaling scheme:
Vth-hopping scheme:
DVS architecture