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CH 3
CH 3
CMOS Technology depends on using both N-Type and P-Type devices on the same chip.
The two main technologies to do this task are:
P-Well
The substrate is N-Type. The N-Channel device is built into a P-Type well within the
parent N-Type substrate, The P-channel device is built directly on the substrate.
N-Well
The substrate is P-Type. The N-channel device is built directly on the substrate.
while the P channel device is built into a N-type well within the parent P-Type substrate.
Becoming more popular for sub-micron geometries where device performance and
density must be pushed beyond the limits of the conventional p & n-well CMOS
processes
Twin Tub
Both an N-Well and a P-Well are manufactured on a lightly doped N-type substrate
Silicon-on-Insulator (SOI) CMOS Process
SOI allows the creation of independent, completely isolated nMOS and pMOS
Why to study Fabrication?
• Strong link between Fabrication Process , the circuit design
procedure and the performance of resulting chip
• Twin-tubs
Flow Diagram
Create n-Well regions and
Channel Stops region
n+ diffusion
p+ diffusion
n+ n+ p+ p+
polysilicon
n well
p substrate
metal1
p+ n+ n+ p+ p+ n+
n well
p substrate
GND VDD
– n-well
– Polysilicon Polysilicon
– n+ diffusion n+ Diffusion
– p+ diffusion p+ Diffusion
– Contact Contact
– Metal
Metal
Fabrication Steps
• Start with blank wafer
• Build inverter from the bottom up
• First step will be to form the n-well
– Cover wafer with protective layer of SiO2 (oxide)
– Remove layer where n-well should be built
– Implant or diffuse n dopants into exposed wafer
– Strip off SiO2
p substrate
Oxidation
• Grow SiO2 on top of Si wafer
– 900 – 1200 C with H2O or O2 in oxidation furnace
SiO2
p substrate
Photolithography
Exposure Processes
Photoresist
• Used for lithography .
• Lithography is a process used to transfer a pattern to layer on the chip.
Similar to Printng Process
• Spin on photoresist (about 1 mm thickness)
– Photoresist is a light-sensitive organic polymer
– Possitive Photoresist: Softens where exposed to light
– Negative Photresist: Harden where exposed to light, Not used in
practise generally
Photoresist
SiO2
p substrate
Lithography
• Expose photoresist through n-well mask
• Strip off exposed photoresist
Photoresist
SiO2
p substrate
Etch
Cluster Tool Etch
Configuration Chambers
Wafers Transfer
Chamber
Loadlock
Exhaust
Etch
• Etch oxide with hydrofluoric acid (HF)
– Seeps through skin and eats bone; nasty stuff!!!
• Only attacks oxide where resist has been
exposed
Photoresist
SiO2
p substrate
Strip Photoresist
• Strip off remaining photoresist
– Use mixture of acids called piranah etch
• Necessary so resist doesn’t melt in next step
SiO2
p substrate
n-well
• n-well is formed with diffusion or ion implantation
• Diffusion
– Place wafer in furnace with arsenic gas
– Heat until As atoms diffuse into exposed Si
• Ion Implanatation
– Blast wafer with beam of As ions
– Ions blocked by SiO2, only enter exposed Si
SiO2
n well
Ion Implantation
Focus Beam trap and Neutral beam and
gate plate beam path gated
phosphorus
(-) ions photoresist mask
f ield oxide
n-w ell p- epi
p-channel transistor
p+ substrate
Strip Oxide
• Strip off the remaining oxide using HF
• Back to bare wafer with n-well
• Subsequent steps involve similar series of steps
n well
p substrate
Polysilicon
• Deposit very thin layer of gate oxide
– < 20 Å (6-7 atomic layers)
• Chemical Vapor Deposition (CVD) of silicon layer
– Place wafer in furnace with Silane gas (SiH4)
– Forms many small crystals called polysilicon
– Heavily doped to be good conductor
Polysilicon
Thin gate oxide
n well
p substrate
Polysilicon Patterning
• Use same lithography process to pattern polysilicon
Polysilicon
Polysilicon
Thin gate oxide
n well
p substrate
Self-Aligned Process
• Use oxide and masking to expose where n+ dopants should be
diffused or implanted
• N-diffusion forms nMOS source, drain, and n-well contact
n well
p substrate
N-diffusion
• Pattern oxide and form n+ regions
• Self-aligned process where gate blocks diffusion
• Polysilicon is better than metal for self-aligned gates because
it doesn’t melt during later processing
n+ Diffusion
n well
p substrate
N-diffusion cont.
• Historically dopants were diffused
• Usually ion implantation today
• But regions are still called diffusion
n+ n+ n+
n well
p substrate
N-diffusion cont.
• Strip off oxide to complete patterning step
n+ n+ n+
n well
p substrate
P-Diffusion
• Similar set of steps form p+ diffusion regions for pMOS source
and drain and substrate contact
p+ Diffusion
p+ n+ n+ p+ p+ n+
n well
p substrate
Contacts
• Now we need to wire together the devices
• Cover chip with thick field oxide
• Etch oxide where contact cuts are needed
Contact
n well
p substrate
Metalization
• Sputter on aluminum over whole wafer
• Pattern to remove excess metal, leaving wires
Metal
Metal
Thick field oxide
p+ n+ n+ p+ p+ n+
n well
p substrate
Stick Diagrams
Stick Diagrams
• Objectives:
– To know what is meant by stick diagram.
– To understand the capabilities and limitations of stick
diagram.
– To learn how to draw stick diagrams for a given MOS
circuit.
• Outcome:
– At the end of this module the students will be able
draw the stick diagram for simple MOS circuits.
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Stick Diagrams
Stick Diagrams
N+ N+
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S.N.Bhat, Faculty, Dept. of E&C Engineering, M.I.T Manipal
Stick Diagrams
Stick Diagrams
VDD
VDD
X
X
x x x
x Stick
Diagram X
Gnd Gnd
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Stick Diagrams
Stick Diagrams
VDD
VDD
X
X
x x x
x X
Gnd Gnd
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Stick Diagrams
Stick Diagrams
• VLSI design aims to translate circuit concepts
onto silicon.
• stick diagrams are a means of capturing
topography and layer information using simple
diagrams.
• Stick diagrams convey layer information
through colour codes (or monochrome
encoding).
• Acts as an interface between symbolic circuit
and the actual layout.
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Stick Diagrams
Stick Diagrams
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Stick Diagrams
Stick Diagrams
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Stick Diagrams
poly
ndiff
pdiff
Can also draw
in shades of
gray/line style.
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Stick Diagrams
40
Stick Diagrams
41
Stick Diagrams
43
Stick Diagrams
44
2 Input NAND GATE
2 Input NOR Gate
Boolean Expression
Stick Diagrams
Power
A Out
Ground
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Layout Design Rules
SHEET RESISTANCECE Rs
For any layer, knowing the dielectric (silicon dioxide) thickness, we can calculate area
capacitance as follows:
STANDARD UNIT OF CAPACITANCE Cg
•It is convenient to employ a standard unit of capacitance that can be given a value
appropriate
to the technology
•But can also be used in calculations without associating it with an absolute value.
MOS transistor having W = L = feature size, that is, a 'standard' or 'feature size' square
Table: 4.2
SOME AREA CAPACITANCE CALCULATIONS