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Fundamentals of Electronic Device Fabrication - Week 2
Fundamentals of Electronic Device Fabrication - Week 2
by
Santhra Krishnan P
Research Scholar (PMRF)
Department of Metallurgical and materials Engineering
Indian Institute of Technology Madras
Quick Recap
• Layering → Oxide layer formation
• Processes involved
2. Which among the following are examples of a solid and liquid dopant source
a) AsH3
b) BBr3 liquid
solid
c) Sb2O3
liquid
d) POCl3
Fundamentals of Electronic Device Fabrication - NPTEL Live 4
Questions Thin oxide Thick oxide
(1 – 100 nm) (.01 – 1 μm)
3. In oxide growth, parabolic rate law is
• Linear oxide growth • Parabolic oxide growth
obeyed under what conditions? • • Diffusion controlled
Reaction controlled
a) Thin oxide layer • Growth rate is constant • Growth rate decreases
• Thickness is with time
b) Thick oxide layer proportional to time • Thickness is
proportional to the
c) When reaction is the rate limiting square root of time
step
d) No oxide layer
Thickness (nm) Application
4. A typical thickness value for a field
6 -10 Tunnelling gates
oxide layer is ______ nm
15 – 50 Gate oxides, dielectric capacitor gates
a) 5
20 – 50 LOCOS pad oxide
b) 50 200 - 500 Hard masks, surface passivation
c) 100 300 – 1000 Field oxides