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AFM-ATOMIC FORCE MICROSCOPE

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SEMSCANNING ELECTRON MICROSCOPE

Content

Introduction. Types of mocroscope. Automatic Force Microscope. Scanning Electron Microscope. Reference.

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Introduction
The Microscope is being used to solve processing and materials problems in a wide range of technologies.

Here we describe two types of mocroscope.

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1.

Automatic Force Microscope. Scanning Electron microscope.

1.

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AFM-ATOMIC FORCE MICROSCOPE.

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What is AFM?

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The 4/23/12 cantilever is typically silicon or silicon nitride

The AFM can be operated in a number of modes, depending on the application.

Imaging modes. Contact mode. Non-contact mode.

The primary modes of operation for an AFM are static mode and dynamic mode. In static mode, the cantilever is "dragged" across the surface of the sample and the contours of the surface are measured directly using the deflection of the cantilever. In the dynamic mode, the cantilever is externally oscillated at or close to its fundamental resonance 4/23/12 frequency or a harmonic.

Contact mode

In the static mode operation, the static tip deflection is used as a feedback signal. Because the measurement of a static signal is prone to noise and drift, low stiffness cantilevers are used to boost the deflection signal. However, close to the surface of the sample, attractive forces can be quite strong, causing the tip to "snap-in" to the surface.
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Non-contact mode

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In this mode, the tip of the cantilever does not contact the sample surface. The cantilever is instead oscillated at a frequency slightly above its resonant frequency where the amplitude of oscillation is typically a few nanometers (<10nm). The van der Waals forces, which are strongest from 1nm to 10nm above the surface, or any other long range force which extends above the surface acts to decrease the resonance frequency of the cantilever. This decrease in resonant frequency combined with the feedback loop system maintains a constant oscillation amplitude or frequency by adjusting the average tip-to-sample distance.
4/23/12 Measuring

the tip-to-sample distance at each (x,y)

AFM cantilever deflection measurement

AFM beam deflection detection 4/23/12

Laser light from a solid state diode is reflected off the back of the cantilever and collected by a position sensitive detector (PSD) consisting of two closely spaced photodiodes whose output signal is collected by a differential amplifier. Angular displacement of the cantilever results in one photodiode collecting more light than the other photodiode, producing an output signal (the difference between the photodiode signals normalized by their sum) which is proportional to the deflection of the cantilever. It detects 4/23/12 noise cantilever deflections <10nm (thermal limited). A long beam path (several

Advantages: The AFM provides a three-dimensional surface profile. Most AFM modes can work perfectly well in ambient air or even a liquid environment. AFM can provide higher resolution than SEM. Disadvantages: The single scan image size. The scanning speed of an AFM is also a limitation. That may require software enhancement and filtering. 4/23/12

SEM-SCANNING ELECTRON MICROSCOPE

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What is a SEM?

The SEM is a microscope that uses electrons instead of light to form an image.

How does a SEM work?

A beam of electrons is produced at the top of the microscope by an electron gun.

The electron beam follows a vertical path through the microscope, which is held within a vacuum.

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Scanning 4/23/12

process and image formation

How is a sample prepared?

All water must be removed from the samples . All metals are conductive preparation before being used . and require no

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Advantages

The SEM has a large depth of field, which allows more of a specimen to be in focus at one time. The SEM also has much higher resolution, so closely spaced specimens can be magnified at much higher levels.

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Reference
www.wikipedia.encyclopedia Knoll, Max (1935). "Aufladepotentiel und Sekundremission elektronenbestrahlter Krper". Zeitschrift fr technische Physik 16: 467475.

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Thank you
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4/23/12